• Current Optics and Photonics
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• v.7 no.4
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• pp.325-336
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• 2023

We review recent research related to shearing interferometry, reported over the last two decades. Shearing interferometry is categorized as azimuthal, radial, or lateral shearing interferometers by its fundamental principle to generate interference. In this review the research trends for each technique are provided, with a summary of experimental results containing theoretical background, the optical configuration, analysis, and perspective on its application fields.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2000.11a
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• pp.55-59
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• 2000

Nonlinearity is one of the primary causes of error in precision length measurement using laser interferometer. It arises periodically. The periodical nonlinearity usually ranges from sub-naometre to several namertres. In the homodyne interferometer, it results from a number of factors including polarization mixing, imperfect optical clement, unequal gain of detectors, misalignment of axes between input beam and beam splitter. In this paper, we described a method for measuring and compensating the nonlinearity of homodyne interferometer using the elliptical least-square fitting technique associated with electric method and experimental results in one frequency polarization interferometer.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.9
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• pp.171-178
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• 2001

The nonlinearity of a laser interferometer usually ranges from sub-nanometer to several manometers. This nonlinearity, which has periodic characteristics, limits the accuracy of the interferometer at the sub-nanometer level. The nonlinearity error of the one-frequency homodyne interferometer with quadrature fringe detection results from a number of factors including polarization mixing by imperfect optical elements, unequal gain of photo detectors, lack of quadrature between two signals and misalignment. In this paper, we described a method for measuring and compensating the nonlinearity of homodyne interferometer using the elliptical fitting technique with least-square method. Experimental results demonstrate that $^\pm$3.5 nm nonlinearity can be reduced to $^\pm$0.2 nm level.

• Journal of Engineering Education Research
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• v.16 no.2
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• pp.24-30
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• 2013

This paper deals with the measurement theory and technique of linear expansion coefficient for solid material using Michelson interferometer. The Michelson interferometer produces interference fringes by splitting a beam of monochromatic light so that one beam strikes a fixed mirror and the other a movable mirror. When the reflected beams are brought back together, an interference pattern results. Precise distance measurements until a quarter of wave length can be made with the Michelson interferometer by moving the mirror and counting the interference fringes which move by a photo diode. This paper represents the application of Michelson interferometer for measuring infinitesimal length system and shows the measurement method of linear expansion coefficients for various materials like copper, aluminum and iron. the results are good agreement with theoretical value within margin of error for each materials.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.371-374
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• 1995

The real-time holographic interferometer with a digital high-speed camera is applied to the visualization of transient temperature field. Collimated and diffused laser beams are used to the object beam according to the shape and transmittance of the phase object. Also, ESPI(Electronic Speckle Speckle Pattern Interferometer) technique is used to the visualization and quantitatie measurement of slow-varying temperature field. The experimental results obtained form these two techniques are discussed.

• Proceedings of the IEEK Conference
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• 2002.06b
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• pp.87-90
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• 2002

A digital watermark is an invisible mark embedded in a digital image which used for copyright protection. In this paper, we propose a new optical watermarking system. A optical watermarking system is applied for digital watermarking by phase hologram and Mach-Zehnder interferometer. A optical watermarking technique to be hidden is phase modulated in a random patten, and its Fourier-transformed hologram image is superposed on a content image. The autentication information extract by using Mach-zehnder interferometer.

• Proceedings of the IEEK Conference
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• 2002.06a
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• pp.227-230
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• 2002

A digital watermark is an invisible mark embedded in a digital image which used for copyright protection. In this paper, we propose a new optical watermarking system. A optical watermarking system is applied for digital watermarking by phase hologram and Mach-Zehnder interferometer. A optical watermarking technique to be hidden is phase modulated in a random patten, and its Fourier-transformed hologram image is superposed on a content image. The autentication information extract by using Mach-zehnder interferometer.

• Journal of the Korea Institute of Military Science and Technology
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• v.2 no.2
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• pp.157-165
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• 1999

Production and measurement of a super-polished few-ppm-scattering mirror substrate are investigated. In order to improve the surface roughness directly determining scattering, the super-polishing process using Bowl-Feed technique is tried. The surface quality of the super-polished substrate is estimated by the phase-measuring interferometer. For the reliable roughness measurement using the interferometer, data averaging method is applied so that the optimal data averaging condition, 30 phase-data averaging and 20 intensity-data averaging, minimizing the measurement error is experimently searched. Based on the optimal data averaging condition, surface roughness of home-made mirror substrate is measured to be less than $0.5{\AA}$ rms corresponding to 2-ppm total-integrated-scattering.

• Nuclear Engineering and Technology
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• v.45 no.3
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• pp.361-366
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• 2013

An imaging technique to visualize the internal defects in a plate-type nuclear fuel specimen was developed by using an active optical interferometer for a nondestructive quality inspection. A periodic thermal wave having a sinusoidal intensity pattern induced a periodical strain variation for the specimen. The varying strain image was acquired using an optical laser interferometer. The strain distribution over the internal defects will be distorted in an acquired strain image because a part of the thermal wave will be reflected from these defects during propagation. In this paper, internal defects were efficiently visualized by sequentially accumulating the extracted defect components. The experimental results confirmed that the developed visualization system can be a valuable tool to detect the internal defects in plate-type nuclear fuel.

• Current Optics and Photonics
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• v.2 no.5
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• pp.474-481
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• 2018

We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.