• Journal of the Korea Institute of Information and Communication Engineering
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• v.9 no.3
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• pp.582-586
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• 2005

This paper presents a new structure of Phase Locked Loop(PLL) which changes its loop bandwidth according to the locking status. The proposed PLL consists of a conventional PLL and, Locking Status Indicator(LSI). The LSI decides the operating bandwidth of loop filler. When the PLL becomes out of lock, the PLL increases the loop bandwidth and achieves fast locking. When the PLL becomes in-lock, this PLL decreases the loop bandwidth and minimizes phase noise output. The PLL can achieve fast locking and low phase noise output at the same time. Proposed PLL's locking time is less than $40{\mu}s$ and spur is 76.1dBc. It is simulated by HSPICE in a Hynix CMOS $0.35{\mu}m$ Process.

• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.1836-1840
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• 2003

This paper, we propose a new phase-locked loop (PLL) system with the controllable output phase, independent from the output frequency, and lock-up time. This PLL system has a dual control loop is described, the inner loop greatly improved VCO characteristic such as faster speed response as well as higher operation bandwidth, to minimize the effect of the VCO noise and the power supply variation and also get better linearity of VCO output. The main loop is the heart of this PLL which greatly improved the output frequency instability due to the external high frequency noise coupling to the input reference frequency also the main loop can control the output phase, independent from the output frequency, and reduce the lock-up time of the step frequency response. The experimental results confirm the validity of the proposed strategy.

• Journal of IKEEE
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• v.23 no.3
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• pp.800-804
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• 2019

This paper presents a dual-loop sub-sampling digital PLL for a 2.4 GHz IoT applications. The PLL initially performs a divider-based coarse lock and switches to a divider-less fine sub-sampling lock. It achieves a low in-band phase noise performance by enabling the use of a high resolution time-to-digital converter (TDC) and a digital-to-time converter (DTC) in a selected timing range. To remove the difference between the phase offsets of the coarse and fine loops, a phase offset calibration scheme is proposed. The phase offset of the fine loop is estimated during the coarse lock and reflected in the coarse lock process, resulting in a smooth transition to the fine lock with a stable fast settling. The proposed digital PLL is designed by SystemVerilog modeling and Verilog-HDL and fully verified with simulations.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.5
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• pp.65-70
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• 2008

A novel fast locking dual-loop integer-N phase locked loop(PLL) with adaptive bandwidth scheme is presented. When the PLL is out-of-lock, bandwidth becomes much wider than 1/10 of channel spacing with the wide bandwidth loop. When the PLL is near in-lock, bandwidth becomes narrower than 1/10 of channel spacing with the narrow bandwidth loop. The proposed PLL is designed based on a $0.35{\mu}m$ CMOS process with a 3.3V supply voltage. Simulation results show the fast look time of $50{\mu}s$ for an 80MHz frequency jump in a 200KHz channel spacing PLL with almost 14 times wider bandwidth than the channel spacing.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.2
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• pp.46-52
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• 2014

This paper presents a multiple gain controlled digital phase and frequency detector with a fast lock-time. Lock-time of the digital PLL can be significantly reduced by applying proposed adaptive gain control technique. A loop gain of the proposed digital PLL is controlled by three conditions that are very large phase difference between reference and feedback signal, small phase difference and before lock-state, and after lock-state. The simulation result shows that lock-time of the proposed multiple gain controlled digital PLL is 100 times faster than that of the conventional structure with unit gain mode.

• Proceedings of the KIPE Conference
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• 2018.11a
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• pp.104-106
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• 2018

The harmonics and the DC offset in the grid can cause serious synchronization problems for grid connected inverters (GCIs) which leads not able to satisfy the IEEE 519 and p1547 standards in terms of phase and frequency variations. In order to guarantee the smooth and reliable synchronization of GCIs with the grid, Phase Locked Loop (PLL) is the crucial element. Typically, the performance of the PLL is assessed to limit the grid disturbances e.g. grid harmonics, DC Offset and voltage sag etc. To ensure the quality of GCI, the PLL should be precise in estimating the grid amplitude, frequency and phase. Therefore, in this paper a novel Robust PLL technique called Digital Lock-in Amplifier (DLA) PLL is proposed. The proposed PLL estimate the frequency variations and phase errors accurately even in the highly distorted grid voltage conditions like grid voltage harmonics, DC offsets and grid voltage sag. To verify the performance of proposed method, it is compared with other six conventional used PLLs (CCF PLL, SOGI PLL, SOGI LPF PLL, APF PLL, dqDSC PLL, MAF PLL). The comparison is done by simulations on MATLAB Simulink. Finally, the experimental results are verified with Single Phase GCI Prototype.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.48 no.12
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• pp.28-34
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• 2011

In this paper, a PLL frequency synthesizer for RSSI applications is designed by phase noise analysis. Required synthesizer performance is achieved by optimizing the noise performance of PLL components and a loop transfer function, since its phase noise, lock time, and spur suppression capability are determined by the performance of loop components and loop filter characteristics. As an application example, a PLL frequency synthesizer for RSSI applications, which operates at the frequency of 2.288GHz, is designed using the phase noise analysis. The validity of the design technique is proved by experiments.

• Journal of information and communication convergence engineering
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• v.10 no.2
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• pp.187-193
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• 2012

A 1 GHz CMOS fast-lock phase-locked loop (PLL) is proposed to support the quick wake-up time of mobile consumer electronic devices. The proposed fast-lock PLL consists of a conventional charge-pump PLL, a frequency-to-digital converter (FDC) to measure the frequency of the input reference clock, and a digital-to-analog converter (DAC) to generate the initial control voltage of a voltage-controlled oscillator (VCO). The initial control voltage of the VCO is driven toward a reference voltage that is determined by the frequency of the input reference clock in the initial mode. For the speedy measurement of the frequency of the reference clock, an FDC with a parallel architecture is proposed, and its architecture is similar to that of a flash analog-to-digital converter. In addition, the frequency-to-voltage converter used in the FDC is designed simply by utilizing current integrators. The circuits for the proposed fast-lock scheme are disabled in the normal operation mode except in the initial mode to reduce the power consumption. The proposed PLL was fabricated by using a 0.18-${\mu}m$ 1-poly 6-metal complementary metal-oxide semiconductor (CMOS) process with a 1.8 V supply. This PLL multiplies the frequency of the reference clock by 10 and generates the four-phase clock. The simulation results show a reduction of up to 40% in the worstcase PLL lock time over the device operating conditions. The root-mean-square (rms) jitter of the proposed PLL was measured as 2.94 ps at 1 GHz. The area and power consumption of the implemented PLL are $400{\times}450{\mu}m^2$ and 6 mW, respectively.

• ETRI Journal
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• v.35 no.2
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• pp.218-225
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• 2013

The pull-out frequency of a second-order phase lock loop (PLL) is an important parameter that quantifies the loop's ability to stay frequency locked under abrupt changes in the reference input frequency. In most cases, this must be determined numerically or approximated using asymptotic techniques, both of which require special knowledge, skills, and tools. An approximating formula is derived analytically for computing the pull-out frequency for a second-order Type II PLL that employs a sinusoidal characteristic phase detector. The pull-out frequency of such PLLs can be easily approximated to satisfactory accuracy with this formula using a modern scientific calculator.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.50 no.10
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• pp.479-485
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• 2001

In this paper, we introduce a charge pump phase-locked loop (PLL) architecture which employs a precharge phase frequency detector (PFD) and a sequential PFD to achieve a high frequency operation and a fast acquisition. Operation frequency is increased by using the precharge PFD when the phase difference is within $-{\pi}{\sim}{\pi}$ and acquisition time is shortened by using the sequential PFD and the increased charge pump current when the phase difference is larger than ${\pm}{\pi}$. So error detection range of the proposed PLL structure is not limited to $-{\pi}{\sim}{\pi}$ and a high frequency operation and a higher speed lock-up time can be achieved. The proposed PLL was designed using 1.5 ${\mu}m$ CMOS technology with 5V supply voltage to verify the lock in process. The proposed PLL shows successful acquisition for 200 MHz input frequency. On the other hand, the conventional PLL with the sequential PFD cannot operate at up to 160MHz. Moreover, the lock-up time is drastically reduced from 7.0 ${\mu}s\;to\;2.0\;{\mu}s$ only if the loop bandwidth to input frequency ratio is regulated by the divide-by-4 counter during the acquisition process. By virtue of this dual PFDs, the proposed PLL structure can improve the trade-off between acquisition behavior and locked behavior.