• 제목/요약/키워드: Low energy X-ray

검색결과 576건 처리시간 0.248초

EDLC를 이용한 X선 투시촬영장치용 하이브리드 X선 제너레이터 (Hybrid Type X-Ray Generator Using EDLC for Fluoroscopy X-Ray System)

  • 서영민;홍순찬
    • 조명전기설비학회논문지
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    • 제28권9호
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    • pp.89-98
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    • 2014
  • A diagnostic fluoroscopy X-ray system uses a 32kW or greater X-ray generator for obtaining real-time moving images and high-resolution images. Fluoroscopy X-ray systems have to use a high-capacity AC power source to perform long-time low-power fluoroscopy and short-time high-power spot exposure. In this paper, we propose a hybrid type X-ray generator for fluoroscopy X-ray system which can perform fluoroscopy and spot exposure with a low-capacity AC power source and an energy storage device. The characteristics of energy storage devices are compared and each energy storage device is modelled to equivalent circuit. And the characteristics of available energy are analyzed as a function of output voltage and power. A 32kW class hybrid X-ray generator with EDLC as an energy storage device for fluoroscopy X-ray system was constructed, and its validity was verified by means of simulations and experiments.

이중 에너지 검출기를 이용한 영상 시스템 (Image System Using Dual Energy Detector)

  • 여화연
    • 한국산학기술학회논문지
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    • 제11권9호
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    • pp.3517-3523
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    • 2010
  • 본 논문은 이중 에너지 DR(Digital Radiography) 방식 중, 단일 조사 X-선(single shot X-ray exposure) 장치와 이중 모드 검출기 모듈 (Low Energy Detector & High Energy Detector)을 이용한 이중 X-선 이미징이 가능한 검출기 모듈에 관한 연구이다. 상용 BIS(baggage inspection system)에서 사용되고 있는 X-선 발생장치의 스펙트럼과 이중 모드 검출기에 대한 특징 및 방사선적 특성을 분석하여 새롭게 제안 할 검출기 모듈의 최적 설계 방향을 기술하고 상용화된 용화된 LED 및 HED 검출기와 새롭게 제안 한 검출기 모듈에 대해 전기적, 광학적, 방사선적 특성 실험을 실시하여, 새롭게 제안된 검출기 모듈이 BIS 용도로 사용 가능함을 증명하였다. 새롭게 제안 된 검출기 모듈이 적용된 BIS에 대해, 기본 특성 실험에 대한 X-선 영상을 획득하여 실험 및 분석을 실시하였다.

엑스선에 의한 반도체 소자의 방사선 손상 (Radiation Damage of Semiconductor Device by X-ray)

  • 김동성;홍현승;박혜민;김정호;주관식
    • Journal of Radiation Protection and Research
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    • 제40권2호
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    • pp.110-117
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    • 2015
  • 최근 방사선을 이용한 반도체 검사장비 산업의 증가로 이에 대한 기술 연구 수요 또한 증가하고 있다. 반도체 검사장비는 저에너지 엑스선으로 최저 40 keV에서 최고 120 keV의 에너지 영역을 사용하고 있지만, 국내에서는 저에너지 엑스선이 주는 방사선 손상 연구가 미흡한 상황이다. 따라서 본 연구는 저에너지 엑스선을 이용하여 반도체 소자의 한 종류인 BJT (bipolor junction transistor)가 받는 방사선 손상에 관한 것이다. BJT는 NXP반도체사의 BC817-25(NPN type)를 사용하였으며, 엑스선 발생장치를 사용하여 엑스선을 조사하였다. BJT의 방사선 손상 여부는 엑스선 조사 전과 후에 전류 이득을 10으로 고정하고, 콜렉터 전류에 따른 콜렉터-이미터 전압을 측정하여 변화 정도를 분석하여 확인하였다. 엑스선 발생장치의 관전압은 40 kVp, 60 kVp, 80 kVp, 100 kVp, 120 kVp 등 다섯 가지로, 조사 시간은 60초, 120초, 180초, 360초, 540초 등 다섯 가지로 변수를 두었다. 실험 결과 BJT에서 저에너지 엑스선 즉, 120 keV 이하의 엑스선을 조사하여도 방사선 손상이 발생하는 것을 확인하였고, 특히 80 kVp에서 가장 큰 방사선 손상이 발생되었다. 이는 ELDRS (enhanced low dose rate sensitivity) 현상이 80 kVp을 기준으로 발생되는 것으로 판단된다. 본 연구의 결과는 저에너지 엑스선을 이용한 반도체 검사장비의 효율적인 선량관리와 엑스선 여과기의 연구 및 개발에 기여할 것으로 기대한다.

PCB 비파괴 검사에 있어서 단일 에너지 소스와 이중 에너지 소스의 영상비교를 위한 엑스선 스펙트럼 분석 (Energy Spectrum Analysis between Single and Dual Energy Source X-ray Imaging for PCB Non-destructive Test)

  • 김명수;김기윤;이민주;강동욱;이대희;박경진;김예원;김찬규;김형택;조규성
    • 방사선산업학회지
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    • 제9권3호
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    • pp.153-159
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    • 2015
  • Reliability of printed circuit board (PCB), which is based on high integrated circuit technology, is having been important because of development of electric and self-driving car. In order to answer these demand, automated X-ray inspection (AXI) is best solution for PCB non-destructive test. PCB is consist of plastic, copper, and, lead, which have low to high Z-number materials. By using dual energy X-ray imaging, these materials can be inspected accurately and efficiently. Dual energy X-ray imaging, that have the advantage of separating materials, however, need some solution such as energy separation method and enhancing efficiency because PCB has materials that has wide range of Z-number. In this work, we found out several things by analysis of X-ray energy spectrum. Separating between lead and combination of plastic and copper is only possible with energy range not dose. On the other hand, separating between plastic and copper is only with dose not energy range. Moreover the copper filter of high energy part of dual X-ray imaging and 50 kVp of low energy part of dual X-ray imaging is best for efficiency.

X-선 스펙트럼 변조 기술 연구 (X-Ray Spectrum Modulation for Mammography)

  • 김광현;김경락;오창현
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 B
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    • pp.600-603
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    • 2003
  • Energy spectrum modulation of X-ray source in digital mammography has been studied. In this study, we calculated various filtered spectra using the scattering data. Primary spectra were generated by Molybdenum (Mo) and Tungsten (W) targets. The materials of added filters are Molybdenum and Rhodium (Rh) for 40 kVp Mo. primary spectrum, the amounts of photons over whole energy ranges are attenuated to 0.43 with 0.03 mm Mo filter and 0.38 with 0.06 mm Mo filter while the photons of energy ranged from 17 keV to 20 keV. The photons of low energy ranged below 17 keV are considerably attenuated. This effect brings out reducing the scattered radiation and dose to the patient, and enhancing subject contrast in the image. The results show that filtered spectra are not seriously affected by X-ray tube loadability. Because the energy range from 17 keV to 20 keV is directly transmitted although low and high energies are mainly filtered.

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방사광 X-선을 이용한 리튬이온전지 소재의 실시간 구조 분석 연구 (In situ Synchrotron X-ray Techniques for Structural Investigation of Electrode Materials for Li-ion Battery)

  • 한다슬;남경완
    • 세라미스트
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    • 제22권4호
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    • pp.402-416
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    • 2019
  • The development of next-generation secondary batteries, including lithium-ion batteries (LIB), requires performance enhancements such as high energy/high power density, low cost, long life, and excellent safety. The discovery of new materials with such requirements is a challenging and time-consuming process with great difficulty. To pursue this challenging endeavor, it is pivotal to understand the structure and interface of electrode materials in a multiscale level at the atomic, molecular, macro-scale during charging / discharging. In this regard, various advanced material characterization tools, including the first-principle calculation, high-resolution electron microscopy, and synchrotron-based X-ray techniques, have been actively employed to understand the charge storage- and degradation-mechanisms of various electrode materials. In this article, we introduce and review recent advances in in-situ synchrotron-based x-ray techniques to study electrode materials for LIBs during thermal degradation and charging/discharging. We show that the fundamental understanding of the structure and interface of the battery materials gained through these advanced in-situ investigations provides valuable insight into designing next-generation electrode materials with significantly improved performance in terms of high energy/high power density, low cost, long life, and excellent safety.

Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement

  • Park, Junghwan;Choi, Yong Suk;Kim, Junhyuck;Lee, Jeongmook;Kim, Tae Jun;Youn, Young-Sang;Lim, Sang Ho;Kim, Jong-Yun
    • Nuclear Engineering and Technology
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    • 제53권4호
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    • pp.1297-1303
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    • 2021
  • Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R2 = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.

X-ray / gamma ray radiation shielding properties of α-Bi2O3 synthesized by low temperature solution combustion method

  • Reddy, B. Chinnappa;Manjunatha, H.C.;Vidya, Y.S.;Sridhar, K.N.;Pasha, U. Mahaboob;Seenappa, L.;Sadashivamurthy, B.;Dhananjaya, N.;Sathish, K.V.;Gupta, P.S. Damodara
    • Nuclear Engineering and Technology
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    • 제54권3호
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    • pp.1062-1070
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    • 2022
  • In the present communication, pure and stable α-Bismuth Oxide (Bi2O3) nanoparticles (NPs) were synthesized by low temperature solution combustion method using urea as a fuel and calcined at 500℃. The synthesized sample was characterized by using powder X-ray Diffraction (PXRD), Scanning Electron Microscopy (SEM), Energy dispersive X-ray analysis (EDAX), Transmission Electron Microscopy (TEM), Fourier Transform Infrared Spectroscopy (FTIR) and UV-Visible absorption spectroscopy. The PXRD pattern confirms the formation of mono-clinic, stable and low temperature phase α-Bi2O3. The direct optical energy band gap was estimated by using Wood and Tauc's relation which was found to be 2.81 eV. The characterized sample was studied for X-ray/gamma ray shielding properties in the energy range 0.081-1.332 MeV using NaI (Tl) detector and multi channel analyzer (MCA). The measured shielding parameters agrees well with the theory, whereas, slight deviation up to 20% is observed below 356 keV. This deviation is mainly due to the influence of atomic size of the target medium. Furthermore an accurate theory is necessary to explain the interaction of X-ray/gamma ray with the NPs.The present work opens new window to use this facile, economical, efficient, low temperature method to synthesize nanomaterials for X-ray/gamma ray shielding purpose.

A Copper Shield for the Reduction of X-γ True Coincidence Summing in Gamma-ray Spectrometry

  • Byun, Jong-In
    • Journal of Radiation Protection and Research
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    • 제43권4호
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    • pp.137-142
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    • 2018
  • Background: Gamma-ray detectors having a thin window of a material with low atomic number can increase the true coincidence summing effects for radionuclides emitting X-rays or gamma-rays. This effect can make efficiency calibration or spectrum analysis more complicated. In this study, a Cu shield was tested as an X-ray filter to neglect the true coincidence summing effect by X-rays and gamma-rays in gamma-ray spectrometry, in order to simplify gamma-ray energy spectrum analysis. Materials and Methods: A Cu shield was designed and applied to an n-type high-purity germanium detector having an $X-{\gamma}$ summing effect during efficiency calibration. This was tested using a commercial, certified mixed gamma-ray source. The feasibility of a Cu shield was evaluated by comparing efficiency calibration results with and without the shield. Results and Discussion: In this study, the thickness of a Cu shield needed to avoid true coincidence summing effects due to $X-{\gamma}$ was tested and determined to be 1 mm, considering the detection efficiency desired for higher energy. As a result, the accuracy of the detection efficiency calibration was improved by more than 13% by reducing $X-{\gamma}$ summing. Conclusion: The $X-{\gamma}$ summing effect should be considered, along with ${\gamma}-{\gamma}$ summing, when a detection efficiency calibration is implemented and appropriate shielding material can be useful for simplifying analysis of the gamma-ray energy spectra.