• Title/Summary/Keyword: Functional Testing

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Content Validity for a New Korean Version of Pediatric Functional Muscle Testing (한국형 소아 기능근력검사의 개발을 위한 내용타당도 검증)

  • Seo, Hye-Jung;Kim, Joong-Hwi
    • Journal of the Korean Society of Physical Medicine
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    • v.11 no.2
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    • pp.103-114
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    • 2016
  • PURPOSE: The purpose of this study was first to develop a Korean version of pediatric functional muscle testing for children with a motor developmental disorder who have a communication problem and who are aged below five years, and also to verify the content validity. METHODS: First, the preliminary study was conducted to verify the reliability of pediatric functional muscle testing, developed by Venita in Korea. Based on the results of the study, the primary evaluation items were selected and modified. Second, the first test of content validity was conducted through a panel discussion, and a second investigation of content validity was carried out by utilizing the Item Content Validity Index (I-CVI). In this study, we selected only 0.78 or more items from I-CVI. RESULTS: Based on the results of the preliminary study, 19 primary evaluation items were selected. Based on the results of the first and second content validity tests, 15 tertiary evaluation items for the Korean version of pediatric functional muscle testing were determined. CONCLUSION: This study developed a new Korean version of pediatric functional muscle testing and suggested that it will be a useful tool to measure muscle strength for Korean children with a motor developmental disorder and a communication problem, aged below five years.

A study on behavioral analysis and efficient test algorithm for memory with resistive short and open defects (저항성 단락과 개방 결함을 갖는 메모리에 대한 동작분석과 효율적인 테스트 알고리즘에 관한 연구)

  • 김대익;배성환;이상태;이창기;전병실
    • Journal of the Korean Institute of Telematics and Electronics B
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    • v.33B no.7
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    • pp.70-79
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    • 1996
  • To increase the functionality of the memories, previous studies have deifned faults models and proposed functional testing algorithms with low complexity. Although conventional testing depended strongly on functional (voltage) testing method, it couldn't detect short and open defects caused by gate oxide short and spot defect which can afect memory reliability. Therefore, IDDQ (quiescent power supply current) testing is required to detect defects and thus can obtain high reliability. In this paper, we consider resistive shorts on gate-source, gate-drain, and drain-source as well as opens in mOS FET and observe behavior of the memory by analyzing voltage at storge nodes of the memory and IDDQ resulting from PSPICE simulation. Finally, using this behavioral analysis, we propose a linear testing algorithm of complexity O(N) which can be applicable to both functional testing and IDDQ testing simultaneously to obtain high functionality and reliability.

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Classical testing based on B-splines in functional linear models (함수형 선형모형에서의 B-스플라인에 기초한 검정)

  • Sohn, Jihoon;Lee, Eun Ryung
    • The Korean Journal of Applied Statistics
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    • v.32 no.4
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    • pp.607-618
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    • 2019
  • A new and interesting task in statistics is to effectively analyze functional data that frequently comes from advances in modern science and technology in areas such as meteorology and biomedical sciences. Functional linear regression with scalar response is a popular functional data analysis technique and it is often a common problem to determine a functional association if a functional predictor variable affects the scalar response in the models. Recently, Kong et al. (Journal of Nonparametric Statistics, 28, 813-838, 2016) established classical testing methods for this based on functional principal component analysis (of the functional predictor), that is, the resulting eigenfunctions (as a basis). However, the eigenbasis functions are not generally suitable for regression purpose because they are only concerned with the variability of the functional predictor, not the functional association of interest in testing problems. Additionally, eigenfunctions are to be estimated from data so that estimation errors might be involved in the performance of testing procedures. To circumvent these issues, we propose a testing method based on fixed basis such as B-splines and show that it works well via simulations. It is also illustrated via simulated and real data examples that the proposed testing method provides more effective and intuitive results due to the localization properties of B-splines.

Functional Testing Techniques for Concurrency Control in Transaction Processing Systems (트랜잭션 처리 시스템을 위한 동시성 제어의 기능시험 기법)

  • 홍석희
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.7 no.4
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    • pp.805-811
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    • 2003
  • System test is an important factor in the development process of good quality complex software in time, ensuring user requirements. Transaction processing module of database management systems schedules multiple transactions effectively and ensures that each transaction preserves data consistency. In this paper, we propose automatic functional testing techniques which ensure systematically that the implemented concurrency control function confirms to its requirements. The proposed testing technique tests functions of concurrency control module based on scenario without user intervention, and displays the result of functional testing. Finally, we utilize the proposed functional testing technique in the testing process of a database management system.

New Scan Design for Delay Fault Testing of Sequential Circuits (순차 회로의 지연 고장 검출을 위한 새로운 스캔 설계)

  • 허경회;강용석;강성호
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.48 no.9
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    • pp.1161-1166
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    • 1999
  • Delay testing has become highlighted in the field of digital circuits as the speed and the density of the circuits improve greatly. However, delay faults in sequential circuits cannot be detected easily due to the existence of state registers. To overcome this difficulty a new scan filp-flop is devised which can be used for both stuck-at testing and delay testing. In addition, the new scan flip-flop can be applied to both the existing functional justification method and the newly-developed reverse functional justification method which uses scan flip-flops as storing the second test patterns rather than the first test patterns. Experimental results on ISCAS 89 benchmark circuits show that the number of testable paths can be increased by about 10% on the average.

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Testing System for Automotive Software Using a General Purpose Development Board (범용 개발 보드를 이용한 차량용 소프트웨어 테스트 시스템 개발)

  • Kum, DaeHyun;Hong, JaeSeung;Jin, SungHo;Cho, JeongHun
    • IEMEK Journal of Embedded Systems and Applications
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    • v.7 no.1
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    • pp.17-24
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    • 2012
  • Recently automotive software has been more complex and needs to be reduced its development time. Software testing of its functionalities and performance should be conducted in an early development phase to reduce time to market and the development cost. Software functional testing can be performed through simulating the hardware, but it is not guaranteed that evaluation of real-time performance using simulation has enough accuracy. Real-time performance can be precisely evaluated with hardware-in-the-loop simulation, but it costs time and effort to set up hardware for testing. In this paper, we suggest a testing system that can evaluate functional requirements and real time properties with a general-purpose development board in the early development phase. In addition, we improve reusability of the testing system through modularized and layered architecture. With the proposed testing system we can contribute to building reliable testing system at low cost without difficulty.

Performance Evaluation of Fine-Dust Blocking Effect of Functional Clothing (미세먼지 차단 기능성 의류 제품의 성능 평가에 관한 연구)

  • Seok-Ju, Hwang;Chang-Hoon, Lee;Jin-Kyung, Kwon;Young-Sil, Kim;Eun-Jin, Choi;Da-Jin, Kim;Min, Kim;Se-Jin, Yook
    • Particle and aerosol research
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    • v.18 no.4
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    • pp.137-145
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    • 2022
  • As many studies on the harmfulness of fine dust have been reported, awareness of its seriousness is spreading. Recently, interest in indoor air quality as well as air pollution is increasing, and research on measures to block fine dust flowing into the room from the outside is being conducted. The clothing company is launching functional clothing to prevent fine dust attached to clothing from entering the room through outdoor activities. However, it is difficult to confirm whether there is actually fine-dust blocking performance, and there is no evaluation standard. In this study, the contamination rate caused by fine dust was quantitatively compared through image processing after contamination of the outer fabric for 4 types of commercially available functional clothing with fine-dust blocking effect. The difference in particle contamination according to the material of the outer fabric was analyzed by comparing the surface resistance, and it was found that the higher the surface resistance of the outer fabric material, the more fine dust was attached. The analysis method of this study is expected to be able to quantitatively compare and evaluate the fine-dust blocking performance of functional clothing.

MSC-based Test-case Generation Module for Railway Signaling Software Testing (철도신호 소프트웨어 테스팅을 위한 MSC 기반 테스트케이스 생성 모듈)

  • Hwang, Jong-Gyu;Baek, Jong-Hyun
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.64 no.3
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    • pp.138-142
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    • 2015
  • Most of the existing studies on functional safety testing for the railway signaling system software have focused on verifying the functional safety through the monitoring of internal memory embedded railway signaling system. However, the railway signaling system is one of the typical embedded control system in the railway sector, and the embedded software has a characteristic of generating an appropriate outputs through the combination of internal processing in consideration of the current internal status and external input. Therefore, the test approach of using the interface communication channel can be effective way for the functional testing for railway signaling system software in consideration of these characteristic. Since a communication interface specification of the railway signal system has a the properties of the sequence input and output signals, test-case for software testing is the most effective methodology by MSC (Message Sequence Chart) language, one of the graphic language. The MSC-based test-case generating methodology for signaling system software was proposed in this paper.

Study on Reliability Assessment for the Medical Device Software from the Viewpoint of Functional Safety (기능 안전 관점에서의 의료기기 소프트웨어 신뢰성 평가 방법에 관한 연구)

  • Kim, Sung Min;Ko, Byeonggak;Do, Gyeong-Hun;Kim, Hye Jin;Ham, Jung-Keol
    • Journal of Applied Reliability
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    • v.16 no.3
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    • pp.216-223
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    • 2016
  • Purpose: This paper suggests the procedure to enhance the reliability of the software of the medical device that is to cure, treat, diagnose, and prevent a disease or an abnormal health conditions. Methods: After test requirements are classified by the software requirements specification for safety and backgrounds, reliability assessment methods are suggested. Results: Verification and validation for function and safety can be performed whether the medical device software are implemented as intended. Conclusion: Procedure on the static analysis, unit test, integration test, and system test are provided for the medical device software.

A design of BIST circuit and BICS for efficient ULSI memory testing (초 고집적 메모리의 효율적인 테스트를 위한 BIST 회로와 BICS의 설계)

  • 김대익;전병실
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.34C no.8
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    • pp.8-21
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    • 1997
  • In this paper, we consider resistive shorts on gate-source, gate-drain, and drain-source as well as opens in MOS FETs included in typical memory cell of VLSI SRAM and analyze behavior of memory by using PSPICE simulation. Using conventional fault models and this behavioral analysis, we propose linear testing algorithm of complexity O(N) which can be applied to both functional testing and IDDQ (quiescent power supply current) testing simultaneously to improve functionality and reliability of memory. Finally, we implement BIST (built-in self tsst) circuit and BICS(built-in current sensor), which are embedded on memory chip, to carry out functional testing efficiently and to detect various defects at high-speed respectively.

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