• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.287.2-287.2
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• 2016

Silicon has considerably good characteristics on electron, hole mobility and its price. With 2-D sinlge-layer Graphene/n-Si heterojunction solar cell shows that in one sun condition exhibit power conversion efficiency(PCE) of 10.1%. This photovoltaic effect was achieved by applying gate voltage to the Schottky junction of the heterostructure solar cell. Energy band diagram shows that Schottky barrier between Si and graphene can be adjust by the external electric field. because of the fermi level of the graphene can be changed by external gate voltage, we can control the Schottkky barrier of the heterostructure solar cell. The ratio between generated power of solar cell and consumption electrical power is remarkable. Since we use the graphene as the top gate electrode, most of the sun light can penetrate into the active area.

• 대한방사선기술학회지:방사선기술과학
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• 제21권2호
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• pp.11-18
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• 1998

Single phase, narrow beam X-ray attenuation data were obtained using various construction materials concrete, white block, red block, 3 hole block, gypsum board, artificial marble, cement, plate glass, wood, and lead. Tube voltages of 60, 80, 100, 120 kVp were employed and the resulting curves were compared to transmission data found in this report. The shielding methodology and the derivation of equations used for determination of barrier requirements were presented in NCRP 49. We could calculate the X-ray exposed dose after attenuation and thickness of protection barrier in the clinic facilities accordingly. For the purpose of maximizing the benefit/cost ratio to diagnostic shielding, various construction materials must be installed carefully and attnuation rate considered thoroughly.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.263-266
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• 1999

Electrolunlinescent devices based on conjugated polymer emitting materials have been much attracted possible applications for multicolor flat panel display, since the conjugated polymers have a small band gap emitting obtained at a low driving voltage. In this paper, we fabricated the single layer EL device using poly(3-hexylthiophene) as emitting material Electroluminescence(EL) and I-V-L characteristics of indium-tin-oxide[ITO]P3HT/AI device with a various thickness were investigated. It was demonstrate that the I-V characteristics depend, not the voltage but the electric- field strength, The current is dependent on the electric filed and not on the applied voltage, indicating that the carriers are injected by a tunneling process. In the device, the barrier to hole injection is only 0.5eV and the barrier to electron injection is 1.5eV.

• 센서학회지
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• 제17권5호
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• pp.346-349
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• 2008

A metal-semiconductor-metal (MSM) ultraviolet (UV) photodetector (PD) is proposed as an effective UV sensing device for integration with a GaN n-channel MISFET on auto-doped p-type GaN grown on a silicon substrate. Due to the high hole barrier of the metal-p-GaN contact, the dark current density of the fabricated MSM PD was less than $3\;nA/cm^2$ at a bias of up to 5 V. Meanwhile, the UV/visible rejection ratio was 400 and the cutoff wavelength of the spectral responsivity was 365 nm. However, the UV/visible ratio was limited by the sub-bandgap response, which was attributed to defectrelated deep traps in the p-GaN layer of the MSM PD. In conclusion, an MSM PD has a high process compatibility with the n-channel GaN Schottky barrier MISFET fabrication process and epitaxy on a silicon substrate.

• JSTS:Journal of Semiconductor Technology and Science
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• 제4권2호
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• pp.94-99
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• 2004

silicided 50-nm-gate-length n-type Schottky barrier metal-oxide-semiconductor field-effect-transistors (SB-MOSFETs) with 5 nm gate oxide thickness are manufactured. The saturation current is $120{\mu}A/{\mu}m$ and on/off-current ratio is higher than $10^5$ with low leakage current less than $10{\mu}A/{\mu}m$. Novel phenomena of this device are discussed. The increase of tunneling current with the increase of drain voltage is explained using drain induced Schottky barrier thickness thinning effect. The abnormal increase of drain current with the decrease of gate voltage is explained by hole carrier injection from drain into channel. The mechanism of threshold voltage increase in SB-MOSFETs is discussed. Based on the extracted model parameters, the performance of 10-nm-gate-length SB-MOSFETs is predicted. The results show that the subthreshold swing value can be lower than 60 mV/decade.

• 한국전기전자재료학회논문지
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• 제16권5호
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• pp.409-417
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• 2003

We have studied electrical properties and luminous efficiency of organic light-emitting diodes(OLEDs) with different buffer layer and cathodes in a temperature range of 10 K and 300 K. Four different device structures were made. The OLEDs are based on the molecular compounds, N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1'-biphenyl-4,4'-diamine (TPD) as a hole transport, tris(8-hydroxyquinolinato) aluminum(III) (Alq$_3$) as an electron transport and omissive layer, and poly(3,4-ethylenedioxythiophene) :poly (styrenesulfonate) (PEDOT:PSS ) as a buffer layer. And LiAl was used as a cathode. Among the devices, the ITO/PEDOT:PSS/TPD/Alq$_3$/LiAl structure has a low energy-barrier height for charge injection and show a good luminous efficiency. We have got a highly efficient and low-voltage operating device using the conductive PEDOT:PSS and low work-function LiAl. From current-voltage characteristics with temperature variation, conduction mechanisms are explained SCLC (space charge limited current) and tunneling one. We have also studied energy barrier height and luminous efficiency at various temperature.

• Transactions on Electrical and Electronic Materials
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• 제18권4호
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• pp.225-228
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• 2017

In this study, zinc tin oxide (ZTO) films were prepared on indium tin oxide (ITO) glasses and annealed at different temperatures under vacuum to investigate the correlation between the Ohmic/Schottky contacts, electrical properties, and bonding structures with respect to the annealing temperatures. The ZTO film annealed at $150^{\circ}C$ exhibited an amorphous structure because of the electron-hole recombination effect, and the current of the ZTO film annealed at $150^{\circ}C$ was less than that of the other films because of the potential barrier effect at the Schottky contact. The drift current as charge carriers was similar to the leakage current in a transparent thin-film device, but the diffusion current related to the Schottky barrier leads to the decrease in the leakage current. The direction of the diffusion current was opposite to that of the drift current resulting in a two-fold enhancement of the cut-off effect of leakage drift current due to the diffusion current, and improved performance of the device with the Schottky barrier. Hence, the thin film with an amorphous structure easily becomes a Schottky contact.

• 한국광학회지
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• 제3권3호
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• pp.183-190
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• 1992

$Al_x/Ga_{1-x}$ /As/AlAs GaAs 계로 이루어진 비대칭 이중 양자우물 구조의 광학적 특성을 photoluminescence, photoluminescence excitation, time-resolved photoluminescence를 통하여 조사하였다. 양자장벽 AlAs의 두께에 따른 특성 변화를 조사하기 위하여 두께를 15$\AA$., 150$\AA$로 제작하였다. 양자장벽이 15$\AA$인 경우 매우 빠른 전자의 관통 현상을 보여 주었으며, 이로 인해 $Al_x/Ga_{1-x}$As의 여기자 재결합에 해당하는 피크가 관찰되지 않았다. AlAs 양자장벽이 150$\AA$인 경우에는 $Al_x/Ga_{1-x}$As양자우물에서 여기자 재결합에 의한 피크가 50ps 이하로 빠른 decay시간을 보여 주었으며 이것은 양자장벽과의 $\Gamma$-X전이에 의한 것으로 사료되었다. GaAs양자우물에서의 luminescence decay는 두 시료 모두 1ns정도 이었으나, 15$\AA$인 경우에는 약 100ps의 rise시간이 존재하였으며 이것은 정공의 관통에 의한 시간으로 판명되었다.

• Nuclear Engineering and Technology
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• 제54권6호
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• pp.2135-2146
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• 2022

A nuclear energy facility is one of the most critical facilities to be safely protected during and after operation because the physical destruction of its barriers by an external attack could release radioactivity into the environment and can cause harmful effects. The barrier walls of nuclear energy facilities should be sufficiently robust to protect essential facilities from external attack or sabotage. Physical protection system (PPS) vulnerability assessment of a typical small nuclear research reactor was carried out by simulating an external attack with a tri-nitro toluene (TNT) shaped charge and results are presented. The reinforced concrete (RC) barrier wall of the research reactor located at a distance of 50 m from a TNT-shaped charge was the target of external attack. For the purpose of the impact assessment of the RC barrier wall, a finite element method (FEM) is utilized to simulate the destruction condition. The study results showed that a hole-size of diameter 342 mm at the front side and 364 mm at the back side was created on the RC barrier wall as a result of a 143.35 kg TNT-shaped charge. This aperture would be large enough to let at least one person can pass through at a time. For the purpose of the PPS vulnerability assessment, an Estimate of Adversary Sequence Interruption (EASI) model was used, which enabled the determination of most vulnerable path to the target with a probability of interruption equal to 0.43. The study showed that the RC barrier wall is vulnerable to a TNT-shaped charge impact, which could in turn reduce the effectiveness of the PPS.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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• pp.431-434
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• 2008

The physical OLED analog behavioral model for SPICE simulation has been described using Verilog-A language. The model is based on the carrier-balance between the hole and electron injected through Schottky barrier at anode and cathode. The accuracy of this model was examined by comparing with the results from device simulation.