• 제목/요약/키워드: Logic Circuit

검색결과 724건 처리시간 0.027초

라디오 데이타 수신 시스템의 디지탈 복조회로 설계와 그의 성능 평가에 관한 연구 (A Study on the Digital Demodulation Circuit Design and its Performance Evaluation of Radio Data Receiver System)

  • 김기근;허동규;김주광;유흥균;배현덕;이종하
    • 한국통신학회논문지
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    • 제16권4호
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    • pp.301-308
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    • 1991
  • 본 연구에서는 라디오 데이타 수신 시스템의 복조 회로를 제안하고, 잡음에 모험된 디지탈 전송 신호의 오차확률을 구하여, 그의 성능을 평가하였다.일반적인 논리회로와 PLL을 이용하여 수신 복조회로를 설계 및 구현하였으며, 이것을 이요 여 라디오 데이터 수신 시스템의 새로운 집적회로 설계가 가능하도록 하였다. 또한 복원된 디지탈 신호의 오율특성을 계산하여 기존의 복조회로와 등가의 성능임을 확인하였다.임을 확인하였다.

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CMOS 단일칩 마이크로 컴퓨터의 ALU 설계 (ALU Design of CMOS Single Chip Microcomputer)

  • 박용수;류기철;김태경;정호선;이우일
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1987년도 전기.전자공학 학술대회 논문집(II)
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    • pp.1481-1484
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    • 1987
  • The ALU of CMOS microcomputer have been designed with the 3um design rule for CMOS polysilicon gate and Its cells were layed out. The operation of circuits were simulated with EDAS_P. The widths and lengths of gates In the circuit were determined using SPlCE. The carry delay of the ALU was Improved by Manchester carry method. The results of logic and circuit simulation were in good agreement with expected circuit characteristics.

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BiCMOS 회로의 고장 검출을 위한 테스트 패턴 생성 (Test Pattern Generation for Detection of faults in BiCMOS Circuits)

  • 신재흥;이병효;김일남;이복용
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 학술대회 논문집 전문대학교육위원
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    • pp.113-116
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    • 2003
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In this paper, proposes a method for efficiently generating test pattern which detect faults in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

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BiCMOS 회로의 Stuck-Open 고장 검출을 위한테스트 패턴 생성 (Test Pattern Generation for Detection of Sutck-Open Faults in BiCMOS Circuits)

  • 신재홍
    • 전기학회논문지P
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    • 제53권1호
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    • pp.22-27
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    • 2004
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

PDP 모듈의 소음 저감 (Noise Reduction of PDP Module)

  • Park, Sooyong;Lee, Seokyeong;Jaeman Joo;Junghun Kang;Sangkyoung O
    • 한국소음진동공학회:학술대회논문집
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    • 한국소음진동공학회 2002년도 추계학술대회논문초록집
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    • pp.326.2-326
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    • 2002
  • A PDP(Plasma Display Panel) module consists of a discharge panel, a SMPS for power supply, driving boards for panel control, and a logic board. Driving boards supply high voltage pulses to induce glow dischargein the PDP panel. The electrical pulses excite the circuit elements and subsequentlyacoustic noises. The main sources of the noise in the circuit are the transformer of SMPS and the power MOSFET of driving boards, and the heat sinks often amplify the noise level. (omitted)

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범용 제어기의 주변 소자 접속을 최적화하기 위한 전용 제어 회로의 구현 연구 (A study on an implementation of the custom control circuit for optimizing the interface of peripheral devices to general-purpose controllers)

  • 류경식;이태훈;정기현;김용득
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1992년도 한국자동제어학술회의논문집(국내학술편); KOEX, Seoul; 19-21 Oct. 1992
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    • pp.75-80
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    • 1992
  • This paper deals with the design scheme of the custom control circuit for optimizing the interface of peripheral devices to general-purpose controllers for the high speed digital system. When the various peripheral devices such as memory, I/O devices and buffers which operate at low speed are interfaced to the microprocessor which operates at high speed, inserting the proper wait state to the processor is required. The proposed scheme designed with random logic may be applied to the high performance graphic system like the X-terminal. This circuit provides the flexibility and system independancy for the optimum digital system design.

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Si PIN Radiation Sensor with CMOS Readout Circuit

  • Kwon, Yu-Mi;Kang, Hee-Sung;Lee, Jung-Hee;Lee, Yong Soo
    • 센서학회지
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    • 제23권2호
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    • pp.73-81
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    • 2014
  • Silicon PIN diode radiation sensors and CMOS readout circuits were designed and fabricated in this study. The PIN diodes were fabricated using a 380-${\mu}m$-thick 4-inch n+ Si (111) wafer containing a $2-k{\Omega}{\cdot}cm$ n- thin epitaxial layer. CMOS readout circuits employed the driving and signal processes in a radiation sensor were mixed with digital logic and analog input circuits. The primary functions of readout circuits are amplification of sensor signals and the generation of the alarm signals when radiation events occur. The radiation sensors and CMOS readout circuits were fabricated in the Institute of Semiconductor Fusion Technology (ISFT) semiconductor fabrication facilities located in Kyungpook National University. The performance of the readout circuit combined with the Si PIN diode sensor was demonstrated.

자체시험 (Self-Testing) 특성 비교기(Comparator)설계와 응용에 관한 연구 (A Study for Design and Application of Self-Testing Comparator)

  • 정용운;김현기;양성현;이기서
    • 한국철도학회:학술대회논문집
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    • 한국철도학회 1998년도 창립기념 춘계학술대회 논문집
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    • pp.408-418
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    • 1998
  • This paper presents the implementation of comparator which is self-testing with respect to the faults caused by any single physical defect likely to occur in NMOS and CMOS integrated circuit. The goal is to use it for the fault-tolerant system. First, a new fault model for PLA(Programmable Logic Array) is presented. This model reflects several physical defects in VLSI circuits. It focuses on the designs based on PLA because VLSI chips are far too complex to allow detailed analysis of all the possible physical defects that can occur and of the effects on the operation of the circuit. Second, this paper shows that these design, which has been implemented with 2 level AND-ORor NOR-NOR circuit, are optimal in term of size. And it also presents a formal proof that a comparator implemented using NOR-NOR PLA, based on these design, is sol f-testing with respect to most single faults in the presented fault model. Finally, it discusses the application of the self-testing comparator as a building block for the implementation of the fault-tolerant system.

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고속 다이나믹 CMOS PLA의 설계 (Design of High-Speed Dynamic CMOS PLA)

  • 김윤홍;임인칠
    • 전자공학회논문지B
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    • 제28B권11호
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    • pp.859-865
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    • 1991
  • The paper proposes a design of high-speed dynamic CMOS PLA (Programmable Logic Array) which performs stable circuit operation. The race problem which nay occur in a NOR-NOR implementation of PLA is free in the proposed dynamic CMOS PLA by delaying time between the clocks to the AND- and to the OR-planes. The delay element has the same structure as the product line of the longest delay in the AND p`ane. Therefore it is unnecessary to design the delay element or to calculate correct delay time. The correct delay generated by the delay element makes the dynamic CMOS PLA to perform correct and stable circuit operation. Theproposed dynamic CMOS PLA has few variation of switching delay with the increasing number of inputs or outputs in PLA. It is verified by SPICE circuit simulation that the proposed dynamic CMOS PLA has the better performance over existing dynamic CMOS PLA's.

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Field programmable circuit board를 위한 위상 기반 회로 분할 (A topology-based circuit partitioning for field programmable circuit board)

  • 최연경;임종석
    • 전자공학회논문지C
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    • 제34C권2호
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    • pp.38-49
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    • 1997
  • In this paper, w describe partitioning large circuits into multiple chips on the programmable FPCB for rapid prototyping. FPCBs consists of areas for FPGAs for logic and interconnect components, and the routing topology among them are predetermined. In the partition problem for FPCBs, the number of wires ofr routing among chips is fixed, which is an additonal constraints to the conventional partition problem. In order to deal with such aconstraint properly we first define a new partition problem, so called the topologybased partition problem, and then propose a heuristic method. The heuristic method is based on the simulated annealing and clustering technique. The multi-level tree clustering technique is used to obtain faster and better prtition results. In the experimental results for several test circuits, the restrictions for FPCB were all satisfied and the needed execution time was about twice the modified K-way partition method for large circuits.

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