• Title/Summary/Keyword: Electron life time

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The Algorithm of Life Time Diagnostics end Evaluating of Exchanges Time about High Pressure Sodium Vapor Lamp Using the LabVIEW Software Package (LabVIEW 소프트웨어 패키지를 이용한 고압나트륨전등의 교환시점 및 수명진단 알고리듬)

  • Han, Tae-Hwan
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.18 no.6
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    • pp.1-7
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    • 2004
  • It is necessary for starting voltage to him on high pressure discharge lamp. This starting voltage supply to high pressure sodium vapor lamp as electric discharge lamp, Electric field is producted in Electric discharge tube, So accelerative electron collide against vapour atom and second electron is generated, And rapidly the current flow to Electric discharge tube. This paper showed that the life cycle and exchanges time for all electric discharge lamp was different according to each manufactures, This paper is proposed the evaluating algorithm of exchanges time for high pressure sodium vapor lamp, used LabVIEW software package.

PLS-II separator the vacuum electron gun beam current emission test (PLS-II 전자총 진공이원화와 빔 전류 인출시험)

  • Son, Yoon-Kyoo
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.1580-1581
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    • 2011
  • The linear accelerator of Pohang Accelerator Laboratory(PAL) will drive a top-up mode operation in PLS-II(Pohang Light Source-II). Due to this kind of the operation mode, the electron gun is expected to have shorter life time of the cathode. Further in the PLS-II, two gate valves will be installed in front of the electron gun. The distance between the pre-bunching section and the electron gun will increase by 400 mm compared to the existing system due to the insertion of these gate valves. As a result the incident electron beam. One of the goals to improve the beam pulse width is by incorporating suitable biased voltage. In this paper, we will present test results of beam pulse width as a function of different biased voltage and focusing solenoid coil.

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Micro-morphological Features of Liquid Urea-Formaldehyde Resins during Curing Process at Different Levels of Hardener and Curing Time Assessed by Transmission Electron Microscopy

  • Nuryawan, Arif;Park, Byung-Dae
    • Current Research on Agriculture and Life Sciences
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    • v.32 no.3
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    • pp.125-130
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    • 2014
  • This study used transmission electron microscopy (TEM) to investigate the micro-morphological features of two formaldehyde to urea (F/U) mole ratio liquid urea-formaldehyde (UF) resins with three hardener levels as a function of the curing time. The micro-morphological features of the liquid UF resins were characterized after different curing times. As a result, the TEM examination revealed the presence of globular/nodular structures in both liquid UF resins, while spherical particles were only visible in the low F/U mole ratio resins. The high F/U mole ratio liquid UF resins also showed extensive particle coalescence after adding the hardener, along with the appearance of complex filamentous networks. When the resins were cured with a higher amount of hardener and longer curing time, the spherical particles disappeared. For the low mole UF resins, the particles tended to coalesce with a higher amount of hardener and longer curing time, although discrete spherical particles were still observed in some regions. This is the first report on the distinct features of the crystal structures in low F/U mole ratio UF resins cured with 5% hardener and after 0.5 h of curing time. In conclusion, the present results indicate that the crystal structures of low F/U mole ratio UF resins are formed during the curing process.

Development of Small-Specimen Creep Tester for Life Assessment of High Temperature Components of Power Plant (발전소 고온부의 수명 평가를 위한 소형 시편용 크리프 시험기의 개발)

  • Kim, Hyo-Jin;Jeong, Yong-Geun;Park, Jong-Jin
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.24 no.10 s.181
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    • pp.2597-2602
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    • 2000
  • The most effective means of evaluating remaining life is through the creep testing of samples removed from the component. But sampling of large specimen from in-service component is actually impossible. So, sampling device and small-specimen creep tester have been applied. Sampling device has been devised to extract mechanically small samples by hemispherical, diamond -coated cutter from the surface of turbine rotor bores and thick-walled pipes without subsequent weld repairs requiring post weld heat treatment. A method of manufacturing small creep specimen, 2min gage diameter and 10min gage length, using electron beam welding to attach grip section, has been proven. Small-specimen creep tester has been designed to control atmosphere to prevent stress increment by oxidation during experiment. To determine whether the small specimens successfully reproduce the behavior of large specimens, creep rupture tests for small and large specimens have been performed at identical conditions. Creep rupture times based on small specimens have closely agreed within 5% error compared with that of large specimen. The errors in rupture time have decreased at longer test period. This comparison validates the procedure for fabricating and testing on small specimen. This technique offers potential as an efficient method for remaining life assessment by direct sampling from in -service high temperature components.

The Electrical and Optical Properties of Xe Flat Plasma Light Source (제논 (Xe) 평판형 플라즈마 광원의 전기적 및 광학적 특성 연구)

  • Choi, Yong-Sung;Moon, Jong-Dae;Lee, Kyung-Sup;Lee, Sang-Heon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.05a
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    • pp.86-90
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    • 2006
  • Discharge of the flat lamp lighting source research are requested very much. For improving brightness, life time, efficiency of flat lamp, plasma diagnosis of the f1at lamp lighting source to understand property of lighting source is very important. Distance of discharge electrode is 5.5mm and width is 16.5mm, we have measured electron temperature and electron density measured with single Langmuir probe in flat lamp. We have tested the discharge from 100 Torr to 300 Torr pressure. The pulse is rectangular pulse with frequency 20kHz and duty ratio 20%. In result, electron temperature decreases and electron density increase as increase the gas pressure and electron temperature decreases and electron density increase as increase the voltage.

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Effect of thermal aging on the mechanical, intergranular corrosion and corrosion fatigue properties of Z3CN20.09M cast duplex stainless steel

  • Ti, Wenxin;Wu, Huanchun;Xue, Fei;Zhang, Guodong;Peng, Qunjia;Fang, Kewei;Wang, Xitao
    • Nuclear Engineering and Technology
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    • v.53 no.8
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    • pp.2591-2599
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    • 2021
  • The effect of thermal aging at 475 ℃ and 750 ℃ of Z3CN20.09M cast duplex stainless steel (CDSS) on microstructure, mechanical and intergranular corrosion properties were investigated by transmission electron microscope (TEM), nano indenter, scanning electron microscope (SEM) and corrosion fatigue test system. The result indicated that the spinodal decomposition and G precipitated were occurred after aged at 475 ℃, as well as sigma precipitated at 750 ℃. The microstructure degeneration of ferrite was saturated after aged for 2000h and 200 h at 475 ℃ and 750 ℃ respectively. The mechanical properties, intergranular corrosion resistance and corrosion fatigue lives were continuing deteriorated with increasing the aging time at both temperatures. The difference of the degeneration mechanisms of Z3CN20.09M CDSS aged at 475 ℃ and 750 ℃ was analyzed.

A flat thin display with RF electron generation

  • Dijk, R. Van;Vissenberg, M.C.J.M.;Zwart, S.T. De
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.927-930
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    • 2004
  • We report on a new type of a flat and thin display with a secondary emission electron source. In this display device electrons are multiplied between two secondary emission plates under a high frequency electric field. This principle has a few important advantages over a field emission display: the emission comes from flat plates, which reduces the life-time problems of ion bombardment of field emitter tips. Furthermore, the electron emission is space charge limited which gives a uniform electron distribution. The electrons are extracted from the source and accelerated to a phosphor screen to generate light. Gray levels are made by pulse width modulation.

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Current Status of Automatic Serial Sections for 3D Electron Microscopy

  • Choi, Hyosun;Jung, Min Kyo;Mun, Ji Young
    • Applied Microscopy
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    • v.47 no.1
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    • pp.3-7
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    • 2017
  • The automatic equipment for three-dimensional electron microscopy (3DEM) can acquire serial sections of a large sample in a relatively short time, and is especially suitable for the connectomics, which is a field related to understanding the brain structure as a whole. As many results obtained through 3DEM using automatic serial sections have been published in the field of brain research, many researchers continue to apply this technique to various samples. We reviewed the equipment for automatic serial sectioning, the block preparation method, the limitations of 3DEM, and future directions.

CNT Emitter Coated with Titanium Oxide Nanoparticles for FED Application

  • Kim, Jong-Ung;Ryu, Byong-Hwan;Moon, Hee-Sung;Kim, Jae-Myeong;No, Cho-Hang;Uk, Park-Seoung;Choi, Young-Min
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.937-939
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    • 2007
  • Carbon nanotubes (CNTs) have used as an electron field emitter of the field emission display (FED) due to their characteristics of high-electron emission, rapid response and low power consumption. However, to commercialize the FED with CNT emitter, some fundamental problems regarding life time and emission efficiency have to be solved. In this study, we investigated the $TiO_2$ coated CNT as a field emitter. $TiO_2$ nanoparticles can coated on CNT surface by chemical solution method. $TiO_2$ nanoparticles had uniform size with the average size of about 2.4 nm to 3.1 nm. Field emission performance of CNT coated with $TiO_2$ nanoparticles was evaluated and discussed.

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Improved Electron Injection on Organic Light-emitting Diodes with an Organic Electron Injection Layer

  • Kim, Jun-Ho;Suh, Chung-Ha;Kwak, Mi-Young;Kim, Bong-Ok;Kim, Young-Kwan
    • Transactions on Electrical and Electronic Materials
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    • v.6 no.5
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    • pp.221-224
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    • 2005
  • To overcome of poor electron injection in organic light-emitting diodes (OLEDs) with Al cathode, a thin layer of inorganic insulating materials, like as LiF, is inserted between an Al cathode and an organic electron transport layer. Though the device, mentioned above, improves both turn on voltage and luminescent properties, it has some problems like as thickness restriction, less than 2 nm, and difficulty of deposition control. On the other hand, Li organic complex, Liq, is less thickness restrictive and easy to deposit and it also enhances the performance of devices. This paper reports the improved electron injection on OLEDs with another I A group metal complex, Potassium quinolate (Kq), as an electron injection material. OLEDs with organic complexes showed improved turn-on voltage and luminous efficiency which are remarkably improved compared to OLEDs with Al cathode. Especially, OLEDs with Kq have longer life time than OLEDs with Liq.