• International Journal of Reliability and Applications
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• 제3권3호
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• pp.147-154
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• 2002

In this paper, we consider the warm standby redundant system(WSRS) which is consisted of an active unit, a standby unit and a switchover device. In addition, the switchover processing is controlled by a control module. The effect of failure of the control module is taken into account to develop our reliability model for the redundant structure. For the performance evaluation of a redundant system with the function of switchover processing which is assumed to cause the increase of the failure rate of the system, some reliability indices, such as availability, average availability, reliability and steady state availability, are considered.

• 조명전기설비학회논문지
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• 제16권3호
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• pp.61-66
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• 2002

배전시스템은 고 신뢰도가 요구되는 사례시스템이다. 신뢰도는 정해진 기간과 운전 조건하에서 설비나 시스템이 적절히 자기 기능을 할 수 있는 확률로 정의된다 수용가에서 배전시스템의 성능을 예측하고 검증하기 위한 기본적인 신뢰지수는 평균고장률, 평균고장기간, 평균 활용률 등이 포함된다 본 논문에서는 EDSA의 배전계통 신뢰도 평가 프로그램을 이용하여 배전 시스템의 기본적인 신뢰도 평가지수를 구하고, 수지식 사례 배전시스템을 개선시키기 위한 방법으로 환상식 시스템으로 구성을 변경시켜 수치적으로 얼마나 높은 신뢰도가 얻어졌는지를 보여준다.

• International Journal of Reliability and Applications
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• 제2권2호
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• pp.107-115
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• 2001

This paper considers some reliability indices, such as availability, average availability, reliability and steady state availability, of a redundant system with the function of switchover processing. We also derive the confidence limits for steady state availability of such system. The system, which is considered in this paper, consists of an active unit, a standby unit and a switchover device. In addition, the switchover processing is controlled by a control module. The effect of failure of the control module is taken into account to develop our reliability model for the redundant structure. Numerical examples are presented to illustrate our results.

• 전력전자학회:학술대회논문집
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• 전력전자학회 2008년도 하계학술대회 논문집
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• pp.601-603
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• 2008

The main purpose of this study is to design and develop the information display device for power conditioning system of photovoltaic power generation system. The function of this device is to display the information, communicate with PCS controller and store the special information. The developed device is tested to verify the performance and experimental results show the excellent performance. An actual running test is being carried out to verify the reliability of the device including PCS by applying it to 10kW level photovoltaic power generation system established in Ulsan College.

• Tribology and Lubricants
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• 제29권1호
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• pp.7-12
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• 2013

Turbine power control devices at a nuclear / thermoelectric power plant lead to failure by creating mechanical shocks and strong vibrations that are due to the strong elasticity of a spring and the inertia of the valve face during its rapid movement to block steam. To ensure durability of the turbine power control device, which is the main component in the power plant, it is necessary to develop a device that can prevent such vibrations. In this study, a cushion mechanism is added to the head of the hydraulic servo actuator, which is a turbine power control device. Moreover, the cushion mechanism, which includes various modifies shapes and orifices is investigated dynamically through modeling and simulations.

• 마이크로전자및패키징학회지
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• 제21권2호
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• pp.13-21
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• 2014

Technology for high power devices has made impressive progress in increasing the current density of power semiconductor, system module, and design optimization, which realize high power systems with heterogeneous functional integration. Depending on the performance development of high power semiconductor, packaging technology of high power device is urgently required for efficiency improvement of the device. Power device packaging must provide superior thermal management due to high operating temperature of power modules. Here we, therefore, review critical challenges of typical power electronics packaging today including core assembly processes, component materials, and reliability evaluation regulations.

• 대한전자공학회논문지
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• 제25권2호
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• pp.182-187
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• 1988

Hot carrier induced device degradation characteristics under DC bias stress have been investigated in n-MOSFETs with channel length of 1.2,1.8 um, and compared with those of LDD structure device with same channel length. Based on these results, the device lifetime in normal operating bias(Vgs=Vds=5V) is evaluated. The lifetimes of conventional and LDD n-MOSFET with channel length of 1.2 um are estimated about for 17 days and for 12 years, respectively. The degradation rate of LDD n-MOSFET under the same stress is the lowest at n-region implnatation dose of 2.5E15 cm-\ulcorner while the substrate current is the lowest at the dose of 1E13cm-\ulcorner Thses results show that the device degradation characteristics are basic measurement parameter to find optimum process conditions in LDD devices and evaluate a reliability of sub-micron device.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1998년도 하계학술대회 논문집 G
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• pp.2336-2338
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• 1998

This paper describes an active laser sensing device using laser diodes and optic devices. It is able to detect near targets existed in $360^{\circ}$ directions simultaneously with effectiveness and reliability. This sensing device consists of four laser transmitters and four receivers. Only four transmitter/receiver channels of this near range sensing device are capable of $360^{\circ}$ coverage. The usefulness of this sensing device is confirmed through some experiments for the mock-up targets.

• 대한의용생체공학회:의공학회지
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• 제40권1호
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• pp.20-31
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• 2019

Medical device performance management is an activity that allows a device to be safely used and maintained even after it is put on the market. The purpose of this study is to provide procedures and criteria for selection of medical device items that should manage the safety and performance among medical devices in hospital. Investigate the performance management status of medical devices in hospitals and identify the performance management status by domestic and advanced regulatory agencies. Provides selection procedures and test methods for medical devices subject to performance management in hospitals based on medical device risk management and reliability. In addition, a case study on drug infusion pumps was conducted.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -2
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• pp.1042-1045
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• 2002

The scaling of device dimension and supply voltage with high performance and reliability has been the main subject in the evolution of VLSI technology, The MOSFET structures become susceptible to high field related reliability problems such as hot-electron induced device degradation and dielectric breakdown. HLDBD(HLD Buffered Deposition) is used to decrease junction electric field in this paper. Also we compared the hot carrier characteristics of HLDBD and conventional.