Acknowledgement
This research was supported by the National Research Foundation of Korea funded by the Korean government (Ministry of Science and ICT) (grant nos. 2017M2A8A5014754 and 2019M1A7A1A02085179).
References
- K.A. Bakeev (Ed.), Process Analytical Technology, John Wiley & Sons, Chichester, UK, 2010, https://doi.org/10.1002/9780470689592.
- S. Bordawekar, A. Chanda, A.M. Daly, A.W. Garrett, J.P. Higgins, M.A. LaPack, T.D. Maloney, J. Morgado, S. Mukherjee, J.D. Orr, G.L. Reid, B.-S. Yang, H.W. Ward, Industry perspectives on process analytical technology: tools and applications in API manufacturing, Org. Process Res. Dev. 19 (2015) 1174-1185, https://doi.org/10.1021/acs.oprd.5b00088.
- S.W. Song, J. Kim, C. Eum, Y. Cho, C.R. Park, Y.-A. Woo, H.M. Kim, H. Chung, Hyperspectral Raman line mapping as an effective tool to monitor the coating thickness of pharmaceutical tablets, Anal. Chem. 91 (2019) 5810-5816, https://doi.org/10.1021/acs.analchem.9b00047.
- J. Workman, D.J. Veltkamp, S. Doherty, B.B. Anderson, K.E. Creasy, M. Koch, J.F. Tatera, A.L. Robinson, L. Bond, L.W. Burgess, G.N. Bokerman, A.H. Ullman, G.P. Darsey, F. Mozayeni, J.A. Bamberger, M.S. Greenwood, Process analytical chemistry, Anal. Chem. 71 (1999) 121-180, https://doi.org/10.1021/a1990007s.
- M.H. Ali, A. Rabhi, A. El Hajjaji, G.M. Tina, Real time fault detection in photovoltaic systems, Energy Procedia 111 (2017) 914-923, https://doi.org/10.1016/j.egypro.2017.03.254.
- C.D. Dimitrakopoulos, D.J. Mascaro, Organic thin-film transistors: a review of recent advances, IBM J. Res. Dev. 45 (2001) 11-27, https://doi.org/10.1147/rd.451.0011.
- C.D. Dimitrakopoulos, P.R.L. Malenfant, Organic thin film transistors for large area electronics, Adv. Mater. 14 (2002) 99-117, https://doi.org/10.1002/1521-4095(20020116)14:2<99::AID-ADMA99>3.0.CO;2-9.
- P. Peumans, A. Yakimov, S.R. Forrest, Small molecular weight organic thin-film photodetectors and solar cells, J. Appl. Phys. 93 (2003) 3693-3723, https://doi.org/10.1063/1.1534621.
- P. Fenter, F. Schreiber, L. Zhou, P. Eisenberger, S. Forrest, In situ studies of morphology, strain, and growth modes of a molecular organic thin film, Phys. Rev. B Condens. Matter 56 (1997) 3046-3053, https://doi.org/10.1103/PhysRevB.56.3046.
- P.V. Pesavento, K.P. Puntambekar, C.D. Frisbie, J.C. McKeen, P.P. Ruden, Film and contact resistance in pentacene thin-film transistors: dependence on film thickness, electrode geometry, and correlation with hole mobility, J. Appl. Phys. 99 (2006), 094504, https://doi.org/10.1063/1.2197033.
- H. Jia, S. Gowrisanker, G.K. Pant, R.M. Wallace, B.E. Gnade, Effect of poly (3-hexylthiophene) film thickness on organic thin film transistor properties, J. Vac. Sci. Technol. A Vacuum, Surf. Film. 24 (2006) 1228-1232, https://doi.org/10.1116/1.2202858.
- J.J. Allport, N.L. Brouwer, R.A. Kramer, Backscatter/transmission X-ray thickness gauge, NDT Int. 20 (1987) 217-223, https://doi.org/10.1016/0308-9126(87)90244-6.
- O. Durand, V. Berger, R. Bisaro, A. Bouchier, A. De Rossi, X. Marcadet, I. Prevot, Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry, Mater. Sci. Semicond. Process. 4 (2001) 327-330, https://doi.org/10.1016/S1369-8001(00)00103-7.
- C. Fiorini, A. Gianoncelli, A. Longoni, F. Zaraga, Determination of the thickness of coatings by means of a new XRF spectrometer, X Ray Spectrom. 31 (2002) 92-99, https://doi.org/10.1002/xrs.550.
- M. Birkholz, Thin Film Analysis by X-Ray Scattering, John Wiley & Sons, Darmstadt, Germany, 2006.
- M. Yasaka, X-ray thin-film measurement techniques, Rigaku J 26 (2010) 1-9.
- H. Okada, M. Shibata, T. Echigo, S. Naka, H. Onnagawa, Film Thickness Measuring Method and Measuring Apparatus for Organic Thin Film for Use in Organic Electroluminesce Device, US6992781B2, 2006.
- Y.S. Choi, J.-Y. Kim, S.B. Yoon, K. Song, Y.J. Kim, Determination of water content in silica nanopowder using wavelength-dispersive X-ray fluorescence spectrometer, Microchem. J. 99 (2011) 332-338, https://doi.org/10.1016/j.microc.2011.06.003.
- J.Y. Kim, Y.S. Choi, Y.J. Park, K. Song, S.H. Jung, E.M.A. Hussein, Thickness measurement of organic films using Compton scattering of characteristic Xrays, Appl. Radiat. Isot. 69 (2011) 1241-1245, https://doi.org/10.1016/j.apradiso.2011.03.048.
- J.A. Bearden, A.F. Burr, Reevaluation of X-ray atomic energy levels, Rev. Mod. Phys. 39 (1967) 125-142, https://doi.org/10.1103/RevModPhys.39.125.
- AMPTEK, X-123CdTe complete X-ray & gamma ray spectrometer, (n.d.). https://www.amptek.com/products/cdte-x-ray-and-gamma-ray-detectors/x123-cdte-complete-x-ray-gamma-ray-spectrometer-with-cdte-detector (accessed August 23, 2020).
- Y.S. Choi, J. Hwang, J.-Y. Kim, On-line and real-time analysis of moisture content in activated carbon powder by X-ray scattering technique, Asian J. Chem. 26 (2014) 4067-4069, https://doi.org/10.14233/ajchem.2014.17715.
- H.A. van Sprang, M.H.J. Bekkers, Determination of light elements using x-ray spectrometry. Part Idanalytical implications of using scattered tube lines, X Ray Spectrom. 27 (1998) 31-36, https://doi.org/10.1002/(SICI)1097-4539(199801/02)27:1<31::AID-XRS245>3.0.CO;2-#.