• 제목/요약/키워드: Leakage current path

검색결과 43건 처리시간 0.029초

Analysis of Leakage Current Diagnosis According to Online and Offline Conditions (On-Line 및 Off-Line 상태에 따른 누설 전류 진단 분석)

  • Han, Kyung-Chul;Lee, Gyeong-Seop;Choi, Yong-Sung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • 제31권4호
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    • pp.261-266
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    • 2018
  • When the clamp meter approaches the electric path where current is flowing, leakage current can be measured at a distance from the electric current because the induced current increases as the magnitude of the current increases and approaches nearer to the electric path. Therefore, measurements were carried out from a distance to avoid this effect. In addition, the measured values differ depending on the location of the power line that penetrates the ZCT of the clamp meter, thus measurements were performed at a location where this effect was minimized. The fraction of compliant branch circuits, whose leakage current was lower than 1.00 mA, was found to be 69.0% out of the total of 439 branch circuits, while the percentage of compliant branch circuits having an insulation resistance higher than $0.20M{\Omega}$ was found to be 93.2%. The reason why the percentage of compliant branch circuits with low leakage current was low might be due to the inclusion of capacitive leakage current in the total measured leakage current.

Human Hazard by Outdoor Electrical Facilities in Submerged Area (옥외 전기시설물 침수시 누설전류에 의한 인체영향)

  • 하태현;이현구;배정효;김대경
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • 제52권12호
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    • pp.602-607
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    • 2003
  • We show three-dimensional distribution of voltages resulted from the leakage current originated from outdoor electrical facilities in a submerged area. In case these facilities are grounded by the neutral line multiple grounding method, the existence of ungrounded electrical facilities can cause a disastrous effect on near-by passengers. In order to investigate this situation, we installed a real-scale test field for the experiment type I (for the leakage current path between a enclosure grounded electrical facility and another enclosure grounded one), and that for the experiment type II (for the leakage current path between a enclosure grounded electrical facility and another ungrounded one). For both cases, we carried out three-dimensional monitoring of the voltage distribution while varying additional conditions such as the exposure of the underground cables and the finishing of cable connection part. The result shows that a disastrous effect on human safety can arise from the leakage current without a pertinent measure for the construction and maintenance of outdoor electrical facilities.

A Family of Non-Isolated Photovoltaic Grid Connected Inverters without Leakage Current Issues

  • Ji, Baojian;Wang, Jianhua;Hong, Feng;Huang, Shengming
    • Journal of Power Electronics
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    • 제15권4호
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    • pp.920-928
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    • 2015
  • Transformerless solar inverters have a higher efficiency than those with an isolation link. However, they suffer from a leakage current issue. This paper proposes a family of single phase six-switch transformerless inverter topologies with an ac bypass circuit to solve the leakage current problem. These circuits embed two unidirectional freewheeling current units into the midpoint of a full bridge inverter, to obtain a freewheeling current path, which separates the solar panel from the grid in the freewheeling state. The freewheeling current path contains significantly fewer devices and poor performance body diodes are not involved, leading to a higher efficiency. Meanwhile, it is not necessary to add a voltage balancing control method when compared with the half bridge inverter. Simulation and experiments are provided to validate the proposed topologies.

Diagnosis Technique of Surface Aging according to Various Environment Condition for Silicon Polymer Insulator (여러환경조건에 의한 Silicon애자의 표면열화 진단기술)

  • Park, Jae-Jun;Jung, Myeong-Yeon;Lee, Seung-Wook;Kim, Jeong-Boo;Song, Young-Chul;Kim, Hee-Dong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 한국전기전자재료학회 2004년도 춘계학술대회 논문집 방전 플라즈마 유기절연재료 초전도 자성체연구회
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    • pp.76-81
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    • 2004
  • This paper presents the results of spectral analysis of leakage current waveforms on contaminated insulators under various fog and environment conditions(salt fog, clean fog, rain) The larger the leakage current during 200ms, the higer the power spectrum at 60Hz. For almost equal maximum current during 200ms, however, the spectrum at 60hz and the odd order harmonics increase emphatically when discharges occur continuously for several half-waves. If contaminated insulators suffers from high salt-density fog, the leakage current occurs with high crest value intermittently, results in the low spectrum. Analysis of leakage current data showed that this electrical activity was characterized by transient arcing behavior contaminants are deposited on the insulator surface during salt fog tests. This provides a path for the leakage current to flow along the surface of the insulator. It is important to have an indication of the pollution accumulation in order to evulate the test performance of a particular insulator. If the drop in surface resistivity is severe enough, then the leakage current may escalate into s service interrupting flashover that degrade power quality.

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The analysis of leakage current of InGaAsP/InP PBH-LD fabricated by LPE (LPE 방법으로 제작된 InGaAsP/InP PBH-LD의 누설전류해석)

  • 최미숙;김정호;홍창희
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 한국해양정보통신학회 2002년도 추계종합학술대회
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    • pp.481-485
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    • 2002
  • In this study, we fabricated the PBH-LD by meltback method using the LPE. The PBH-LDs are analyzed the leakage current that flows through leakage current path like the p-n diode and p-n-p-n current blocking layer. We observed the variation of threshold current with the leakage width $W_{ι}$. As a consequence, we confirmed that the threshold current became low in the decrease of the leakage width and in the increase of the ratio of specific resistivity of leakage region to active region. We also compared between the calculated threshold current in the absence of leakage region and the measured threshold current in the device. As a result, the ratio of specific resistivity was about 0.5 in the measured LDs, which have the width of a active layer of 1.4${\mu}{\textrm}{m}$ and leakage width of 0.6${\mu}{\textrm}{m}$.

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Implementation of Leakage Monitoring System Using ZigBee (ZigBee를 적용한 누전상태 모니터링시스템 구현)

  • Ju, Jae-han;Na, Seung-kwon
    • Journal of Advanced Navigation Technology
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    • 제21권1호
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    • pp.107-112
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    • 2017
  • In recent years, electric shock accidents due to electric leakage currents of household appliances such as computers, TVs, refrigerators, and LED lights are continuously occurring in homes and industrial buildings. And it is not easy to check the leakage current of each household appliances connected in parallel at the rear end of the module. In addition, the leakage current flowing through the path of the normal current other than the existing current leakage circuit breakers are installed in the distribution box, only the function to cut off the power when the leakage. Therefore, there are various disasters such as electric shock and fire caused by short circuit of household appliances, and the risk of such leakage current is seriously presented. In this paper, we propose a method to implement a leakage monitoring system that can be monitored at all times using Zigbee communication based on IEEE 80215.4, which has advantages in low power and low cost among short range wireless communication systems.

A study on the low power architecture of multi-giga bit synchronous DRAM's (Giga Bit급 저전력 synchronous DRAM 구조에 대한 연구)

  • 유회준;이정우
    • Journal of the Korean Institute of Telematics and Electronics C
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    • 제34C권11호
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    • pp.1-11
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    • 1997
  • The transient current components of the dRAM are analyzed and the sensing current, data path operation current and DC leakage current are revealed to be the major curretn components. It is expected that the supply voltage of less than 1.5V with low VT MOS witll be used in multi-giga bit dRAM. A low voltage dual VT self-timed CMOS logic in which the subthreshold leakage current path is blocked by a large high-VT MOS is proposed. An active signal at each node of the nature speeds up the signal propagation and enables the synchronous DRAM to adopt a fast pipelining scheme. The sensing current can be reduced by adopting 8 bit prefetch scheme with 1.2V VDD. Although the total cycle time for the sequential 8 bit read is the same as that of the 3.3V conventional DRAM, the sensing current is loered to 0.7mA or less than 2.3% of the current of 3.3V conventional DRAM. 4 stage pipeline scheme is used to rduce the power consumption in the 4 giga bit DRAM data path of which length and RC delay amount to 3 cm and 23.3ns, respectively. A simple wave pipeline scheme is used in the data path where 4 sequential data pulses of 5 ns width are concurrently transferred. With the reduction of the supply voltage from 3.3V to 1.2V, the operation current is lowered from 22mA to 2.5mA while the operation speed is enhanced more than 4 times with 6 ns cycle time.

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Effects of Carrier Leakage on Photoluminescence Properties of GaN-based Light-emitting Diodes at Room Temperature

  • Kim, Jongseok;Kim, Seungtaek;Kim, HyungTae;Choi, Won-Jin;Jung, Hyundon
    • Current Optics and Photonics
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    • 제3권2호
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    • pp.164-171
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    • 2019
  • Photoluminescence (PL) properties of GaN-based light-emitting diodes (LEDs) were analyzed to study the effects of carrier leakage on the luminescence properties at room temperature. The electrical leakage and PL properties were compared for LEDs showing leakages at forward bias and an LED with an intentional leakage path formed by connecting a parallel resistance of various values. The leakages at the forward bias, which could be observed from the current-voltage characteristics, resulted in an increase in the excitation laser power density for the maximum PL efficiency (ratio of PL intensity to excitation power) as well as a reduction in the PL intensity. The effect of carrier leakages on PL properties was similar to the change in PL properties owing to a reduction of the photovoltage by a reverse current since the direction of the carrier movement under photoexcitation is identical to that of the reverse current. Valid relations between PL properties and electrical properties were observed as the PL properties deteriorated with an increase in the carrier leakage. The results imply that the PL properties of LED chips can be an indicator of the electrical properties of LEDs.

Low Leakage Current Circular AlGaN/GaN Schottky Barrier Diode (누설전류를 줄이기 위한 원형 AlGaN/GaN 쇼트키 장벽 다이오드)

  • Kim, Min-Ki;Lim, Ji-Yong;Choi, Young-Hwan;Kim, Young-Shil;Seok, O-Gyun;Han, Min-Koo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • 제22권9호
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    • pp.751-755
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    • 2009
  • We proposed circular AlGaN/GaN schottky barrier diode, which has no mesa structure near the current path. Proposed device showed low leakage current of 10 nA/mm at -100 V while that of the rectangular device was 34 nA/mm at the same condition. Proposed circular AIGaN/GaN SBD showed high forward current of 88.61 mA at 3,5 V while that of the conventional device was 14.1 mA at the same condition.

Waveform analysis of leakage current on silicon insulator for various environment condition variation (환경조건변화에 대한 실리콘애자의 누설전류 파형분석)

  • Park, Jae-Jun
    • The Journal of Information Technology
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    • 제7권2호
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    • pp.69-76
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    • 2004
  • This paper presents the results of spectral analysis about waveforms and leakage current waveforms on contaminated silicon insulators under various environment conditions.(salt fog, clean fog, rain). The larger the leakage current during 200ms, the higher the power spectrum at 60Hz. If contaminated insulators suffers from high salt density fog, the leakage current occurs with high crest value intermittently, results in the low spectrum. Analysis of leakage current data showed that this electrical activity was characterized by transient arcing behavior contaminants are deposited on the insulator surface during salt fog tests. This provides a path for the leakage current to flow along the surface of the insulator. It is important to have an indication of the pollution accumulation in order to evaluate the test performance of a particular insulator. If the drop in surface resistivity is severe enough, then the leakage current may escalate into service interrupting flashover that degrade power quality.

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