• Journal of the Optical Society of Korea
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• v.15 no.3
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• pp.244-251
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• 2011

We propose a new 2-step phase-shifting digital holographic optical encryption technique and analyze tolerance error for this cipher system. 2-step phase-shifting digital holograms are acquired by moving the PZT mirror with phase step of 0 or ${\pi}$/2 in the reference beam path of the Mach-Zehnder type interferometer. Digital hologram with the encrypted information is Fourier transform hologram and is recorded on CCD camera with 256 gray-level quantized intensities. The decryption performance of binary bit data and image data is analyzed by considering error factors. One of the most important errors is quantization error in detecting the digital hologram intensity on CCD. The more the number of quantization error pixels and the variation of gray-level increase, the more the number of error bits increases for decryption. Computer experiments show the results to be carried out encryption and decryption with the proposed method and the graph to analyze the tolerance of the quantization error in the system.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.7
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• pp.109-116
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• 1998

In this work was produced and analyzed a z-cut Ti:LiNbO$_{3}$ optical waveguide which applies for various optical devices.A waveguide channel with a thickness 8 .mu.m and a length 66,000.mu.m and a mach-zehnder interferometer type waveguide were fabricated at a diffusion temperature 1050.deg. C for 6-8hours in a wet $O_{2}$ environment. The resulting Ti:LiNbO$_{3}$ optical waveguide was measured to have a Ti-strip thickness of 950.angs. and low loss. Surfaces and cross-sections of a fabricated waveguide were analysed. The mode pattern anaysis revealed that the waveguide showed a single mode at a 1550nm wavelength. The effective dimension of the waveguide was calculated by measuring a gaussian profile; Wx=10.95.mu. and Wy=9.14.mu.m. a propagation loss, of 0.50dB/cm for a TM mode and 0.45dB/cm for a TE mode, was low enough to be accepatable for optical devices.

• Current Optics and Photonics
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• v.1 no.6
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• pp.631-636
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• 2017

We firstly develop a straightforward method to generate full $Poincar{\acute{e}}$ beams with any polarization geometry over an arbitrary order $Poincar{\acute{e}}$ sphere. We implement this by coaxial superposition of two orthogonal circular polarized beams with alternative topological charges with the help of a Mach-Zehnder interferometer. Secondly we find the existence of singularity points. And the inner relationship between their characteristics and the order of $Poincar{\acute{e}}$ spheres is also studied. In summary, this work provides a convenient and effective way to generate vector beams and to control their polarization states.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.10a
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• pp.474-480
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• 2002

Aspheric optical lenses and mirrors are widely used in recent. It is more difficult to manufacture and measure the aspherical optics compared to conventional spherical ones. The interferometric optical test is common for the measurement of spherical optical surface. But the application of the interferometry to the measurement of aspheric surface is difficult because it needs a precise null corrector and very careful environmental conditions such as keeping constant temperature, humidity, atmospheric pressure and vibrations. To enhance productivity of optics manufacturing on-machine measurement and correction has been developed in this study. For practical applications, robustness of the measurement method to environments is more important. For the purpose an optical OMM(On-Machine Measurement) system has been developed using Shack-Hartmann test which has robustness to the environment. The wavefront has been reconstructed from the measured data using the primary aberration polynomial function by least square fitting. The measured result of the developed only system gives the maximum deviation only in 200 nm from the result measured by a commercial Fizeau interferometer Wyko 6000.

• Korean Journal of Optics and Photonics
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• v.17 no.4
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• pp.335-341
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• 2006

A modified Michelson interferometer type digital holography microscopy system is developed. There is a problem about recording and numerical reconstruction area at the microscopy application of Michelson type interferometer structure in the digital holography field. In this paper, to overcome this problem, we developed a new reflection type digital holography microscope system and increased recording and numerical reconstruction area of target object.

• Journal of the Korean Society for Precision Engineering
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• v.22 no.9 s.174
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• pp.69-76
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• 2005

The laser interferometer system such as HP5529A is one of the most powerful equipment fur measurement of the straightness error in precision stages. The straightness measurement system, HP5529A is composed of a Wollaston prism and a reflector. In this system, the straightness error is defined as relative lateral motion change between the prism and the reflector and computed from optical path difference of two polarized laser beams between these optics. However, rotating motion of the prism or the reflector used as a moving optic causes unwanted straightness error. In this paper, a compensation method is proposed for removing the unwanted straightness error generated by rotating the moving optic and an experiment is carried out for theoretical verification. The result shows that the unwanted straightness error becomes very large when the reflector is used as the moving optic and the distance between the reflector and the prism is far. Therefore, the prism must be generally used as the moving optic instead of the reflector so as to reduce the measurement error. Nevertheless, the measurement error must be compensated because it's not a negligible error if a rotating angle of the prism is large. In case the reflector must be used as the moving optic, which is unavoidable when the squareness error is measured between two axes, this compensation method can be applied and produces a better result.

• Korean Journal of Optics and Photonics
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• v.15 no.1
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• pp.56-62
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• 2004

We present a diffraction grating interferometer of large equivalent wavelength specially designed for flatness testing of rough surfaces. Two transmission diffraction gratings are illuminated on the object under test by use of two measurement beams with different angles of incidence, which yields a large equivalent wavelength. This interferometer design minimizes unnecessary diffraction rays and the systematic error caused by the diffraction gratings, and provides a large working distance and easy alignment. To improve the measurement accuracy, phase shifting technique is applied and the equivalent wavelength error caused by defocus is calibrated. Test results obtained from mirror surfaces and machined rough surfaces are discussed.

• Journal of the Korean Society for Precision Engineering
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• v.30 no.7
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• pp.702-708
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• 2013

The white-light scanning interferometer (WSI) is an effective optical measurement system for high-precision industries (e.g., flat-panel display and electronics packaging manufacturers) and semiconductor manufacturing industries. Its major disadvantages include a slow image-capturing speed for interferogram acquisition and a high computational cost for peak-detection on the acquired interferogram. Here, a WSI system is proposed for the semiconductor inspection process. The new imaging acquisition technique uses an 'on-the-fly' imaging system. During the vertical scanning motion of the WSI, interference fringe images are sequentially acquired at a series of pre-defined lens positions, without conventional stepwise motions. To reduce the calculation time, a parallel computing method is used to link multiple personal computers (PCs). Experiments were performed to evaluate the proposed high-speed WSI system.

• Korean Journal of Optics and Photonics
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• v.6 no.4
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• pp.365-372
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• 1995

A signal processing technique for interferometric fiber-optic sensors is proposed. It does not require a any special optic components such as phase modulator, $3times3$ couplers,to obtain the full sensitivity of the interferometer. Instead, it requires a reference interferometer for phase referencing and a reference mirror for intensity referencing, but intensity referencing can be done without using the r reference mirror. The new technique utilizes the frequency chirping of the laser diode to process t the sensor signal with both wide dynamic range and high sensitivity of the interferometer. It was a applied to an internal-mirrored FP interferometric temperature sensor to obtain the system noise of $4\times10^{-3\circ}C$ from I cm FP Interferometor sensor device.

• Korean Journal of Optics and Photonics
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• v.16 no.4
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• pp.319-325
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• 2005

A signal processing method for white light interferometry (WLI), which performs a series of analog signal processing steps to locate the central interference fringe position at high speed: is developed and applied to a WLI temperature sensor system. We found that the new method has random walk of $0.019^{\circ}C/\sqrt{Hz}$ with good linearity. However, the temperature change in the path-matching interferometer results in drift of the measured sensor output. The temperature dependence of drift in the WLI temperature sensor system, was calculated to be $1.42{\mu}m/^{\circ}C$. It is also found that the relationship between the peak spacing in the interferogram and the spacing measured by the method can be nonlinear when the fringe spacing is comparable to the coherence length of the source.