• Proceedings of the Korean Institute of Navigation and Port Research Conference
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• 2002.03a
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• pp.13-19
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• 2002

In inner harbour of Inchon Port, there are two lock gates (50KT, 10KT) which have two gates per lock gate in inner/outer sides except a gate in inner harbour side 7f 10KT. Due to the lack of the fore-mentioned gate, the use of 10KT lock gate Is suspended in every 3 years for regular maintenance. Now an additional gate is under construction in order to improve the efficiency of the 10KT lock gate. This paper will be aimed to evaluate the operational utilization levels of lock gates in present and future. The present operational utilization levels of lock gates are 0.2119 in 10KT lock gate, 0.2051 in 50KT lock gate which were considered the 46.5 closed days every 3 years for 10KT regular maintenance. The levels are estimated to 0.2246(10KT), 0.2539(50KT) in 2006 and 0.2241(10KT), 0.2560(50KT) in 2011. The levels of 50KT lock gate are evaluated to be more rapidly increased up to 24.5% in 2011.

• Proceedings of the KIEE Conference
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• 1987.11a
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• pp.193-196
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• 1987

We reported that hot electron phenomena in submicron nMOSFET by Monte Carlo method. In order to predict the influence of the hot electron effects on the device reliability, either simple analytical model or a complete two dimensional numerical simulation has been adopted. Results of numerical simulation, based on the static mobility model, may be inaccurate when gate length of MOSFET is scaled down to less than 1um. Most of device simulation packages utilize the static nobility model. Monte Carlo method based on stochastic analysis of carrier movement may be a powerful tool to characterize hot electrons. In this work, energy and velocity distribution of carriers were obtained to predict the relative degree of short channel effects for different device parameters. Our analysis shows a few interesting results when $V_{ds}$ is 5 volt, average electron energy does not increase with gate bias as evidenced by substrate current.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.16 no.7
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• pp.4411-4417
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• 2015

The proper design of the gate location for injection molding of plastic goods is obtained from three-dimensional injection molding analysis for various design alternatives. This paper is study on effect of gate location in injection molding. It have a decisive impact on productivity and quality of plastic goods. This objectives of this paper is to analysis effect of hot runner gate location for resin filling, weld line, injection pressure to manufacture of automobile air cleaner upper case with injection molding machine. Thus, to analysis these problems in this paper, location of gate are gave variety in 4 CASEs. In this paper, the CAE simulation considering each variations in location of gate is performed to predict the cause of faulty which appears in the injection molding process.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.4 s.346
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• pp.23-30
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• 2006

This paper describes the short-channel effect(SCE), corner effect of nano-scale MuGFETs(Multiple-Gate FETs) by three-dimensional simulation. We can extract the equivalent gate number of MuGFETs(Double-gate=2, Tri-gate=3, Pi-gate=3.14, Omega-gate=3.4, GAA=4) by threshold voltage model. Using the extracted gate number(n) we can calculate the natural length for each gate devices. We established a scaling theory for MuGFETs, which gives a optimization to avoid short channel effects for the device structure(silicon thickness, gate oxide thickness). It is observed that the comer effects decrease with the reduction of doping concentration and gate oxide thickness when the radius of curvature is larger than 17 % of the channel width.

• Journal of IKEEE
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• v.25 no.2
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• pp.381-387
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• 2021

As Head-Mounted Displays(HMDs), which are mainly used to maximize realism in games and videos, have experienced increased demand and expanded scope of use in education and training, there is growing interest in methods to enhance the performance of conventional HMDs. In this study, a methodology to utilize Carbon NanoTubes(CNTs) to improve the performance of gate drivers that send control signals to each pixel circuit of the HMD is discussed. This paper proposes a new circuit design method that replaces the transistors constituting the buffer part of the conventional gate driver with transistors incorporating CNTs and compare the performance of the suggested gate drive with that of a gate driver comprising only conventional transistors via simulations. According to the simulation results, by including CNTs in the gate driver, the output voltage can be increased by approximately 0.3V compared to the conventional gate driver high voltage(1.1V) at a speed of 12.5 GHz and the gate width also can be reduced by up to 20 times.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.723-726
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• 1998

Fault dropping is a very important part of test generation process. It is used to reduce test generation time. Test generation systems use fault simulation for the purpose of fault dropping by identifying detectable faults with generated test patterns. Two kinds of delay fault model is used in practice, path delay fault model and gate delay fault model. In this paper we propose an efficient method for gate delay test generation which shares second test vector.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.59 no.9
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• pp.1611-1614
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• 2010

The explosion of a nuclear weapon radiates a gamma-ray in the form of a transient pulse. If the gamma-ray introduces to semiconductor devices, much Electron-Hole Pairs(EHPs) are generated in depletion region of the devices[7]. as a consequence of that, high photocurrent is created and causes upset, latchup and burnout of semiconductor devices[8]. This phenomenon is known for Transient Radiation Effects on Electronics(TREE), also called dose-rate effects. In this paper 3D structure of inverter and NAND gate device was designed and transient pulse gamma-ray was modeled. So simulation for transient radiation effect on inverter and NAND gate was accomplished and mechanism for upset and latchup was analyzed.

• Proceedings of the KIEE Conference
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• 1994.07a
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• pp.237-239
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• 1994

The MOS-controlled thyristor(MCT) is a new power semi-conductor device that combines four layers thyristor structure presenting regenerative action and MOS-gate providing controlled turn-on and turn-off. The MCT has very fast switching speed owing to voltage controlled MOS-gate, and very low on-state voltage drop resulting from regenerative action of four layers thyristor structure. In addition, because of a higher dv/dt rating and di/dt rating, gate drive circuit and snubber circuit can be simpler comparing to other power switching devices. So recently much interest and endeavor is being applied to develop the performance and ratings of the MCT. This paper describes the switching characteristic of the MCT for its practical applications and presents a model for PSPICE circuit simulation. The model for PSPICE circuit simulation is compared to the experimental result using MCTV75P60F1 made by Harris co..

• ETRI Journal
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• v.32 no.4
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• pp.530-539
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• 2010

As the conventional silicon metal-oxide-semiconductor field-effect transistor (MOSFET) approaches its scaling limits, quantum mechanical effects are expected to become more and more important. Accurate quantum transport simulators are required to explore the essential device physics as a design aid. However, because of the complexity of the analysis, it has been necessary to simulate the quantum mechanical model with high speed and accuracy. In this paper, the modeling of double gate MOSFET based on an adaptive neuro-fuzzy inference system (ANFIS) is presented. The ANFIS model reduces the computational time while keeping the accuracy of physics-based models, like non-equilibrium Green's function formalism. Finally, we import the ANFIS model into the circuit simulator software as a subcircuit. The results show that the compact model based on ANFIS is an efficient tool for the simulation of nanoscale circuits.

• Journal of Sensor Science and Technology
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• v.24 no.5
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• pp.353-357
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• 2015

A new SPICE-compatible model for a gate/body-tied PMOSFET photodetector (GBT PD) with an overlapping control gate is presented. The proposed SPICE-compatible model of a GBT PD with an overlapping control gate makes it possible to control the photocurrent. Research into GBT PD modeling was proposed previously. However, the analysis and simulation of GBT PDs is not lacking. This SPICE model concurs with the measurement results, and it is simpler than previous models. The general GBT PD model is a hybrid device composed of a MOSFET, a lateral bipolar junction transistor (BJT), and a vertical BJT. Conventional SPICE models are based on complete depletion approximation, which is more applicable to reverse-biased p-n junctions; therefore, they are not appropriate for simulating circuits that are implemented with a GBT PD with an overlapping control gate. The GBT PD with an overlapping control gate can control the sensitivity of the photodetector. The proposed sensor is fabricated using a $0.35{\mu}m$ two-poly, four-metal standard complementary MOS (CMOS) process, and its characteristics are evaluated.