• Title/Summary/Keyword: Lifetime test

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A Study of the Roust Degradation Model by Analyzing the Filament Lamp Degradation Data (헤드램프용 필라멘트 램프 가속열화데이터 분석을 통한 로버스트 열화모형 연구)

  • Sung, Ki-Woo
    • Transactions of the Korean Society of Automotive Engineers
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    • v.20 no.6
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    • pp.132-139
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    • 2012
  • It is generally needed to test durability and lifetime when we develop parts in new technology. In this paper, the accelerated degradation analysis methods are developed to test them. This study is presented robust model estimation method that is less affected by outlier in regresstion model estimation. In addition, the lifetime can be predicted by Degradation-stress relationship in stress level.

Comparisons of Two-Stage Acceptance Life Test Sampling Plans for Exponential Lifetime Distribution

  • Cho, Ho Sung;Seo, Sun Keun
    • Journal of Korean Society for Quality Management
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    • v.20 no.1
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    • pp.22-32
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    • 1992
  • This thesis compares life test acceptance sampling plans under lifetime has an exponential distribution. Various practical considerations may lead a user adopt a two-stage, or double sampling, test procedure. Hewett and Spurrier(1983) provided a survey of two-stage methods, as well as examples of experiments for which a two-stage procedure would be appropriate. The plans are compared in terms of the expected number of failures, and the expected time required to reach a dicision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.

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The Study on the Temperature Distribution for 154kV Power Transformers (154kV 전력용 변압기의 온도분포에 관한 연구)

  • Woo, Jung-Wook;Koo, Kyo-Sun;Kwak, Joo-Sik;Kim, Kyung-Tak;Kweon, Dong-Jin
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.25 no.9
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    • pp.56-61
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    • 2011
  • The temperature of power transformers is very important factor for power system operation in substation because load capacity and limited lifetime of power transformers are determined by winding temperature. Also, The temperature of power transformers varies with the structure, capacity, operation condition and manufacturers. Thus, it is necessary for temperature distribution to be exactly investigated because of efficient load management and prediction of limited lifetime. Nevertheless, there was no case of analysis as well as measurement of the temperature of power transformers. In this paper, we manufactured the 154kV standard power transformer for the test. And we measured the temperature by the heat run test and analyzed the temperature distribution of transformer.

Parametric inference on step-stress accelerated life testing for the extension of exponential distribution under progressive type-II censoring

  • El-Dina, M.M. Mohie;Abu-Youssef, S.E.;Ali, Nahed S.A.;Abd El-Raheem, A.M.
    • Communications for Statistical Applications and Methods
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    • v.23 no.4
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    • pp.269-285
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    • 2016
  • In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

A Study on the Short-Term Deterioration Test Method of MgO in AC PDP (AC PDP 보호막 MgO의 단시간 열화시험방법에 관한 연구)

  • 김윤기;허정은;김영기;이호준;박정후
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.51 no.12
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    • pp.578-583
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    • 2002
  • For ac PDP, the lifetime should be guaranted over, 30000 hours. The lifetime is correlated with the deterioration characteristics for the weakest element in ac PDP. However, the short-term deterioration test method of the at PDP has not well developed. In this paper, a short term deterioration test method of a given element in the ac PDP is proposed. By this method, MgO deterioration characteristics are investigated. The deterioration rate is decreased with MgO thickness but it was almost saturated over 5000$\AA$.

On simple estimation technique for the reliability of exponential lifetime model

  • Al-Hemyari, Z.A.;Al-Saidy, Obaid M.;Al-Ali, A.R.
    • International Journal of Reliability and Applications
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    • v.14 no.2
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    • pp.79-96
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    • 2013
  • Exponential distribution plays a key role in engineering reliability and its applications. The exponential failure model has been studied for years. This article introduces two new preliminary test estimators for the reliability function (R(t)) in complete and censored samples from the exponential model with the use of a prior estimation (${\theta}_0$) of the mean (${\theta}$). The proposed preliminary test estimators are studied and compared numerically with the existing estimators. Computer-intensive calculations for bias and relative efficiency show that for, different values of levels of significance and for varying constants involved in the proposed estimators, the proposed estimators are far better than classical and existing estimators.

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Exponential Lifetime Estimation with Unequal Interval Censoring (불균등 구간검사를 이용한 지수수명시간의 추정)

  • 이태섭;윤상운
    • Journal of Applied Reliability
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    • v.2 no.2
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    • pp.113-119
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    • 2002
  • The estimation of mean lifetimes in presence of interval censoring with replacement procedure are examined when the distributions of lifetimes are exponential. It is assumed that, due to physical restrictions and/or economic constraints, the number of failures is investigated only at several inspection times during the lifetime test. The maximum likelihood estimator is found in an implicit form. The Cramer-Rao lower bounds of the estimates are found in places of variances and by simulations the properties of the estimates are examined.

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A Study on OLED's lifetime at high temperature (OLED소자의 고온에서의 가속 수명에 관한 연구)

  • Choi, Young-Tae;Cho, Jai-Rip
    • Proceedings of the Safety Management and Science Conference
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    • 2008.04a
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    • pp.273-282
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    • 2008
  • To application Arrhenius model for OLED's lifetime, it's needed in high temperature test. Because OLED's character is changed in high temperature, it's important to find limit temperature. We found out $40^{\circ}C$ is proper temperature by result of tests. But that is not enough acceleration to apply in practical affairs. We find new stress to get a bigger accelerated constant.

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A Study on the lifetime Expectation of Dry type Transformer (건식변압기 수명예측에 관한 연구)

  • Kim, Min-Kyu;Lee, Jeong-Gi;Jeong, Ju-Young;Kim, Ik-Soo
    • Proceedings of the KIEE Conference
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    • 2005.07c
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    • pp.2106-2108
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    • 2005
  • This paper describes a method of lifetime expectation for the dry-type molded transformer which is widely used in the domestic distribution system. And the result of the temperature accelerated aging test for the winding insulation and the analyzed report on the reliability are included in this study.

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