• 대한전기학회논문지
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• 제43권7호
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• pp.1121-1127
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• 1994

The accelerated degradation phenomena in amorphous silicon thin film transistors due to both electrical stress and visible light illumination under the elevated temperature have been investigated systematically as a function of gate bias, light intensity, and stress time. It has been found that, in case of electrical stress, the thrshold voltage shifts of a-Si:H TFT's may be attributed to the defect creation process at the early stage, while the charge trapping phenomena may be dominant when the stressing periods exceed about 2 hours. It has been also observed that the degradation in the device characteristics of a-Si:H TFT's is accelerated due to multiple stress effects, where the defect creation mechanism may be more responsible for the degradation rather than the charge trapping mechanism.

• 동력기계공학회지
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• 제7권2호
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• pp.66-72
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• 2003

Recently, the steel parts used at the aerospace and automobile industries are required to be used light weight parts. Therefore, used material, steel have to be a high stress, which is an indispensable condition in this field. At the consideration of parts design, high hardness of the lightweight parts have an benefit of saving fuel and material. A high stress of metal has a point of difference according to the shape of design, external cyclic load and condition of vibration. A crack generates on the surface of metal or under yield stress by defect of inner metal defect or surface defect and slowly, this crack grow stable growth. Finally, rapidity failure phenomena is happen. Fatigue failure_phenomena, which happen in metal, bring on danger in human life and property therefor, anti-fatigue failure technology take an important part of current industries Currently, the shot peening is used for removing the defect from the surface of steel and improving the fatigue strength on surface. Therefore, this paper investigated the effect on frcature toughness using shot peening which is improve the resistance of crack growth and crack expansion rate by fatigue that make a compressive residual stress on surface.

• 대한기계학회논문집B
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• 제25권7호
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• pp.952-957
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• 2001

In the glass forming process, the phenomena of hyperbolic heat conduction in the hot mold with an inner defect are studied analytically. It is shown that the temperature predicted by the parabolic model is underestimated compared to the one by the hyperbolic model. As the rmal wave is reflected from the area with defects and then arrives at the surface supplied by the heat flux, it is expected that there exists thermal shock in the materials. The area with defects is assumed to be adiabatic since its thermal conductivity is much lower compared to the one of the material. The results also indicate that the sudden temperature -jump in the mold surface can cause diverse problems such as glass defect (embryo mark, etc), oxidation of mold and coating, and change of material properties.

• 대한기계학회논문집A
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• 제28권10호
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• pp.1492-1499
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• 2004

In this paper, defect formation in ring rolling is revealed by computer simulation of ring rolling processes. The rigid-plastic finite element method is employed for this study. An analysis model having relatively fine mesh system near the roll gap is used for reducing the computational time and a scheme of minimizing the volume change is applied. The formation of the central cavity formation defect in ring rolling of a taper roller bearing outer race and the polygonal shape defect in ring rolling of a ball bearing outer race has been simulated. It has been seen that the results are qualitatively good with actual phenomena.

• Journal of Welding and Joining
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• 제19권3호
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• pp.267-273
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• 2001

In this study, welding phenomena involved in formation of penetrators during high frequency electric resistance welding were investigated. High speed cinematography of the process revealer that a molten bridge between neighboring skelp edges forms at apex point and travels along narrow gap toward to welding point at a speed ranging from 100 to 400 m/min. The bridge while moving along the narrow gap swept away oxide containing molten metal from the gap, providing oxide-free surface for a forge-welding at upsetting stand frequency of the budge formation, travel distance and speed of the bridge were affected by the heat input rate into strip. The travel distance and its standard deviation were found to have a strong relationship with the weld defect density. Based on the observation, a new mechanism of the penetrator formation during HF ERW process is proposed.

• 반도체디스플레이기술학회지
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• 제23권2호
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• pp.60-64
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• 2024

The threshold voltage shift in thin-film transistors (TFTs) is modeled using stretched-exponential (SE) and stretched-hyperbola (SH) functions. These models are derived by introducing empirical parameters into reaction rate equations that describe defect generation or charge trapping caused by hydrogen diffusion in the dielectric or interface. Separately, the dielectric relaxation phenomena are also described by the same reaction rate equations based on defect diffusion. Dielectric relaxation was initially modeled using the SE model, and various models have been proposed using fractional calculus. In this study, the characteristics of the threshold voltage shift and the dielectric relaxation phenomena are compared and analyzed to explore the applicability of analytical models used in the field of dielectric relaxation, in addition to the conventional SE and SH models.

• 산업경영시스템학회지
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• 제44권2호
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• pp.102-114
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• 2021

NDF (No Defect Found) is a phenomenon in which defects have been found in the manufacturing, operation and use of a product or facility, but phenomenon of defects is not reproduced in the subsequent investigation system or the cause of the defects cannot be identified. Recently, with the development of the fourth industrial revolution, convergence of hardware and software technologies in various fields is spreading to products such as aircraft, home appliances, and mobile devices, and the number of parts is increasing due to functional convergence. The application of such convergence technologies and the increase in the number of parts are major factors that lead to an increase in NDF phenomena. NDF phenomena have a significant negative impact on cost, reliability, and reliability for both manufacturers, service providers and operators. On the other hand, due to the nature of NDF phenomena such as difficult and intermittent cause identification and ambiguity in judgment, it is common to underestimate the cost of NDF or fail to take appropriate countermeasures in corporate management. Therefore, in this paper, we propose a methodology for estimating NDF costs by the PAF model which is a quality cost analysis model and ABC (Activity Based Costing) technique. The methodology of this study suggests a detailed procedure and the concept to accurately estimate the NDF costs, using ABC analysis, accounting system information, and IT system data. In addition case studies have validated the methodology. We think this could be a valid methodology to refer to when estimating the cost of other parts. And, it is meaningful to provide important judgment information in the decision-making process based on quality management and ultimately reduce NDF costs by visualizing them separately by major variable factors.

• Bulletin of the Korean Chemical Society
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• 제33권7호
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• pp.2168-2176
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• 2012

Relations between fitted parameters for photoionization spectra both below and above the thresholds in the systems involving 3 channels are obtained using phase-shifted version of the multichannel quantum-defect theory. Analytical continuation of the photoionization cross sections in the form of ${\langle}{\sigma}_{below}{\rangle}_{v_{below}}={\sigma}_{above}$ examined using several representations.

• 제어로봇시스템학회논문지
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• 제13권11호
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• pp.1060-1066
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• 2007

When a high-energy ultrasound propagates through a solid body that contains a crack or a delamination, the two faces of the defect do not ordinarily vibrate in unison, and dissipative phenomena such as friction, rubbing and clapping between the faces will convert some of the vibrational energy to heat. By combining this heating effect with infrared imaging, one can detect a subsurface defect in material efficiently. In this paper a detection of the welding defect of thin SUS 304 plates using the UIR (ultrasonic infrared imaging) technology is described. A low frequency (20kHz) ultrasonic transducer was used to infuse the welded thin SUS 304 plates with a short pulse of sound for 280ms. The ultrasonic source has a maximum power of 2kW. The surface temperature of the area under inspection is imaged by a thermal infrared camera that is coupled to a fast frame grabber in a computer. The hot spots, which are a small area around the defect tip and heated up highly, are observed. From the sequence of the thermosonic images, the location of defective or inhomogeneous regions in the welded thin SUS 304 plates can be detected easily.

• 한국산학기술학회논문지
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• 제20권8호
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• pp.181-189
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• 2019

항공기용 전원 분배 장치는 발전기에서 생성된 전원을 분배 및 제어하고, 과전류를 보호하는 역할을 한다. 항공기 비행 중에 교류 전원 분배 장치의 결함으로 인해 교류 전원 분배가 불가능해지는 현상이 다수 발생하였다. 이로 인해 정상적인 교류 전원 분배가 불가능하고 일부 전자장비가 구동을 상실하는 문제점이 제기되었다. 본 논문에서는 결함 발생 조건인 항공기 비행 중 진동 조건을 진동 시험 장비로 모의하여, 결함의 근본 원인을 도출한 과정을 기술하였다. 이를 통해 결함의 원인이 교류 전원 분배 장치의 접촉기가 진동에 의해 내부 배선 손상이 발생한 것임을 확인하였으며, 결함 해소를 위해 접촉기 개선 형상을 도출하였다. 또한 결함이 내재된 접촉기를 검출하기 위해, 진동 시험 장비를 활용한 결함 검출 시험을 수행하는 방식으로 시험 절차를 개선하였다. 개선활동 결과 교류 전원 분배 장치의 결함 현상이 개선되었음을 구성품 인증 시험 및 비행 시험을 통해 입증하였다.