• Title/Summary/Keyword: HBT

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Monolithic SiGe HBT Feedforward Variable Gain Amplifiers for 5 GHz Applications

  • Kim, Chang-Woo
    • ETRI Journal
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    • v.28 no.3
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    • pp.386-388
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    • 2006
  • Monolithic SiGe heterojunction bipolar transistor (HBT) variable gain amplifiers (VGAs) with a feedforward configuration have been newly developed for 5 GHz applications. Two types of the feedforward VGAs have been made: one using a coupled-emitter resistor and the other using an HBT-based current source. At 5.2 GHz, both of the VGAs achieve a dynamic gain-control range of 23 dB with a control-voltage range from 0.4 to 2.6 V. The gain-tuning sensitivity is 90 mV/dB. At $V_{CTRL}$= 2.4 V, the 1 dB compression output power, $P_{1-dB}$, and dc bias current are 0 dBm and 59 mA in a VGA with an emitter resistor and -1.8 dBm and 71mA in a VGA with a constant current source, respectively.

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VBIC Model Application and Parameter Extraction and Optimization for SiGe HBT

  • Lee, Sang-Heung;Park, Chan-Woo;Lee, Seung-Yun;Lee, Ja-Yol;Kang, Jin-Yeong
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.28 no.8A
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    • pp.650-656
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    • 2003
  • In 1995, a group of representatives from the integrated circuits and computer-aided design industries presented a industry standard bipolar model called the VBIC model. The VBIC model includes the improved Early effect, quasi-saturation, substrate parasitic, avalanche multiplication, and self-heating which are not available in the conventional SGP model. This paper applies VBIC model for SiGe HBT device and develops an accurate and efficient methodology to extract all the DC and AC parameters of the VBIC model for SiGe HBT device at room temperature. Simulated results by the extracted VBIC model parameter are compared with the measurement data and show very good agreement in both DC and s-parameters prediction.

A Wideband H-Band Image Detector Based on SiGe HBT Technology

  • Yoon, Daekeun;Kaynak, Mehmet;Tillack, Bernd;Rieh, Jae-Sung
    • Journal of electromagnetic engineering and science
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    • v.15 no.1
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    • pp.59-61
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    • 2015
  • A wideband H-band detector operating near 300 GHz has been developed based on SiGe HBT technology. The detector consists of an on-chip antenna and a HBT differential pair for square-law detection. It showed responsivity of more than 1,700 V/W and noise equivalent power (NEP) smaller than $180pW/Hz^{0.5}$ for the measured frequency range of 250-350 GHz. The maximum responsivity and the minimum NEP were 5,155 V/W and $57pW/Hz^{0.5}$, respectively; both were obtained at 330 GHz with DC power dissipation at 9.1 W.

Degradation of the SiGe hetero-junction bipolar transistor in SiGe BiCMOS process (실리콘-게르마늄 바이시모스 공정에서의 실리콘-게르마늄 이종접합 바이폴라 트랜지스터 열화 현상)

  • Kim Sang-Hoon;Lee Seung-Yun;Park Chan-Woo;Kang Jin-Young
    • Journal of the Korean Vacuum Society
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    • v.14 no.1
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    • pp.29-34
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    • 2005
  • The degradation of the SiGe hetero-junction bipolar transistor(HBT) properties in SiGe BiCMOS process was investigated in this paper. The SiGe HBT prepaired by SiGe BiCMOS process, unlike the conventional one, showed the degraded DC characteristics such as the decreased Early voltage, the decreased collector-emitter breakdown voltage, and the highly increased base leakage current. Also, the cutoff frequency(f/sub T/) and the maximum oscillation frequency(f/sub max/) representing the AC characteristics are reduced to below 50%. These deteriorations are originated from the change of the locations of emitter-base and collector-base junctions, which is induced by the variation of the doping profile of boron in the SiGe base due to the high-temperature source-drain annealing. In the result, the junctions pushed out of SiGe region caused the parastic barrier formation and the current gain decrease on the SiGe HBT device.

(AlGaAs/GaAs HBT IC Chipset for 10Gbit/s Optical Receiver) (10Gbit/s 광수신기용 AlGaAs/GaAs HBT IC 칩 셋)

  • 송재호;유태환;박창수;곽봉신
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.36C no.4
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    • pp.45-53
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    • 1999
  • A pre amplifier, a limiting amplifier, and a decision IC chipset for 10Gbit/s optical receiver was implemented with AIGaAs/GaAs HBT(Heterojunction Bipolar Transistor) technology. The HBT allows a cutoff frequency of 55GHz and a maximum oscillation of 45GHz. An optical receiver front-end was implemented with the fabricated pre amplifier IC and a PIN photodiode. It showed 46dB$\Omega$, gain and $f_{3db}$ of 12.3GHz. The limiting amplifier Ie showed 27dB small signal gain, $f_{3db}$ of 1O.6GHz, and the output is limited to 900mVp-p from 20mVp-p input voltage. The decision circuit IC showed 300-degree phase margin and input voltage sensitivity of 47mVp-p at 1OGbit/s.

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Explosion Properties and Thermal Stability of Reactive Organic Dust (반응성 유기물 분진의 폭발특성과 열안정성)

  • Han, Ou-Sup;Han, In-Soo;Choi, Yi-Rac;Lee, Keun-Won
    • Journal of the Korean Institute of Gas
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    • v.15 no.4
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    • pp.7-14
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    • 2011
  • Using 20 L spherical explosion vessel and differential scanning calorimeter (DSC), an experimental investigation was carried on explosion characteristics and thermal decomposition of some reactive organic dust. As the result, the minimum explosion concentration of Benzoyl peroxide (BPO), Phthalic anhydride (PA) and 1-Hydroxybenzotriazol (HBT) exist between 10 and 15 g/$m^3$, which indicates that their explosion sensitivity are high. The maximum Kst values of HBT, PA and 97 % BPO are 251, 146 and 80 [$bar{\cdot}m/s$], respectively and the explosion severity of HBT is the explosion class of St-2. The flame velocity was also calculated from the combustion time of dust and flame arrival time to estimate the flame propagation characteristics in a closed vessel. The decomposition temperature and heat of decomposition reaction for 97 % BPO and HBT are $107^{\circ}C$ (1025 J/g), $214^{\circ}C$ (1666 J/g), respectively and it was found that these low decomposition temperature and high released heat affect the explosion characteristics.

Pd/Si-based Emitter Ohmic Contacts for AlGaAs/GaAs HBTs (AlGaAs/GaAs HBT 에미터 전극용 Pd/Si계 오믹 접촉)

  • 김일호
    • Journal of the Korean Vacuum Society
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    • v.12 no.4
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    • pp.218-227
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    • 2003
  • Pd/Si/Ti/Pt and Pd/Si/Pd/Ti/Au ohmic contacts to n-type InCaAs were investigated for applications to AlGaAs/GaAs HBT emitter ohmic contacts. In the Pd/Si/Ti/Pt ohmic contact, as-deposited contact showed non-ohmic behavior, and high specific contact resistivity of $5\times10^{-3}\Omega\textrm{cm}^2$ was achieved by rapid thermal annealing at $375^{\circ}C$/10 sec. However, the specific contact resistivity decreased remarkably to $2\times10^{-6}\Omega\textrm{cm}^2$ by annealing at $425^{\circ}C$/10sec. In the Pd/Si/Pd/Ti/Au ohmic contact, minimum specific contact resistivity of $3.9\times10^{-7}\Omega\textrm{cm}^2$ was achieved by annealing at $400^{\circ}C$/20sec. In both ohmic contacts, low contact resistivity and non-spiking planar interface between ohmic materials and InGaAs were maintained. Therefore, these thermally stable ohmic contact systems are promising candidates for compound semiconductor devices. RF performance of the AlGaAs/GaAs HBT was also examined by employing the Pd/Si/Ti/Pt and Pd/Si/Pd/Ti/Au systems as emitter ohmic contacts. Cutoff frequencies were 63.9 ㎓ and 74.4 ㎓, respectively, and maximum oscillation frequencies were 50.1 ㎓ and 52.5 ㎓, respectively. It shows very successful high frequency operations.