• 한국전자파학회논문지
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• 제25권11호
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• pp.1164-1171
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• 2014

Bulk Current Injection(BCI) 테스트는 전류 주입 프로브를 사용하여 측정하고자 하는 Integrated Circuit(IC)에 전류를 주입하여 Electromagnetic Compatibility(EMC) 규격을 충족시키는지 시험하는 방법이다. 본 논문에서는 국제전기표준회의에서 제정한 IEC 62132-part 3에서 규정하는 BCI 테스트의 전류 주입 프로브를 대체하여, RF 잡음을 인가할 수 있는 마이크로스트립 커플러 구조를 제안하였다. 전통적으로 높은 전원 전압을 사용하는 자동차 IC 테스트에 사용되어 오던 BCI 전류 주입 프로브를 저 전압을 사용하는 저 전력 IC의 테스트에 사용할 수 있는 마이크로스트립 커플러 구조를 개발하여 그 유효성을 100 MHz에서부터 1,000 MHz까지의 주파수 영역에서 비교 및 검증하였다. 또한, 주파수에 따라 전류 주입 프로브를 통한 RF 잡음 인가와 마이크로스트립 커플러 구조를 통한 RF 잡음 인가 시 규정한 노이즈를 얻는데 필요한 전력을 dBm 단위로 측정, 비교하여 마이크로스트립 커플러 구조를 이용한 경우에 더 적은 전력으로 필요한 RF 잡음을 주입할 수 있음을 확인하였다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권2호
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• pp.114-126
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• 2013

In this paper, we present a set of methodologies to model the electromagnetic susceptibility (EMS) testing of I/O buffers for mobile system memory based on the bulk current injection (BCI) method. An efficient equivalent circuit model is developed for the current injection probe, line impedance stabilization network (LISN), printed circuit board (PCB), and package. The simulation results show good correlation with the measurements and thus, the work presented here will enable electromagnetic susceptibility analysis at the integrated circuit (IC) design stage.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.426-429
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• 1999

In this paper, we have provided the measurement technique of the grounding mesh resistance by field measurements. The standard of measurement is specified in the IEEE Std 81.2-1991 and JEAC 5001-1988, which is the the fall-of-potential method by test-current injection, but this method is difficult to apply at field, where is small around a electric power substation of domestic. For the convenient measurement method, space of assistant probe and quantity of test-current injection are changed step for step. As the result, ' the proposed measurement technique of grounding mesh resistance is that the space of current and potential probes must be fixed at 150rn from a grounding mesh, the test-current injection has to keep 5A or more.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권2호
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• pp.202-211
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• 2014

The bulk current injection (BCI) and direct power injection (DPI) method have been established as the standards for the electromagnetic susceptibility (EMS) test. Because the BCI test uses a probe to inject magnetically coupled electromagnetic (EM) noise, there is a significant difference between the power supplied by the radio frequency (RF) generator and that transferred to the integrated circuit (IC). Thus, the immunity estimated by the forward power cannot show the susceptibility of the IC itself. This paper derives the real injected power at the failure point of the IC using the power transfer efficiency of the BCI method. We propose and mathematically derive the power transfer efficiency based on equivalent circuit models representing the BCI test setup. The BCI test is performed on I/O buffers with and without decoupling capacitors, and their immunities are evaluated based on the traditional forward power and the real injected power proposed in this work. The real injected power shows the actual noise power level that the IC can tolerate. Using the real injected power as an indicator for the EMS test, we show that the on-chip decoupling capacitor enhances the EM noise immunity.

• 한국광학회지
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• 제17권2호
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• pp.143-148
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• 2006

광섬유 내 브릴루앙 산란의 이득 스펙트럼을 측정하는 새로운 방법을 제안하고 실험하였다. 기존의 측정 방식과는 달리, 주입전류를 직접 변조하여 광주파수 변조된 하나의 레이저 다이오드로부터 펌프광과 프로브광을 발생시키고, 주입전류를 사각파로 변조할 때 나타나는 광주파수 처핑을 이용하여 펌프/프로브간 광주파수 차이를 연속적으로 변화시키는 방법으로 브릴루앙 이득 스펙트럼을 측정하였다. 통신용 단일모드 광섬유의 브릴루앙 이득 스펙트럼을 측정하여 기존 문헌의 결과와 거의 일치하는 결과를 얻었다.

• 전자공학회논문지SC
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• 제48권3호
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• pp.53-59
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• 2011

본 논문에서는 DNA 올리고뉴클리오타이드(oligonucleotide)를 통한 전하 이동을 기반으로 하는 분자성 전자광학 스위칭 소자를 제시한다. DNA 올리고머(oligomer)가 흡착되어 있는 금전극에 전자들이 주입되어 전극으로부터 DNA 올리고머로 전하가 흘러가게 하고 이 전하의 이동도를 광학적 스위칭으로 확인할 수 있도록 제안되었다. DNA 올리고머의 흡착량이 증가함에 따라 DNA를 통한 전하의 이동성과 전극 표면에서의 전하전달 제한성으로 인해 전리전류는 감소하였다. DNA의 끝단에 합성된 Cy3 형광 분자의 점멸도를 전극 기반의 전하 주입법을 이용하여 확인하였다. 이러한 결과들은 DNA 올리고머를 이용한 새로운 분자성 전자광학 스위칭 소자에 이용될 수 있다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제1권1호
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• pp.15-19
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• 2001

Current leakage is the major failure mode of semiconductor device characteristic failures. Conventionally, failures such as short circuit breaks and gate breakdowns have been analyzed and the detected causes have been reflected in the fabrication process. By using a wafer-level emission-leakage failure analysis method (in-line QC), we analyzed leakage mode failure, which is the major failure detected during the probe inspection process for LSIs, typically DRAMs and CMOS logic LSIs. We have thus developed a new technique that copes with the critical structural failures and random failures that directly affect probe yields.

• Journal of Electrical Engineering and Technology
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• 제1권3호
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• pp.359-365
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• 2006

Since the start of the KSTAR (Korea Superconducting Tokamak Advanced Research) project, Instrumentation and Control (I&C) of the Neutral Beam Test Facility (NB-TF) has been striving to answer diverse requests arising from various facets during the project's development and construction phases. Hard-wired electrical circuits have been designed, tested, fabricated, and finally installed to the relevant parts of the system. In relation to the vacuum system I&C, controlling functions for the rotary pumps, a Roots pump, two turbomolecular pumps, and four cryosorption pumps have been constructed. I&C for the ion source operation are the temperature and flow rate signal monitoring, Langmuir probe signal measurements, gradient grid current measurements, and arc detector circuit. For the huge power system to be monitored or safely operated, many temperature measurement functions have also been implemented for the beam line components like the neutralizer, bending magnet, ion dump, and calorimeter. Nearly all of the control and probe signals between the NB test stand and the control room were made to be transmitted through the optical cables. Failures of coolant flow or beam line vacuum pressure were made to be safely blocked from influencing the system by an appropriate interlock circuit that will shut down the extraction voltage application to the system or prevent damages to the vacuum components. Preliminary estimation of the beam power through the calorimetric measurement shows that 87.9% of the total power of the 60kV/18A beam with 200 seconds duration is absorbed by the calorimeter surface. Most of these I&C results would be highly appropriate for the construction of the main NBI facility for the KSTAR national fusion research project.

• KIEE International Transaction on Electrical Machinery and Energy Conversion Systems
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• 제5B권3호
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• pp.289-295
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• 2005

Instrumentation and Control (I&C) of the Neutral Beam Test Stand (NB- TS) Facility at the Korea Atomic Energy Research Institute (KAERI) for the Korea Superconducting Tokamak Advanced Research (KSTAR) project has been underway since the start of the project to answer the diverse requests arising from the various facets of the development and construction phases of the project. Optical signal transmission constitutes a significant portion of I&C works and has been performed for the entirety of the project. During the NB- TS construction and related experiments, significant achievements to a more accurate as well as more refined optical signal transmissions have been made. Examples of those I&C works that utilized the optical signal transmission are the Langmuir probe signal transmission, gradient grid current signal transmission, gas flow control and signal transmission, ion source temperature measurement, beam line component temperature monitoring, and coolant flow signal transmission, etc. These optical signal transition provisions are now performing part of the indispensable functions for the proper operation of the NB- TS facility. Attained experience and expertise are expected to be well applied to the upcoming main neutral beam injection (NBI) system construction for the KSTAR project.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2010년도 제39회 하계학술대회 초록집
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• pp.58-58
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• 2010

Reactive or unstable adsorbates are often difficult to study spectroscopically. They may have, for instance, resonance states lying close to the Fermi level, inducing them to desorb or decompose by the probe itself, low-energy tunneling electrons. In order to overcome this limitation, we developed a novel method, which we call x-ramp scan. The method sweeps the bias voltage, with the simutaneous scan along the imaging direction, in a constant current mode. This mapping yields the tip-height variation as a function of bias, or Z(V), at nominally always fresh surface. We applied this method to the investigation of methanol-induced molecular features, attributed to methoxy, found on NiAl(110) surface. These were produced by methanol molecules deposited by a pulse injection method onto the metallic surface. Our study shows adsorbed methoxy are very reactive to the bias voltage, rendering the standard spectroscopy useless. Our new x-ramp scan shows that the decomposition of adsorbates occurs at the sample bias of 3.63 V, and proceeds with the lifetime of a few milliseconds. The details of the method will be provided at the discussion.