• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.197-197
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• 2010

본 연구에서는 RF/DC dual 마그네트론 스퍼터 시스템을 이용하여 Glass 기판 상에 유기태양전지용 Nb-doped $TiO_2$ (NTO)/Ag/NTO 다층 투명전극을 성막하고 이 다층 투명전극을 $200^{\circ}C{\sim}700^{\circ}C$ 온도 범위에서 급속 열처리 (Rapid Thermal Annealing ; RTA)를 통하여 전기적, 광학적, 구조적 및 표면의 특성 변화를 연구하였다. Hall effect measurement, UV-Vis spectrometer, FESEM 분석을 통하여 다층투명전극의 전기적, 광학적, 표면분석을 하였고 Synchrotron 분석을 통하여 온도에 따른 구조변화를 분석하였다. 상온에서 성막된 다층투명전극은 30nm 두께의 NTO 박막 사이에 얇은 9nm의 얇은 Ag 층을 삽입한 구조로써 10ohm/square 이하의 매우 낮은 면저항과 ${\sim}10^{-5}\;ohm-cm$ 의 비저항, Anti-reflection 효과에 의해 85% 이상의 높은 광투과성을 나타내었다. RTA 온도가 증가함에 따라 전기적, 광학적 특성은 약간 향상되었고 비정질 구조를 유지함을 알 수 있었다. 그러나 높은 온도범위에서는 비정질 구조에서 Anatase 상으로 결정구조가 변화함을 알 수 있었고 전기적, 광학적 특성이 감소됨을 알 수 있었다. NTO/Ag/NTO 다층 투명전극을 유기태양전의 Anode로 적용하여 특성을 비교한 결과 RTA 온도가 증가함에 따라 유기태양전지의 효율 또한 증가하였고 최적화된 온도 조건에서 2.49% 의 높은 효율을 얻을 수 있었다. 이를 통해 우수한 특성을 나타내는 NTO/Ag/NTO 다층투명전극이 기존의 디스플레이 및 태양전지 등의 투명전극 재료로 주로 사용되어 온 ITO (Indium Tin Oxide) 를 대체 할 수 있는 재료로써의 가능성을 제시하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.200.2-200.2
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• 2013

Yttrium (Y)이 도핑 된 ZnO 나노 구조물을 수열합성법으로 제작하였다. 먼저 졸겔법으로 SiO2/Si 기판 위에 seed layer (Y-doped ZnO ; Y0.02Zn0.98O)를 제작하였으며 5번의 코팅을 진행하여 박막의 두께는 약 180 nm로 측정이 되었다. 그 후 진공 분위기에서 RTA를 이용하여 $500^{\circ}C$에서 3분간 열처리가 진행되었다. 이어서 수열합성법으로 mole 농도를 0.5~1.0 M 범위에서 변화시키며 YZO 시료를 제작하였다. X-ray diffraction (XRD)을 통해서 Y2O3 또는 결함과 관련된 피크는 관찰이 되지 않았으며, 모든 구조물에서 압축응력이 존재하는 알 수 있었으며, field emission scanning electron microscope (FESEM)에서 나노 구조물의 크기와 형태는 수열합성법의 mole 농도에 많은 영향을 받는 것으로 나타났다. Hall effect 측정을 통해서 모든 구조물은 n-type 전도 특성을 가지는 것으로 나타났다. 또한 광학적 특성인 photoluminescence (PL)에서는 수열합성법의 화학식을 고려할 때 Zn가 rich한 상태에서는 Zn interstitial로 존재하는 것으로 나타났고, mole 농도가 높아 질수록 free exciton에 의한 재결합인 UV emission이 우세하게 나타났다.

• Korean Journal of Materials Research
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• v.25 no.3
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• pp.125-131
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• 2015

Fluorine-doped $SnO_2$ (FTO) thin film/Ag nanowire (NW) double layers were fabricated by means of spin coating and ultrasonic spray pyrolysis. To investigate the optimum thickness of the FTO thin films when used as protection layer for Ag NWs, the deposition time of the ultrasonic spray pyrolysis process was varied at 0, 1, 3, 5, or 10 min. The structural, chemical, morphological, electrical, and optical properties of the double layers were examined using X-ray diffraction, X-ray photoelectron spectroscopy, field-emission scanning electron microscopy, transmission electron microscopy, the Hall effect measurement system, and UV-Vis spectrophotometry. Although pure Ag NWs formed isolated droplet-shaped Ag particles at an annealing temperature of $300^{\circ}C$, Ag NWs covered by FTO thin films maintained their high-aspect-ratio morphology. As the deposition time of the FTO thin films increased, the electrical and optical properties of the double layers degraded gradually. Therefore, the double layer fabricated with FTO thin films deposited for 1 min exhibited superb sheet resistance (${\sim}14.9{\Omega}/{\Box}$), high optical transmittance (~88.6 %), the best FOM (${\sim}19.9{\times}10^{-3}{\Omega}^{-1}$), and excellent thermal stability at an annealing temperature of $300^{\circ}C$ owing to the good morphology maintenance of the Ag NWs covered by FTO thin films.

• Journal of the Korean Society for Nondestructive Testing
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• v.22 no.1
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• pp.38-44
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• 2002

MFL method is a qualitative inspection tool and is a reliable, fast and economical NDT method. The application of MFL method to the inspection of storage tank floor plates has been shown to be a viable means. Examination of tank floors previously depended primarily upon ultrasonic test methods that required slow and painstaking application. Therefor most ultrasonic inspection of storage tank has been limited to spot testing only. Our NDE group have developed magnetic flux leakage system to overcome limitation of ultrasonic test. The developed system consists of magnetic yoke, array sensor, crawler and software. It is proved that the system is able to detect artificial flaw like 3.2mm diameter, 1.2mm depth in 6mm thick steel plate.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.234-238
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• 2004

A stoichiometric mixture of evaporating materials for $CuInSe_2$ single crystal thin films was prepared from horizontal electric furnace. To obtain the single crystal thin films, $CuInSe_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were $620^{\circ}C$ and $410^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of $CuInSe_2$ single crystal thin films measured with Hall effect by van der Pauw method are $9.62{\times}10^{l6}\;cm^{-3}$ and $296\;cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the $CuInSe_2$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)\;=\;1.1851\;eV\;-\;(8.99{\times}10^{-4}\;eV/K)T^2/(T+153K)$. The crystal field and the spin-orbit splitting energies for the valence band of the $CuInSe_2$ have been estimated to be 0.0087 eV and 0.2329 eV at 10K, respectively, by means of the photocurrent spectra and the Hopfield quasicubic model. These results indicate that the splitting of the ${\Delta}_{so}$ definitely exists in the $\Gamma_6$ states of the valence band of the $CuInSe_2$. The three photocurrent peaks observed at 10K are ascribed to the $A_1-$, $B_1-$, and $C_1$-exciton peaks for n = 1.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.34 no.4
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• pp.256-261
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• 2021

Indium-doped Mg_0.05Zn_0.95O thin films were deposited on glass substrates by a sol-gel method. Three types of indium precursors such as indium chloride, indium acetate, and indium nitrate were used as doping sources. Physical properties of fabricated thin films were analyzed through XRD (x-ray diffraction), UV-vis spectrophotometer, Hall effect measurement, and EDS (energy dispersive x-ray spectroscopy). All In-doped thin films grown in this study exhibited a preferred orientation of (002) with over 80% transmittance. The results showed that the Mg_0.05Zn_0.95O thin film from indium chloride as the indium precursor has higher crystallinity and transmittance with lower resistivity when compared with those from other indium precursors.

• The Journal of the Korea Contents Association
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• v.21 no.3
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• pp.194-204
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• 2021

The purposes of the study were two-folded: to identify visitors' motivations for the history-based dark tourism and to test empirically the relationships among visitors' motivations, authenticity, emotion, satisfaction and attitude change. The online survey was conducted, from August 3rd to 20th of 2020, on visitors over 15 years old with previous experience with dark tourism within last three years. 347 individuals responded to the online survey. The study results were as follows: first, among four dark tourism visiting motivation including, motivation to research, historicalness, deviation, and self-examination, first two variables motivation to research and historicalness showed positive effect on authenticity and emotion. Second, the study found that visitors' satisfaction influenced positively towards attitude change. Finally, authenticity and emotion positively influenced attitude change. This study empirically suggests a change in attitude toward history due to the dark tour. Since historicality has been shown to have a significant influence on the attitude of history through authenticity and emotion, it is necessary to strengthen story-based experience programs at historical sites.

• Journal of the Korean Geosynthetics Society
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• v.21 no.3
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• pp.29-39
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• 2022

The engineering characteristics of synthetic polymer-silica sol, which has the effect of reducing leakage, was evaluate and compared with typical grouting material, the water glass-based SGR injection material in this study. The result of the laboratory tests on strength and durability about the synthetic polymer-silica sol showed more than twice as high as LW-based injection materials in uniaxial compressive strength, significantly lower values in shrinkage rate and permeability. The result of pH was less than 8.5 (the drinking water quality standard). As a result of the leaching test, the Na₂O elution amount of the synthetic polymer-silica sol was measured to be 3 to 4 times smaller than that of the water glass grout. These results be assumed that the synthetic polymer-silica sol has better durability and permeability than those of the typical water glass-based grout.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2001.11a
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• pp.68-68
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• 2001

Thin films of polycrystalline silicon (poly-Si) is a promising material for use in large-area electronic devices. Especially, the poly-Si can be used in high resolution and integrated active-matrix liquid-crystal displays (AMLCDs) and active matrix organic light-emitting diodes (AMOLEDs) because of its high mobility compared to hydrogenated _amorphous silicon (a-Si:H). A number of techniques have been proposed during the past several years to achieve poly-Si on large-area glass substrate. However, the conventional method for fabrication of poly-Si could not apply for glass instead of wafer or quartz substrate. Because the conventional method, low pressure chemical vapor deposition (LPCVD) has a high deposition temperature ($600^{\circ}C-1000^{\circ}C$) and solid phase crystallization (SPC) has a high annealing temperature ($600^{\circ}C-700^{\circ}C$). And also these are required time-consuming processes, which are too long to prevent the thermal damage of corning glass such as bending and fracture. The deposition of silicon thin films on low-cost foreign substrates has recently become a major objective in the search for processes having energy consumption and reaching a better cost evaluation. Hence, combining inexpensive deposition techniques with the growth of crystalline silicon seems to be a straightforward way of ensuring reduced production costs of large-area electronic devices. We have deposited crystalline poly-Si thin films on soda -lime glass and SiOz glass substrate as deposited by PVD at low substrate temperature using high power, magnetron sputtering method. The epitaxial orientation, microstructual characteristics and surface properties of the films were analyzed by TEM, XRD, and AFM. For the electrical characterization of these films, its properties were obtained from the Hall effect measurement by the Van der Pauw measurement.

• Proceedings of the Materials Research Society of Korea Conference
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• 2003.03a
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• pp.83-83
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• 2003

The stochiometric mix of evaporating materials for the CuInSe$_2$ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, CuInSe$_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were 62$0^{\circ}C$ and 41$0^{\circ}C$, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of CuInSe$_2$ single crystal thin films measured from Hall effect by van der Pauw method are 9.62$\times$10$^{16}$ cm$^{-3}$ , 296 $\textrm{cm}^2$/V.s at 293 K, respectively From the photocurrent spectrum by illumination of perpendicular light on the c-axis of the CuInSe$_2$ single crystal thin film, we have found that the values of spin orbit splitting ΔSo and the crystal field splitting ΔCr were 6.1 meV and 175.2 meV at 10 K, respectively. From the photoluminescence measurement on CuInSe$_2$ single crystal thin film, we observed free excition (Ex) existing only high quality crystal and neutral bound exiciton (D$^{\circ}$,X) having very strong peak intensity. Then, the full-width-at -half-maximum(FWHM) and binding energy of neutral donor bound excition were 7 meV and 5.9 meV, respectivity. By Haynes rule, an activation energy of impurity was 59 meV.