A Study on the Si-SiO$_2$ Interface State Characteristics of Nonvolatile SNOS FET Memories using The Charge Pumping Method
(Charge Pumping 방법을 이용한 비휘발성 SNOS FET기억소자의 Si-SiO$_2$ 계면상태 특성에 관한 연구)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 1992.05a
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- pp.82-85
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- 1992