• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.05b
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• pp.51-54
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• 2002

Recently, due to its better photosensitivity in X-ray, the amorphous selenium based photoreceptor is used on digital direct method conversion material. Compared to other photoconductive material, amorphous selenium has good X-ray response characteristic and low leakage current. It has many parameters of detecting X-ray response on selenium. Among of them, it is well known that manufacture of a-Se is the most basic element. In this paper, we fabricated two types of amorphous selenium sample which had time variable. The one was fabricated continuous deposition sample and the other was step by step sample. Thickness of sample was $300{\mu}m$ and top electrode was evaporated gold. We investigated the leakage current and photo current of them and analysed their electrical characteristics. For analyzing morphology of samples, SEM and surface was pictured. We found that step by step deposition method could be applied for novel fabricating amorphous selenium film.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.05c
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• pp.71-74
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• 2003

Photoconductor for direct detection fiat-panel imager present a great materials challenge, since their requirement include high X-ray absorption, ionization and charge collection, low leakage current and large area deposition, CdTe is practical material. We report studies of detector sensitivity, That is an CdTe with $5{\mu}m$ thickness on glass. That is hybrid layer of depositting ZnS:AgCl phosphor with $100{\mu}m$ on CdTe. The leakage current of hybrid is similar to it of a-Se, but photocurrent is larger than a-Se. Both of them have high spatial resolution, but hybrid has higher sensitivity than a-Se at comparable bias voltage.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.64 no.12
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• pp.1709-1717
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• 2015

In remote islands PV (Photo Voltaic) panel with BESS (Battery Energy Storage System) supplies electric power to the customers in parallel operation with EG (Engine Generator) to save fuel consumption and to mitigate environmental load. BESS operates in voltage control mode when it supplies power to the load alone, while it operates in current control mode when it supplies power to the load in parallel with EG. This paper proposes a smooth mode change scheme from current control to voltage control of BESS by adding proper initial value to the integral part of voltage control, and a smooth mode change scheme from voltage control to current control by tracking the EG output voltage to the BESS output voltage using PLL (Phase-Locked Loop). The feasibility of proposed schemes was verified through computer simulations with PSCAD/EMTDC, and the feasibility of actual hardware system was verified by experiments with scaled prototype. It was confirmed that the proposed schemes offer a seamless operation in the stand-alone power system in remote islands.

• The Magazine of the IEIE
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• v.30 no.5
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• pp.499-508
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• 2003

실제 실험에 사용한 대표적인 InAs/GaAs QUDIP에 대해서 detector를 평가하는데 사용하는 responsitity D*뿐만 아니라 이두 값을 좌우하는 phottoconductive gain 양자효율 noise current에 대해 정량적으로 살펴보고 QWIP와 비교해보았다 우선 가장 중요한 것은 QDIP의 온도가 약 10K에서 거의 200K까지 올라가도 responsivity와 D* 모두 온도에 따라 민감하게감소하지 않는다는 사실이다(거의 10배 정도만 감소했음). 이러한 측정결과는 QDIP의 가장 큰 장점인 실온 동작 가능성이 아주 높음을 확인시켜 준다. 참고로, 이미 사용되고 있는 QWIP나 MCT detector는 낮은 온도 영역에서도 온도가 증가함에 따라 responsivity와 D*가 민감하게 감소해서 77K 이상에서는 동작하지 않는다. 두번째로, QWIP는 시료의 표면에 수직 입사되는 IR에 반응하지 않는데, QDIP는 시료의 표면에 수직 입사되는 IR에도 잘 반응함을 확인하였다. 이러한 두 가지 특성은 QDIP가 가질 것이라고 예상되던 QDIP의 가장 큰 장점으로, QDIP가 mid IR이나 far IR detector로서의 전망이 아주 밝음을 보여준다. 저온에서 QDIP의 responsivity는 수 A/W 로, 보통의 QWIP의 responsivity가 수십 mA/W인 것을 고려할 때, 충분히 큰 값이었다. QDIP의 responsivity가 이렇게 큰 이유는 photo-conductive gain이 1000 이상으로 매우 컸기 때문이었다. 반면에, 양자효율은 0.01% 이하로 아주 작았는데, 이것은 흡수 계수 자체보다는 흡수 두께가 작기 때문인 것 같고, 따라서 QDIP의 주기 수를 늘릴 필요가 있음을 알았다. Detector를 평가하는데 가장 중요한 것은 responsivity보다는 D*인데, photoconductive gain과 양자효율의 곱에 비례하는 responsivity는 $\sim$A/W로 충분히 컸지만, 반면에 D*는 $\sim$2E8으로 QWIP에 비해 작았다. 이것은 noise current가 컸기 때문이며 이를 줄이는 것이 중요하다. Noise current의 주된 요인이 dark current에 비례하는 g-r noise이므로, dark current를 줄이는 구조가 필요하다. 대표적인 예가 AlGaAs 같은 additional barrier를 넣어 dark current를 줄이는 방법이다. QDIP의 주기 수를 늘리는 것도 dark current를 줄이는 데 도움이 될 것이다.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.423-423
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• 2012

Recently, many researchers made progress in various studies improving the efficiency of dye-sensitized solar cell. In this paper, we used glass textured by wet-chemical etching process for improvement of photocurrent density in dye-sensitized solar cells. This is owing to increase coefficient of light utilization. Consequently, DSSC using the textured glass exhibit a Jsc of 9.49 mA/$cm^2$, a Voc of 0.73 V and a fill factor (FF) of 0.67 with an overall conversion efficiency of 4.64. This result showed increasing of 20% current density and 16% conversion efficiency using the textured glass. These results suggested that glass texturing was very effective in controlling the light-scattering properties into the photovoltaic cell.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.2
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• pp.260-264
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• 2017

Process variation effect on arch-structured gate stacked array (GSTAR) 3-D NAND flash is investigated. In case of arch-structured GSTAR, a shape of the arch channel is depending on an alignment of photo-lithography. Channel width fluctuates according to the channel hole alignment. When a shape of channel exceeds semicircle, channel width becomes longer, increasing drain current. However, electric field concentration on tunnel oxide decreases because less electric flux converges into a larger surface of tunnel oxide. Therefore, program efficiency is dependent on the process variation. Meanwhile, a radius of channel holes near the bottom side become smaller due to an etch slope. It also affects program efficiency as well as channel width. Larger hole radius has an advantage of higher drain current, but causes degradation of program speed.

• Current Photovoltaic Research
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• v.6 no.2
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• pp.43-48
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• 2018

The traditional silicon heterojunction solar cells consist of intrinsic amorphous silicon to prevent recombination of the silicon surface and doped amorphous silicon to transport the photo-generated electrons and holes to the electrode. Back contact solar cells with silicon heterojunction exhibit very high open-circuit voltages, but the complexity of the process due to form the emitter and base at the backside must be addressed. In order to solve this problem, the structure, manufacturing method, and new materials enabling the carrier selective contact (CSC) solar cell capable of achieving high efficiency without using a complicated structure have recently been actively developed. CSC solar cells minimize carrier recombination on metal contacts and effectively transfer charge. The CSC structure allows very low levels of recombination current (eg, Jo < 9fA/cm2), thereby achieves high open-circuit voltage and high efficiency. This paper summarizes the core technology of CSC solar cell, which has been spotlighted as the next generation technology, and is aiming to speed up the research and development in this field.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.1
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• pp.75-80
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• 2006

We have fabricated a carbon nanotube field emission display(CNT-FED) panel with a 2 inch diagonal size using a screen printing method and in-situ vacuum sealing technology. The field emission properties of CNT FED panel with square-type CNT emitters. As results, the square-characterized and compared with those of the line-type CNT emitters. As results, the square-type CNT emitters showed much larger emission current and more stable I-V characteristics. Light emission started to be occurred at an electric field of 3.5 V/${\mu}m$ corresponding to the anode-cathode voltage of 700 V. The vacuum level inside of the in-situ vacuum sealed panel was obtained with $1.4 {\times} 10^{-5}$ torr. The sealed panel showed the similar I-V characteristics with the unsealed one and the uniform light emission with very high brightness at a current density of $243 {\mu}A/ cm^2$ obtained by the electric field of 10 V/${\mu}m$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.121-121
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• 2008

We propose a novel nanomaterial-based pn diode which constructed with an n-type ZnO nanowire (NW) and a p-type HgTe nanoparticle (NP) thin film. The photo current characteristics of a ZnO NW, a HgTe NP thin film and pn diode constructed with a ZnO NW and a HgTe NP thin film were investigated under illumination of the 325 nm and 633 nm wavelength light. The conductivities of a ZnO NW exposed to the 325 nm and 633 nm wavelength light increased, while the photocurrents taken from the HgTe NP thin film was very close to the dark currents. Moreover, The pn diode exhibited the rectifying characteristics of the dark current and of the photocurrent excited by the 633 nm wavelength light. In contrast, the ohmic characteristics for the photocurrent were observed due to the junction barrier lowering in the conduction band of the ZnO nanowire under the illumination of the 325 nm wavelength light.

• Current Optics and Photonics
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• v.3 no.6
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• pp.510-515
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• 2019

In this paper, we introduce a 1.3-㎛ 25-GHz waveguide-integrated vertical PIN type Ge-on-Si photodetector fabricated using a multi-project wafers service based on fringing field analysis in the depletion region. In general, 1.3-㎛ photodetectors fabricated using a commercial foundry service can achieve limited bandwidths because a significant amount of photo-generated carriers are located within a few microns from the input along the device length, and they are influenced by the fringing field, leading to a longer transit time. To estimate the response time, we calculate the fringing field in that region and the transit time using the drift velocity caused by the field. Finally, we compare the estimated value with the measured one. The photodetector fabricated has a bandwidth of 20.75 GHz at -1 V with an estimation error of <3 GHz and dark current and responsivity of 110 nA and 0.704 A/W, respectively.