• 제목/요약/키워드: Edge Orientation

검색결과 199건 처리시간 0.03초

체인코드를 이용한 새로운 에지 방향 결정 기법 (Chain code based New Decision Technique of Edge Orientation)

  • 성민철;이상화;조남익
    • 한국군사과학기술학회지
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    • 제10권1호
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    • pp.101-106
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    • 2007
  • In this paper, we propose chain code based decision technique of edge orientation. Edge Information is one of the most important information for handling image signals, and is applied to various civilian and military area, such as image surveillance for military reconnaissance, restoration of noised image signal, fingerprint recognition, and so on. The conventional methods to find edge orientations exploit a certain size of mask which weights for a certain direction, so they showed limitations in the case of diagonal edges except 45 degrees. We find edge orientations using chain code. According to the experiments, the proposed method shows better performance than the conventional approaches. The exact edge orientations including diagonal directions are well found.

에지 방향 지도와 영역 컬러 정보를 이용한 얼굴 추출 기법 (Face Detection Using Edge Orientation Map and Local Color Information)

  • 김재협;문영식
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2005년도 추계종합학술대회
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    • pp.987-990
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    • 2005
  • An important issue in the field of face recognitions and man-machine interfaces is an automatic detection of faces in visual scenes. it should be computationally fast enough to allow an online detection. In this paper we describe our ongoing work on face detection that models the face appearance by edge orientation and color distribution. We show that edge orientation is a powerful feature to describe objects like faces. We present a method for face region detection using edge orientation and a method for face feature detection using local color information. We demonstrate the capability of our detection method on an image database of 1877 images taken from more than 700 people. The variations in head size, lighting and background are considerable, and all images are taken using low-end cameras. Experimental results show that the proposed scheme achieves 94% detection rate with a resonable amount of computation time.

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Line feature extraction in a noisy image

  • Lee, Joon-Woong;Oh, Hak-Seo;Kweon, In-So
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1996년도 Proceedings of the Korea Automatic Control Conference, 11th (KACC); Pohang, Korea; 24-26 Oct. 1996
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    • pp.137-140
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    • 1996
  • Finding line segments in an intensity image has been one of the most fundamental issues in computer vision. In complex scenes, it is hard to detect the locations of point features. Line features are more robust in providing greater positional accuracy. In this paper we present a robust "line features extraction" algorithm which extracts line feature in a single pass without using any assumptions and constraints. Our algorithm consists of five steps: (1) edge scanning, (2) edge normalization, (3) line-blob extraction, (4) line-feature computation, and (5) line linking. By using edge scanning, the computational complexity due to too many edge pixels is drastically reduced. Edge normalization improves the local quantization error induced from the gradient space partitioning and minimizes perturbations on edge orientation. We also analyze the effects of edge processing, and the least squares-based method and the principal axis-based method on the computation of line orientation. We show its efficiency with some real images.al images.

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에지맵 기반 지문 기준점 검출 (Edge Map-Based Fingerprint Reference-Point Detection)

  • 송영철
    • 전기학회논문지
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    • 제56권7호
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    • pp.1321-1323
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    • 2007
  • A new reference point location method based on an edge map is proposed, where an orientation map is defined and used to find the edge map. Experimental results show that the proposed method can effectively detect the core point in poor quality and arch-type fingerprint images and produces better results in terms of the detection rate and accuracy than the sine map-based method.

사파이어 기판의 다른 결정방향 위에 제작된 YBCO step-edge 접합의 특성 (Properties of YBCO Step-edge Junction Fabricated on Different Crystal Orientation of Sapphire Substrate)

  • 임해용;김인선;박용기;박종철
    • Progress in Superconductivity
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    • 제3권1호
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    • pp.60-64
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    • 2001
  • We have studied properties of step-edge Junction prepared with crystal orientation of sapphire substrate. The Step on sapphire substrates fabricated by conventional photolithography method and Ar ion milling method. $CeO_2$ buffer layer and in-situ YBCO thin film were deposited on the stepped sapphire substrates by a pulsed laser deposition method with the predetermined optimized condition. The step angle was centre fled low angle of about $25^{\circ}$. The YBCO film thickness was varied to obtain various thickness ratios of the film to the step height in a range from 0.7 to 1.2. I-V curves of junction were showed RSJ-behavior, double junction structure, and hysteresis due to the crystal orientation of substrate.

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자연영상에서 적응적 문자-에지 맵을 이용한 텍스트 영역 검출 (Text Region Detection using Adaptive Character-Edge Map From Natural Image)

  • 박종천;황동국;전병민
    • 한국산학기술학회논문지
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    • 제8권5호
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    • pp.1135-1140
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    • 2007
  • 본 논문은 자연영상에서 문자의 크기와 방향에 무관한 적응적 문자-에지 맵을 이용한 에지-기반 텍스트 영역검출 알고리즘을 제안한다. 첫 번째로, 에지 이미지로부터 에지 레이블을 얻고, 레이블 이미지로부터 문자를 찾기 위해 배열문법을 이용하여 적응적 문자-에지 맵을 적용한다. 선택된 레이블은 이웃 레이블과의 거리를 기준으로 클러스터 된다. 그 결과 텍스트 후보 영역이 얻어진다. 최종적으로, 텍스트 후보 영역은 경험적 규칙과 텍스트 영역에 대한 수평/수직 프로파일을 분석함으로서 검증된다. 실험결과 제안한 알고리즘은 다양한 문자의 크기 변화, 문자열의 방향, 그리고 복잡한 배경에서도 강인한 텍스트 영역 검출 결과를 보였다.

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디지털 영상에서 부화소 정밀도의 실제 경계 추정 (Estimation of Real Boundary with Subpixel Accuracy in Digital Imagery)

  • 김태현;문영식;한창수
    • 한국정밀공학회지
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    • 제16권8호
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    • pp.16-22
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    • 1999
  • In this paper, an efficient algorithm for estimating real edge locations to subpixel values is described. Digital images are acquired by projection into image plane and sampling process. However, most of real edge locations are lost in this process, which causes low measurement accuracy. For accurate measurement, we propose an algorithm which estimates the real boundary between two adjacent pixels in digital imagery, with subpixel accuracy. We first define 1D edge operator based on the moment invariant. To extend it to 2D data, the edge orientation of each pixel is estimated by the LSE(Least Squares Error)line/circle fitting of a set of pixels around edge boundary. Then, using the pixels along the line perpendicular to the estimated edge orientation the real boundary is calculated with subpixel accuracy. Experimental results using real images show that the proposed method is robust in local noise, while maintaining low measurement error.

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Influence of stiffener edge on the buckling load of holed composite plates

  • Zakeri, Mahnaz;Mozaffari, Ali;Katirae, Mohamad A.
    • Steel and Composite Structures
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    • 제29권5호
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    • pp.681-688
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    • 2018
  • In this paper, buckling load of edge stiffened composite plates is assessed. The effect of stiffener edge size, circular hole, and the fiber orientation angle on buckling behavior of composite plates under uni-axial compressive load is investigated. This paper includes two parts as experimental and numerical studies. L-shape composite plates are manufactured in three different layups. Then the buckling loads are experimentally determined. Subsequently, by using the numerical simulation, the size variation effects of stiffener edge and circular cutout on the plate buckling loads are analyzed in five different layups. The results show that cutout size, stiffener edge height and fiber orientation angle have important effects on buckling load. In addition, there is an optimum height for stiffener edge during different conditions.

선형적 영상의 특징 추출에 관한 연구 (A Study on Feature Extraction of Linear Image)

  • 김춘영;한백룡;이대영
    • 한국통신학회논문지
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    • 제13권1호
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    • pp.74-84
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    • 1988
  • 본 논문에서는 에지검출 알고리즘을 이용하여 선형 영상에 대한 특징 추출기술을 논하였다. 에지 검출과정은 여러 개의 에지 마스크를 가지고 영상을 콘벌루션(convolution)함으로써 에지 크기와 방향을 결정하고, 이러한 에지 크기를 쓰레숄딩과 세선화하고, 간극(Gap)의 발생시 반복적으로 이 부분을 수정, 근접성(Proximity)과 방향성(orientation)에 기본을 두어 에지요소들을 연결(linking)하고, 선형근사화 시켰다. 이러한 것은 유사한 알고리즘을 연구하는 사람에게 도움이 될 것이다.

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웨이퍼 정렬법과 정밀도 평가 (A Wafer Alignment Method and Accuracy Evaluation)

  • 박홍래;유준
    • 제어로봇시스템학회논문지
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    • 제8권9호
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    • pp.812-817
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    • 2002
  • This paper presents a development of high accuracy aligner and describes a method to find the orientation of a substantially circular disk shaped wafer with at least one flat region on an edge thereof. In the developed system, the wafer is spun one 360 degree turn on a chuck and the edge position is measured by a linear array to obtain a set of data points at various wafer orientation. The rotation axis may differ from wafer center by an unknown eccentricity. The flat angle is found by fitting a cosine curve to the actual data to obtain a deviation. The maximum deviation is then corrected for errors due to a finite number of data points and wafer eccentricity by calculating an adjustment angle from data points on the wafer fiat. After determining the flat angle the wafer is spun to the desired orientation. The wafer eccentricity can be calculated from four of the data points located away from the flat edge region. and the wafer is then centered.