• Title/Summary/Keyword: PCB Substrate

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A Design of the Multiband Small Chip Antenna Using the Branch Structure and Gap Feeding for Mobile Phone (가지 구조와 간극 급전을 사용한 휴대 단말기용 소형 유전체 다중 대역 칩 안테나)

  • Kim, Min-Chan;Kim, Hyung-Hoon;Park, Jong-Il;Kim, Hyeong-Dong
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.18 no.3 s.118
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    • pp.298-304
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    • 2007
  • In this paper, the antenna which has a multiband operation (GSM850, EGSM, DCS1800, USPCS, W-CDMA) is proposed. This antenna was designed by the commercial software HFSS 3-D EM simulator, and it is organized by using a meander branch structure which has a via and lines on FR-4$(\varepsilon_r=4.4)$ substrate. Especially, it has a gap feeding structure which makes good operation at overall bandwidth. The designed antenna is manufactured by PCB processing, and measured by using a network analyzer and a test chamber. The manufactured antenna with the dimension of 8 mm width, 20 mm height and 3.2 mm thickness is able to applied as an internal antenna for multiband mobile phones.

Influence of Bath Temperature on Electroless Ni-B Film Deposition on PCB for High Power LED Packaging

  • Samuel, Tweneboah-Koduah;Jo, Yang-Rae;Yoon, Jae-Sik;Lee, Youn-Seoung;Kim, Hyung-Chul;Rha, Sa-Kyun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.323-323
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    • 2013
  • High power light-emitting diodes (LEDs) are widely used in many device applications due to its ability to operate at high power and produce high luminance. However, releasing the heat accumulated in the device during operating time is a serious problem that needs to be resolved to ensure high optical efficiency. Ceramic or Aluminium base metal printed circuit boards are generally used as integral parts of communication and power devices due to its outstanding thermal dissipation capabilities as heat sink or heat spreader. We investigated the characterisation of electroless plating of Ni-B film according to plating bath temperature, ranging from $50^{\circ}C$ to $75^{\circ}C$ on Ag paste/anodised Al ($Al_2O_3$)/Al substrate to be used in metal PCB for high power LED packing systems. X-ray diffraction (XRD), Field-Emission Scanning Electron Microscopy (FE-SEM) and X-ray Photoelectron Spectroscopy (XPS) were used in the film analysis. By XRD result, the structure of the as deposited Ni-B film was amorphous irrespective of bath temperature. The activation energy of electroless Ni-B plating was 59.78 kJ/mol at the temperature region of $50{\sim}75^{\circ}C$. In addition, the Ni-B film grew selectively on the patterned Ag paste surface.

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A Numerical Study on the Effect of Initial Shape on Inelastic Deformation of Solder Balls under Various Mechanical Loading Conditions (다양한 기계적 하중조건에서 초기 형상이 솔더볼의 비탄성 변형에 미치는 영향에 관한 수치적 연구)

  • Da-Hun Lee;Jae-Hyuk Lim;Eun-Ho Lee
    • Journal of the Microelectronics and Packaging Society
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    • v.30 no.4
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    • pp.50-60
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    • 2023
  • Ball Grid Array (BGA) is a widely used package type due to its high pin density and good heat dissipation. In BGA, solder balls play an important role in electrically connecting the package to the PCB. Therefore, understanding the inelastic deformation of solder balls under various mechanical loads is essential for the robust design of semiconductor packages. In this study, the geometrical effect on the inelastic deformation and fracture of solder balls were analyzed by finite element analysis. The results showed that fracture occurred in both tilted and hourglass shapes under shear loading, and no fracture occurred in all cases under compressive loading. However, when bending was applied, only the tilted shape failed. When shear and bending loads were combined with compression, the stress triaxiality was maintained at a value less than zero and failure was suppressed. Furthermore, a comparison using the Lagrangian-Green strain tensor of the critical element showed that even under the same loading conditions, there was a significant difference in deformation depending on the shape of the solder ball.

Observation of Dynamic Movement of Probing Pin on PCB Pad Using Electrical Reliability Test (인쇄회로 기판의 전기검사에서의 미세 탐침과 패드의 동적 거동 현상 관측)

  • Song, Seongmin;Cha, Gangil;Kim, Myungkyu;Jeon, Seungho;Yu, SangSeok
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.39 no.3
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    • pp.245-251
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    • 2015
  • In an electrical reliability test of a printed circuit board (PCB), the impact of the micro probing pins on the PCB needs to be checked to ascertain the quality of the circuit. In this study, the impact of the dynamic movement of the probing pin on the pad was observed. As a misaligned pin can exert horizontal force on the pad of the PCB, this study focused on the behavior of a misaligned probing pin. The parameters of observation were the circular and flat edges of the probing pin. The effects of the speed of movement, diameter, and the length of projection of the probing pin were also investigated. The results demonstrated that slippage angle is strongly affected by the shape of the edge of the probing pin, and that projection length is an important factor affecting pin slippage. In contrast, the speed of movement of the probing pin was able to double the slippage angle.

Unidirectional Sintering in LTCC Substrate (LTCC 기판의 일 방향 소결)

  • Sun Yong-Bin;Ahn Ju-Hwan;Kim Seuk-Buom
    • Journal of the Microelectronics and Packaging Society
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    • v.11 no.4 s.33
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    • pp.37-41
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    • 2004
  • As mobile communication devices use wide bands for large data transmission, Low Temperature Co-fired Ceramic(LTCC) has been a candidate for module substrate, for it provides better electrical properties and enables various embedded passive devices compared to conventional PCB. The LTCC, however, has applied in limited area because of non-uniform shrinkage. Hybrid heating was developed to raise sample temperature uniformly in a short period of time This leads to unidirectional sintering which enables sample to be sintered layer by layer from the bottom, resulting in more stable shape of interconnection at the top surface of the sample than conventional electric furnace heating. When sintering properties of substrate and electrical/mechanical properties of interconnection were compared, hybrid heating showed possibility to be applicable to substrate miniaturization and interconnection densification superior to electric furnace heating.

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RFID Tag Antenna on Si Substrate by Thin-film Deposition Process (박막 증착공정으로 Si 기판위에 구현된 RFID 태그 안테나)

  • Jung, Tae-Hwan;Kim, Jung-Yeon;Park, Seong-Beom;Lee, Seok-Jin;Ahn, Sang-Ki;Woo, Deok-Hyun;Kwon, Soon-Yong;Lim, Dong-Gun;Park, Jae-Hwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.04b
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    • pp.55-56
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    • 2009
  • Small RFID tag antenna were fabricated on Si substrate and their physical and electrical properties were evaluated. With decreasing the size of tag antenna on Si substrate, small SMD-type RFID tags could be fabricated, which is very useful for PCB tracking. Firstly, tag antenna pattern and the electromagnetic properties were simulated with HFSS. The frequency was 13.56MHz, the line-width and line-gap were modeled in the range of $50{\sim}200{\mu}m$. S parameters, SRF, and Q value were calculated from geometry. When the line-width and line-gap were 100um and the loop-turn was 10, the SRF was 80MHZ and the Q value was ca. 9. When the microstrip antenna pattern of aluminum was fabricated by using DC sputtering, Vpp of ca. 1.6V was obtained when the reader-tag distance was 40mm.

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Analysis of Symmetric and Asymmetric Multiple Coupled Line on the Multi-layer Substrate (다층 기판위의 대칭 및 비대칭의 다중 결합선로에 대한 해석)

  • Kim, Yoonsuk;Kim, Minsu
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.3
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    • pp.16-22
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    • 2013
  • A general characterization procedure based on the extraction of a 2n-port admittance matrix corresponding to n uniform coupled lines on the multi-layered substrate using the Finite-Difference Time-Domain (FDTD) technique is presented. In this paper, the frequency-dependent normal mode parameters are obtained from the 2n-port admittance matrix to analyze multi-layered asymmetric coupled line structure, which in turn provides the frequency-dependent propagation constant, effective dielectric constant, and line-mode characteristic impedances. To illustrate the technique, several practical coupled line structures on multi-layered substrate have been simulated. Especially, embedded conductor structures have been simulated. Comparisons with Spectral Domain Method are given, and their results agree well. It is shown that the FDTD based time domain characterization procedure is an excellent broadband simulation tool for the design of multiconductor coupled lines on multilayered PCBs as well as thick or thin hybrid structures.

Formation of Metal Electrode on Si3N4 Substrate by Electrochemical Technique (전기화학 공정을 이용한 질화규소 기판 상의 금속 전극 형성에 관한 연구)

  • Shin, Sung-Chul;Kim, Ji-Won;Kwon, Se-Hun;Lim, Jae-Hong
    • Journal of the Korean institute of surface engineering
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    • v.49 no.6
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    • pp.530-538
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    • 2016
  • There is a close relationship between the performance and the heat generation of the electronic device. Heat generation causes a significant degradation of the durability and/or efficiency of the device. It is necessary to have an effective method to release the generated heat. Based on demands of the printed circuit board (PCB) manufacturing, it is necessary to develop a robust and reliable plating technique for substrates with high thermal conductivity, such as alumina ($Al_2O_3$), aluminium nitride (AlN), and silicon nitride ($Si_3N_4$). In this study, the plating of metal layers on an insulating silicon nitride ($Si_3N_4$) ceramic substrate was developed. We formed a Pd-$TiO_2$ adhesion layer and used APTES(3-Aminopropyltriethoxysilane) to form OH groups on the surface and adhere the metal layer on the insulating $Si_3N_4$ substrate. We used an electroless Ni plating without sensitization/activation process, as Pd particles were nucleated on the $TiO_2$ layer. The electrical resistivity of Ni and Cu layers is $7.27{\times}10^{-5}$ and $1.32{\times}10^{-6}ohm-cm$ by 4 point prober, respectively. The adhesion strength is 2.506 N by scratch test.

Design of an extremely miniaturized planar ring hybrid

  • Kang, In Ho;Sun, Shu Zhong
    • Journal of Advanced Marine Engineering and Technology
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    • v.37 no.7
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    • pp.752-759
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    • 2013
  • This paper presents a method for analyzing and designing an extremely miniaturized planar ring hybrid, using the combination of parallel and diagonally shorted coupled lines. In contrast to conventional miniaturized coupled line filters, it is proven that the required electrical length of transmission line can be largely reduced to even a few degrees, not only effectively suppressing the spurious passband but also approximately maintaining the same characteristic around the stable center frequency. A ring hybrid filter at center frequency of 1 GHz was fabricated on the FR4 epoxy glass cloth copper-clad plat (CCL) PCB substrate. The insertion loss of a ring hybrid filter with the die area of $30mm{\times}30mm$ is -4.68 dB. Simulated results are well agreed with the measurements.

Board level joint reliability of differently finished PWB pad (PCB Pad finish 방법에 따른 solder의 Board level joint reliability)

  • Lee W. J.;Moon H. J.;Kim Y. H.
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2004.02a
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    • pp.37-59
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    • 2004
  • In the case of Ni/Au finished pad on the package side, the solder joint of SnAgCu system can bring brittle fracture under impact load such as drop test. Therefore, it's difficult to prevent the brittle fracture of lead-free solder, by controlling Cu content. The failure locus existing on the interface between $(Ni,Cu)_3Sn_4\;and\;(Cu,Ni)_6Sn_5$ IMC layers must be changed to other site in order to avoid brittle fracture due to impact load. It was not found any clear evidence that there were two IMC layers exist. But it was strongly assumed these were two layers which have different Cu-Ni composition. From the above analysis it was assumed that Cu atom in the solder alloy or substrate seemed to affect IMC composition and cause to IMC brittle fracture.

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