• Title/Summary/Keyword: Conventional sintering

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Study on Synthesis and Electromagnetic Properties of Ni- Zn Ferrite Sintered at Low Temperature (저온 소결용 Ni-ZN계 페라이트의 합성 및 전자기적 특성 연구)

  • Kim, Chul-Won;Koh, Jae-Gui
    • Korean Journal of Materials Research
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    • v.12 no.8
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    • pp.600-607
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    • 2002
  • The Ni-Zn synthetic ferrite were acquired from thermally decomposing the metal nitrates Fe(NO$_3$)$_3$.$9H_2$O, Zn($NO_3$)$_2$.$6H_2$O, Ni($NO_3$)$_2$. $6H_2$O, and Cu($NO_3$)$_2$. $3H_2$O at $150^{\circ}C$ for 24 hours and was calcined at $500^{\circ}C$. Each of those was pulverized for 3, 6, 9, and 12 hours in a steel ball mill and was sintered between $700^{\circ}C$ and $1,000^{\circ}C$ for 1 hour, and then their microstructures and electromagnetic properties were examined. We could make the initial specimens chemically bonded in liquid at the temperature as low as $150^{\circ}C$, by using the melting points less than $200^{\circ}C$ of the metal nitrates instead of the mechanical ball milling, then narrowed a distance between the particles into a molecular level, and thus lowed sintering temperature by at least $200^{\circ}C$ to$ 300^{\circ}C$. Their initial permeability was 50 to 400 and their saturation magnetic induction density and coercive force 2,400 G and 0.3 Oe to 0.5 Oe each, which were similar to those of Ni- Zn ferrite synthesized in the conventional process. In the graph of initial permeability vs frequencies, we could observe a $180^{\circ}C$rotation of the magnetic domain, which appears in a broad band of microwave near the resonance frequency.

Microstructure and Microwave Dielectric Properties of (1-x)Mg4Ta2O9-xTiO2(x=0\sim0.9) Ceramics ((1-x)Mg4Ta2O9-xTiO2(x=0\sim0.9)세라믹스의 미세구조와 마이크로파 유전 특성)

  • 김재식;최의선;이문기;류기원;이영희
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.8
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    • pp.840-845
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    • 2004
  • The microstructure and microwave dielectric properties of $(1-x){Mg}_4{Ta}_2{O}_9-xTi{O}_2(x=0\sim0.9)$ ceramics were investigated. The specimens were prepared by the conventional mixed oxide method with sintering temperature of 140$0^{\circ}C$∼150$0^{\circ}C$. To improve the quality factor and the temperature coefficient of resonant frequency,$ Ti{O}_2(\varepsilon\Gamma=100, Q\times f_\Gamma=40,000 GHz,\ta_f= +450 ppm\diagup^{\circ}C $ was added in ${Mg}_4{Ta}_2{O}_9$ceramics. The dielectric and structural properties were investigated. According to the XRD patterns, $(1-x){Mg}_4{Ta}_2{O}_9-xTi{O}_2(x=0\sim0.9)$ ceramics had the ${Mg}_4{Ta}_2{O}_9$ phase(hexagonal) and ${MgTi}_2{O}_5$phase(orthorhombic). The dielectric constant($\varepsilon_r$). quality($Qtimes{f}_r$${\tau}_f$) of the $(1-x){Mg}_4{Ta}_2{O}_9-xTi{O}_2(x=0\sim0.9)$ ceramics were 8.12∼18.59, 18,750∼186,410 GHz and -36.02∼+3.46 ppm/$^{\circ}C$, respectively.

Fabrication of Ceramic 3D Integration Technology for Ink-jet Printing (Ink-jet Printing을 이용한 3D-Integration 구현)

  • Hwang, Myung-Sung;Kim, Ji-Hoon;Kim, Hyo-Tae;Yoon, Young-Joon;Kim, Jong-Hee;Moon, Joo-Ho
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.332-332
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    • 2010
  • We have successfully demonstrated the inkjet printing method to create $Al_2O_3$ films withouWe have successfully demonstrated the inkjet printing method to create $Al_2O_3$ films without a high temperature sintering process. In order to remove the coffee ring effect in the ink drop, we have introduced a co-solvent system in order to create Marangoni flow in the ink drop, which leads to the dense packing of ceramic powders on the substrate during inkjet process. The packing density of the Inkjet-printed $Al_2O_3$ films is around 60% (max. 70%) which is very high compared to the value obtained from the same material films by other conventional methods such as film casting, dip coating process, etc. The voids inside the films (which are around 40% of the entire film volume) are filled with the polymer resin (Cyanate ester) by the infiltration process. This resin infiltration is also implemented by the inkjet printing process right after the Ah03 film ink-jetting process. The microstructures of the printed $Al_2O_3$ films are investigated by Scanning Electron Microscope (SEM) to understand the degree of packing density in the printed films. The inkjet-printed $Al_2O_3$ films have been characterized to investigate its thickness and roughness. Quality factor of the printed $Al_2O_3$ film is also measured to be over 300 at 1MHz.

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Dielectric and Piezoelectric Properties of 0.95(Na0.5K0.5)0.04[(Nb0.8Ta0.20)0.994Co0.015]O3-0.05KNbO3 Ceramics as a Function of Calcination Temperature (하소온도 변화에 따른 0.95(Na0.5K0.5)0.04[(Nb0.8Ta0.20)0.994Co0.015]O3-0.05KNbO3 세라믹스의 유전 및 압전 특성)

  • Park, Min-Ho;Lee, Kab-Soo;Yoo, Ju-Hyun;Jeong, Woy-Seung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.2
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    • pp.104-108
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    • 2013
  • In this paper, the $0.95(Na_{0.5}K_{0.5})_{0.04}[(Nb_{0.8}Ta_{0.20})_{0.994}Co_{0.015}]O_3$(abbreviated as NKNT) + $0.05KNbO_3$ lead-free piezoelectric ceramics were synthesized by the conventional mixed oxide method route with normal sintering. And also, the effects of calcination temperature on the microstructure, dielectric properties, and piezoelectric properties were investigated. A polymorphic phase transition(PPT) between orthorhombic and tetragonal phases was observed in specimens calcined at $810^{\circ}C{\sim}850^{\circ}C$. The ceramics calcined at $830^{\circ}C$ showed excellent piezoelectric properties: $d_{33}$= 179 pC/N, $k_p$= 0.384, $Q_m$= 79.73). These results indicate that the ceramic is a promising candidate material for lead-free piezoelectric ceramics.

Microstructure and Electrical Properties of Low Temperature Processed Ohmic Contacts to p-Type GaN

  • Park, Mi-Ran;Song, Young-Joo;Anderson, Wayne A.
    • ETRI Journal
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    • v.24 no.5
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    • pp.349-359
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    • 2002
  • With Ni/Au and Pd/Au metal schemes and low temperature processing, we formed low resistance stable Ohmic contacts to p-type GaN. Our investigation was preceded by conventional cleaning, followed by treatment in boiling $HNO_3$:HCl (1:3). Metallization was by thermally evaporating 30 nm Ni/15 nm Au or 25 nm Pd/15 nm Au. After heat treatment in $O_2$ + $N_2$ at various temperatures, the contacts were subsequently cooled in liquid nitrogen. Cryogenic cooling following heat treatment at $600^{\circ}C$ decreased the specific contact resistance from $9.84{\times}10^{-4}$ ${\Omega}cm^2$ to $2.65{\times}10^{-4}$ ${\Omega}cm^2$ for the Ni/Au contacts, while this increased it from $1.80{\times}10^{-4}$ ${\Omega}cm^2$ to $3.34{\times}10^{-4}$ ${\Omega}cm^2$ for the Pd/Au contacts. The Ni/Au contacts showed slightly higher specific contact resistance than the Pd/Au contacts, although they were more stable than the Pd contacts. X-ray photoelectron spectroscopy depth profiling showed the Ni contacts to be NiO followed by Au at the interface for the Ni/Au contacts, whereas the Pd/Au contacts exhibited a Pd:Au solid solution. The contacts quenched in liquid nitrogen following sintering were much more uniform under atomic force microscopy examination and gave a 3 times lower contact resistance with the Ni/Au design. Current-voltage-temperature analysis revealed that conduction was predominantly by thermionic field emission.

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The Effect of Grain Boundary Diffusion on the Boundary Structure and Electrical Characteristics of Semiconductive $SrTiO_3$ Ceramics (입계확산에 의한 반도성 $SrTiO_3$ 세라믹스의 입계구조 및 전기적 특성 변화)

  • 김태균;조남희
    • Journal of the Korean Ceramic Society
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    • v.34 no.1
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    • pp.23-30
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    • 1997
  • Semiconductive SrTiO3 ceramic bodies were prepared by conventional ceramic powder processes in-cluding sintering in a reducing atmosphere. Sodium or potassium ions were diffused from the surface of the sintered bodies into the inner region using thermal diffusion process at 800-120$0^{\circ}C$. The effects of such ther-mal treatments on the electrical and chemical characteristics of the grain boundaries were investigated. The presence of sodium or potassium ions at grain boundaries produces non-linear current-voltage behaviors, electrical boundary potential barriers of 0.1-0.2eV, and threshold voltages of 10-70V. The diffused ions form diffusion layers with thicknesses of 20-50nm near the grain boundaries, reducing the concentration of strontium and oxygen.

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Fabrication of Alloy Target for Formation of Ti-Al-Si-N Composite Thin Film and Their Mechanical Properties (Ti-Al-Si-N 박막 제작을 위한 합금 타겟 제조 및 박막의 기계적 특성)

  • Lee, Han-Chan
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.10
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    • pp.665-670
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    • 2016
  • Prevailing dissemination of machine tools and cutting technology have caused drastic developments of high speed dry machining with work materials of high hardness, and demands on the high-hardness-materials with high efficiency have become increasingly important in terms of productivity, cost reduction, as well as environment-friendly issue. Addition of Si to TiAlN has been known to form nano-composite coating with higher hardness of over 30 GPa and oxidation temperature over $1,000^{\circ}C$. However, it is not easy to add Si to TiAlN by using conventional PVD technologies. Therefore, Ti-Al-Si-N have been prepared by hybrid process of PVD with multiple target sources or PVD combined with PECVD of Si source gas. In this study, a single composite target of Ti-Al-Si was prepared by powder metallurgy of MA (mechanical alloying) and SPS (spark plasma sintering). Properties of he resulting alloying targets were examined. They revealed a microstructure with micro-sized grain of about $1{\sim}5{\mu}m$, and all the elements were distributed homogeneously in the alloying target. Hardness of the Ti-Al-Si-N target was about 1,127 Hv. Thin films of Ti-Al-Si-N were prepared by unbalanced magnetron sputtering method by using the home-made Ti-Al-Si alloying target. Composition of the resulting thin film of Ti-Al-Si-N was almost the same with that of the target. The thin film of Ti-Al-Si-N showed a hardness of 35 GPa and friction coefficient of 0.66.

Characteristics and Fabrication of Multi-Layered Piezoelectric Ceramic Actuators for Speaker Application (스피커 응용을 위한 적층형 압전 세라믹 액츄에이터 제조 및 특성)

  • Lee, Min-seon;Yun, Ji-sun;Park, Woon Ik;Hong, Youn-Woo;Paik, Jong Hoo;Cho, Jeong Ho;Park, Yong-Ho;Jeong, Young-Hun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.29 no.10
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    • pp.601-607
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    • 2016
  • Piezoelectric thick films of soft $Pb(Zr,Ti)O_3$ (PZT) based commercial material (S55) were fabricated using a conventional tape casting method. Ag-Pd electrodes were printed on the piezoelectric film at room temperature and all 5 layered films with a dimension of $12mm{\times}16mm$ were successfully laminated for a multi-layered piezoelectric ceramic actuator. The laminated specimens were co-fired at $1,100^{\circ}C$ for 1 h. A flat layered and dense microstructure was obtained for the $112{\mu}m$ thick piezoelectric actuator after sintering process. Thereafter, a prototype piezoelectric speaker was fabricated using the multi-layered piezoelectric ceramic actuator which can operate as a bimorph. Its SPL (sound pressure level) characteristic was also evaluated for speaker application. Frequency response revealed that the output SPL with a root mean square voltage of 10 V increased gradually to the highest peak of 87.5 dB for 1.5 kHz and exhibited a relatively stable behavior over the measured frequency range (${\leq}20kHz$) at a distance of 10 cm, implying that the fabricated piezoelectric speaker is potential for speaker applications.

Microwave assisted processing of silver thick films for microelectronic applications

  • Rane, Sunit;Bhatkar, Rushna;Mulik, Uttam;Amalnerkar, Dinesh
    • Advances in materials Research
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    • v.2 no.3
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    • pp.133-140
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    • 2013
  • This paper aims to focus on the microwave processing of thick films which is a fast, cheap technique and could be the alternative to the currently used conventional high temperature processing technique. Microwave processing has gained worldwide acceptance as a novel method for heating and sintering a variety of materials, as it offers specific advantages in terms of speed, energy efficiency, process simplicity, finer microstructures and lower environmental hazards. Silver conducting thick films were prepared and processed in the household microwave oven. The films sintered at different time period by keeping the other parameter such as microwave power, film thickness etc constant. The microstructure analysis revealed that the surface morphology of the microwave processed films become compact with respect to the processing time. The sheet resistance for microwave sintered silver films is in the range of 0.003 to $1.207{\Omega}/{\Box}$ where as the films fired at 750 and $850^{\circ}C$ showed the resistance of 0.009 and $0.003{\Omega}/{\Box}$ which can be comparable. The results revealed that the microstructure of the microwave sintered films has more uniform and compact surface than that of the conventionally fired films. The paper reports upon the preparation of silver thick film by screen printing technique and processing the same by microwave which also compared with the conventionally processed thick films.

Microwave Dielectric Properties of $0.95MgTiO_3-0.05SrTiO_3$ Ceramics with $V_2O_5$ ($V_2O_5$ 첨가에 따른 $0.95MgTiO_3-0.05SrTiO_3$ 세라믹스의 마이크로파 유전특성)

  • Nam, Gyu-Bin;Kim, Kang;Park, In-Gil;Ryu, Ki-Won;Lee, Young-Hie
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.05c
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    • pp.112-116
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    • 2002
  • The $0.95MgTiO_3-0.05SrTiO_3$ ceramics with $V_2O_5$(10wt%) were prepared by the conventional mixed oxide method. The structural properties were investigated with sintering temperatue by XRD. According to the X-ray diffraction pattern of the $0.95MgTiO_3-0.05SrTiO_3$ ceramics with $V_2O_5$(10wt%), the ilmenite $MgTiO_3$ and perovskite $SrTiO_3$ structures were coexisted and secondary phase $MgTi_2O_5$ were appeared. In the case of $0.95MgTiO_3-0.05SrTiO_3$ ceramics with $V_2O_5$(10wt%), dielectric constant, quality factor and temperature coefficient of resonant frequency were 15.84~18.28, 12627~23138GHz, -21.414~1.568$ppm/^{\circ}C$, respectively.

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