• 한국산학기술학회논문지
• /
• 제16권10호
• /
• pp.6666-6672
• /
• 2015

전력 케이블의 고장에 대한 위치를 검출하기 위한 다양한 반사파 계측법들이 연구되고 있다. 하지만 대부분 관련 연구들이 시뮬레이션과 실험실에서의 성능 검증이 이루어지고 있고, 실제 현장과 비슷한 조건에서의 연구는 실증 시험장의 부재로 인해 이루어지지 못하고 있다. 따라서 본 논문에서는 케이블 고장 검출 장치의 표준화된 성능 시험과, 장비 운영 교육을 위한 실증 시험장을 설계 및 구축하였다. 구축된 실증시험장에서는 100m, 200m 거리에서 단선, 합선, 반단선, 접촉 불량 고장을 발생시켰고 최대 거리 측정 시험을 위해 1km 케이블을 설치하였다. 이러한 실증시험장은 향후 케이블 고장 검출 기술의 개발과 표준화, 그리고 장비 성능 검증 및 인증 시험 등을 위해 활용될 수 있을 것이다.

• 경영과학
• /
• 제27권3호
• /
• pp.33-41
• /
• 2010

A lot of researches find negative volatility risk premium in options market. We can make a trading profit by exploiting the negative volatility premium. This study proposes negative volatility risk premium hypotheses in the KOSPI 200 stock price index options market and empirically test the proposed hypotheses with intra-day short straddle strategy. This strategy sells both at-the-money call option and at-the-money put option at market open and exits the position at market close. Using MySQL 5.1, we create our database with 1 minute option price data of the KOSPI 200 index options from 2004 to 2009. Empirical results show that negative volatility risk premium exists in the KOSPI 200 stock price index options market. Furthermore, intra-day short straddle strategy consistently produces annual profits except one year.

• 전자공학회논문지A
• /
• 제31A권10호
• /
• pp.173-184
• /
• 1994

BiCMOS circuits mixed with CMOS and bipolar technologies show peculiar fault characteristics that are different from those of other technoloties. It has been reported that because most of short faults in BiCMOS circuits cause logically intermediate level at outputs, current monitoring method is required to detect these faluts. However current monitoring requires additional hardware capabilities in the testing equipment and evaluation of test responses can be more difficult. In this paper, we analyze the characteristics of faults in BiCMOS circuit together with their test methods and propose a new design technique for testability to detect the faults by logic monitoring. An effective method to detect the transition delay faults induced by performance degradation by the open or short fault of bipolar transistors in BiCMOS circuits is presented. The proposed design-for-testability methods for BiCMOS circuits are confirmed by the SPICE simulation.

• Journal of Korean Biological Nursing Science
• /
• 제22권2호
• /
• pp.111-118
• /
• 2020

Purpose: The purpose of this study was to understand the impact of long- and short-term energy drinks on anxiety-like, depressionlike, and cognitive behavior in adolescent rats. Methods: Adolescent rats (age six weeks) were randomly classified into a control group (CON), a long-term administration group (LT), and a short-term administration group (ST). The LT group was orally administered 1.5 mL/100 g (body weight) of energy drink twice daily for 14 days, the ST group was orally administered for one day, and the control group applied the same amount of normal saline. Later, an open-field test, a forced swim test, novel object recognition test, and an 8-arm radial maze test was conducted to assess the rats' anxiety, depression, and cognitive function. Results: There were different effects in the long- and short-term groups of energy drink administration. In the LT group, anxiety- and depressive-like behavior increased because of increased movement in the side corner and decrease of immobility time. Also, the time to explore novel objects decreased, and the number of correct responses was reduced, indicating a learning and memory function disorder. However, the ST group was not different from the control group. Conclusion: These results indicate that long-term consumption of energy drinks can increase anxiety-like, depression-like behavior, and this can lead to decrease in learning and memory functions. Thus, nurse and health care providers should understand the impact of energy drink consumption in adolescence to provide appropriate practices and education.

• Journal of information and communication convergence engineering
• /
• 제3권1호
• /
• pp.28-32
• /
• 2005

In this paper, we propose a novel test method to effectively detect hard and soft faults in CMOS 2-stage op-amps. The proposed method uses a very high frequency sinusoidal signal that exceeds unit gain bandwidth to maximize the fault effects. Since the proposed test method doesn't require any complex algorithms to generate the test pattern and uses only a single test pattern to detect all target faults, therefore test costs can be much reduced. The area overhead is also very small because the CUT is converted to a unit gain amplifier. Using HSPICE simulation, the results indicated a high degree of fault coverage for hard and soft faults in CMOS 2-stage op-amps. To verify this proposed method, we fabricated a CMOS op-amp that contained various short and open faults through the Hyundai 0.65-um 2-poly 2-metal CMOS process. Experimental results for the fabricated chip have shown that the proposed test method can effectively detect hard and soft faults in CMOS op-amps.

• 전기학회논문지
• /
• 제63권12호
• /
• pp.1710-1715
• /
• 2014

In this paper, we propose a novel on-chip test logic for TSV fault detection in 3-dimensional integrated circuits. The proposed logic called OTT realizes the input signal delay-based TSV test method introduced earlier. OTT only includes one F/F, two MUXs, and some additional logic for signal delay. Thus, it requires small silicon area suitable for TSV testing. Both pre-bond and post-bond TSV tests are able to use OTT for short or open fault as well as small delay fault detection.

• 전자공학회논문지D
• /
• 제35D권9호
• /
• pp.26-34
• /
• 1998

본 논문은 주사전자현미경(SEM)의 전자총을 이용하여 MCM 또는 PCB 회로기판의 신호연결선에서 전압차를 유도시켜 개방/단락 등의 결함을 측정 검사하는 방법을 제시한다. 본 실험에서는 주사전자현미경의 구조를 변형시키지 알고 회로기판의 개방/단락 검사를 실시할 수 있는 이중전위전자빔(Dual Potential) 검사방법을 사용한다. 이중전위전자빔(Dual Potential) 측정검사 방법은 이차전자수율 값 δ의 차이를 유기시키는 δ < 1 인 충전 전자빔과 δ > 1 인 읽기 전자빔을 사용하여 한 개의 전자총이 각각 다른 가속전압에 의해 생성된 두 개의 전자빔으로 측정하는 방법으로 특정 회로네트에 대한 개방/단락 등의 측정 검사가 가능하다. 또한 읽기 전자빔을 이용할 경우 검사한 회로 네트를 방전시킬 수 있어 기판 도체에 유기된 전압차를 없앨 수 있는 방전시험도 실시할 수 있어, 많은 수의 회로네트를 지닌 회로 기판에 대해 측정 검사할 때 충전되어 있는 회로네트에 대한 측정오류를 줄일 수 있다. 측정검사를 실시한 결과 glass-epoxy 회로기판 위에 실장된 구리(Cu) 신호연결선은 7KeV의 충전 전자빔으로 충전시키고 10초 이내에 주사전자현미경을 읽기 모드로 바꾸어 2KeV의 읽기 전자빔으로 구리표면에서의 명암 밝기 차이를 읽어 개방/단락 상태를 검사할 수 있었다. 또한 IC 칩의 Au 패드와 BGA의 Au 도금된 Cu 회로패드를 검사한 결과도 7KeV 충전 전자빔과 2KeV 읽기 전자빔으로 IC칩 내부회로에서의 개방 단락 상태를 쉽게 검사할 수 있었다. 이 검사방법은 주사전자현미경에 있는 한 개의 전자총으로 비파괴적으로 회로 기판의 신호 연결선의 개방/단락 상태를 측정 검사할 수 있음을 보여 주었다.

• Tribology and Lubricants
• /
• 제40권1호
• /
• pp.28-37
• /
• 2024

This paper presents the development of a squeeze film damper (SFD) test rig and experimental identification of the effects of clearance, damper length, journal eccentricity ratio, excitation amplitude, oil supply pressure, and oil flow rate on the damping coefficients of a test SFD with open ends and a central groove. Test data are compared with predictions from a simple model developed for short SFDs with open ends and a central groove. The test results show a significant decrease in the damping coefficient with increasing clearance and a dramatic increase with damper length, which are in good agreement with the simple model predictions. According to the simple model, the damping coefficient is inversely proportional to the cube of the clearance and directly proportional to the cube of the length. An increase in the journal eccentricity ratio results in a dramatic increase in the damping coefficient by as much as 15 times that of the concentric case, particularly at low excitation frequencies. By contrast, the measured damping coefficient remains almost constant with changes in the excitation amplitude and supply pressure, which are not major factors in the damper design. In general, the test data agree well with the simple model predictions, excluding cases that show increases in the SFD length and journal eccentricity, which indicate significant dependency on the excitation frequency.

• Journal of Korean Biological Nursing Science
• /
• 제21권3호
• /
• pp.217-223
• /
• 2019

Purpose: Caffeine is the most widely consumed psychostimulant of the methylxanthine class. Among adolescents, high-dose of caffeine consumption has increased rapidly over the last few decades due to the introduction of energy drinks. However, little is known about the time-dependent effect of high doses of caffeine consumption in adolescents. The present study aims to examine the short- and long-term influence of high-dose caffeine on behavior of adolescence. Methods: The animals were divided into three groups: a "vehicle" group, which was injected with 1 ml of phosphate-buffered saline for 14 days; a "Day 1" group, which was injected with caffeine (30 mg/kg), 2 h before the behavioral tests; and a "Day 14" group, which was infused with caffeine for 14 days. An open-field test, a Y-maze test, and a passive avoidance test were conducted to assess the rats'activity levels, anxiety, and cognitive function. Results: High-dose caffeine had similar effects in short-and long-term treatment groups. It increased the level of locomotor activity and anxiety-like behavior, as evidenced by the increase in the number of movements and incidences of rearing and grooming in the caffeine-treated groups. No significant differences were observed between the groups in the Y-maze test. However, in the passive avoidance test, the escape latency in the caffeine-treated group was decreased significantly, indicating impaired memory acquisition. Conclusion: These results indicate that high-dose caffeine in adolescents may increase locomotor activity and anxiety-like behavior and impair learning and memory, irrespective of the duration of administration. The findings will be valuable for both evidence-based education and clinical practice.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1987년도 전기.전자공학 학술대회 논문집(II)
• /
• pp.1476-1480
• /
• 1987

This paper proposes a design method for SCLA(sequential CMOS Domino Logic Array) using 1-level CMOS Domino Logic and Stable Shift Register Latch. Also an algorithm to generate a test sequence and a test procedure for the SCLA are presented. The SCLA has advantages of low power consumption, high density and high speed, and performs hazard-and race-free logic operation, because of using SSRL(Stable Shift Register Latch). By using the proposed test method, all of stuck-at, cross-point, stuck-on and stuck-open faults in SCLA are detected by short test sequence.