• 제목/요약/키워드: Logic circuits

검색결과 530건 처리시간 0.033초

고집적 회로에 대한 고속 경로지연 고장 시뮬레이터 (A High Speed Path Delay Fault Simulator for VLSI)

  • 임용태;강용석;강성호
    • 한국정보처리학회논문지
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    • 제4권1호
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    • pp.298-310
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    • 1997
  • 스캔 환경에 바탕을 둔 대부분의 경로 지연고장 시뮬레이터들은 개선된 스캔 플 립플롭을 사용하며 일반적인 논리 게이트를 대상으로만 동작한다. 본 연구에서는 새 로운 논리값을 사용한 새로운 경로 지연고장 시뮬레이션 알고리즘을 고안하여 이의 적용범위를 CMOS 소자를 포함하는 대규모 집적회로로 확장하였다. 제안된 알고리즘에 기초하여 표준 스캔 환경 하에서 동작하는 고속 지연고장 시뮬레이터를 개발하였다. 실험결과는 새 시뮬레이터가 효율적이며 정확함을 보여준다.

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라디오 데이타 수신 시스템의 디지탈 복조회로 설계와 그의 성능 평가에 관한 연구 (A Study on the Digital Demodulation Circuit Design and its Performance Evaluation of Radio Data Receiver System)

  • 김기근;허동규;김주광;유흥균;배현덕;이종하
    • 한국통신학회논문지
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    • 제16권4호
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    • pp.301-308
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    • 1991
  • 본 연구에서는 라디오 데이타 수신 시스템의 복조 회로를 제안하고, 잡음에 모험된 디지탈 전송 신호의 오차확률을 구하여, 그의 성능을 평가하였다.일반적인 논리회로와 PLL을 이용하여 수신 복조회로를 설계 및 구현하였으며, 이것을 이요 여 라디오 데이터 수신 시스템의 새로운 집적회로 설계가 가능하도록 하였다. 또한 복원된 디지탈 신호의 오율특성을 계산하여 기존의 복조회로와 등가의 성능임을 확인하였다.임을 확인하였다.

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노이즈 성분을 고려한 SRM 센서리스 알고리즘의 강인성 (Robustness of a Sensorless Algorithm for Switched Reluctance Motor Considering Noise)

  • 최재동
    • 전력전자학회:학술대회논문집
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    • 전력전자학회 2000년도 전력전자학술대회 논문집
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    • pp.717-720
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    • 2000
  • The sensorless scheme for Switched Reluctance Motor(SRM) dives must have the robustness and reliability because the noise and error are sensitive. These elements make electrically noisy environments due to the proximity of high current power circuits with small signal electronic circuits when SRM drives. Also the leakage inductances and finite coupling capacitances these can cause the noise on any low voltage current and voltage measurement. the error can occur because the current and voltage including the noise are used as the input of sensorless algorithm In this paper the high robustness and resistance of input noise are described and the fuzzy logic based rotor estimation algorithm is used to reduce the tolerance of input data.

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전류모드 CMOS에 의한 3치 가산기 및 승산기의 구현 (Implementation of Ternary Adder and Multiplier Using Current-Mode CMOS)

  • 성현경
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2006년 학술대회 논문집 정보 및 제어부문
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    • pp.142-144
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    • 2006
  • In this paper, the Ternary adder and multiplier are implemented by current-mode CMOS. First, we implement the ternary T-gate using current-mode CMOS which have an effective availability of integrated circuit design. Second, we implement the circuits to be realized 2-variable ternary addition table and multiplication table over finite fields GF(3) with the ternary T-gates. Finally, these operation circuits are simulated by Spice under $1.5{\mu}m$ CMOS standard technology, $1.5{\mu}m$ unit current, and 3.3V VDD voltage. The simulation results have shown the satisfying current characteristics. The ternary adder and multiplier implemented by current-mode CMOS are simple and regular for wire routing and possess the property of modularity with cell array.

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고온초전도 다층박막 RSFQ 회로를 이용한 균형잡힌 비교기와 델타-시그마 모듈레이터 (Balanced Comparator and Delta-Sigma Modulator with High-Tc Multilayer RSFQ Logic Circuits)

  • 정연욱;김정구
    • 한국초전도학회:학술대회논문집
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    • 한국초전도학회 1999년도 High Temperature Superconductivity Vol.IX
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    • pp.48-53
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    • 1999
  • We demonstrate small-scale high-T$_c$ superconductor RSFQ(Rapid Single Flux Quantum) circuits using multilayer bicrystal technology. An RSFQ balanced comparator is demonstrated with good current resolution, and its operating conditions are discussed in some detail. A single-loop delta-sigma modulator is realized adding a feedback loop to the comparator. The effect of the feedback is confirmed by dc measurement and simulation. A design of an RSFQ toggle flip-flop with the same multilayer bicrystal technology is suggested.

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회로 레벨의 신뢰성 시뮬레이션 및 그 응용 (Circuit-Level Reliability Simulation and Its Applications)

  • 천병식;최창훈;김경호
    • 전자공학회논문지A
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    • 제31A권1호
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    • pp.93-102
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    • 1994
  • This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

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BiCMOS 회로의 고장 검출을 위한 테스트 패턴 생성 (Test Pattern Generation for Detection of faults in BiCMOS Circuits)

  • 신재흥;이병효;김일남;이복용
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 학술대회 논문집 전문대학교육위원
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    • pp.113-116
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    • 2003
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In this paper, proposes a method for efficiently generating test pattern which detect faults in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

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A Digital Signal Processing Circuit Design for Position Sensitive Detectors(PSD), using an FPGA

  • Bongsu Hahn;Park, Changhwan;Park, Kyihwan
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2001년도 ICCAS
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    • pp.107.1-107
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    • 2001
  • In this paper, a digital signal processing circuit for Position Sensitive Detectors(PSDs) is introduced to substitute the conventional analog signal processing circuit and to compensate disadvantages of the PSD. In general, the analog circuits have the problems such as noise accumulation, sensitivity for environmental changes, and high cost for manufacturing. Moreover, the intrinsic nonlinearity problem of the PSD makes it hard to measure the position accurately because it is difficult to be overcome the problem by using the conventional analog circuits, which can be solved by using the digital signal processing circuit. The circuit is implemented by using a Field Programmable Gate Array (FPGA). The Pulse Amplitude Modulation(PAM) method is used for reducing the environmental noise effect, and a linear interpolation logic is used to compensate the ...

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쉬프트레지스터를 사용한 순서논리회로의 간단화에 관하여 (On the Logical Simplification of Sequential Machines using Shift-Registers)

  • 이근영
    • 대한전자공학회논문지
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    • 제15권4호
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    • pp.7-13
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    • 1978
  • 쉬프트레지스터 (SR) 모듈을 기억소자로서 사용하여 순서회로를 실현하는 방법을 논하였다. 종래의 방법은 특수한 조건하에서 SR를 선택하는 것으로서 그것을 구동하는 조합논리회로의 복잡도는 고려되지 않았다. 본 논문은 한 정수치함수를 사용하여 단수가 최소인 SR를 선택하였고 각 SR를 구동하는 조합논리회로의 입력선수를 비교하여 논리회로의 복잡도가 낮은 최적 상태할당을 구하였다.

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A design of 16-bit adiabatic Microprocessor core

  • Youngjoon Shin;Lee, Hanseung;Yong Moon;Lee, Chanho
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제3권4호
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    • pp.194-198
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    • 2003
  • A 16-bit adiabatic low-power Micro-processor core is designed. The processor consists of control block, multi-port register file and ALU. A simplified four-phase clock generator is designed to provide supply clocks for adiabatic processor. All the clock line charge on the capacitive interconnections is recovered to recycle the energy. Adiabatic circuits are designed based on ECRL(efficient charge recovery logic) and $0.35\mu\textrm$ CMOS technology is used. Simulation results show that the power consumption of the adiabatic Microprocessor core is reduced by a factor of 2.9~3.1 compared to that of conventional CMOS Microprocessor