• Title/Summary/Keyword: Electrical Contact

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The study of laser processing parameter for $\mu$-BGA cutting ($\mu$-BGA 절단을 위한 레이저 가공 파라미터 연구)

  • Baek, kwang-yeol;Lee, cheon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.652-655
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    • 2001
  • In this paper, I have studied minimization of the kerf-width and surface burning which are occurred after the singulation process of multi layer $\mu$-BGA( thickness 1.1 mm, 0.9 mm) with a pulsed Nd:YAG( = 532 nm, repetition rate = 10 Hz) laser. The thermal energy of a pulsed Nd:YAG laser is used to cut the copper layer. I have studied are minimization of the surface burning and kerf-width using a photo resist, $N_2$blowing and polyester double sided tape as a cutting parameter. The $N_2$blowing reduces a laser energy loss by debris and suppresses a surface carbonization. Also, I have studied characters of cutting with a choice of side of laser beam incidence. The SEM(Scanning Electron Microscope), non-contact 3D inspector and high-resolution microscope are used to measure kerf width and surface state. The optimum value of 1.1 mm $\mu$-BGA singulation is 524 $\mu$m that is reduced kerf width of 60 % with $N_2$blowing. And I obtained reduction of carbonization of 68 % with a polyester double side tape in 0.9 mm $\mu$-BGA. I used laser intensity of 1.91$\times$10$^{6}$ / $\textrm{cm}^2$ in this study.

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Highly-conformal Ru Thin Films by Atomic Layer Deposition Using Novel Zero-valent Ru Metallorganic Precursors and $O_2$ for Nano-scale Devices

  • Kim, Su-Hyeon
    • Electrical & Electronic Materials
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    • v.28 no.2
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    • pp.25-33
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    • 2015
  • Ruthenium (Ru) thin films were grown on thermally-grown $SiO_2$ substrates by atomic layer deposition (ALD) using a sequential supply of four kinds of novel zero-valent Ru precursors, isopropyl-methylbenzene-cyclohexadiene Ru(0) (IMBCHDRu, $C_{16}H_{22}Ru$), ethylbenzen-cyclohexadiene Ru(0) (EBCHDRu, $C_{14}H_{18}Ru$), ethylbenzen-ethyl-cyclohexadiene Ru(0) (EBECHDRu, $C_{16}H_{22}Ru$), and (ethylbenzene)(1,3-butadiene)Ru(0) (EBBDRu, $C_{12}H_{16}Ru$) and molecular oxygen (O2) as a reactant at substrate temperatures ranging from 140 to $350^{\circ}C$. It was shown that little incubation cycles were observed for ALD-Ru processes using these new novel zero-valent Ru precursors, indicating of the improved nucleation as compared to the use of typical higher-valent Ru precursors such as cyclopentadienyl-based Ru (II) or ${\beta}$-diketonate Ru (III) metallorganic precursors. It was also shown that Ru nuclei were formed after very short cycles (only 3 ALD cycles) and the maximum nuclei densities were almost 2 order of magnitude higher than that obtained using higher-valent Ru precursors. The step coverage of ALD-Ru was excellent, around 100% at on a hole-type contact with an ultra-high aspect ratio (~32) and ultra-small trench with an aspect ratio of ~ 4.5 (top-opening diameter: ~ 25 nm). The developed ALD-Ru film was successfully used as a seed layer for Cu electroplating.

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A Study of Joint Characteristic of BSCCO Superconductor Tape (BSCCO 고온초전도 선재의 접합특성 연구)

  • Kim, Jung-Ho;Kim, Joong-Seok;Kim, Tae-Woo;Ji, Bong-Ki;Joo, Jin-Ho;Nah, Wan-Soo
    • 한국초전도학회:학술대회논문집
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    • v.9
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    • pp.378-382
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    • 1999
  • We evaluated the effect of joining process such as contact method, shape of joined area and pressure on the electrical property of Bi-2223 superconducting tape. It was observed that the current capacity was reduced at the transition area of the joined tape and was significantly dependent on the uniaxial pressure. The lap-joined tape, fabricated with a pressure of 1,000-1,600 MPa, show the highest value of current capacity(80-90%) of the tape itself. It is believed the highest value of current capacity results from improvement in core density, contacting area and grain alignment, etc. In addition, the irreversible strain( ${\varepsilon}$ irrev) for the joined tape· was measured to be 0.1%, smaller than that of enjoined tape( ${\varepsilon}$ irrev = 0.3%). The decrease in the strength and irreversible strain for joined tape is believed to be due to the irregular geometry/morphology of the transition area of the tape.

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Experimental Study on Heat and Mass transfer Coefficient Comparison Between Counterflow Types and Parallel in Packed Tower of Dehumidification System

  • Sukmaji, I.C.;Choi, K.H.;Yohana, Eflita;Hengki R, R.;Kim, J.R.
    • 한국태양에너지학회:학술대회논문집
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    • 2009.04a
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    • pp.162-169
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    • 2009
  • In summer electrical energy is consumed in very high rate. It is used to operate conventional air conditioning system. Hot and humid air can germinate mould spores, encourage ill health, and create physiological stress (discomfort). Dehumidifier solar cooling effect is the one alternative solution saving electrical energy. We use surplus heat energy in the summer, to get cooling effect and then to get human reach to comfort condition. These devices have two system, dehumidifier and regeneration system. This paper will be focus in dehumidifier system. Dehumidifier system use for absorbing moisture in the air and decreasing air temperature. When the liquid desiccant as strong solution contact with the vapor air in the packed tower, it works. The heat and mass transfer performances of flow pattern in the packed tower of dehumidifier are analyzed and compared in detail. In this experiment was introduced, the flow patterns are parallel flow and counter flow. The performance of these flow patterns will calculate from air side. Which is the best flow pattern that gave huge mass transfer rate? The proposed dehumidifier flow pattern will be helpful in the design and optimization of the dehumidifier solar cooling system.

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A study on the friction force caused by abrasives in chemical mechanical polishing (CMP시 연마입자에 작용하는 마찰력에 관한 연구)

  • Kim, Goo-Youn;Kim, Hyoung-Jae;Park, Beom-Young;Jeong, Young-Suk;Jeong, Hae-Do
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1312-1315
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    • 2004
  • Chemical Mechanical Polishing is referred to as a three body tribological system, because it includes two solids in relative motion and the slurry. On the assumption that the abrasives between the pad and the wafer could be a major reason of not only the friction force but also material removal during polishing. The friction force generated by the abrasives was inspected with the change of abrasive size and concentration in this paper. The variation of coefficient of friction with abrasive concentration and size could result from the condition of contact and load balance between wafer and abrasives carried by pad asperity. The simulation was performed in this paper and compared with the result of experiment. The material removal rate also estimated with abrasive concentration and size increasement.

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The Effect of Pad Groove Dimension on Polishing Performance in CMP (CMP에서 패드 그루브의 채수가 연마특성에 미치는 영향)

  • Park, Ki-Hyun;Kim, Hyung-Jae;Jeong, Young-Seok;Jeong, Hae-Do;Park, Jae-Hong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1308-1311
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    • 2004
  • It is very important that get polishing characteristic that to be stable that accomplish planarization of high efficiency in chemical mechanical polishing, and there is repeatability Groove of pad causes much effects in flow of slurry among various factors that influence in polishing characteristic, is expected to cause change of lubrication state and polishing characteristic in contact between wafer and pad. Therefore, divided factors of pad groove by groove pattern, groove profile, groove dimensions. This research wishes to study effect that dimension of pad groove gets in polishing performance. When changed dimension (width, depth, pitch of groove) of groove, measured change of removal rate and friction force. According as groove dimension changes, could confirm that removal rate and friction force change. While result of this experiment studies effect of pad groove in CMP, it is expected to become small help.

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Field Emission properties of Porous Polycrystalline silicon Nano-Structure (다결정 다공질 실리콘 나노구조의 전계 방출 특성)

  • Lee, Joo-Won;Kim, Hoon;Park, Jong-Won;Lee, Yun-Hi;Jang, Jin;Ju, Byeong-Kwon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.04b
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    • pp.69-72
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    • 2002
  • We establish a visible light emission from porous polycrystalline silicon nano structure(PPNS). The PPNS layer are formed on heavily doped n-type Si substrate. 2um thickness of undoped polycrystalline silicon deposited using LPCVD (Low Pressure Chemical Vapor Deposition) anodized in a HF: ethanol(=1:1) as functions of anodizing conditions. And then a PPNS layer thermally oxidized for 1 hr at $900^{\circ}C$. Subsequently, thin metal Au as a top electrode deposited onto the PPNS surface by E-beam evaporator and, in order to establish ohmic contact, an thermally evaporated Al was deposited on the back side of a Si-substrate. When the top electrode biased at +6V, the electron emission observed in a PPNS which caused by field-induces electron emission through the top metal. Among the PPNSs as functions of anodization conditions, the PPNS anodized at a current density of $10mA/cm^{2}$ for 20 sec has a lower turn-on voltage and a higher emission current. Furthermore, the behavior of electron emission is uniformly maintained.

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Passivation Layers for Organic Thin-film-transistors

  • Lee, Ho-Nyeon;Lee, Young-Gu;Ko, Ik-Hwan;Kang, Sung-Kee;Lee, Seong-Eui;Oh, Tae-Sik
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.1
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    • pp.36-40
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    • 2007
  • Inorganic layers, such as SiOxNy and SiOx deposited using plasma sublimation method, were tested as passivation layer for organic thin-film-transistors (OTFTs). OTFTs with bottom-gate and bottom-contact structure were fabricated using pentacene as organic semiconductor and an organic gate insulator. SiOxNy layer gave little change in characteristics of OTFTs, but SiOx layer degraded the performance of OTFTs severely. Inferior barrier properties related to its lower film density, higher water vapor transmission rate (WVTR) and damage due to process environment of oxygen of SiOx film could explain these results. Polyurea and polyvinyl acetates (PVA) were tested as organic passivation layers also. PVA showed good properties as a buffer layer to reduce the damage come from the vacuum deposition process of upper passivation layers. From these results, a multilayer structure with upper SiOxNy film and lower PVA film is expected to be a superior passivation layer for OTFTs.

Characteristics of V-type Ultrasonic Motor with the Change Angle of Legs (Leg-angle 변화에 따른 V-type 초음파모터의 특성)

  • Jeong, Seong-Su;Park, Min-Ho;Kim, Jong-Wook;Park, Choong-Hyo;Chong, Hyon-Ho;Park, Tae-Gone
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.320-320
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    • 2010
  • In the case of existing ultrasonic motors, they have characteristics such as outstanding response speed, speed and high efficiency. However, it's very hard to use practically them as small motors due to complicated structure and expensive cost. This paper proposed v-type ultrasonic linear motor. Stator of the motor is composed of thin elastic body and four ceramics attached to upper and bottom areas of the body. The ceramics have each direction of polarization. When two harmonic voltages which had $90^{\circ}$ phase difference were applied to the ceramics, the symmetric and anti-symmetric displacements were generated at the tip to make the elliptical motion. To find out a model that generates maximum displacement at contact tip, FEM program was used with change of leg-angle. In addition, optimal model was chosen by considering magnitude and shape of displacement according to change of frequency.

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Two-dimensional numerical simulation study on the nanowire-based logic circuits (나노선 기반 논리 회로의 이차원 시뮬레이션 연구)

  • Choi, Chang-Yong;Cho, Won-Ju;Chung, Hong-Bay;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.82-82
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    • 2008
  • One-dimensional (1D) nanowires have been received much attention due to their potential for applications in various field. Recently some logic applications fabricated on various nanowires, such as ZnO, CdS, Si, are reported. These logic circuits, which consist of two- or three field effect transistors(FETs), are basic components of computation machine such as central process unit (CPU). FETs fabricated on nanowire generally have surrounded shapes of gate structure, which improve the device performance. Highly integrated circuits can also be achieved by fabricating on nano-scaled nanowires. But the numerical and SPICE simulation about the logic circuitry have never been reported and analyses of detailed parameters related to performance, such as channel doping, gate shapes, souce/drain contact and etc., were strongly needed. In our study, NAND and NOT logic circuits were simulated and characterized using 2- and 3-dimensional numerical simulation (SILVACO ATLAS) and built-in spice module(mixed mode).

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