• Korean Journal of Materials Research
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• v.29 no.6
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• pp.356-362
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• 2019

$BaSiO_3:RE^{3+}$ (RE = Sm or Eu) phosphor powders with different concentrations of activator ions are synthesized using the solid-state reaction method. The effects of the concentration of activator ions on the structural, photoluminescent, and morphological properties of the barium silicate phosphors are investigated. X-ray diffraction data reveals that the crystal structure of all the phosphors, regardless of the type and the concentration of the activator ions, is an orthorhombic system with a main (111) diffraction peak. The grain particles agglomerate together to form larger clusters with increasing concentrations of activator ions. The emission spectra of the $Sm^{3+}$-doped $BaSiO_3$ phosphors under excitation at 406 nm consist of an intense orange band at 604 nm and three weak bands centered at 567, 651, and 711 nm, respectively. As the concentration of $Sm^{3+}$ increases from 1 to 5 mol%, the intensities of all the emission bands gradually increase, reach maxima at 5 mol% of $Sm^{3+}$ ions, and then decrease significantly with further increases in the $Sm^{3+}$ concentration due to the concentration quenching phenomenon. For the $Eu^{3+}$-doped $BaSiO_3$ phosphors, a strong red emission band at 621 nm and several weak bands are observed. The optimal orange and red light emissions of the $BaSiO_3$ phosphors are obtained when the concentrations of $Sm^{3+}$ and $Eu^{3+}$ ions are 5 mol% and 15 mol%, respectively.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.175-175
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• 2010

Transparent conducting oxide (TCO) films are widely used as transparent conducting thin film material for application in various fields such as solar cells, optoelectronic devices, heat mirrors and gas sensors, etc. Recently the increased utilization of many transparent electrodes has accelerated the development of inexpensive TCO materials. Indium tin oxide (ITO) film is well-known for TCO materials because of its low resistivity, but there is disadvantage that it is too expensive. ZnO film is cheaper than ITO but it shows thermally poor stability. On the contrary, antimony-doped tin oxide films (ATO) are more stable than TCO films such as Al-doped zinc oxide (AZO) and ITO. Moreover, SnO2 film shows the best thermal and chemical stability, low cost and mechanical durability except the poor conductivity. However, annealing is proved to improve the conductivity of ATO film. Therefore, in this work, antimony (6 wt%) doped tin oxide films to improve the conductivity were deposited on 7059 corning glass by RF magnetron sputtering method for the application to transparent electrodes. In general, of all TCO films, glass is the most commonly selected substrate. However, for future development in flexible devices, glass is limited by its intrinsic inflexibility. In this study, we report the growth and properties of antimony doped tin oxide (ATO) films deposited on PES flexible substrate by using RF magnetron sputtering. The optimization process was performed varying the sputtering parameters, such as RF power and working pressure, and parameter effect on the structural, electrical and optical properties of the ATO films were investigated.

• Proceedings of the Materials Research Society of Korea Conference
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• 2009.11a
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• pp.50.2-50.2
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• 2009

ZnO 는 상온에서 3.37eV의 넓은 밴드갭과 60 meV의 엑시톤 결합에너지를 가지는 직접형 반도체로서 높은 투과성, 저가의 재료비, 비독성, 친환경적인 재료로서 발광다이오드, 디스플레이 응용분야 등 많은 부분에서 관심을 받고 있다. 유리 기판은무겁고 쉽게 깨지는 특성에도 불구하고 디스플레이 응용분야에서 폭넓게 사용되고 있으나 많은 연구자들은 이러한 문제점들을 해결하기 위해 플렉서블 기판위에서의 ZnO 성장 연구를 진행하고 있다 ZnO를 성장시키는 방법에는 molecular beam epitaxy (MEB), chemical vapordeposition (CVD), 그리고 atomic layer deposition (ALD)등많은 방법들이 있다. 이 연구에서 우리는 플렉서블기판의 플라즈마 전처리에 따른 ZnO의 구조적 그리고 광학적 특성에 대해 연구하였다. ZnO는 ALD 방법에 의해 성장되었고 반응물로는 temperature controlled bath 속에서 $10^{\circ}C$와 $30^{\circ}C$로 각각 온도를 유지시킨 diethylzinc (DEZn)과 distilled water ($H_2O$)를 사용하였다. 성장된 ZnO의 표면 morphology는atomic force microscope (AFM) 과 scanning electron microscope (SEM)으로 측정하였고, 광학적, 구조적특성은 Photoluminescence (PL)와 X-ray diffraction (XRD) 방법으로 각각으로 측정 되었다.

• 한국신재생에너지학회:학술대회논문집
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• 2009.11a
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• pp.398-398
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• 2009

텐덤 구조의 양자점 태양전지에서 양자점의 크기에 따라 에너지 밴드갭이 달라 넓은 대역의 태양광을 이용할 수 있다. 이러한 양자점의 크기는 증착 두께의 제어로 조절이 가능하다. Si과 C target을 이용한 RF Co-sputtering 법으로 각각 증착시간을 다르게 하여, SiC/$Si_{1-x}C_x$(x~0.20)인 실리콘 양자점 초격자 박막을 제조하고, $1000^{\circ}C$에서 20분간 질소 분위기에서 열처리를 하였다. Grazing incident X-ray diffraction(GIXRD)를 통해서 Si(111)과 $\beta$-SiC (111)이 생성되었음을 확인하였고, High resolution transmission electron microscopy(HRTEM) 사진으로 양자점의 크기와 분포 밀도를 확인할 수 있었다. Photoluminescence(PL)에서 1.4, 1.5, 1.7, 1.9eV의 Peak이 확인되었다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2012.05a
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• pp.241-242
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• 2012

산화아연 씨앗층을 졸-겔 스핀코팅법으로 석영기판위에 증착시킨 후, 수열합성법을 이용하여 갈륨의 양을 0에서 2.0 at.% 으로 변화를 주어 갈륨이 도핑된 산화아연 나노막대를 성장하였다. 산화아연과 갈륨이 도핑된 산화아연 나노막대의 구조적 광학적 특성을 조사하기 위해 field-emission scanning electron microscopy, X-ray diffraction (XRD), photoluminescence (PL), 그리고 ultraviolet-visible spectroscopy를 이용하였다. 일정한 산화아연과 갈륨이 도핑된 산화아연 나노막대는 육각형형태로 성장하였다. XRD 데이터로부터, 산화아연과 갈륨이 도핑된 산화아연 나노막대의 스트레스는 각각 -0.022 (0 at.%), 0.097 (0.5 at.%), 0.165 (1.0 at.%), 0.177 (1.5 at.%), 0.182 GPa (2.0 at.%) 였다. PL 스펙트라에서 얻어진 반가폭(The full width at half maximum)은 갈륨의 양이 0에서 2.0 at.%로 증가함에 따라 127에서 171 meV로 증가하였다. Urbach 에너지는 68 (0 at.%), 97 (0.5 at.%), 108 (1.0 at.%), 104 (1.5 at.%), 127 meV (2.0 at.%)였다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2012.05a
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• pp.243-244
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• 2012

산화아연 나노구조를 금을 금속촉매로 사용하여 실리콘 기판위에 기상이동법으로 성장하였다. 성장할 때 소스(source)와 기판 사이의 거리는 5에서 50 mm로 변화를 주며 아르곤과 산소 분위기에서 $900^{\circ}C$로 성장하였다. 산화아연 나노구조의 구조적 및 광학적 특성을 조사하기 위해 field-emission scanning electron microscopy, X-ray diffraction (XRD), 그리고 photoluminescence (PL)를 이용하였다. 산화아연 나노구조는 나노선과 나노입자의 형태로 성장하였다. 산화아연 나노구조의 광학적 특성은 소스와 기판사이의 거리가 가까울수록 향상되었다. 특히, 소스와 기판사이의 거리가 5 mm 일 때, 산화아연 나노선이 관찰되었으며 XRD 와 PL 분석에서 나타난 반가폭 (full width at half maximum)은 $0.061^{\circ}$ 와 96 meV로써 가장 작았다. 산화아연 나노선은 산화아연 나노입자와 비교하여, 결정성 및 광학적 특성이 우수하였다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2012.05a
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• pp.245-246
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• 2012

Al 농도를 0 부터 2 at.% 까지 조절하여 도핑된 $Cd_{0.5}Zn_{0.5}O$ 박막을 석영 기판 위에 성장하였다. Al 도핑된 $Cd_{0.5}Zn_{0.5}O$ 박막의 구조적, 광학적 특성을 조사하기 위해 field-emission scanning electron microscopy, X-ray diffraction (XRD), photoluminescence (PL), 그리고 ultraviolet-visible (UV) spectroscopy을 사용하였다. 광학적 밴드갭은 Al 도핑 농도가 증가함에 따라 2.874 (0 at.%), 2.874 (0.5 at.%), 3.029 (1.0 at.%), 3.038 (1.5 at.%), 3.081 eV (2.0 at.%)로 증가하였다. Urbach energy는 도핑 농도에 따라 각각 464 (0 at.%), 585 (0.5 at.%), 571 (1.0 at.%), 600 (1.5 at.%), 470 meV (2.0 at.%)이었다. 또한, Al 농도가 증가함에 따라 $Cd_{0.5}Zn_{0.5}O$ 박막의 표면, 구조적 및 광학적 특성이 크게 변화되었다.

• 한국신재생에너지학회:학술대회논문집
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• 2011.11a
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• pp.47.1-47.1
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• 2011

We report on a direct measurement of two-dimensional chemical and electrical distribution on the surface of photovoltaic Cu(In,Ga)$Se_2$ thin-films using a nano-scale spectroscopic and electrical characterization, respectively. The Raman measurement reveals non-uniformed surface phonon vibration which comes from different compositional distribution and defects in the nature of polycrystalline thin-films. On the other hand, potential analysis by scanning Kelvin probe force microscopy shows a higher surface potential or a small work function on grain boundaries of the thin-films than on the grain surfaces. This demonstrates the grain boundary is positively charged and local built-in potential exist on grain boundary, which improve electron-hole separation on grain boundary. Local electrical transport measurements with scanning probe microscopy on the thin-films indicates that as external bias is increases, local current is started to flow from grain boundary and saturated over 0.3 V external bias. This accounts for carrier behavior in the vicinity of grain boundary with regard to defect states. We suggest that electron-hole separation at the grain boundary as well as chemical and electrical distribution of polycrystalline Cu(In,Ga)$Se_2$ thin-films.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.23 no.8
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• pp.581-586
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• 2010

The porous Si (PS) was annealed at various temperature in air, argon, and nitrogen atmosphere. Structural and optical properties of the annealed PS were investigated by scanning electron microscopy (SEM) and photoluminescence (PL). It is found that the shape of pore is changed from circle to channel as increasing annealing temperature which was annealed in air and argon atmosphere. In case of PS annealed in nitrogen atmosphere, the shape of pore is changed from channel to circle with increase annealing temperature from 600 to $800^{\circ}C$. The PL peak position is blue-shifted with increasing annealing temperature. As annealing temperature increases, the PL intensity of the PS annealed in argon is decreased but that of the PS annealed in nitrogen is increased. It might be due to the formation of Si-N bonds and it passivates the non-radiative centers which is Si dangling bonds on the surface of the PS.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.355-356
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• 2008

In this work, ZnO films doped with different contents of Indium (0.1at.%, 0.3at.%, 0.6at.%, respectively) were deposited on Si (111) substrate that has 1~20 $\Omega$cm by pulsed laser deposition (PLD) at $600^{\circ}C$ for 30min. The thickness of the films are about 250 nm. The structural, optical and electrical properties of the films were investigated using X-ray Diffraction (XRD), Atomic force microscope (AFM), Photoluminescence (PL) and Hall measurement. It has been found that RMS of the films is decreased and grain size is increased with increasing the contents of doped Indium. The results of the Photoluminescence properties were indicated that the films have UV emission about 380nm and shows a little red shitf with increasing contents of doped indium. The result of the Hall measurement shows that the concentration and resisitivity in doped ZnO are as changing as one order, respectively ${\sim}10^{18}/cm^2$, ${\sim}10^{-2}cm{\Omega}cm$.