• Title/Summary/Keyword: Dual-probe method

Search Result 34, Processing Time 0.033 seconds

Development of Hand-Held Type Sheet Resistance Meter Based on a Dual-Configuration Four-Point Probe Method (Dual-Configuration Four-Point Probe Method에 의한 휴대형 면저항 측정기 개발)

  • Kang, Jeon-Hong;Yu, Kwang-Min;Kim, Wan-Seop
    • The Transactions of the Korean Institute of Electrical Engineers P
    • /
    • v.59 no.4
    • /
    • pp.423-427
    • /
    • 2010
  • Portable sheet resistance-measuring instrument using the dual-configuration Four-Point Probe method is developed for the purpose of precisely measuring the sheet resistance of conducting thin films. While single-configuration Four-Point Probe method has disadvantages of applying sample size, shape and thickness corrections for a probe spacing, the developed instrument has advantages of no such corrections, little edge effects and measuring simply and accurately the sheet resistance between $0.2\Omega/sq$ and $2k\Omega/sq$.

Development of a Handheld Sheet Resistance Meter with the Dual-configuration Four-point Probe Method

  • Kang, Jeon-Hong;Lee, Sang-Hwa;Yu, Kwang-Min
    • Journal of Electrical Engineering and Technology
    • /
    • v.12 no.3
    • /
    • pp.1314-1319
    • /
    • 2017
  • A handheld sheet resistance meter that can easily and quickly measure the sheet resistance of indium tin oxide films was developed. The dual-configuration four-point probe method was adopted for this instrument, which measured sheet resistance in the range from $0.26{\Omega}/sq$. to $2.6k{\Omega}/sq$. with 0.3 % ~ 0.5 % uncertainty. The screen of the instrument displayed the sheet resistance when the probe was in contact with the sample surface and the value continued to be displayed during the probe contact. Even after separating the probe from the surface, the value was still displayed on the screen and could be read easily. A feature of the instrument was the use of the dual-configuration technique to reduce edge effects markedly compared with the single-configuration technique and its ease of operation without applying correction factors for sample size and thickness.

Thermal Diffusivity Measurement of Backfilling Materials for Horizontal Ground Heat Exchanger Using Dual-Probe Method (이중탐침법을 이용한 수평형 지중열교환기 뒤채움재의 열확산계수 측정)

  • Sohn, Byong-Hu;Choi, Hang-Seok
    • Journal of the Korean Society for Geothermal and Hydrothermal Energy
    • /
    • v.7 no.2
    • /
    • pp.51-59
    • /
    • 2011
  • Storage and transfer heat in soils are governed by the soil thermal properties and these properties are therefore needed in many engineering applications, including horizontal ground heat exchanger for ground-coupled heat pumps. This paper presents the measured results of the thermal diffusivity of soils(silica, quartzite, limestone, sandstone, and masonry soils) used for the trench backfilling materials of the horizontal ground heat exchanger. To assess this thermal property, we (i) measure the soil thermal conductivities and volumetric heat capacities using dual-probe method and (ii) compare the estimates from the de Vries method of summing the heat capacities of the soil constituents. The results show that the thermal diffusivity tends to increase as dry soil begins to wet, but it approaches a constant value or even decreases as the soil continues to wet. Measurements made by using the dual-probe method agreed well with independent estimates obtained using the single-probe method.

A Development of Hand Held Type Sheet Resistance Meter by Dual Configuration Method (Dual Configuration Method에 의한 휴대용 면저항 측정기 개발)

  • Kang, Jeon-Hong;Yu, Kwang-Min;Kim, Han-Jun;Han, Sang-Ok;Park, Kang-Sic;Koo, Kyung-Wan;Lee, Se-Hyun
    • Proceedings of the KIEE Conference
    • /
    • 2007.07a
    • /
    • pp.929-930
    • /
    • 2007
  • 박막재료 및 반도체의 면저항 측정에는 주로 Four Point Probe(FPP) 원리를 이용한 측정기를 사용하고 있다. FPP에 의한 측정방식은 single 및 dual configuration method가 있으며, dual configuration은 single configuration에 비해 probe spacing 변화나 시료의 가장자리 효과 등에서 측정편차가 적은 장점이 있어서 dual configuration 기술을 사용하는 추세이다. 개발된 휴대용 면저항 측정기는 dual configuration원리를 적용하여 제작되었으며, 박막재료의 면저항을 누구나 쉽고 정확하게 측정할 수 있도록 설계되었다. 또한 시료의 크기가 핀 간격에 비해 5배 이상 크면 보정계수를 거의 무시할 수 있는 장점이 있어 작은 시료라도 정확한 면저항을 측정할 수 있다. 이측정기의 측정 불확도는 지시값의 1 % 이하이고, 측정범위는 (2$\sim$2000)$\Omega/sq$이다.

  • PDF

Dual-Toehold-Probe-Mediated Exonuclease-III-Assisted Signal Recycles Integrated with CHA for Detection of mecA Gene Using a Personal Glucose Meter in Skin and Soft Tissue Infection

  • Jiaguang Su;Wenjun Zheng
    • Journal of Microbiology and Biotechnology
    • /
    • v.33 no.12
    • /
    • pp.1692-1697
    • /
    • 2023
  • Staphylococcus aureus integrated with mecA gene, which codes for penicillin-binding protein 2a, is resistant to all penicillins and other beta-lactam antibiotics, resulting in poor treatment expectations in skin and soft tissue infections. The development of a simple, sensitive and portable biosensor for mecA gene analysis in S. aureus is urgently needed. Herein, we propose a dual-toehold-probe (sensing probe)-mediated exonuclease-III (Exo-III)-assisted signal recycling for portable detection of the mecA gene in S. aureus. When the target mecA gene is present, it hybridizes with the sensing probe, initiating Exo III-assisted dual signal recycles, which in turn release numerous "3" sequences. The released "3" sequences initiate catalytic hairpin amplification, resulting in the fixation of a sucrase-labeled H2 probe on the surface of magnetic beads (MBs). After magnet-based enrichment of an MB-H1-H2-sucrase complex and removal of a liquid supernatant containing free sucrase, the complex is then used to catalyze sucrose to glucose, which can be quantitatively detected by a personal glucose meter. With a limit of detection of 4.36 fM for mecA gene, the developed strategy exhibits high sensitivity. In addition, good selectivity and anti-interference capability were also attained with this method, making it promising for antibiotic tolerance analysis at the point-of-care.

The Effects of the Four Point Probe Measurement Technique on the Precision and Accuracy in Electrical Resistivity Measurements. (4탐침 측정기술이 비저항 측정 정밀 정확도에 미치는 영향)

  • Kang, Jeon-Hong;Yu, Kwang-Min;Kim, Han-Jun;Han, Sang-Ok;Kim, Jong-Suk
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2003.07a
    • /
    • pp.267-269
    • /
    • 2003
  • 반도체 웨이퍼 및 각종 박막의 면/비저항(sheet/resistivity resistance)의 측정에 비교적 간단히 측정할 수 있고 측정정확도가 높은 4탐침(four-point probe)방법이 널리 사용되고 있다 또한 4탐침 측정방법은 높은 분해능의 contour map작성과 ion implantation의 doping accuracy 및 doping uniformity의 측정에도 사용된다. 최근 재료의 소형, 박막화 경향으로 볼 때 정확한 비저항 측정의 필요성이 요구되고 있으며 이에 따라 4탐침 측정기술인 single 및 dual configuration method로 실리콘 웨이퍼에 대한 비저항의 측정 정확도를 고찰한 결과 dual configuration 측정방법이 single configuration측정 방법에 비하여 정밀 정확도가 더 좋은 것으로 고찰되었다.

  • PDF

An international Comparison Measurement of Silicon Wafer Sheet Resistance using the Four-point Probe Method

  • Kang, Jeon-Hong;Ying, Gao;Cheng, Yuh-Chuan;Kim, Chang-Soo;Lee, Sang-Hwa;Yu, Kwang-Min
    • Journal of Electrical Engineering and Technology
    • /
    • v.10 no.1
    • /
    • pp.325-330
    • /
    • 2015
  • With approval from the Asia Pacific Metrology Program Working Group on Materials Metrology (APMP WGMM), an international comparison for sheet resistance standards for silicon wafers was firstly conducted among Korea Research Institute of Standards and Science (KRISS) in Korea, CMS/ITRI in Taiwan, and NIM in China, which are national metrology institutes (NMIs), from August 2011 to January 2012. The sheet resistance values of the standards are $10{\Omega}$, $100{\Omega}$, and $1000{\Omega}$; the measurement was conducted in sequence at KRISS, CMS/ITRI, NIM, and KRISS again using the four-point probe method with single and dual configuration techniques. The reference value for the measurement results of the three NMIs was obtained through averaging the values of the three results for each sheet resistance range. The differences between the reference value and the measured values is within 0.22% for $10{\Omega}$, 0.17% for $100{\Omega}$, and 0.12% for $1000{\Omega}$. Therefore, the international consistency for conducting sheet resistance measurements is confirmed within 0.22% through the APMP WGMM approved comparison.

Peptide Nucleic Acid Probe-Based Analysis as a New Detection Method for Clarithromycin Resistance in Helicobacter pylori

  • Jung, Da Hyun;Kim, Jie-Hyun;Jeong, Su Jin;Park, Soon Young;Kang, Il-Mo;Lee, Kyoung Hwa;Song, Young Goo
    • Gut and Liver
    • /
    • v.12 no.6
    • /
    • pp.641-647
    • /
    • 2018
  • Background/Aims: Helicobacter pylori eradication rates are decreasing because of increases in clarithromycin resistance. Thus, finding an easy and accurate method of detecting clarithromycin resistance is important. Methods: We evaluated 70 H. pylori isolates from Korean patients. Dual-labeled peptide nucleic acid (PNA) probes were designed to detect resistance associated with point mutations in 23S ribosomal ribonucleic acid gene domain V (A2142G, A2143G, and T2182C). Data were analyzed by probe-based fluorescence melting curve analysis based on probe-target dissociation temperatures and compared with Sanger sequencing. Results: Among 70 H. pylori isolates, 0, 16, and 58 isolates contained A2142G, A2143G, and T2182C mutations, respectively. PNA probe-based analysis exhibited 100.0% positive predictive values for A2142G and A2143G and a 98.3% positive predictive value for T2182C. PNA probe-based analysis results correlated with 98.6% of Sanger sequencing results (${\kappa}$-value=0.990; standard error, 0.010). Conclusions: H. pylori clarithromycin resistance can be easily and accurately assessed by dual-labeled PNA probe-based melting curve analysis if probes are used based on the appropriate resistance-related mutations. This method is fast, simple, accurate, and adaptable for clinical samples. It may help clinicians choose a precise eradication regimen.

A Pivot And Probe Algorithm(PARA) for Network Optimization

  • Moonsig Kang;Kim, Young-Moon
    • Korean Management Science Review
    • /
    • v.15 no.1
    • /
    • pp.1-12
    • /
    • 1998
  • This paper discusses a new algorithm, the PAPANET (Pivot And Probe Algorithm for NETwork optimization), for solving linear, capacitated linear network flow problem (NPs), PAPANET is a variation and specialization of the Pivot And Probe Algorithm (PAPA) developed by Sethi and Thompson, published in 1983-1984. PAPANET first solves an initial relaxed NP (RNP) with all the nodes from the original problem and a limited set of arcs (possibly all the artificial and slack arcs). From the arcs not considered in the current relaxation, we PROBE to identify candidate arcs that violate the current solution's dual constraints maximally. Candidate arcs are added to the RNP, and this new RNP is solved to optimality. This candidate pricing procedure and pivoting continue until all the candidate arcs price unfavorably and all of the dual constraints corresponding to the other, so-called noncandidate arcs, are satisfied. The implementation of PAPANET requires significantly fewer arcs and less solution CPU time than is required by the standard network simplex method implementation upon which it is based. Computational tests on randomly generated NPs indicate that our PAPANET implementation requires up to 40-50% fewer pivots and 30-40% less solution CPU time than is required by the comparable standard network simplex implementation from which it is derived.

  • PDF

Thermal Property Evaluation of a Silicon Nitride Thin-Film Using the Dual-Wavelength Pump-Probe Technique (2파장 펌프-프로브 기법을 이용한 질화규소 박막의 열물성 평가)

  • Kim, Yun Young
    • Korean Journal of Materials Research
    • /
    • v.29 no.9
    • /
    • pp.547-552
    • /
    • 2019
  • In the present study, the thermal conductivity of a silicon nitride($Si_3N_4$) thin-film is evaluated using the dual-wavelength pump-probe technique. A 100-nm thick $Si_3N_4$ film is deposited on a silicon (100) wafer using the radio frequency plasma enhanced chemical vapor deposition technique and film structural characteristics are observed using the X-ray reflectivity technique. The film's thermal conductivity is measured using a pump-probe setup powered by a femtosecond laser system of which pump-beam wavelength is frequency-doubled using a beta barium borate crystal. A multilayer transient heat conduction equation is numerically solved to quantify the film property. A finite difference method based on the Crank-Nicolson scheme is employed for the computation so that the experimental data can be curve-fitted. Results show that the thermal conductivity value of the film is lower than that of its bulk status by an order of magnitude. This investigation offers an effective way to evaluate thermophysical properties of nanoscale ceramic and dielectric materials with high temporal and spatial resolutions.