• 제목/요약/키워드: Paper-based test

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컴퓨터 적응형 알고리즘을 이용한 웹기반 시험 시스템 설계 및 구축 (A Design and Implementation of Web-based Test System using Computer-adaptive Test Algorithm)

  • 조성호
    • 컴퓨터교육학회논문지
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    • 제7권6호
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    • pp.69-76
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    • 2004
  • e러닝을 교육과 학습을 위하여 e비즈니스 기술 및 서비스를 사용하는 응용프로그램이다. 이는 원격지 자원과 서비스에 접근을 수월하게 함으로서 교육의 질을 높이기 위한 새로운 멀티미디어 및 인터넷 기술을 사용한다. 본 논문은 실제 TOEFL CBT에 기반을 두어 신중하게 설계되고 구현된 인터넷기반의 시험 시스템에 대하여 기술한다. 본 시스템은 콘텐츠 전달 기술, 컴퓨터 적응형 시험 알고리즘, 리뷰엔진으로 구성되어 있다. 본 논문에서는 컴퓨터기반 시험 시스템을 설계 및 구현 시 고려사항들에 대하여 서술한다.

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회로분할과 테스트 입력 벡터 제어를 이용한 저전력 Scan-based BIST 설계 (Design for Lour pouter Scan-based BIST Using Circuit Partition and Control Test Input Vectors)

  • 신택균;손윤식;정정화
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2001년도 하계종합학술대회 논문집(2)
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    • pp.125-128
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    • 2001
  • In this paper, we propose a low power Scan-based Built-ln Self Test based on circuit partitioning and pattern suppression using modified test control unit. To partition a CUT(Circuit Under Testing), the MHPA(Multilevel Hypergraph Partition Algorithm) is used. As a result of circuit partition, we can reduce the total length of test pattern, so that power consumptions are decreased in test mode. Also, proposed Scan-based BIST architecture suppresses a redundant test pattern by inserting an additional decoder in BIST control unit. A decoder detects test pattern with high fault coverage, and applies it to partitioned circuits. Experimental result on the ISCAS benchmark circuits shows the efficiency of proposed low power BIST architecture.

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Testing the Goodness of Fit of a Parametric Model via Smoothing Parameter Estimate

  • Kim, Choongrak
    • Journal of the Korean Statistical Society
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    • 제30권4호
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    • pp.645-660
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    • 2001
  • In this paper we propose a goodness-of-fit test statistic for testing the (null) parametric model versus the (alternative) nonparametric model. Most of existing nonparametric test statistics are based on the residuals which are obtained by regressing the data to a parametric model. Our test is based on the bootstrap estimator of the probability that the smoothing parameter estimator is infinite when fitting residuals to cubic smoothing spline. Power performance of this test is investigated and is compared with many other tests. Illustrative examples based on real data sets are given.

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소프트웨어 컴포넌트 기반 로봇 시스템을 위한 입출력 연관관계 기반 적응형 조합 테스팅 기법 (Input/Output Relationship Based Adaptive Combinatorial Testing for a Software Component-based Robot System)

  • 강정석;박홍성
    • 제어로봇시스템학회논문지
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    • 제21권7호
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    • pp.699-708
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    • 2015
  • In the testing of a software component-based robot system, generating test cases for the system is a time-consuming and difficult task that requires the combining of test data. This paper proposes an adaptive combinatorial testing method which is based on the input/output relationship among components and which automatically generates the test cases for the system. The proposed algorithm first generates an input/output relationship graph in order to analyze the input/output relationship of the system. It then generates the reduced set of test cases according to the analyzed type of input/output relationship. To validate the proposed algorithm some comparisons are given in terms of the time complexity and the number of test cases.

ON THE GOODNESS OF FIT TEST FOR DISCRETELY OBSERVED SAMPLE FROM DIFFUSION PROCESSES: DIVERGENCE MEASURE APPROACH

  • Lee, Sang-Yeol
    • 대한수학회지
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    • 제47권6호
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    • pp.1137-1146
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    • 2010
  • In this paper, we study the divergence based goodness of fit test for partially observed sample from diffusion processes. In order to derive the limiting distribution of the test, we study the asymptotic behavior of the residual empirical process based on the observed sample. It is shown that the residual empirical process converges weakly to a Brownian bridge and the associated phi-divergence test has a chi-square limiting null distribution.

하드웨어 고장 검출을 위한 행위레벨 설게에서의 테스트패턴 생성 (High level test generation in behavioral level design for hardware faults detection)

  • 김종현;윤성욱;박승규;김동욱
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 하계종합학술대회논문집
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    • pp.819-822
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    • 1998
  • The high complexity of digital circuits has changed the digital circuits design mehtods from schemeatic-based to hardware description languages like VHDL, verilog that make hardware faults become more hard to detect. Thus test generation to detect hardware defects is very important part of the design. But most of the test generation methods are gate-level based. In this paper new high-level test generation method to detect stuck-at-faults on gate level is described. This test generation method is independent of synthesis results and reduce the time and efforts for test generation.

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Some versatile tests based on percentile tests

  • Park, Hyo-Il;Kim, Ju-Sung
    • Journal of the Korean Data and Information Science Society
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    • 제21권2호
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    • pp.291-296
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    • 2010
  • In this paper, we consider a versatile test based on percentile tests. The versatile test may be useful when the underlying distributions are unknown or quite different types. We consider two kinds of combining functions for the percentile statistics, the quadratic and summing forms and obtain the limiting distributions under the null hypothesis. Then we illustrate our procedure with an example. Finally we discuss some interesting features of the test as concluding remarks.

A Dissimilarity with Dice-Jaro-Winkler Test Case Prioritization Approach for Model-Based Testing in Software Product Line

  • Sulaiman, R. Aduni;Jawawi, Dayang N.A.;Halim, Shahliza Abdul
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • 제15권3호
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    • pp.932-951
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    • 2021
  • The effectiveness of testing in Model-based Testing (MBT) for Software Product Line (SPL) can be achieved by considering fault detection in test case. The lack of fault consideration caused test case in test suite to be listed randomly. Test Case Prioritization (TCP) is one of regression techniques that is adaptively capable to detect faults as early as possible by reordering test cases based on fault detection rate. However, there is a lack of studies that measured faults in MBT for SPL. This paper proposes a Test Case Prioritization (TCP) approach based on dissimilarity and string based distance called Last Minimal for Local Maximal Distance (LM-LMD) with Dice-Jaro-Winkler Dissimilarity. LM-LMD with Dice-Jaro-Winkler Dissimilarity adopts Local Maximum Distance as the prioritization algorithm and Dice-Jaro-Winkler similarity measure to evaluate distance among test cases. This work is based on the test case generated from statechart in Software Product Line (SPL) domain context. Our results are promising as LM-LMD with Dice-Jaro-Winkler Dissimilarity outperformed the original Local Maximum Distance, Global Maximum Distance and Enhanced All-yes Configuration algorithm in terms of Average Fault Detection Rate (APFD) and average prioritization time.

Nonparametric Test for Money and Income Causality

  • Jeong, Ki-Ho
    • Journal of the Korean Data and Information Science Society
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    • 제15권2호
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    • pp.485-493
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    • 2004
  • This paper considers the test of money and income causality. Jeong (1991, 2003) developed a nonparametric causality test based on the kernel estimation method. We apply the nonparametric test to USA data of money and income. We also compare the test results with ones of the conventional parametric test.

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Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs

  • Ansari, M. Adil;Kim, Dooyoung;Jung, Jihun;Park, Sungju
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제15권1호
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    • pp.85-95
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    • 2015
  • Network-on-chip (NoC) has evolved to overcome the issues of traditional bus-based on-chip interconnect. In NoC-reuse as TAM, the test schedulers are constrained with the topological position of cores and test access points, which may negatively affect the test time. This paper presents a scalable hybrid test data transportation scheme that allows to simultaneously test multiple heterogeneous cores of NoC-based SoCs, while reusing NoC as TAM. In the proposed test scheme, single test stimuli set of multiple CUTs is embedded into each flit of the test stimuli packets and those packets are multicast to the targeted CUTs. However, the test response packets of each CUT are unicast towards the tester. To reduce network load, a flit is filled with maximum possible test response sets before unicasting towards the tester. With the aid of Verilog and analytical simulations, the proposed scheme is proved effective and the results are compared with some recent techniques.