• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.125-128
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• 2001

In this paper, we propose a low power Scan-based Built-ln Self Test based on circuit partitioning and pattern suppression using modified test control unit. To partition a CUT(Circuit Under Testing), the MHPA(Multilevel Hypergraph Partition Algorithm) is used. As a result of circuit partition, we can reduce the total length of test pattern, so that power consumptions are decreased in test mode. Also, proposed Scan-based BIST architecture suppresses a redundant test pattern by inserting an additional decoder in BIST control unit. A decoder detects test pattern with high fault coverage, and applies it to partitioned circuits. Experimental result on the ISCAS benchmark circuits shows the efficiency of proposed low power BIST architecture.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.8
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• pp.10-22
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• 1998

To handle the density increase of SRAMs, a new parallel testing methodology based on built-in self test (BIST) is developed, which allows to access multiple cells simultaneously. The main idea is that a march algorithm is dperformed concurently in each baisc marching block hwich makes up whole memory cell array. The new parallel access method is very efficient in speed and reuqires a very thny hardware overhead for BIST circuitry. Results show that the fault coverage of the applied march algorithm can be achieved with a lower complexity order. This new paralle testing algorithm tests an .root.n *.root.n SRAM which consists of .root.k * .root.k basic marching blocks in O(5*.root.k*(.root.k+.root.k)) test sequence.

• Proceedings of the Korean Information Science Society Conference
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• 2000.10c
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• pp.30-32
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• 2000

본 논문에서는 RTL 회로의 데이터패스에 대한 테스트 용이도 분석방식과 테스트 용이화 설계방식을 제안한다. 데이터패스에 대한 테스트 용이도 분석은 콘트롤러에 대한 정보없이 RTL 회로의 데이터패스만으로 수행한다. 본 논문에서 제안한 테스팅을 고려한 설계방식은 내장된 자체 테스트(BIST)나 주사(scan)방식이 아니며, 주사 방식을 적용했을 때에 비해 본 논문에서 제안한 테스트 용이화 설계방식을 적용했을 때에 보다 적은 면적 증가율(area overhead)을 보인다는 것을 실험을 통해 확인하였다. 또한, 회로 합성 후 ATPG를 통해 적은 면적 증가만으로 높은 고장 검출율(fault coverage)을 얻을 수 있음을 보인다.

• Proceedings of the IEEK Conference
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• 2002.07c
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• pp.1968-1971
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• 2002

In this paper, we have presented a test- ing method for a kind of asynchronous circuits. Tar- get circuit model is the 3D machine that is one of the most successful implementation of extended burst-mode (XBM) machines. We present a high-level test generation method for the 3D machine using the specification of the circuit. We also present a gate-level test pattern generation method using a synchronous test pattern generator. Experimental results show that the combination of the above two methods achieves high fault coverage over 3D machines and saves test generation time.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2004.05b
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• pp.651-654
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• 2004

In this paper, high-level events that adjust or control the conflicts between blocks or process statement, or job sequences are defined compared to low-level events. This paper proposes that high-level events consist of resources conflicts and protocol or specification-dependent conflicts, and two low-level coverage metrics can be used to defect high-level events.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.60 no.4
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• pp.796-800
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• 2011

As the increasing integrity of VLSI, the BIST(Built-In Self Test) is used as an effective method to test chips. Generally the pseudo-random test pattern generation is used for BIST. But it requires too many test patterns when there exist random resistant faults. Therefore we propose a mixed test scheme which applies to the circuit under test, a deterministic test sequence followed by a pseudo-random one. This scheme allows the maximum fault coverage detection to be achieved, furthermore the silicon area overhead of the mixed hardware generator can be reduced.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.8
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• pp.86-96
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• 2000

The representative area among the ones whose cost increases as the integration ratio increases is the test area. As the relative cost of hardware decreases, the BIST method has been focued on as the future-oriented test method. The biggest drawback of it is the increasing test time to obtain the acceptable fault coverage. This paper proposed a BIST implementation method to reduce the test times. This method uses an input grouping and test point insertion method, in which the definition of test point is different from the previous one. That is, the test points are defined on the basis of the internal nodes which are the reference points of the input grouping and are merging points of the grouped signals. The main algorithms in the proposed method were implemented with C-language, and various circuits were used to apply the proposed method for experiment. The results showed that the test time could be reduced to at most $1/2^{40}$ of the pseudo-random pattern case and the fault coverage were also increased compared with the conventional BIST method. The relative hardware overhead of the proposed method to the circuit under test decreases as th e size of the circuit to be tested increases, and the delay overhead by the BIST utility is negligible compared to that of the original circuit. That means, the proposed method can be applied efficiently to large VLSI circuits.

• Journal of Auto-vehicle Safety Association
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• v.11 no.2
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• pp.6-10
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• 2019

This paper describes effectiveness of accident reduction on vehicles equipped with AEB using accident data occurring in Korea. During the statistical period, we used the number of vehicles which are covered by auto insurance and the number of accidents. To maximize the reduction effect of accidents caused by the driver's carelessness, the analysis was limited to Physical Damage Coverage that covers the cost of repairing or replacing the damaged vehicle caused by the driver's fault. Due to Personal Information Protection Law, it was not capable of comparing the same vehicle using Vehicle Identification Number in this study. Instead of that, we used it as a similar vehicle, so there are limits to the comparison and analysis results. As a result of this study, we have found that the effect of reducing accidents was different depending on the vehicle class, but it was generally concluded that the number of accidents decreased when the vehicle was equipped with an AEB system. Domestic research on the AEB effect of reducing accidents is not active yet. Therefore, it is absolutely essential to analyze the effects according to various conditions such as driver's age, occupation and gender as well as expanding the study models in the future.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.14 no.4
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• pp.219-225
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• 2014

The New efficient Mux-based scan latch cell design and scan test of LOS/LOC modes are proposed for detection of delay faults in digital logic circuits. The proposed scan cell design can support LOS(Launch-off-Shift) and LOC(Launch-off-Capture) tests with high fault coverage and low scan power and it can alleviate the problem of the slow selector enable signal and hold signal by supporting the logic capable of switching at the operational clock speeds. Also, it efficiently controls the power dissipation of the scan cell design during scan testing. Functional operation and timing simulation waveform for proposed scan hold cell design shows improvement in at-speed test timing in both test modes.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.61 no.10
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• pp.1542-1547
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• 2012

Asynchronous phenomenon occurs on the synchronous generators under power system when a generator's amplitude of electromagnetic force, phase angle, frequency and waveform etc become different from those of other synchronous generators which can follow instantly varying speed of turbine. Because the amplitude of electromagnetic force, phase frequency and waveform differ from those of other generators with which are to be put into parallel operation due to the change of excitation condition for load sharing and the sharing load change, if reactive current in the internal circuit circulates among generators, the efficiency varies and the stator winding of generators are overheated by resistance loss. When calculation method of protection settings and logic for protection of generator asynchronization will be recommended, a distance relay scheme is commonly used for backup protection. This scheme, called a step distance protection, is comprised of 3 steps for graded zones having different operating time. As for the conventional step distance protection scheme, zone 2 can exceed the ordinary coverage excessively in case of a transformer protection relay especially. In this case, there can be overlapped protection area from a backup protection relay and, therefore, malfunctions can occur when any fault occurs in the overlapped protection area. Distance relays and overcurrent relays are used for backup protection generally, and both relays have normally this problem, the maloperation, caused by a fault in the overlapped protection area. Corresponding to an IEEE standard, this problem can be solved with the modification of the operating time. On the other hand, in Korea, zones are modified to cope with this problem in some specific conditions. These two methods may not be obvious to handle this problem correctly because these methods, modifying the common rules, can cause another coordination problem. To overcome asynchronizing protection, this paper describes an improved backup protection coordination scheme using a new logic that will be suggested.