• Corrosion Science and Technology
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• v.18 no.6
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• pp.232-242
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• 2019

In this study, hydrophobically modified fumed silica was added to the PVDF coating to improve corrosion protection performance. Two types of silane modifiers, trimethylchlorosilane (TMCS) and hexamethyldisilazane (HMDZ), were used for hydrophobic modification of the fumed silica. The composition of modified fumed silica was analyzed by Fourier transform infrared, X-ray photoelectron spectroscopy, and elemental analysis. The dispersion of modified fumed silica in the PVDF coating was observed by the transmission electron microscopy, and the hydrophobicity of PVDF coating was analyzed by the water contact angle. Surface properties were examined by the field emission scanning electron microscopy and scanning probe microscopy. Potentiodynamic polarization was conducted to confirm corrosion protection performance of PVDF coating in terms of hydrophobically-modified fumed silica contents. As a result, the average surface roughness and the water contact angle of the PVDF coating increased with modifier contents. The results of the potentiodynamic polarization test showed an increase of the E_corr values with increase of the hydrophobicity of PVDF coating. Thus, it clearly indicates that the corrosion protection performance of PVDF coating improved with the addition of the hydrophobic-modified fumed silica that prevents the penetration of moisture into the PVDF coating.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.55 no.9
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• pp.423-428
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• 2006

We have been carried out the two-beam interference method to form the diffraction grating on chalcogenide $AS_{40}Se_{15}S_{35}Ge_{10}$ thin films for Holography Data Storage (HDS). In the present work, we have been formed holographic diffraction gratings using He-Ne laser (632.8nm) under different Polarization state combinations (intensity polarization holography, phase polarization holography). It was obtained the diffraction grating efficiency by 11st order intensity and investigated the formed grating structure using Atomic Force Microscopy (AFM). As the results, it is shown that the diffraction efficiency of (P: P) polarized recording was maximum 2.4% and we found that its value was rather higher than that of other-polarized recordings. From the results, it is confirmed that the efficient holographic grating formation on amorphous chalcogenide $AS_{40}Se_{15}S_{35}Ge_{10}$ films depend on both the spatial variation of intensity and the polarization state of the incident field pattern.

• Corrosion Science and Technology
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• v.17 no.5
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• pp.249-256
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• 2018

Metallic structures in the oil and gas production undergo severe degradation due to sweet and sour corrosion caused by the presence of $CO_2$ and $H_2S$ in the fluid environment. The corrosion behavior of 304 austenitic stainless was investigated in the presence of varying concentrations of $CO_2$ or $H_2S$ and $CO_2+H_2S$ to understand the effect of the parameters either individually or in combination. Potentiodynamic polarization study revealed that a small amount of $CO_2$ aided in the formation of calcareous deposit of protective layer on passive film of 304 steel, while increase in $CO_2$ concentration ruptured the layer resulting in sweet corrosion. The presence of $S^{2-}$ damaged the passive and protective layer of the steel and higher levels increased the degradation rate. Electrochemical impedance studies revealed lower polarization resistance and impedance at higher concentration of $CO_2$ or $H_2S$, supporting the outcomes of polarization study. XRD analysis revealed different types of iron carbides and iron sulphides corresponding to sweet and sour corrosion as the corrosion products, respectively. SEM analysis revealed the presence of uniform, localized and sulphide cracking in sour corrosion and general corrosion with protective carbide layer amid for sweet corrosion.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.32 no.1
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• pp.20-24
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• 2019

Ferroelectric material properties are strongly governed by domain structures and their evolution processes, but the evolution processes of complex domain patterns during a macroscopic electrical poling process are still elusive. In the present work, domain-evolution processes in a PZT ceramic near the morphotropic phase-boundary composition were studied during a step-wise electrical poling using piezoresponse force microscopy (PFM). Electron backscatter diffraction was used with the PFM data to identify the grain boundaries in the region of interest. In response to an externally the applied electric field, growth and retreat of non-$180^{\circ}$ domain boundaries wasere observed. The results indicate that ferroelectric polarization-switching nucleates and evolves in concordance with the pattern of the pre-existing domains.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.27 no.6
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• pp.849-856
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• 2003

A three-dimensional constitutive model for polarization switching in ferroelectric materials is used to predict the formation of switching zones in an atomic force microscopy(AFM) tip/ferroelectric thin film/bottom electrode system via finite element simulation. Initially the ferrolectric film is poled upward and the bottom electrode is grounded. A strong dc field is imposed on a fixed point of the top surface of the film through the AFM tip. A small switching zone with downward polarization is nucleated and grows with time. It is found that initially the shape of the switched zone is that of a bulgy dagger, but later turn to the shape of a reversed cup with the lower part wider than the upper part. It can also be concluded that the size of switching zones increases with the period of applied electric potential. The present results are qualitatively consistent with experimental observations.

• Journal of Electrochemical Science and Technology
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• v.7 no.2
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• pp.153-160
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• 2016

The inhibition ability of N,N-bis(2,4-dihydroxyhydroxybenzaldehyde)-1,3-Propandiimine (DHBP) as a schiff base against the corrosion of API-5L-X65 steel in 1 M HCl solution was evaluated by electrochemical impedance spectroscopy, potentiodynamic polarization and scanning electron microscopy. Electrochemical impedance studies indicated that DHBP inhibited corrosion by blocking the active corrosion sites. The inhibition efficiency increased with increasing inhibitor concentrations. EIS data was analysed to equivalent circuit model and showed that the charge transfer resistance of steel increased with increasing inhibitor concentration whilst the double layer capacitance decreased. The adsorption of this compound obeyed the Langmuir adsorption isotherm. Gibbs free energy of adsorption was calculated and indicated that adsorption occurred through physical and spontaneous process. The corrosion inhibition mechanism was studied by potential of zero charge. Polarization studies indicated that DHBP retards both the cathodic and anodic reactions through adsorption on steel surface. Scanning electron microscopy was used to study the steel surface with and without inhibitor.

• Korean Journal of Materials Research
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• v.27 no.9
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• pp.484-488
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• 2017

In the present study, domain evolution processes of a near-morphotropic PZT ceramic during poling was studied using vertical piezoresponse force microscopy (PFM). To perform macroscopic poling in bulk polycrystalline PZT, poling was carried out in a stepwise fashion, and PFM scan was performed after unloading the electric field. To identify the crystallographic orientation and planes for the observed non-$180^{\circ}$ domain walls in the PFM images, compatibility theory and electron backscatter diffraction (EBSD) were used in conjunction with PFM. Accurate registration between PFM and the EBSD image quality map was carried out by mapping several grains on the sample surface. A herringbone-like domain pattern consisting of two sets of lamellae was observed; this structure evolved into a single set of lamellae during the stepwise poling process. The mechanism underlying the observed domain evolution process was interpreted as showing that the growth of lamellae is determined by the potential energy associated with polarization and an externally applied electric field.

• Corrosion Science and Technology
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• v.9 no.5
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• pp.223-232
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• 2010

NiTi alloy has been used for orthodontic wire due to good mechanical properties, such as elastic strength, friction resistance, and high corrosion resistance. Recently, these wire were coated by polymer and ceramic materials for aesthetics. The purpose of this study was to investigate electrochemical characteristics of tooth colored NiTi wire using various instruments. Wires (round type and rectangular type) were used, respectively, for experiment. Polymer coating was carried out for wire. Specimen was investigated with optical microscopy (OM), field emission scanning electron microscopy (FE-SEM) and energy dispersive x-ray spectroscopy (EDS). The corrosion properties of the specimens were examined using potentiodynamic tests (potential range of -1500 ~ 2000 mV) and electrochemical impedance spectroscopy (frequency range of 100 kHz ~ 10 mHz) in a 0.9 % NaCl solution by potentiostat. From the results of polarization behavior, the passive region of non-coated NiTi wire showed largely, whereas, the passive region of curved NiTi wire showed shortly in anodic polarization curve. In the case of coated NiTi wire, pitting and crevice corrosion occurred severely at interface between non-coated and coated region. From the results of EIS, polarization resistance(Rp) value of non-coated round and rectangular NiTi wire at curved part showed $5.10{\times}10^5{\Omega}cm^2$ and $4.43{\times}10^5{\Omega}cm^2$. lower than that of coated NiTi wire. $R_p$ of coated round and rectangular NiTi wire at curved part showed $1.31{\times}10^6{\Omega}cm^2$ and $1.19{\times}10^6{\Omega}cm^2$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.23-23
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• 2009

GaN-based nitride semiconductors have attracted considerable attention in high-brightness light-emitting-diodes (LEDs) and laser diodes (LDs) covering from green to ultraviolet spectral range. LED and LD heterostructures are usually grown on (0001)-$Al_2O_3$. The large lattice mismatch between $Al_2O_3$ substrates and the GaN layers leads to a high density of defects(dislocations and stacking faults). Moreover, Ga and N atoms are arranged along the polar [0001] crystallographic direction, which leads to spontaneous polarization. In addition, in the InGaN/GaN MQWs heterostructures, stress applied along the same axis can also give rise to piezoelectric polarization. The total polarization, which is the sum of spontaneous and piezoelectric polarizations, is aligned along the [0001] direction of the wurtzite heterostructures. The change in the total polarization across the heterolayers results in high interface charge densities and spatial separation of the electron and hole wave functions, redshifting the photoluminescence peak and decreasing the peak intensity. The effect of polarization charges in the GaN-based heterostructures can be eliminated by growing along the non-polar [$11\bar{2}0$] (a-axis) or [$1\bar{1}00$] (m-axis) orientation instead of thecommonly used polar [0001] (c-axis). For non-polar GaN growth on non-polar substrates, the GaN films have high density of planar defects (basal stacking fault BSFs, prismatic stacking fault PSFs), because the SFs are formed on the basal plane (c-plane) due to their low formation energy. A significant reduction in defect density was recently achieved by applying blocking layer such as SiN, AlN, and AlGaN in non-polar GaN. In this work, we were performed systematic studies of the defects in the nonpolar GaN by conventional and high-resolution transmission electron microscopy.

• Transactions on Electrical and Electronic Materials
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• v.14 no.3
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• pp.130-132
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• 2013

$Bi_{3.25}La_{0.75}Ti_3O_{12}$(BLT) thin films were prepared on the Pt(150 nm)/Ti(50 nm)/$SiO_2$/Si substrate using the rf magnetron sputtering method. The BLT thin films were annealed at temperatures ranging from $600^{\circ}C$ to $750^{\circ}C$ using the rapid thermal annealing. The structure and surface morphology of the thin films were characterized by x-ray diffraction and field emission scanning electron microscopy. The hysteresis loop of the BLT thin films showed that the remanent polarization (2Pr) of the film annealed at $700^{\circ}C$ was 10.92 ${\mu}C/cm^2$. The fatigue characteristic of the BLT thin film annealed at $700^{\circ}C$ was shown change polarization up to $1.2{\times}10^9$ switching cycles. We confirmed the excellent remnant polarization (Pr) and fatigue properties compared with other fabrication methods and suggested a good method for BLT thin films fabrications.