• Journal of Ocean Engineering and Technology
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• v.13 no.3 s.33
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• pp.100-107
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• 1999

Due to the high temperature and pressure, the materials of pipeline in power plant are degraded by creep damage. So far, many conventional measurement techniques such as replica method, electric resistance method, adn hardness test method for creep damage have been used. Among them, the replica method has mainly been used for the inspection of components. But this technique is restricted to the applications at the surface of the objects and cannot be used to material inside. In this paper, the measuring methods of evaluation by using ultrasonic attenuation and electric resistance for the creep detection of creep damage in the form of cavities on grain boundaries or intergranular microcracks were carried out. Absolute measuring method of quantitave ultrasonic attenuation technique for 1Cr0.5Mo material degradation was analyzed for determining the creep degradation steps using life prediction formula. As a result of measurement for creep specimens, we founded that the coefficient of utrasonic attenuation was increased as the increase of creep life fracton(${phi}c$) and the decreasing rate of wlwctric resistance was also increased.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.05b
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• pp.75-78
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• 2001

Recently, the HFPD measurement testing is widely used in partial discharge measurement of HV machines because HFPD measurement testing receives less influence of external noise and has a merit of good sensitivity. Also HFPD testing is able to offer the judgement standard of degradation level of HV machine and can detect discharge signals in live-line. Therefore it is very useful method compare to previous conventional PD testing method and effective diagnosis method in power transformer that requires live-line diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.05a
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• pp.50-54
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• 2000

Recently, the HFPD measurement testing is widely used in partial discharge measurement of HV machines because HFPD measurement testing receives less influence of external noise and has a merit of good sensitivity. Also HFPD testing is able to offer the judgement standard of degradation level of HV machine and can detect discharge signals in live-line. Therefore it is very useful method compare to previous conventional PD testing method and effective diagnosis method in power transformer that requires live-line diagnosis. But partial discharges have very complex characteristics of discharge pattern so it is required continuous research to development of precise analysis method. In recent, the study of partial discharge is carrying out discover of initial defect of power equipment through condition diagnosis and system development of degradation diagnosis using HFPD(High Frequency Partial Discharge) detection. In this study, simulated transformer is manufactured and HFPD occurred from transformer is measured with broad band antenna in real time, the degradation grade of transformer is analyzed through produced patterns in simulated transformer according to applied voltages.

• Journal of the Korea Institute of Military Science and Technology
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• v.21 no.2
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• pp.173-179
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• 2018

Estimating reliability of a non-repairable system using the degradation data, variance assumption such as homogeneity (constant) or heteroscedasticity (time-variant) could affect accuracy of reliability estimation. This paper showed reliability estimation and comparison results under normal conditions using accelerated degradation data obtained from destructive measurements, according to variance assumption of the data at each measurement time. Degradation data from three accelerated conditions with stress factors of temperature and humidity were used to estimate reliability. The $B_{10}$ lifetime was estimated as 1243.8 years by constant variance assumption, and 18.9 years by time-variant variance. And variance assumption provided different analysis results of important stresses to reliability. Thus, accurate assumption of variance at each measurement time is required when estimating reliability using degradation data of a non-repairable system.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.10
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• pp.902-908
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• 2005

Various stresses (such as electrical stress, mechanical stress, environmental and electrochemical stress, and defects of structure) result in insulation degradation of epoxy mold type insulators. Since the insulation degradation of BCT(Bushing Current Transformer) and bushing proceeds during fabrication process or operation time due to these causes, various methods to reduce the degradation in their insulation ability have been suggested. In this paper, we investigated surface temperature increment of these insulators due to PD(partial discharge). After the voltage applied into the insulator to generate the artificial PD, the surface temperature of the insulator was measured with non-contact thermometer using infrared rays. It was confirmed through the analysis based on PD experiments that the procession in the insulation degradation of the insulator could be estimated through the measurement of the surface temperature in the insulator.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.140-143
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• 2000

The primary function of ZnO lightning arrester is to protect transmission and distribution equipment from overvoltages and to absorb electrical energy resulting from lightning or switching surges and form temporary overvoltage. However, ZnO lightning arrester are known to exhibit an increases in resistive current with time, the rate of increase being exacerbated with increasing applied voltage and ambient temperature. So, it is important to the leakage current measurement of ZnO lightning arrester. In addition, since the resistive leakage current caused by deterioration of ZnO lightning arrester mainly caused an increase of the third harmonic component, thereby it is possible the arrester degradation diagnosis by measuring the third harmonic component in the total leakage current. The leakage current and third harmonic component are measured and used to investigate the degradation diagnosis of ZnO element of arrester. Also the SEM photography is used to investigate the change of crystal structure of ZnO element with degradation.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.11
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• pp.62-69
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• 1998

The general degradation model has been applied to analyze the hot carrier induced degradation of the DC and RF characteristics of RF-nMOSFET. The degradation of cut-off frequency has been severer than the degradation of bulk MOSFET drain current. The value of the degradation rate n and the degradation parameter m for RF-nMOSFET has been equal to those for bulk MOSFET. The decrease of device degradation with the increase of fingers could be explained by the large source/drain parasitic resistance and drain saturation voltage. It has been also found that the RF performance degradation could be explained by the decrease of $g_{m}$ and $C_{gd}$ and the increase of $g_{ds}$ after stress. The degradation of the DC and RF characteristics of RF-nMOSFET could be predicted by the measurement of the substrate current.t.

• KSBB Journal
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• v.14 no.3
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• pp.315-321
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• 1999

The relationships between the explosive 2,4,6-trinitrotoluene (TNT) degradation by Stenotrophomonas maltophilia and several relevant physicochemical environmental parameters were examined. At neutral pH of the cultures, the degradation of TNT proceeded to completion, whereas only about 50% of TNT was utilized when the cultures were adjusted to acidic pH. The effect of various co-substrates (e.g., glucose, fructose, acetate, citrate, succinate) on the degradation of TNT by the test culture of S. maltophilia was evaluated. The results indicated that, among the various co-substrates studies, the test culture that received 2 mM fructose degraded 100 mg/L of TNT completely within 20 days of incubation at ambient temperature, whereas partial degradation of TNT was observed in the test culture with acetate, citrate, or succinate as a co-substrate, respectively. In fact, fructose was the best co-substrate for TNT degradation in this experiment. The effect of supplemented nitrogens [e.g., (NH$_4$)$_2$,SO$_4$, NH$_4$Cl. urea] on the TNT degradation was monitored. All supplemented nitrogens in this study were inhibitory to TNT degradation. Addition of 1% Tween80 accelerated TNT degradation, and showed complete degradation of TNT within 8 days of incubation. Addition of yeast extract resulted higher growth yields, based on turbidity measurement, but it inhibited TNT degradation.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.623-624
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• 2004

The coating and estimation of gas and moisture barriers on polymer and glass substrates are receiving very much attention in passivation of organic light emitting devices (OLEDs). In this study, the encapsulation and lifetime measurement techniques of OLEDs were presented. The degradation mechanisms of bare and encapsulated OLEDs were investigated by the visual lifetime measurement (VLM) system with the parameters such as a pixel luminance(L), a luminance rms roughness(dL), a brightness area ratio(R), an edge degradation depth(D), etc.

• Journal of the Korean Physical Society
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• v.73 no.11
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• pp.1657-1662
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• 2018

A null test method which relies on a computer generated hologram (CGH) is widely used to measure a large aspheric surface. For precise measurements of the surface shape of an aspheric optics, the CGH must precisely generate a wavefront that can fit on the ideal surface shape of the aspheric optics. If fabrication errors arise in the CGH, an unwanted wavefront will be generated and the measuring result will lack trustworthiness. Thus far, there has been limited research on wavefronts generated by CGH using only linear-type binary grating models. In this study, a theoretical error model of a circular-type zone plate, the most commonly used types for CGH patterns, is suggested. The proposed error model is checked by simulations and experiments.