• Journal of Korean Institute of Industrial Engineers
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• v.33 no.2
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• pp.273-281
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• 2007

The decision of how long performing system burn-in must be answered with a probabilistic model of a system lifetime at which infant mortality failures created during assembly processes are quantified. In this paper, we propose such a model which is modified from previous results. Using the system model, we derived system reliability in terms of component and system burn-in times for the two cases of minimal repair at system failure and of component replacement and connection repair at their failure times. The procedure is illustrated with a bridge system and the optimal system burn-in times are obtained for maximizing system reliability. The result suggests that an assumption of minimal repair at system failure may underestimate the optimal burn-in time in practice.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.35 no.4
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• pp.1-9
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• 2012

Decisions on reliability screening rules and burn-in policies are determined based on the estimated reliability. The variability in a semiconductor manufacturing process does not only causes quality problems but it also makes reliability estimation more complicated. This study investigates the nonuniformity characteristics of integrated circuit reliability according to defect density distribution within a wafer and between wafers then develops optimal burn-in policy based on the estimated reliability. New reliability estimation model based on yield information is developed using a spatial stochastic process. Spatial defect density variation is reflected in the reliability estimation, and the defect densities of each die location are considered as input variables of the burn-in optimization. Reliability screening and optimal burn-in policy subject to the burn-in cost minimization is examined, and numerical experiments are conducted.

• Communications for Statistical Applications and Methods
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• v.12 no.1
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• pp.1-9
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• 2005

Burn-in is an engineering method which is used to eliminate early failures of products or systems after they have been produced. Recently, various models for determining optimal burn-in times have been developed, where some preventive maintenance policies were considered together with burn-in problem. In this paper, a survey of recent research in burn-in is undertaken.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.19 no.40
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• pp.99-105
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• 1996

최적 Burn-In 방법은 신뢰성이나 평균수명을 극대화하고 위험율과 Cost를 극소화 하는 것이다. 기존의 연구는 하나의 목적을 대상으로 Burn-In 방법에 대하여 연구하였으나 상호 상충되는 목표에 대해 의사 결정을 하는 복잡하고 어려운 상황을 고려하여야 한다. 그러므로 둘 이상의 목표에 대한 최적의 Burn-In 방법에 대하여 연구되어야 한다. 본 논문에서는 이를 위해 Surrogate Worth Trade Off 기법을 사용하여 실제 최적의 Burn-In 방법을 구하고자 하는 경우에 대하여 연구하였다.

• Journal of the Korean Data and Information Science Society
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• v.14 no.4
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• pp.997-1005
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• 2003

In this paper, the problem of determining optimal burn-in time is considered under a general failure model. There are two types of failure in the general failure model. One is Type I failure (minor failure) which can be removed by a minimal repair and the other is Type II failure (catastrophic failure) which can be removed only by a complete repair. In this model, when the unit fails at its age t, Type I failure occurs with probability 1 - p(t) and Type II failure occurs with probability p(t), $0{\leq}p(t)\leq1$. Under the model, the properties of optimal burn-in time maximizing mean time to the catastrophic failure during field operation are obtained. The obtained results are also applied to some illustrative examples.

• Journal of Korean Society for Quality Management
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• v.21 no.2
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• pp.102-108
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• 1993

The purpose of burn-in is to eliminate the early failures of the products before they are delivered for customer use. Therefore burn-in should he continued until one is reasonally sure that all the weak items have failed, thus leaving the remaining items in a healthy state of reliability. From this point of view, burn-in time dependent costs such as a cost per product per burn-in time, and cost of repair of the product per failure occurred during burn-in time will he increased. Conversely, the cost of field repair of the product per failure occurred during the guarantee period will be decreased since the early failure of the product is fully eliminated during burn-in. Hence, this paper intend to determine optimal burn-in time which minimize the total of above costs associated with burn-in.

• Journal of the Korean Society of Propulsion Engineers
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• v.18 no.3
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• pp.40-47
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• 2014

The grain burn-back analysis has been performed for the internal ballistics analysis code to be used for the optimal design of the space launch vehicles. The grain burn-back has been used to calculate the burning surface that is essential to the internal ballistics. The calculation of internal ballistics code used in the optimal design is repeated until satisfying the required performance through the change of the design parameter. Therefore, the burn-back method applied to the internal ballistics analysis should be easy to change the design parameter and calculation time should be short. In this study, a burn-back analysis code has been developed using the analysis method. Also, geometric parameters of the grain have been selected and organized. The developed code has been verified by comparison of results of a numerical method.

• Proceedings of the Safety Management and Science Conference
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• 2001.05a
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• pp.77-81
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• 2001

Burn-in is a test procedure to find and eliminate the inherent initial failure of a product during or at the final stage of production process. Software testing is the validation and verification process which is used to cut off the faults from a software. The two have the common function and objective of "debugging". This article summarizes some significant models on the optimal hardware and software burn-in time, and provides the relevant paper lists. The need for the development of the unified burn-in policy of a hardware-software system is addressed.addressed.

• Journal of the Korean Statistical Society
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• v.28 no.4
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• pp.399-413
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• 1999

• IE interfaces
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• v.20 no.1
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• pp.87-93
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• 2007

Burn-in is an engineering method for screening out products containing reliability defects which would cause early failures in field operation. Previously, various burn-in models have been proposed mainly focused on the trade-off of shop repair cost and warranty cost ignoring manufacturing yield. From the view point of a manufacturer, however, burn-in decreases warranty cost at the expense of yield reduction. In this paper, we provide a general model quantifying a trade-off between product yield and reliability, in which any defect distribution from previous yield models can be used. A profit function is expressed in burn-in environments for determining an optimal burn-in time. Finally, the method is illustrated with gate oxide failures which is an important reliability concerns for VLSI CMOS circuits.