• Current Optics and Photonics
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• v.8 no.2
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• pp.192-200
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• 2024

Wheat stripe rust, caused by Puccinia striiformis, has reduced winter wheat yield globally for ages. In this work, multi-spectral Mueller matrix imaging with 37 measurements using the method of double rotatable quarter-wave plates was used to investigate wheat stripe rust. Individual Mueller matrix measurements were performed on incident monochromatic light with nine bands in the range of 430 to 690 nm. As a result, it was found that the infected area absorbed linearly polarized light and was sensitive to circularly polarized light in the spectral domain. Both linear depolarization and linear diattenuation images distinguished between wheat stripe rust and healthy tissue. The responsiveness of stripe rust to polarized light reveals the potential of using polarization imaging to detect plant diseases. This further suggests that the multi-spectral Mueller matrix imaging system provides us with an alternative approach to agricultural disease detection.

• Journal of Biomedical Engineering Research
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• v.27 no.6
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• pp.310-317
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• 2006

Extensive research with polarimetry and Mueller matrix has been done for chemical measurements and possible cancer detection. However, the effect of thermally denatured biological tissue on polarization changes is not well known. The purpose of this study is to characterize polarization changes in collagen due to thermal denaturation. The variations in polarized state caused by thermal damage were investigated by obtaining the Mueller matrix elements of collagen sample at multiple thermal damage levels. The changes in birefringence of denatured collagen were also investigated. This information could be used to determine the extent of thermal damage level of clinically heat treated tissues.

• Journal of the Semiconductor & Display Technology
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• v.3 no.1
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• pp.31-34
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• 2004

We develop Mueller-matrix spectroscopic ellipsometry based on dual compensator configuration. This technique is very powerful for measuring surface anisotropy in nano-scale, especially when materials show depolarization. Dual-rotating compensator configuration is adopted with the rotational ratio of 5:3 originally developed by Collins et al[1]. The instrument can provide 250-point spectra over the wavelength range from 230 nm to 820 nm in one irradiance waveform with minimum acquisition time of Tc=10 s. In this work, the results obtained in transmission modes are presented for the initial attempt. We present calibration procedures to diagnose the system from the utilized data collected in transmission mode without sample. We expect that the instrument will have important applications in thin films and surfaces that have anisotropy and inhomogeneity.

• Current Optics and Photonics
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• v.7 no.2
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• pp.147-156
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• 2023

Circularly polarized (CP) emission can be achieved by integrating emissive materials into chiral metasurfaces. Such CP light sources in integrated device platforms are desirable for important potential applications. However, the exact characterization of the polarization state in CP emission may include some errors because of the unwanted polarization distortion caused by optical components (e.g., beam splitter) in the optical setup. Here, we consider CP emission measurements from chiral metasurfaces and characterize the polarization distortion caused by the beam splitter. We first detail the procedures for the Stokes parameters and Mueller matrix measurements. Then, we directly measure the Mueller matrix of the beam splitter and retrieve the original polarization state of CP emission from our metasurface sample. Using the measured Mueller matrix of the beam splitter, we specifically identify what contributes to polarization distortion in CP emission. Our work may provide useful guidelines for the characterization and compensation of polarization distortion in general Stokes parameter measurements.

• Korean Journal of Optics and Photonics
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• v.33 no.2
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• pp.59-66
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• 2022

A free-form Mueller matrix ellipsometer (MME) based on independent control of the azimuthal angle of each polarizing element is introduced. The azimuthal angles of the polarizer and the matching compensator which generate the optimum Stokes vectors of an incident beam are investigated for the polarization state generator, where the spectral responses of the retardation angle and transmittance ratio of a nonideal compensator are taken into account. Similarly, the azimuthal angles of the analyzer and the corresponding compensator are investigated for the polarization-state detector, to unambiguously determine the Stokes vector of the outcoming beam from the sample, and explicit expressions for the Stokes elements are derived. Since the suggested technique enables one to utilize a nonideal quarter-wave plate as the compensator for an MME, it will contribute to the construction and application of a Mueller matrix spectroscopic ellipsometer (MMSE) operating over a wide spectral range from deep ultra-violet to near infrared.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.8 no.3
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• pp.273-288
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• 1997

In this work, the electromagnetic waves scattered from 2-dimensional random rough surfaces are characterized by the $4\times4$ Mueller matrix elements. The full wave solutions are used to compute these elements. The results of the full wave solutions for 1-dimensional random rough surfaces were shown to agree well with those of the experiment and the method of moments. The Mueller matrix elements are related to the like and cross polarized radar cross sections as well as to the relative phase of the vertically and horizontally polarized waves. The $4\times4$ Mueller matrix elements completely characterize electromagnetic scattering from target. The computed results of this paper can be useful to the field of active remote sensing or RCS.

• Journal of Korean Society of Environmental Engineers
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• v.39 no.8
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• pp.441-448
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• 2017

A method for measuring the concentration of surfactant in water was developed. In this technique, microbubbles were used as light scatterers. The polarization change of light scattered by microbubbles was analyzed by Mueller matrix analysis. $M_{11}$, one of the Mueller matrix elements, was found to be a key parameter inferring the surfactant concentration within the concentration range of 0 ppm to 60 ppm. The best results for this measurement were obtained when the scattering angle was $150^{\circ}$ and the extinction ratio was 56.2. This experimental result shows that the EPLS can be effectively used as a real time inspection method for water quality monitoring in lakes or rivers.

• Korean Journal of Optics and Photonics
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• v.25 no.5
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• pp.262-272
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• 2014

Using an ellipsometer with dual rotating quarter-wave plates, we have analyzed the relationship between Fourier coefficients and Mueller matrices in the cases of an error-free optical system and of five systematic errors (alignment errors and retardation errors in the quarter-wave plates, and alignment error in the analyzer). In the case with five systematic errors, simulation results show that retardation errors cause more error in the diagonal elements of the Mueller matrix than do alignment errors. We have found that errors in the Mueller matrix caused by initial misalignment of the dual quarter-wave plates were the same. We have chosen the rotation rates of two quarter-wave plates such that the rotational frequencies ${\omega}_1$ and ${\omega}_2$ differ by a factor of 5, i.e. ${\omega}_2=5{\omega}_1$. The simulation results show 0.18% relative error in the diagonal elements ($m_{22}$ and $m_{33}$) and 200% relative error in the off-diagonal elements ($m_{23}$ and $m_{32}$), when we compare errors caused by misalignment of the analyzer to those caused by initial misalignment of the quarter-wave plates. We can use these results in measuring accurate Mueller matrices of optical materials.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.23 no.10
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• pp.1196-1203
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• 2012

This paper presents a study on the calibration of a C-band HPS(Hongik Polarimetric Scatterometer) system using the DMMCT(Differential Mueller Matrix Calibration Technique). For calibration of the polarimetric scatterometer system, a fully-polarimetric antenna pattern(magnitudes and phase-differences) of the antenna main-beam is measured using a conducting sphere at anechoic chamber. The polarimetric scatterometer system could be accurately calibrated after retrieving its distortions using the DMMCT. Unlike a single-polarimetric system, in a fully-polarimetric system, not only backscattering coefficients but also phase differences are important parameters. This calibrated HPS system can be used to measure accurate Mueller matrices of bare soil surfaces, rice paddies, and vegetation fields. The phase-difference parameters as well as the backscattering coefficients for co- and cross-polarizations can then be obtained. The accuracy of calibration was verified by comparing the measured backscattering coefficients with a scattering model. The measured polarization response of a plowed bare field was also compared with the polarization response which was synthesized using a polarimetric scattering model for verifying the calibration technique.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.17 no.2
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• pp.142-152
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• 1992

This paper presentes a new method to measure high electric field (or high voltage) by using crystalline SiO2 which has very high half wave voltage. There are many difficulties in measuring high electric field using other crystals which have generally low half wave voltage.By applying Stokes parameter and Mueller matrix. We derive optical modulation equation in the sensor which is composed of a polarizer, and Mueller matrix, we derive optical modulation equation in the sensor which is composed of a polarizer, a Pokels material, and an analyzer, We theoretically analyzed electro-optic effect, and calculated the phase retardation and half wave volt age of the birefringent material. The designed optical valtage sensor has very excellent linearity up to 20KV without divided volt-age. The maximum error was measured within 3%. Before annealing of Sio2 crystal, the maximum variation of the output voltage is 7.5% with varying temperature from \ulcorner20˚c to 60˚c. But, after annealing of SiO2 crystal, the output voltage variation is improved within 1%error.