• Title/Summary/Keyword: InGaAs/GaAs

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Effect of Short Circuit Current Enhancement in Solar Cell by Quantum Well Structure and Quantitative Analysis of Elements Using Secondary Ion Mass Spectrometry (양자우물구조에 의한 태양전지 단락전류 증가 효과와 이차이온 질량분석법에 의한 원소 정량 분석)

  • Kim, Junghwan
    • Applied Chemistry for Engineering
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    • v.30 no.4
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    • pp.499-503
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    • 2019
  • Characteristics of solar cells employing a lattice matched GaInP/GaAs quantum well (QW) structure in a single N-AlGaInP/p-InGaP heterojunction (HJ) were investigated and compared to those of solar cells without QW structure. The epitaxial layers were grown on a p-GaAs substrate with $6^{\circ}$ off the (100) plane toward the <111>A. The heterojunction of solar cell consisted of a 400 nm N-AlGaInP, a 590 nm p-GaInP and 14 periods of a 10 nm GaInP/5 nm GaAs for QW structure and a 800 nm p-GaInP for the HJ structure (control cell). The solar cells were characterized after the anti-reflection coating. The short-circuit current density for $1{\times}1mm^2$ area was $9.61mA/cm^2$ for the solar cell with QW structure while $7.06mA/cm^2$ for HJ control cells. Secondary ion mass spectrometry and external quantum efficiency results suggested that the significant enhancement of $J_{sc}$ and EQE was caused by the suppression of recombination by QW structure.

LPE meltaback-etch and re-epitaxy of GaAs/AlGaAs for optical micro-lenses fabrication (광소자용 미소렌즈 제작을 위한 GaAs/AlGaAs계 액상식각 및 에피택시)

  • 함성호;권영세
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.9
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    • pp.64-71
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    • 1997
  • A new etching technique of meltback was investigated for GaAs lensed optical devices with selective windows opending in the LPE (liquid phase epitaxy) system. In the meltback process, the etch depth and the etch shape were controlled by the degree of under-saturation, etch time and other parameters. A GaAs/AlGaAs DH layer was grown on the selectively etched hemispherical well for optical device application such as lensed surface emitting LED. The regrowth process were related with the coolin grate and the well to well spacing. A novel surface emitting LED with hemispherical AlGaAs lens was fabricated using the meltbakc and regrowth as the key process for AlaAs lens array. The light emitting efficiency of the LED was upto three times higher than the similar structure LED without lens. The meltback and regrowth technique was applicable to manufacture the optical device in LPE.

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Observation of Gain Asymmetry in InGaAs/AlGaAs Quantum-Wire Array Structures (InGaAs/AlGaAs V-형 양자선 어레이 구조에서 이득 이방성의 관찰)

  • Kim, Kyoung-Chan;Kim, Tae-Geun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.05a
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    • pp.83-85
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    • 2004
  • MOCVD(metalorganic chemical vapor deposition)에 의해 성장된 InGaAs/AlGaAs 물질을 이용하여 V-형 양자선 (V-groove quantum-wire) 어레이(array) 구조에서 이득 결합(gain-coupling)에 의한 분포 광귀환(distributed optical feedback) 특성을 조사하였다. 분포 귀환형 (distributed feedback, DFB) 구조를 제작하는 동안 격자 재성장(grating overgrowth)을 피하기 위하여, 새롭게 개발된 constant MOCVD 성장 방법을 적용하였고, Bragg 파장에서 DFB 방향으로 광귀환의 결과인 스펙트럼의 이득 이방성(gain asymmetry)을 실험적으로 관찰하였다.

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Studies on the MIMIC Power Amplifier using the AlGaAs/InGaAs/GaAs PHEMT (AlGaAs/InGaAs/GaAs PHEMT를 이용한 MIMIC Power Amplifier 제작 연구)

  • Lee, Seong-Dae;Chae, Yeon-Sik;Yun, Yong-Sun;Yun, Jin-Seop;Lee, Eung-Ho;Lee, Jin-Gu
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.1
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    • pp.30-36
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    • 2001
  • 0.35 ${\mu}{\textrm}{m}$-gate AlGaAs/InGaAs PHEMTs have been fabricated using electron beam lithography. DC and AC characteristics of PHEMTs having different gate widths and number of fingers were measured at various bias conditions. An MIMIC power amplifier operating at 35 GHz has been designed and fabricated using passive element library. The power amplifier showed gain and input reflection coefficient of 7.9 ㏈ and -15 ㏈, respectively, at 27.6 GHz.

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Metalorganic VPE growth of GaInP and related semiconductors for mobile communication device application

  • Udagawa, Takashi
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.11 no.5
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    • pp.207-210
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    • 2001
  • Metal-organic VPE (MOVPE) epitaxial growth procedure and related device fabrication technique are reported for GaInP-based epitaxial materials and devices. For GaInP/GaInAs two-dimensional electron-gas field-effect transistor (TEGFET), a promising epitaxial stacking structure resulting in enhanced electron mobility is given. In conjunction with this, a new device fabrication technique to improve luminous intensity of GaInP-based LED is also shown.

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Photoluminescience propeerties for $CuGaSe_2$ epilayers grown by hot wall epitaxy (Hot Wall Epitaxy(HWE) 법에 의해 성장된 $CuGaSe_2$ 에피레이어의 광발광 특성)

  • Kim, Hyae-Jeong;Hong, Kwang-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.100-101
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    • 2008
  • To obtain the single crystal thin films, $CuGaSe_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were $610^{\circ}C$ and $450^{\circ}C$, respectively. After the as-grown $CuGaSe_2$ single crystal thin films was annealed in Cu-, Se-, and Ga-atmospheres, the origin of point defects of $CuGaSe_2$ single crystal thin films has been investigated by the photoluminescence(PL) at 10 K. The native defects of $V_{CU}$, $V_{Se}$, $Cu_{int}$, and $Se_{int}$ obtained by PL measurements were classified as a donors or acceptors type. And we concluded that the heat-treatment in the Cu-atmosphere converted $CuGaSe_2$ single crystal thin films to an optical n-type. Also, we confirmed that Ga in $CuGaSe_2$/GaAs did not form the native defects because Ga in $CuGaSe_2$ single crystal thin films existed in the form of stable bonds.

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Technical Trends in Next-Generation GaN RF Power Devices and Integrated Circuits (차세대 GaN RF 전력증폭 소자 및 집적회로 기술 동향)

  • Lee, S.H.;Lim, J.W.;Kang, D.M.;Baek, Y.S.
    • Electronics and Telecommunications Trends
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    • v.34 no.5
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    • pp.71-80
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    • 2019
  • Gallium nitride (GaN) can be used in high-voltage, high-power-density/-power, and high-speed devices owing to its characteristics of wide bandgap, high carrier concentration, and high electron mobility/saturation velocity. In this study, we investigate the technology trends for X-/Ku-band GaN RF power devices and MMIC power amplifiers, focusing on gate-length scaling, channel structure, and power density for GaN RF power devices and output power level and output power density for GaN MMIC power amplifiers. Additionally, we review the technology trends in gallium arsenide (GaAs) RF power devices and MMIC power amplifiers and analyze the technology trends in RF power devices and MMIC power amplifiers based on both GaAs and GaN. Furthermore, we discuss the current direction of national research by examining the national and international technology trends with respect to X-/Ku-band power devices and MMIC power amplifiers.

Terahertz Emission by LT-GaAs (LT-GaAs에서 테라헬쯔파 방출)

  • Cho, Shin-Ho
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.11a
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    • pp.78-79
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    • 2005
  • We report on optically excited terahertz (THz) omission from low-temperature (LT) grown GaAs. We have used 70 fs titanium-sapphire laser pulses with wavelengths at 800 nm to generate THz radiation pulses. The LT-GaAs layers are grown on semi-insulating GaAs substrates with GaAs buffer layer by molecular beam epitaxy (MBE). The THz emission from the LT-GaAs surface is strong and does not show any significant variation in the strength of the THz emission over several different angles between the polarization of the excitation laser pulse and the crystallographic orientation of the LT-GaAs.

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Synthesis and Characterization of Gallium Nitride Powders and Nanowires Using Ga(S2CNR2)3(R = CH3, C2H5) Complexes as New Precursors

  • Jung, Woo-Sik;Ra, Choon-Sup;Min, Bong-Ki
    • Bulletin of the Korean Chemical Society
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    • v.26 no.1
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    • pp.131-135
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    • 2005
  • Gallium nitride (GaN) powders and nanowires were prepared by using tris(N,N-dimethyldithiocarbamato)gallium(III) (Ga(DmDTC)$_3$) and tris(N,N-diethyldithiocarbamato)gallium(III) (Ga(DeDTC)$_3$) as new precursors. The GaN powders were obtained by reaction of the complexes with ammonia in the temperature ranging from 500 to 1100 ${^{\circ}C}$. The process of conversion of the complexes to GaN was monitored by their weight loss, XRD, and $^{71}$Ga magic-angle spinning (MAS) NMR spectroscopy. Most likely the complexes decompose to $\gamma$ -Ga$_2$S$_3$ and then turn into GaN via amorphous gallium thionitrides (GaS$_x$N$_y$). The reactivity of Ga(DmDTC)$_3$ with ammonia was a little higher than that of Ga(DeDTC)$_3$. Room-temperature photoluminescence spectra of asprepared GaN powders exhibited the band-edge emission of GaN at 363 nm. GaN nanowires were obtained by nitridation of as-ground $\gamma$ -Ga$_2$S$_3$ powders to GaN powders, followed by sublimation without using templates or catalysts.