• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.8
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• pp.61-70
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• 2009

A 10b 30MS/s pipelined ADC operating under 1V power supply is presented. It utilizes a switched-RC based input sampling circuit and a resistive loop to reset the feedback capacitor in the multiplying digital-to-analog converter (MDAC) for the low-voltage operation. Cascaded switched-RC branches are used to achieve accurate grain of the MDAC for the first stage and separate switched-RC circuits are used in the sub-ADC to suppress the switching noise coupling to the MDAC input The measured differential and integral non-linearities of the prototype ADC fabricated in a 0.13${\mu}m$, CMOS process are less than 0.54LSB and 1.75LSB, respectively. The prototype ADC achieves 54.1dB SNDR and 70.4dB SFDR with 1V supply and 30MHz sampling frequency while consuming 17mW power.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.4
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• pp.36-42
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• 2008

40Gb/s CMOS Clock and Data Recovery circuit design for optical serial link is proposed. The circuit generates 8 multiphase clock using LC tank PLL and controls the phase between the clock and the data using the $2{\times}$ oversampling Bang-Bang PD. 40Gb/s input data is 1:4 demultiplexed and recovered to 4 channel 10Gb/s outputs. The design was progressed to separate the analog power and the digital power. The area of the chip is $2.8{\times}2.4mm^2$ for the inductors and the power dissipation is about 200mW. The chip has been fabricated using 0.18um CMOS process. The measured results show that the chip recovers the data up to 9.5Gb/s per channel(Equivalent to serial input rate of up to 38Gb/s).

• Journal of IKEEE
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• v.8 no.1 s.14
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• pp.54-62
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• 2004

In this paper, we discuss on the design of a current mode CMOS multiplier circuit over $GF(3^m)$. Using the standard basis, we show the variation of vector representation of multiplicand by multiplying primitive element α, which completes the multiplicative process. For the $GF(3^m)$ multiplicative circuit design, we design GF(3) adder and multiplier circuit using current mode CMOS technology and get the simulation results. Using the basic gates - GF(3) adder and multiplier, we build the $GF(3^m)$ multiplier circuit and show the examples for the case m=3. We also propose the assembly of the operation blocks for a complete $GF(3^m)$ multiplier. Therefore, the proposed circuit is easily extensible to other p and m values over $GF(p^m)$ and has advantages for VLSI implementation. We verify the validity of the proposed circuit by functional simulations and the results are provided.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.3
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• pp.198-204
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• 2001

In this paper, a 3V 8-bit 200MSPS CMOS folding / interpolation A/D Converter is proposed. It employs an efficient architecture whose FR(Folding Rate) is 8, NFB(Number of Folding Block) is 4, and IR (Interpolating Rate) is 8. For the purpose of improved SNDR by to be low input frequency, distributed track and hold circuits are included. In order to obtain a high speed and low power operation, further, a novel dynamic latch and digital encoder based on a novel delay error correction are proposed. The chip has been fabricated with a 0.35${\mu}{\textrm}{m}$ 2-poly 3-metal n-well CMOS technology. The effective chip area is 1070${\mu}{\textrm}{m}$$\times$650${\mu}{\textrm}{m}$ and it dissipates about 230mW at 3.3V power supply. The INL is within $\pm$1LSB and DNL is within $\pm$1LSB, respectively. The SNDR is about 43㏈, when the input frequency is 10MHz at 200MHz clock frequency.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1093-1096
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• 2003

본 논문에서는, CMOS APS Image Sensor 내에 포함되어 회로의 면적을 줄인 새롭게 제안된 CMOS Bandgap Reference Bias Generator (BGR)를 온도 및 방사능에 대한 응답을 실험하였다. 제안된 BGR 회로의 설계 목표는 V/sub DD/는 2.5V이상이고, V/sub ref/는 0.75V ± 0.5mV 마진을 가지게 하는 것이다. 제안된 BGR회로는 Level Shifter를 갖는 Differential OP-amp단과 Feedback-Loop를 가지는 Cascode Current Mirror를 사용하여 저전압에서도 동작을 가능하게 하였으며, 높은 출력저항 특성을 가지도록 하였다. 제안된 BGR회로는 하이닉스 0.18㎛ ( triple well two-poly five-metal ) CMOS 공정을 이용하여 Test Chip을 제작하였다. 온도의 변화와 Co-60 노출조건 하에서 Total ionization dose (TID) effect된 BGR회로의 V/sub ref/를 측정하여, 이를 평가하였다. 온도에 대한 반응은, 25℃ 일 때의 V/sub ref/에 대해, 각각 45 ℃에서 0.128%. 70℃에서 0.768% 변화하였다. 그리고 온도가 25℃일 때 50krad와 100krad의 방사능을 조사 하였을 경우, V/sub ref/는 각각 2.466%, 그리고 4.612% 변화하였다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.55-60
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• 2007

This paper presents a compact double resolution scheme for the optical angle sensor based on 1-dimensional CMOS photodiode pixel array. All the pixels are divided into the even pixel and the odd pixel groups. The winner take all circuit is provided for each group. The proposed interpolation scheme increases the resolution by 2 from the winner addresses and winner values. The interpolation scheme can be implemented without any additional pixels or winner take all circuits and require only a comparator and a XOR gate. The proposed pixel array chip that has 336 photodiode pixels with $5.6{\mu}m$ pitch was fabricated with $0.35{\mu}m$ CMOS process and was assembled with a $50{\mu}m$ slit to form an angle sensor. The measured resolution is $0.1{\circ}$ with the proposed interpolation. The chip consumes 35mW and provides 8k samples per second.

• Journal of IKEEE
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• v.18 no.4
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• pp.586-592
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• 2014

In this paper, high efficiency power management IC(PMIC) with DT-CMOS(Dynamic threshold voltage Complementary MOSFET) switching device is presented. PMIC is controlled PWM control method in order to have high power efficiency at high current level. The DT-CMOS switch with low on-resistance is designed to decrease conduction loss. The control parts in Buck converter, that is, PWM control circuit consist of a saw-tooth generator, a band-gap reference(BGR) circuit, an error amplifier, comparator circuit, compensation circuit, and control block. The saw-tooth generator is made to have 1.2MHz oscillation frequency and full range of output swing from supply voltage(3.3V) to ground. The comparator is designed with two stage OP amplifier. And the error amplifier has 70dB DC gain and $64^{\circ}$ phase margin. DC-DC converter, based on current mode PWM control circuits and low on-resistance switching device, achieved the high efficiency nearly 96% at 100mA output current. And Buck converter is designed along LDO in standby mode which fewer than 1mA for high efficiency. Also, this paper proposes two protection circuit in order to ensure the reliability.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.12
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• pp.52-57
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• 2011

This paper presents a 4-channel optical transmitter circuit realized in a $0.18{\mu}m$ CMOS technology for high-speed digital interface. Particularly, the VCSEL driver exploits the feed-forward technique, and the pre-amplifier employs the pulse-width control. Thus, the optical transmitter operates at the bias current up to 4mA and the modulation current from $2{\sim}8mA_{pp}$. with the pulse-width distortion compensated effectively. The 4-channel optical transmitter array chip occupies the area of $1.0{\times}1.7mm^2$ and dissipates 35mW per channel at maximum current operations from a single 1.8V supply.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.4
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• pp.292-301
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• 2001

IDDQ Testing is a very effective testing method to detect many kinds of physical defects occurred in CMOS VLSI circuits. In this paper, we consider the most commonly occurring bridging faults in current CMOS technologies and develop pattern generator for IDDQ testing using efficient IDDQ test algorithms. The complete set of bridging faults between every pair of all nodes(internal and external nodes) within circuit under test is assumed as target fault model. The merit of considering the complete bridging fault set is that layout information is not necessary. Implemented test pattern generator uses a new neighbor searching algorithm and fault collapsing schemes to achieve fast run time, high fault coverage, and compact test sets. Experimental results for ISCAS benchmark circuits demonstrate higher efficiency than those of previous methods.

• Journal of the Korea Computer Industry Society
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• v.3 no.1
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• pp.57-66
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• 2002

In this study, Multi-Values Logic processor was designed using the basic circuit of the electric current mode CMOS. First of all, binary FFT(Fast Fourier Transform) was extended and high-speed Multi-Valued Logic processor was constructed using a multi-valued logic circuit. Compared with the existing two-valued FFT, the FFT operation can reduce the number of transistors significantly and show the simplicity of the circuit. Moreover, for the construction of amount was used inside the FFT circuit with the set of redundant numbers like ［0,1,2,3］. As a result, the defects in lines were reduced and it turned out to be effective in the aspect of normality an regularity when it was used designing VLSI(Very Large Scale Integration). To multiply FFT, the time and size of the operation was used as LUT(Look Up Table) Finally, for the compatibility with the binary system, multiple-valued hybrid-type FFT processor was proposed and designed using binary-four valued encoder, four-binary valued decoder, and the electric current mode CMOS circuit.