Current Optics and Photonics

Optical Society of Korea (한국광학회)
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Multi-spectral Mueller Matrix Imaging for Wheat Stripe Rust

  • Yang Feng (School of Science, Northwest A&F University) ;
  • Tianyu He (College of Information Engineering, Northwest A&F University) ;
  • Wenyi Ren (School of Science, Northwest A&F University) ;
  • Dan Wu (College of Mechanical and Electronic Engineering, Northwest A&F University) ;
  • Rui Zhang (School of Science, Northwest A&F University) ;
  • Yingge Xie (School of Science, Northwest A&F University)
  • Received : 2023.11.24
  • Accepted : 2024.03.01
  • Published : 2024.04.25
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Abstract

Wheat stripe rust, caused by Puccinia striiformis, has reduced winter wheat yield globally for ages. In this work, multi-spectral Mueller matrix imaging with 37 measurements using the method of double rotatable quarter-wave plates was used to investigate wheat stripe rust. Individual Mueller matrix measurements were performed on incident monochromatic light with nine bands in the range of 430 to 690 nm. As a result, it was found that the infected area absorbed linearly polarized light and was sensitive to circularly polarized light in the spectral domain. Both linear depolarization and linear diattenuation images distinguished between wheat stripe rust and healthy tissue. The responsiveness of stripe rust to polarized light reveals the potential of using polarization imaging to detect plant diseases. This further suggests that the multi-spectral Mueller matrix imaging system provides us with an alternative approach to agricultural disease detection.

Keywords

Acknowledgement

The National Key Research and Development Project of China (2022YFD1900802); Key Research and Development Project of Shaanxi Province (2024NC-YBXM-215); Natural Science Foundation of Shaanxi Province (2024JCYBQN-0051); Chinese Universities Scientific Fund, P. R. China (2452022382); the National Natural Science Foundation of China, P. R. China (12204380).

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