• Title/Summary/Keyword: Copper etching

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Effect of Plasma Etching and $PdCl_2/SnCl_2$ Catalyzation on the Performance of Electroless Plated Copper Layer (플라즈마 에칭 및 $PdCl_2/SnCl_2$ 촉매조건이 무전해 동도금 피막의 성능에 미치는 영향)

  • 오경화;김동준;김성훈
    • Journal of the Korean Society of Clothing and Textiles
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    • v.27 no.7
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    • pp.843-850
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    • 2003
  • Cu/PET film composites were prepared by electroless copper plating method. In order to improve adhesion between electroless plated Cu layer and polyester (PET) film, the effect of pretreatment conditions such as etching method, mixed catalyst composition were investigated. Chemical etching and plasma treatment increased surface roughness in decreasing order of Ar>HCl>O$_2$>NH$_3$. However, adhesion of Cu layer on PET film increased in the following order: $O_2$<Ar<HCl<NH$_3$. It indicated that appropriate surface roughness and introduction of affinitive functional group with Pd were key factors of improving adhesion of Cu layer. PET film was more finely etched by HCI tolution, resulting in an improvement in adhesion between Cu layer and PET film. Plasma treatment with NH$_3$produced nitrogen atoms on PET film, which enhances chemisorption of Pd$^{2+}$ on PET film, resulting in improved adhesion and shielding effectiveness of Cu layer deposited on the Pd catalyzed surface. Surface morphology of Cu plated PET film revealed that Pd/Sn colloidal particles became more evenly distributed in the smaller size by increasing the molar ratio of PdCl$_2$; SnCl$_2$from 1 : 4 to 1 : 16. With increasing the molar ratio of mixed catalyst, adhesion and shielding effectiveness of Cu plated PET film were increased.d.

Surface Modification for Improving Adhesion between Etching Resist and Copper Substrate (Etching resist와 Copper substrate 간의 Adhesion 향상을 위한 표면개질)

  • Park, Sung-Jun;Seo, Shang-Hoon;Kim, Yong-Sik;Kim, Tae-Gu;Lee, Sang-Gyun;Joung, Jae-Woo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.129-129
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    • 2006
  • 인쇄회로를 제작하기 위하여 기판상에 에칭 레지스트, 도금막, 절연재료, 솔더 마스크 등을 패터닝 하게 되는데, 일반적으로 이러한 유기체 막들은 대부분 액상이나 고형의 필름 형태로 패턴을 형성하게 된다. 형성된 패턴과 동박과의 접착력 향상이 가장 주요한 문제점 중의 하나이다. 상대적으로 편평한 동박면과 유기체 막과의 접착력을 향상시키기 위해 일반적으로 접촉 면적을 증가시키기 위한 표면개질을 하게 된다. 기계적 브러싱이나 스크러빙에 의해서도 기판상의 동박의 surface topography 를 개선하기 위한 노력이 시도 되고 있지만, 본 연구에서는 microetching 방법에 의해서 화학적으로 동박 표면상에 최대한 요철을 많이 형성하여 에칭 레지스트와 동박 간의 접착력을 증대시키기 위한 연구를 수행하였다.

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Micro channel forming of ultra thin copper foil (초미세 구리 박판의 마이크로 채널 성형)

  • Joo B. Y.;Rhim S. H.;Oh S. I.;Baek S. W.
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2005.09a
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    • pp.49-53
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    • 2005
  • The objective of this research was to establish the size limitation of micro metal forming and analyze the formability of foil. Flat-rolled ultra thin metallic copper foil($3{\mu}m$ in thickness) was used as a forming material and foil was annealed to improve the formability at the temperature of $385^{\circ}C$. Forming die was fabricated by using etching technique of DRIE(deep reactive ion etching) and HNA isotropic etching. For the forming die and coupe. foil were vacuum packed and the forming was conducted as applying hydrostatic pressure of 250MPa to the vacuum packed unit. We successfully obtained the micro channels of $12\~14{\mu}m$ width and $9{\mu}m$ depth from micro forming process we designed. We also investigated the thickness strain distribution of foil from experiment and FE simulation result. Micro channels had a good formability of smooth surface and size accuracy. We expect that micro metal forming technology will be applied to production of micro parts.

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Nanoscale Fluoropolymer Pattern Fabrication by Capillary Force Lithography for Selective Deposition of Copper

  • Baek, Jang-Mi;Lee, Rin;Seong, Myeong-Mo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.369-369
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    • 2012
  • The present work deals with selective deposition of copper on fluoropolymers patterned silicon (111) surfaces. The pattern of fluoropolymer was fabricated by nanoimprint lithography (NIL) and plasma reactive ion etching (RIE) was used to remove the residuals layers. Copper was electrochemically deposited in bare Si regions which were not covered with fluoropolymers. The patterns of fluoropolymers and copper have been investigated by scanning electron microscopy (SEM). In this work, we used two deposition methods. One is galvanic displacement method and another is electrodeposition. Selective deposition works in both cases and it shows applicability to other materials. By optimization of the deposition conditions can be achieved therefore this process represents a simple approach for a direct high resolution patterning of silicon surfaces.

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A Fabrication Method of Blade Type Tip for Probe Unit Device (프르브유닛 소자용 블레이드형 팁 제조방법)

  • Lee, Keun-Woo;Lee, Jae-Hong;Kim, Chang-Kyo
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.8
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    • pp.1436-1440
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    • 2007
  • Beryllium copper has been known to be an important material for the various fields of industry because it can be used for mechanical and electrical/electronic components that are subjected to elevated temperatures (up to $400^{\circ}C$ for short times). Blade type tip for probing the cells of liquid crystal display(LCD) was fabricated using beryllium copper foil. The dry film resist was employed as a mask for patterning of the blade type tip. The beryllium copper foil was etched using hydrochloric acidic iron-chloride solution. The concentration, temperature, and composition ratio of hydrochloric acidic iron-chloride solution affect the etching characteristics of beryllium copper foil. Nickel with the thickness of $3{\mu}m$ was electroplated on the patterned copper beryllium foil for enhancing its hardness, followed by electroplating gold for increasing its electrical conductivity. Finally, the dry film resist on the bridge was removed and half of the nickel was etched to complete the blade type tip.

Effect on Copper Recovery by Ultrasonic Energy during Cementation Reaction from Copper-contained Waste Etching Solution (구리 함유 폐에칭액의 시멘테이션 반응 시 구리 회수에 미치는 초음파 에너지의 영향)

  • Kim, Boram;Jang, Dae-Hwan;Kim, Dae-Weon;Chae, Byung-Man;Lee, Sang-Woo
    • Resources Recycling
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    • v.31 no.4
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    • pp.34-39
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    • 2022
  • In this study, effects of ultrasonic energy on the cementation reaction and copper recovery rate were investigated for different types of iron samples, such as plate, chip, and powder, for recovering copper from waste etchant, which contained ~3.5% copper. The cementation reaction using the ultrasonic energy was more effective than the simple stirring reaction, with the former exhibiting a high copper recovery rate than the latter for the same time interval. When cementation was performed for 25 min with ultrasonic treatment, rather than simple stirring, the copper recovery rate of the plate, chip, and powder improved from 7.0% to 12.0%, 14.0% to 46.1%, and 41.9% to 77.2%, respectively. Therefore, the use of ultrasonic energy could detach the copper recovered by the cementation reaction from the surface of the iron samples, thereby increasing the copper recovery rate. Owing to the use of ultrasonic energy, the copper recovery rate increased by 2-6 times, and the recovered copper exhibited a decreased particle size compared to that obtained via simple stirring.

Dry Etching Characteristic of TiN Thin Films using Inductively Coupled Plasma (TiN 박막의 건식 식각 특성)

  • Park, Jung-Soo;Kim, Chang-Il
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.383-383
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    • 2010
  • TiN is one of the mostly used barrier materials in copper metallization because of low friction coefficient and superior electrical properties. We need to investigate for the etching characteristic of TiN. In this study, we investigated about etching characteristic of TiN using $BCl_3$/Ar inductively coupled plasma system. The etch rate was measured by a depth pro filer. The chemical etching reactions of the TiN surface was investigated X-ray photoelectron spectroscopy.

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A study on Safety Management and Control in Wet-Etching Process for H2O2 Reactions (습식 에칭 공정에서의 과산화수소 이상반응에 대한 안전 대책 및 제어에 관한 연구)

  • Yoo, Heung-Ryol;Son, Yung-Deug
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.19 no.4
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    • pp.650-656
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    • 2018
  • The TFT-LCD industry is a kind of large-scale industrial Giant Microelectronics device industry and has a similar semiconductor process technology. Wet etching forms a relatively large proportion of the entire TFT process, but the number of published research papers on this topic is limited. The main reason for this is that the components of the etchant, in which the reaction takes place, are confidential and rarely publicized. Aluminum (Al) and copper (Cu), which have been used in recent years for the manufacture of large area LCDs, are very difficult materials to process using wet etching. Cu, a low-resistance material, can only be used in the wet etching process, and is used as a substitute for Al due to its high speed etching, low failure rate, and low power consumption. Further, the abnormal reaction of hydrogen peroxide ($H_2O_2$), which is used as an etching solution, requires additional piping and electrical safety devices. This paper proposes a method of minimizing the damage to the plant in the case of adverse reactions, though it cannot limit the adverse reaction of hydrogen peroxide. In recent years, there have been many cases in which aluminum etching equipment has been changed to copper. This paper presents a countermeasure against abnormal reactions by implementing safety PLC with a high safety grade.