• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.28 no.9
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• pp.89-98
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• 2014

A diagnostic fluoroscopy X-ray system uses a 32kW or greater X-ray generator for obtaining real-time moving images and high-resolution images. Fluoroscopy X-ray systems have to use a high-capacity AC power source to perform long-time low-power fluoroscopy and short-time high-power spot exposure. In this paper, we propose a hybrid type X-ray generator for fluoroscopy X-ray system which can perform fluoroscopy and spot exposure with a low-capacity AC power source and an energy storage device. The characteristics of energy storage devices are compared and each energy storage device is modelled to equivalent circuit. And the characteristics of available energy are analyzed as a function of output voltage and power. A 32kW class hybrid X-ray generator with EDLC as an energy storage device for fluoroscopy X-ray system was constructed, and its validity was verified by means of simulations and experiments.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.9
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• pp.3517-3523
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• 2010

Single exposure dual X-ray imaging can be used to separate soft and dense-material images for medical and industrial applications. This study keep focusing baggage inspection system(BIS) specifically. New detector modules for single exposure dual X-ray imaging are consisted of low energy detector (LED) and high energy detector (HED). First, the optimized thickness of copper filter coupled HED to separate low energy and high energy was simulated by the given X-ray energy (140 kVp, 1 mA) using Monte Carlo simulation codes, MCNPX. So as a result of simulation, the copper filter thickness is 0.7 mm. For the design of PIN photodiode, ATLAS device simulation tool was used. 16 channels PIN photodiode of 1.5 mm ${\times}$ 3.2 mm for Dual X-ray imaging detector was fabricated in the process of ETRI. And its dark current and quantum efficiency, terminal capacitance were measured. It was proven that the Lanex Fast B coupled HED were a sufficient candidate to replace the CsI(Tl) commerced in dual X-ray system, since these give a strong signal, overcoming system noise. Finally dual X-ray image was acquired through correction of the LED X-ray Image and the HED X-ray Image.

• Journal of Radiation Protection and Research
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• v.40 no.2
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• pp.110-117
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• 2015

Recently, Due to the increased industry using radiation inspection equipment in the semiconductor, this demand of technology research is increasing. Although semiconductor inspection equipment is using low energy X-ray from 40 keV to 120 keV, Studies of radiation damage about the low energy X-ray are lacking circumstance in our country. Therefore, It is study that BJT (bipolar junction transistor) of one type of semiconductor elements are received radiation damage by low energy X-ray. BJT were used to the NXP semiconductor company's BC817-25 (NPN type), and Used the X-ray generator for the irradiation. Radiation damage of BJT was evaluated that confirm to analyse change of collector-emitter voltage of before and after X-ray irradiation when current gain fixed to 10. X-ray generator of tube voltage was setting 40 kVp, 60 kVp, 80 kVp, 100 kVp, 120 kVp and irradiation time was setting 180s, 360s, 540s into 180s intervals. As the result, We confirmed radiation damage in BJT by low energy X-ray under 120 keV energy, and Especially the biggest radiation damage was appeared at the 80 kVp. It is expected that ELDRS (enhanced low dose rate sensitivity) phenomenon occurs on the basis of 80 kVp. This studies expect to contribute effective dose administration of semiconductor inspection equipment using low energy X-ray, Also Research and Development of X-ray filter.

• Journal of Radiation Industry
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• v.9 no.3
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• pp.153-159
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• 2015

Reliability of printed circuit board (PCB), which is based on high integrated circuit technology, is having been important because of development of electric and self-driving car. In order to answer these demand, automated X-ray inspection (AXI) is best solution for PCB non-destructive test. PCB is consist of plastic, copper, and, lead, which have low to high Z-number materials. By using dual energy X-ray imaging, these materials can be inspected accurately and efficiently. Dual energy X-ray imaging, that have the advantage of separating materials, however, need some solution such as energy separation method and enhancing efficiency because PCB has materials that has wide range of Z-number. In this work, we found out several things by analysis of X-ray energy spectrum. Separating between lead and combination of plastic and copper is only possible with energy range not dose. On the other hand, separating between plastic and copper is only with dose not energy range. Moreover the copper filter of high energy part of dual X-ray imaging and 50 kVp of low energy part of dual X-ray imaging is best for efficiency.

• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.600-603
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• 2003

Energy spectrum modulation of X-ray source in digital mammography has been studied. In this study, we calculated various filtered spectra using the scattering data. Primary spectra were generated by Molybdenum (Mo) and Tungsten (W) targets. The materials of added filters are Molybdenum and Rhodium (Rh) for 40 kVp Mo. primary spectrum, the amounts of photons over whole energy ranges are attenuated to 0.43 with 0.03 mm Mo filter and 0.38 with 0.06 mm Mo filter while the photons of energy ranged from 17 keV to 20 keV. The photons of low energy ranged below 17 keV are considerably attenuated. This effect brings out reducing the scattered radiation and dose to the patient, and enhancing subject contrast in the image. The results show that filtered spectra are not seriously affected by X-ray tube loadability. Because the energy range from 17 keV to 20 keV is directly transmitted although low and high energies are mainly filtered.

• Ceramist
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• v.22 no.4
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• pp.402-416
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• 2019

The development of next-generation secondary batteries, including lithium-ion batteries (LIB), requires performance enhancements such as high energy/high power density, low cost, long life, and excellent safety. The discovery of new materials with such requirements is a challenging and time-consuming process with great difficulty. To pursue this challenging endeavor, it is pivotal to understand the structure and interface of electrode materials in a multiscale level at the atomic, molecular, macro-scale during charging / discharging. In this regard, various advanced material characterization tools, including the first-principle calculation, high-resolution electron microscopy, and synchrotron-based X-ray techniques, have been actively employed to understand the charge storage- and degradation-mechanisms of various electrode materials. In this article, we introduce and review recent advances in in-situ synchrotron-based x-ray techniques to study electrode materials for LIBs during thermal degradation and charging/discharging. We show that the fundamental understanding of the structure and interface of the battery materials gained through these advanced in-situ investigations provides valuable insight into designing next-generation electrode materials with significantly improved performance in terms of high energy/high power density, low cost, long life, and excellent safety.

• Nuclear Engineering and Technology
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• v.53 no.4
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• pp.1297-1303
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• 2021

Most thickness measurement techniques using X-ray radiation are unsuitable in field processes involving fast-moving organic films. Herein, we propose a Compton scattering X-ray radiation method, which probes the light elements in organic materials, and a new simple, non-destructive, and non-contact calibration-free real-time film thickness measurement technique by setting up a bench-top X-ray thickness measurement system simulating a field process dealing with thin flexible organic films. The use of X-ray fluorescence and Compton scattering X-ray radiation reflectance signals from films in close contact with a roller produced accurate thickness measurements. In a high-thickness range, the contribution of X-ray fluorescence is negligible, whereas that of Compton scattering is negligible in a low-thickness range. X-ray fluorescence and Compton scattering show good correlations with the organic film thickness (R² = 0.997 and 0.999 for X-ray fluorescence and Compton scattering, respectively, in the thickness range 0-0.5 mm). Although the sensitivity of X-ray fluorescence is approximately 4.6 times higher than that of Compton scattering, Compton scattering signals are useful for thick films (e.g., thicker than ca. 1-5 mm under our present experiment conditions). Thus, successful calibration-free thickness monitoring is possible for fast-moving films, as demonstrated in our experiments.

• Nuclear Engineering and Technology
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• v.54 no.3
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• pp.1062-1070
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• 2022

In the present communication, pure and stable α-Bismuth Oxide (Bi₂O₃) nanoparticles (NPs) were synthesized by low temperature solution combustion method using urea as a fuel and calcined at 500℃. The synthesized sample was characterized by using powder X-ray Diffraction (PXRD), Scanning Electron Microscopy (SEM), Energy dispersive X-ray analysis (EDAX), Transmission Electron Microscopy (TEM), Fourier Transform Infrared Spectroscopy (FTIR) and UV-Visible absorption spectroscopy. The PXRD pattern confirms the formation of mono-clinic, stable and low temperature phase α-Bi₂O₃. The direct optical energy band gap was estimated by using Wood and Tauc's relation which was found to be 2.81 eV. The characterized sample was studied for X-ray/gamma ray shielding properties in the energy range 0.081-1.332 MeV using NaI (Tl) detector and multi channel analyzer (MCA). The measured shielding parameters agrees well with the theory, whereas, slight deviation up to 20% is observed below 356 keV. This deviation is mainly due to the influence of atomic size of the target medium. Furthermore an accurate theory is necessary to explain the interaction of X-ray/gamma ray with the NPs.The present work opens new window to use this facile, economical, efficient, low temperature method to synthesize nanomaterials for X-ray/gamma ray shielding purpose.

• 대한방사선방어학회:학술대회논문집
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• 2011.04a
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• pp.136-137
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• 2011

• Journal of Radiation Protection and Research
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• v.43 no.4
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• pp.137-142
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• 2018

Background: Gamma-ray detectors having a thin window of a material with low atomic number can increase the true coincidence summing effects for radionuclides emitting X-rays or gamma-rays. This effect can make efficiency calibration or spectrum analysis more complicated. In this study, a Cu shield was tested as an X-ray filter to neglect the true coincidence summing effect by X-rays and gamma-rays in gamma-ray spectrometry, in order to simplify gamma-ray energy spectrum analysis. Materials and Methods: A Cu shield was designed and applied to an n-type high-purity germanium detector having an $X-{\gamma}$ summing effect during efficiency calibration. This was tested using a commercial, certified mixed gamma-ray source. The feasibility of a Cu shield was evaluated by comparing efficiency calibration results with and without the shield. Results and Discussion: In this study, the thickness of a Cu shield needed to avoid true coincidence summing effects due to $X-{\gamma}$ was tested and determined to be 1 mm, considering the detection efficiency desired for higher energy. As a result, the accuracy of the detection efficiency calibration was improved by more than 13% by reducing $X-{\gamma}$ summing. Conclusion: The $X-{\gamma}$ summing effect should be considered, along with ${\gamma}-{\gamma}$ summing, when a detection efficiency calibration is implemented and appropriate shielding material can be useful for simplifying analysis of the gamma-ray energy spectra.