• Title/Summary/Keyword: Common-path interferometer

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Post-tuning of Sample Position in Common-path Swept-source Optical Coherence Tomography

  • Park, Jae-Seok;Jeong, Myung-Yung;Kim, Chang-Seok
    • Journal of the Optical Society of Korea
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    • v.15 no.4
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    • pp.380-385
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    • 2011
  • Common-path interferometers are widely used for endoscopic optical coherence tomography (OCT) because an arbitrary arm length can be chosen for the endoscopic imaging probe. However, the scheme suffers from the limited range of the sample position distance from the end of the imaging probe because the position between the reference reflector and the sample is limited by the optical path-length difference (OPD) to induce an interference signal. In this study, we developed a novel method for compensating the arbitrary sample position in common-path swept-source OCT by adding an extra Mach-Zehnder interferometer in the post-path of the interfered optical signal. Theoretical analysis and an experimental demonstration of imaging depth tuning for the flexible sample position of an endoscopic OCT image are discussed. After post-tuning of sample position distance, the positioning limitation between the reference reflector and the sample can be solved for various sample positions over a range of 26 mm for the cross-sectional images of a fish eye sample.

Dual Optical Encryption for Binary Data and Secret Key Using Phase-shifting Digital Holography

  • Jeon, Seok Hee;Gil, Sang Keun
    • Journal of the Optical Society of Korea
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    • v.16 no.3
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    • pp.263-269
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    • 2012
  • In this paper, we propose a new dual optical encryption method for binary data and secret key based on 2-step phase-shifting digital holography for a cryptographic system. Schematically, the proposed optical setup contains two Mach-Zehnder type interferometers. The inner interferometer is used for encrypting the secret key with the common key, while the outer interferometer is used for encrypting the binary data with the same secret key. 2-step phase-shifting digital holograms, which result in the encrypted data, are acquired by moving the PZT mirror with phase step of 0 or ${\pi}/2$ in the reference beam path of the Mach-Zehnder type interferometer. The digital hologram with the encrypted information is a Fourier transform hologram and is recorded on CCD with 256 gray level quantized intensities. Computer experiments show the results to be encryption and decryption carried out with the proposed method. The decryption of binary secret key image and data image is performed successfully.

Polarization Phase-shifting Technique for the Determination of a Transparent Thin Film's Thickness Using a Modified Sagnac Interferometer

  • Kaewon, Rapeepan;Pawong, Chutchai;Chitaree, Ratchapak;Bhatranand, Apichai
    • Current Optics and Photonics
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    • v.2 no.5
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    • pp.474-481
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    • 2018
  • We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.

Common-path OCT Image Using Partial Reflecting Probe (부분 반사 프로브를 사용한 공통경로 OCT 이미지 획득)

  • Park, Jae-Seok;Jeong, Myung-Yung;Kim, Chang-Seok;Han, Jae-Ho;Kang, Jin-U.
    • Korean Journal of Optics and Photonics
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    • v.19 no.2
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    • pp.103-107
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    • 2008
  • Unlike conventional optical coherence tomography systems based on Michelson interferometer, we suggest a common-path OCT system, which does not include a separated configuration between reference signal and sample signal. We optimize the refractive index of partial reflecting probe to induce a balanced intensity of the reference signal. At the end of the probe, convex lens was optimally fabricated to get images of biological samples in the position of focus. Using the experimental system, we could get 2-D images of various biological samples.

Measurement of Refractive Index Profile of Optical Fiber Using the Diffraction Phase Microscope (회절위상현미경을 이용한 광섬유의 굴절률 프로파일 측정)

  • Jafar-Fard, Mohammad R.;Moon, Sucbei
    • Korean Journal of Optics and Photonics
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    • v.23 no.4
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    • pp.135-142
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    • 2012
  • We have developed a measurement method of the refractive index profile of an optical fiber by using diffraction phase microscopy. In the microscope system, the reference light was extracted directly from the probe light that passed through the sample by means of pinhole filtering with a diffraction grating. The spatial interference pattern produced by the probe light and the reference light was processed to generate the phase image of the sample fiber. The index profile was obtained by the inverse Abel transform of the phase profile. In order to remove the background phase that originated from the index difference between the cladding and the surrounding medium, the background phase was calculated from the phase data of the cladding to make a core phase profile that can be directly transformed to the index profile of the core without the full phase image that includes the entire cladding part.