• 제목/요약/키워드: Defect Characterization

검색결과 117건 처리시간 0.028초

알루미나 중공사 한외여과막 제조 및 특성평가 (Fabrication and Characterization of Alumina Hollow Fiber Ultrafiltration Membrane)

  • 김여진;김성중;김정;조영훈;박호식;이평수;박유인;박호범;남승은
    • 멤브레인
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    • 제28권1호
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    • pp.21-30
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    • 2018
  • 본 연구에서는 sol-gel법을 이용하여 균일하고 결함을 최소화한 세라믹 한외여과막을 제조하였다. 알루미나 중공사 정밀여과막 지지체의 기공 크기를 줄이기 위해, 합성된 boehmite sol과 sol-ethanol 혼합 용액을 사용하여 dip coating법으로 지지체 표면 위에 ${\gamma}$-알루미나 활성층을 형성시켰다. pristine sol을 이용하여 4회 이상 코팅했을 경우 박막층의 두께가 상당히 증가하여 균열 및 박리현상을 야기시키고, 3회 코팅을 진행하였을 경우 표면 결함이 최소화된 최적의 시료를 얻을 수 있었다. 또한, 소결 온도가 ${\gamma}$-알루미나 활성층의 기공 크기에 미치는 영향을 분석하였다. 소결 온도가 $1000^{\circ}C$일 때 가장 높은 순수 투과도 값을 보였으며, 10 nm 크기의 dextran 분획분자량(molecular weight cut-off (MWCO) : 51 kDa)이 관찰되었다. 600, $800^{\circ}C$에서 소결한 막의 경우, 12 kDa MWCO (dextran 5 nm)를 갖는 것으로 확인되었다. 결과적으로, 코팅 용액의 조성은 박막층의 두께에 큰 영향을 주었고, 소결 온도에 따라 분획분자량이 크게 영향을 받는 것을 알 수 있었다.

염소(Chlorine)가 도입된 $SiO_2/Si$ 계면을 가지는 게이트 산화막의 특성 분석 (Characterization of Gate Oxides with a Chlorine Incorporated $SiO_2/Si$ Interface)

  • 유병곤;유종선;노태문;남기수
    • 한국진공학회지
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    • 제2권2호
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    • pp.188-198
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    • 1993
  • 두께가 6~10 nm인 게이트 산화막의 계면에 염소(Cl)를 도입시킨 n-MOS capacitor 및 n-MOSFET을 제잘하여 물성적인 방법(SIMS, ESCA)과 전기적인 방법에 의해서 소자의 특성을 분석, 평가하였다. Last step TCA법을 이용하여 성장시킨 산화막은 No TCA법으로 성장시킨 것보다 mobility가 7% 정도 증가하였고, 결함 밀도도 감소하였다. Time-zero-dielectric-breakdown(TZDB)으로 측정한 결과, Cl를 도입한 막의 파괴 전계(breakdon field)는 18 MV/cm인데, 이것은 Cl을 도입하지 않은 것보다 약 0.6 MV/cm 정도 높은 값이다. 또한 time-dependent-dielectric-breakdown(TDDB) 결과로부터 수명이 20년 이상인 것으로 평가되었고, hot carrier 신뢰성 측정으로부터 평가한 소자의 수명도 양호한 것으로 나타났다. 이상의 결과에서 Cl을 계면에 도입시킨 게이트 산화막을 가진 소자가 좋은 특성을 나타내고 있으므로 Last step TCA법을 종래의 산화막 성장 방법 대신에 사용하면 MOSFET 소자의 새로운 게이트 절연막 성장법으로서 대단히 유용할 것으로 생각된다.

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Clinical Features, Response to Treatment, Prognosis, and Molecular Characterization in Korean Patients with Inherited Urea Cycle Defects

  • Yoo, Han-Wook;Kim, Gu-Hwan;Seo, Eul-Ju
    • 대한유전성대사질환학회지
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    • 제2권1호
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    • pp.77-79
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    • 2002
  • The urea cycle, consisting of a series of six enzymatic reactions, plays key roles to prevent the accumulation of toxic nitrogenous compound and synthesize arginine de novo. Five well characterized diseases have been described, resulting from an enzymatic defect in the biosynthesis of one of the normally expressed enzyme. This presentation will focus on two representative diseases; ornithine transcarbamylase(OTC) deficiency and citrullinemia(argininosuccinate synthetase deficiency). OTC deficiency is one of the most common inborn error of urea cycle, which is inherited in X-linked manner. We identified 17 different mutations in 20 unrelated Korean patients with OTC deficiency; L9X, R26P, R26X, T44I, R92X, G100R, R141Q, G195R, M205T, H214Y, D249G, R277W, F281S, 853 del C, R320X, V323M and 10 bp del at nt. 796-805. These mutations occur at well conserved nucleotide sequences across species or CpG hot spot. The L9X and R26X lead to the disruption of leader sequences, required for directing mitochondrial localization of the OTC precursor. Their phenotypes are severe, and neonatal onset. The G100R, R277W and V323M mutations were uniquely identified in patients with late onset OTC deficiency. The other genotypes are associated with neonatal onset. Out of 20 patients with OTC deficiency, only 6 patients are alive; two were liver transplanted, and normal in growth and development at 2, 4 years after transplantation respectively. Citrullinemia is an autosomal recessive disease, caused by the mutations in the argininosuccinate synthetase(ASS) gene. We identified in 3 major mutations in 11 unrelated Korean patients with citrullinemia; G324S, $IVS6^{-2}$ A to G, and 67 bp ins at nt 1125-1126. Among these, the 67 base pair insertion mutation is novel. The allele frequency of each mutation is; G324S(45%), IVS6-2 A to G(32%), and 67 base pair insertion(14%). All patients are diagnosed at neonatal or infantile age. Interestingly, two patients presented with stroke like episode. Out of 11 patients, 5 patients died. Among 6 patients alive, one patient was successfully liver transplanted.

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폴리아닐린 나노섬유를 이용한 광경화형 전도성 투명필름의 제조 및 특성 (Fabrication and Characterization of UV-curable Conductive Transparent Film with Polyaniline Nanofibers)

  • 김성현;송기국
    • 폴리머
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    • 제36권4호
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    • pp.531-535
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    • 2012
  • 폴리아닐린(PANI) 나노섬유를 전도성 충전제로 사용하여 광경화형 전도성 투명필름을 제조하였다. 화학산화중합(chemical oxidation polymerization)으로 나노섬유 구조의 산화형 폴리아닐린(ES-PANI)을 합성하였다. ES-PANI는 디도핑을 통해 환원형 폴리아닐린(EB-PANI)으로 유도하였다. 이것을 전도성 충전제의 전구체로 사용하여 도데실벤젠설폰산(DBSA)이 포함되어 있는 광경화형 레진에 분산시키면 재도핑된 재산화형 폴리아닐린(rES-PANI)을 얻을 수 있었다. 이런 과정을 통해 나노섬유 형태가 유지되면서 높은 전도성과 분산안정성이 우수한 광경화형 전도성 레진용액을 제조할 수 있었다. 제조된 광경화형 전도성 레진용액은 상온에서 3달 정도 두어도 rES-PANI 충전제의 침전물이 생기지 않았다. 또한 이 용액을 폴리(메틸 메타크릴레이트)(PMMA) 기재 위에 스핀코팅 후 광경화하여 약 $5{\mu}m$ 두께의 전도성 투명필름을 제조하였다. rES-PANI 나노섬유 농도가 1.4 wt%일 때 표면저항 $6.5{\times}10^8{\Omega}/sq$, 550 nm 파장에서 91.1%의 투과도를 보였다. ES-PANI의 디도핑-재도핑(dedoping-redoping) 과정을 통해 광경화형 전도성 레진용액에 분산된 PANI는 농도에 따라 필름표면저항과 광학적 투명도를 조절할 수 있는 대전방지 보호필름을 제작하는 새로운 방법을 제시하였다.

Characterization of SiC nanowire synthesize by Thermal CVD

  • 정민욱;김민국;송우석;정대성;최원철;박종윤
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.74-74
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    • 2010
  • One-dimensional nanosturctures such as nanowires and nanotube have been mainly proposed as important components of nano-electronic devices and are expected to play an integral part in design and construction of these devices. Silicon carbide(SiC) is one of a promising wide bandgap semiconductor that exhibits extraordinary properties, such as higher thermal conductivity, mechanical and chemical stability than silicon. Therefore, the synthesis of SiC-based nanowires(NWs) open a possibility for developing a potential application in nano-electronic devices which have to work under harsh environment. In this study, one-dimensional nanowires(NWs) of cubic phase silicon carbide($\beta$-SiC) were efficiently produced by thermal chemical vapor deposition(T-CVD) synthesis of mixtures containing Si powders and hydrocarbon in a alumina boat about $T\;=\;1400^{\circ}C$ SEM images are shown that the temperature below $1300^{\circ}C$ is not enough to synthesis the SiC NWs due to insufficient thermal energy for melting of Si Powder and decomposition of methane gas. However, the SiC NWs are produced over $1300^{\circ}C$ and the most efficient temperature for growth of SiC NWs is about $1400^{\circ}C$ with an average diameter range between 50 ~ 150 nm. Raman spectra revealed the crystal form of the synthesized SiC NWs is a cubic phase. Two distinct peaks at 795 and $970\;cm^{-1}$ over $1400^{\circ}C$ represent the TO and LO mode of the bulk $\beta$-SiC, respectively. In XRD spectra, this result was also verified with the strongest (111) peaks at $2{\theta}=35.7^{\circ}$, which is very close to (111) plane peak position of 3C-SiC over $1400 ^{\circ}C$ TEM images are represented to two typical $\beta$-SiC NWs structures. One is shown the defect-free $\beta$-SiC nanowire with a (111) interplane distance with 0.25 nm, and the other is the stacking-faulted $\beta$-SiC nanowire. Two SiC nanowires are covered with $SiO_2$ layer with a thickness of less 2 nm. Moreover, by changing the flow rate of methane gas, the 300 sccm is the optimal condition for synthesis of a large amount of $\beta$-SiC NWs.

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High quality topological insulator Bi2Se3 grown on h-BN using molecular beam epitaxy

  • Park, Joon Young;Lee, Gil-Ho;Jo, Janghyun;Cheng, Austin K.;Yoon, Hosang;Watanabe, Kenji;Taniguchi, Takashi;Kim, Miyoung;Kim, Philip;Yi, Gyu-Chul
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.284-284
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    • 2016
  • Topological insulator (TI) is a bulk-insulating material with topologically protected Dirac surface states in the band gap. In particular, $Bi_2Se_3$ attracted great attention as a model three-dimensional TI due to its simple electronic structure of the surface states in a relatively large band gap (~0.3 eV). However, experimental efforts using $Bi_2Se_3$ have been difficult due to the abundance of structural defects, which frequently results in the bulk conduction being dominant over the surface conduction in transport due to the bulk doping effects of the defect sites. One promising approach in avoiding this problem is to reduce the structural defects by heteroepitaxially grow $Bi_2Se_3$ on a substrate with a compatible lattice structure, while also preventing surface degradation by encapsulating the pristine interface between $Bi_2Se_3$ and the substrate in a clean growth environment. A particularly promising choice of substrate for the heteroepitaxial growth is hexagonal boron nitride (h-BN), which has the same two-dimensional (2D) van der Waals (vdW) layered structure and hexagonal lattice symmetry as $Bi_2Se_3$. Moreover, since h-BN is a dielectric insulator with a large bandgap energy of 5.97 eV and chemically inert surfaces, it is well suited as a substrate for high mobility electronic transport studies of vdW material systems. Here we report the heteroepitaxial growth and characterization of high quality topological insulator $Bi_2Se_3$ thin films prepared on h-BN layers. Especially, we used molecular beam epitaxy to achieve high quality TI thin films with extremely low defect concentrations and an ideal interface between the films and substrates. To optimize the morphology and microstructural quality of the films, a two-step growth was performed on h-BN layers transferred on transmission electron microscopy (TEM) compatible substrates. The resulting $Bi_2Se_3$ thin films were highly crystalline with atomically smooth terraces over a large area, and the $Bi_2Se_3$ and h-BN exhibited a clear heteroepitaxial relationship with an atomically abrupt and clean interface, as examined by high-resolution TEM. Magnetotransport characterizations revealed that this interface supports a high quality topological surface state devoid of bulk contribution, as evidenced by Hall, Shubnikov-de Haas, and weak anti-localization measurements. We believe that the experimental scheme demonstrated in this talk can serve as a promising method for the preparation of high quality TI thin films as well as many other heterostructures based on 2D vdW layered materials.

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열 화학기상증착법을 이용한 탄화규소 나노선의 합성 및 특성연구 (Characterization of SiC nanowire Synthesized by Thermal CVD)

  • 정민욱;김민국;송우석;정대성;최원철;박종윤
    • 한국진공학회지
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    • 제19권4호
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    • pp.307-313
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    • 2010
  • 본 연구에서는 열 화학기상증착법(thermal chemical vapor deposition)을 이용하여 분말 형태의 규소(Si)와 염화니켈 수화물 $(NiCl_2{\cdot}6H_2O)$을 혼합한 후 탄소공급원인 $CH_4$ 가스를 주입하여 탄화규소 나노선(SiC nanowire)을 합성하였다. 합성 온도와 $CH_4$ 가스 유량 변화에 따른 탄화규소 나노선의 구조적 특성을 분석한 결과, 합성온도가 $1,400^{\circ}C$, $CH_4$ 가스의 유량이 300 sccm인 경우가 탄화규소 나노선의 합성에 최적화된 조건임을 라만 분광법(Raman spectroscopy)과 X-선 회절(X-ray diffraction), 주사전자현미경(scanning electron microscopy), 그리고 투과전자현미경(transmission electron microscopy) 분석을 통해 확인하였다. 합성된 탄화규소 나노선의 직경은 약 50~150 nm이며, 곧은 방향성과 높은 결정성을 가지는 입방구조(cubic structure)를 지니고 있었다.