• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 춘계학술대회
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• pp.774-779
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• 2003

Arc-shaped line array slits have been used for the laser generation of focused Lamb waves. The spatially expanded Nd:YAG pulse laser was illuminated through the arc-shaped line array slit on the surface of a sample plate to generate the Lamb waves of the same pattern as the slit. Then the generated Lamb waves were focused at the point of which distance from the slit position is dependent on the curvature of slit arc. The proposed method showed better spatial resolution than the conventional linear array slit in the detection of laser machined linear defect and drill machined circular defect on aluminum plates of 1mm thickness.

• 한국전기전자재료학회논문지
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• 제23권2호
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• pp.128-132
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• 2010

Photonic crystal is dielectric materials or a set of different dielectric materials with periodic structure. Line defect is obtained by leaving out a row of rods along the $\Gamma$-X direction. We showed the change of group velocity in waveguide mode and found resultant small group velocity. Characteristics of the small group velocity were described by electric field distribution. Investigating the phase shift, it is confirmed if small group velocity is positive or negative.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2003년도 신호처리소사이어티 추계학술대회 논문집
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• pp.351-354
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• 2003

To inspect point-defect in LCD pannel, calculate period and eliminated pattern. And then find point-defect to compare block image with each period. First processing, Founded over point defects. To reduce wrong point defect. Next, label point-defects and eliminated not surpass fixed limit-size.

• 한국멀티미디어학회논문지
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• 제13권8호
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• pp.1115-1127
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• 2010

TFT-LCD 생산 과정에서 발생하는 결함을 정확하게 분류하여 결함 유형에 따라 폐기, 사용가능 등의 의사결정을 적절하게 내리는 것은 수율 증가 및 생산성 향상에 필수적인 요소이다. 본 논문에서는 TFT-LCD 생산 라인에서 획득한 결함 영상에 대하여 명암도 분포(intensity distribution) 및 결함 영상의 형태 특징(shape feature)을 분석하여 효과적으로 필름 결함 유형을 분류하는 기법을 제시한다. 본 연구에서는 먼저 필름 결함 영상을 결함 영역과 결함이 아닌 배경 영역으로 이진화하고, 결함 영역에서 결함의 선형성(linearity), 명암도 분포를 고려한 형태 특징 등의 여러 가지 특징을 분석하여 기준 영상(referential image) 데이터베이스를 구축하였으며, 분류하고자 하는 결함 영상과 데이터베이스에 저장된 기준 영상과의 매칭 비용 함수(matching cost function)를 정의하여 적절히 매칭시킴으로써 결함의 유형을 결정하였다. 제시한 기법의 성능을 검증하기 위하여 실제 TFT-LCD 생산 라인에서 획득한 결함 영상들을 대상으로 분류 실험을 수행하였으며, 실험 결과 생산 라인에서 이용할 수 있을 정도의 상당한 수준의 분류 정확도를 달성하였음을 보여주었다.

• 한국정보통신학회논문지
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• 제21권9호
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• pp.1681-1688
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• 2017

본 논문에서는 FPGA와 Nor-Flash를 사용하여 컬러 라인 스캔 카메라를 위한 고속 신호처리 하드웨어 시스템을 구현하였다. 기존의 시스템에서는 소프트웨어를 기반으로 한 고속 DSP가 적용되어 왔고 주로 RGB 개별 논리에 의해 결함을 검출하는 방법이었지만 본 논문에서는 RGB-HSL 변환기, FIFO, HSL 풀-컬러 결함 디코더 및 이미지 프레임 버퍼로 구성된 하드웨어 기반의 결함 검출기를 제안하였다. 결함 검출기는 RGB에서 HSL로의 색상 공간 변환을 위한 하드웨어 기반 룩업테이블과 4K HSL 풀-컬러 결함 디코더로 구성되어 있다. 또한 단일 라인 데이터 기반의 로컬 픽셀 처리 대신 2차원 배열 구조의 이미지 단위 처리를 위해 라인 데이터 축적용 이미지 프레임을 포함한다. 설계된 시스템을 기존의 곡물 선별기에 적용하여 땅콩을 대상으로 선별해 본 결과 효과적임을 알 수 있었다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.1036-1039
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• 2009

We have developed an automated circuit defect repair method. We focused on the resist patterns on the circuit material layer of TFT substrates before the etching process. In this paper, we report on the repair method that utilizes the syringe system and the stability of the open defect repair process.

• International Journal of Precision Engineering and Manufacturing
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• 제7권3호
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• pp.18-23
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• 2006

The formation degree of sustain (ITO pattern) determines the quality of a PDP (Plasma Display Panel). Thus, in the present study, we attempt to detect 100% of the defects that are larger than $30{\mu}m$. Currently, the inspection method in the PDP manufacturing process is dependent upon the naked eye or a microscope in off-line mode. In this study, a prototype inspection system for PDP ITO patterned glass is developed. The developed system, which is based on a line-scan mechanism, obtains information on the defects and sorts the defects by type automatically. The developed inspection system adopts a multi-vision method using slit-beam formation for minimum inspection time and the detection algorithm is embodied in the detection ability. Characteristic defects such as pin holes, substances, and protrusions are extracted using the blob analysis method. Defects such as open, short, spots and others are distinguished by the line type inspection algorithm. It was experimentally verified that the developed inspection system can detect defects with reliability of up to 95% in about 60 seconds for the 42-inch PDP panel.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2003년도 춘계학술대회 논문집
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• pp.191-195
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• 2003

The formation degree of sustain (ITO pattern) decides quality of PDP (plasma display panel). For this reason. it makes efforts in search defects more than 30 ${\mu}{\textrm}{m}$. Now, the existing inspection process is dependent upon naked eye or SEM equipment in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP ITO glass. This system creates information that detects and sorts kind of defect automatically. Design ed inspection technology adopts line-scan method by slip-beam formation for the minimum of inspection time and image processing algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix which draws up an approach to geometry. A characteristic of area-shaped defects, as pin hole, substance, protrusion et al, are extracted from blob analysis method. Defects, as open, short, spots, et al, are distinguished by line type inspection algorithm. In experiment results, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds

• 비파괴검사학회지
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• 제27권3호
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• pp.246-254
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• 2007

The scanning laser source (SLS) technique is a promising new laser ultrasonic tool for the detection of small surface-breaking defects. The SLS approach is based on monitoring the changes in laser-generated ultrasound as a laser source is scanned over a defect. Changes in amplitude and frequency content are observed for ultrasound generated by the laser over uniform and defective areas. The SLS technique uses a point or a short line-focused high-power laser beam which is swept across the test specimen surface and passes over surface-breaking or subsurface flaws. The ultrasonic signal that arrives at the Rayleigh wave speed is monitored as the SLS is scanned. It is found that the amplitude and frequency of the measured ultrasonic signal have specific variations when the laser source approaches, passes over and moves behind the defect. In this paper, the setup for SLS experiments with full B-scan capability is described and SLS signatures from small surface-breaking and subsurface flaws are discussed using a point or short line focused laser source.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2004년도 추계학술대회 논문집
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• pp.585-589
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• 2004

This paper deals with the algorithm development that inspects defects such as Lens Focus, Black Defect, Dim Defect, Color Defect, White Balance, and Line Defect caused by the process of Compact Camera Module (CCM). These days the demand of CCM goes on increasing in various types like PDA, a cellular phone and PC camera every year. However, owing to the defect inspection of CCM by the semiskilled work the average inspection time of CCM takes about 40 to 50 seconds. As time goes by the efficiency takes a sudden turn for the worse because workers must inspect with seeing a monitor directly. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of assembled CCM. The performances of the developed inspection system and its algorithm are tested on many samples. Experimental results reveal that the proposed system can focus the lens of CCM within 5s and we can recognize various types of defect of CCM modules with good accuracy and high speed.