• Title/Summary/Keyword: Average Run Length(ARL)

Search Result 70, Processing Time 0.023 seconds

Multivariate Cumulative Sum Control Chart for Dispersion Matrix

  • Chang, Duk-Joon;Shin, Jae-Kyoung
    • Journal of the Korean Data and Information Science Society
    • /
    • v.13 no.2
    • /
    • pp.21-29
    • /
    • 2002
  • Several different control statistics to simultaneously monitor dispersion matrix of several quality variables are presented since different control statistics can be used to describe variability. Multivariare cumulative sum (CUSUM) control charts are proposed and the performances of the proposed CUSUM charts are evaluated in terms of average run length (ARL). Multivariate Shewhart charts are also proposed to compare the properties of the proposed CUSUM charts. The numerical results show that multivariate CUSUM charts are more efficient than multivariate Shewhart charts for small or moderate shifts. And we also found that small reference value of the CUSUM chart is more efficient for small shift.

  • PDF

Development of the Statistical Process Control System Using the Kalman Filter (칼만필터를 적용한 통계적 공정관리 시스템의 개발)

  • Kim, Yang-Ho;Hur, Jung-Joon;Kim, Gwang-Sub
    • Journal of Korean Society for Quality Management
    • /
    • v.22 no.2
    • /
    • pp.20-32
    • /
    • 1994
  • This paper is concerned with the design of four control charts for real-time monitoring of the continuous flow processes. Control charts for both uncorrelated data and correlated data are designed using the Kalman filtering techinque. The relative performance between the designed control charts and traditional control charts is evaluated in terms of the Average Run Length(ARL). Results show that the Adaptive EWMA control charts designed for uncorrelated data has better performance when process mean is shifted, while the residual control charts for correlated data has better performance when process is in control.

  • PDF

EWM-MR chart for individual measurements in start-up process (초기공정에서 개별관측치를 이용한 EWM-MR 관리도)

  • 지선수
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.21 no.47
    • /
    • pp.211-218
    • /
    • 1998
  • In start-up process control applications it may be necessary to limit the sample size to one measurement. A control chart for individual measurements is used whenever it is desirable to examine each individual value from the process immediately. A possible option would be to use an exponential weighted moving(EWM), using modifying statistics with individual measurement, chart for monitoring the process center, and using a moving range (MR) chart for monitoring process variability. In this paper it is shown that there is scheme in using the EWM procedure based on average run length. An expression for the ARL is given in terms of an integral equation, approximated using numerical quadrature. In this case, where it is reasonable to assume normality and negligible autocorrelation in the observations, provide graphs that simplify the design of EWM-MR chart and taking method of exponential smoothing constant(λ) and constant(K) are suggested. The charts suggested above evaluate using the conditional probability.

  • PDF

A Development of Expected Loss Control Chart Using Reflected Normal Loss Function (역정규 손실함수를 이용한 기대손실 관리도의 개발)

  • Kim, Dong-Hyuk;Chung, Young-Bae
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.39 no.2
    • /
    • pp.37-45
    • /
    • 2016
  • Control chart is representative tools of statistical process control (SPC). It is a graph that plotting the characteristic values from the process. It has two steps (or Phase). First step is a procedure for finding a process parameters. It is called Phase I. This step is to find the process parameters by using data obtained from in-controlled process. It is a step that the standard value was not determined. Another step is monitoring process by already known process parameters from Phase I. It is called Phase II. These control chart is the process quality characteristic value for management, which is plotted dot whether the existence within the control limit or not. But, this is not given information about the economic loss that occurs when a product characteristic value does not match the target value. In order to meet the customer needs, company not only consider stability of the process variation but also produce the product that is meet the target value. Taguchi's quadratic loss function is include information about economic loss that occurred by the mismatch the target value. However, Taguchi's quadratic loss function is very simple quadratic curve. It is difficult to realistically reflect the increased amount of loss that due to a deviation from the target value. Also, it can be well explained by only on condition that the normal process. Spiring proposed an alternative loss function that called reflected normal loss function (RNLF). In this paper, we design a new control chart for overcome these disadvantage by using the Spiring's RNLF. And we demonstrate effectiveness of new control chart by comparing its average run length (ARL) with ${\bar{x}}-R$ control chart and expected loss control chart (ELCC).

CUSUM charts for monitoring type I right-censored lognormal lifetime data (제1형 우측중도절단된 로그정규 수명 자료를 모니터링하는 누적합 관리도)

  • Choi, Minjae;Lee, Jaeheon
    • The Korean Journal of Applied Statistics
    • /
    • v.34 no.5
    • /
    • pp.735-744
    • /
    • 2021
  • Maintaining the lifetime of a product is one of the objectives of quality control. In real processes, most samples are constructed with censored data because, in many situations, we cannot measure the lifetime of all samples due to time or cost problems. In this paper, we propose two cumulative sum (CUSUM) control charting procedures to monitor the mean of type I right-censored lognormal lifetime data. One of them is based on the likelihood ratio, and the other is based on the binomial distribution. Through simulations, we evaluate the performance of the two proposed procedures by comparing the average run length (ARL). The overall performance of the likelihood ratio CUSUM chart is better, especially this chart performs better when the censoring rate is low and the shape parameter value is small. Conversely, the binomial CUSUM chart is shown to perform better when the censoring rate is high, the shape parameter value is large, and the change in the mean is small.

Exponentially Weighted Moving Average Chart for High-Yield Processes

  • Kotani, Takayuki;Kusukawa, Etsuko;Ohta, Hiroshi
    • Industrial Engineering and Management Systems
    • /
    • v.4 no.1
    • /
    • pp.75-81
    • /
    • 2005
  • Borror et al. discussed the EWMA(Exponentially Weighted Moving Average) chart to monitor the count of defects which follows the Poisson distribution, referred to the $EWMA_c$ chart, as an alternative Shewhart c chart. In the $EWMA_c$ chart, the Markov chain approach is used to calculate the ARL (Average Run Length). On the other hand, in order to monitor the process fraction defectives P in high-yield processes, Xie et al. presented the CCC(Cumulative Count of Conforming)-r chart of which quality characteristic is the cumulative count of conforming item inspected until observing $r({\geq}2)$ nonconforming items. Furthermore, Ohta and Kusukawa presented the $CS(Confirmation Sample)_{CCC-r}$ chart as an alternative of the CCC-r chart. As a more superior chart in high-yield processes, in this paper we present an $EWMA_{CCC-r}$ chart to detect more sensitively small or moderate shifts in P than the $CS_{CCC-r}$ chart. The proposed $EWMA_{CCC-r}$ chart can be constructed by applying the designing method of the $EWMA_C$ chart to the CCC-r chart. ANOS(Average Number of Observations to Signal) of the proposed chart is compared with that of the $CS_{CCC-r}$ chart through computer simulation. It is demonstrated from numerical examples that the performance of proposed chart is more superior to the $CS_{CCC-r}$ chart.

Statistical Design of X Control Chart with Improved 2-of-3 Main and Supplementary Runs Rules (개선된 3 중 2 주 및 보조 런 규칙을 가진 X관리도의 통계적 설계)

  • Park, Jin-Young;Seo, Sun-Keun
    • Journal of Korean Society for Quality Management
    • /
    • v.40 no.4
    • /
    • pp.467-480
    • /
    • 2012
  • Purpose: This paper introduces new 2-of-3 main and supplementary runs rules to increase the performance of the classical $\bar{X}$ control chart for detecting small process shifts. Methods: The proposed runs rules are compared with other competitive runs rules by numerical experiments. Nonlinear optimization problem to minimize the out-of-control ARL at a specified shift of process mean for determining action and warning limits at a time is formulated and a procedure to find two limits is illustrated with a numerical example. Results: The proposed 2-of-3 main and supplementary runs rules demonstrate an improved performance over other runs rules in detecting a sudden shift of process mean by simultaneous changes of mean and standard deviation. Conclusion: To increase the performance in the detection of small to moderate shifts, the proposed runs rules will be used with $\bar{X}$ control charts.

Design and efficiency of the variance component model control chart (분산성분모형 관리도의 설계와 효율)

  • Cho, Chan Yang;Park, Changsoon
    • Journal of the Korean Data and Information Science Society
    • /
    • v.28 no.5
    • /
    • pp.981-999
    • /
    • 2017
  • In the standard control chart assuming a simple random model, we estimate the process variance without considering the between-sample variance. If the between-sample exists in the process, the process variance is under-estimated. When the process variance is under-estimated, the narrower control limits result in the excessive false alarm rate although the sensitivity of the control chart is improved. In this paper, using the variance component model to incorporate the between-sample variance, we set the control limits using both the within- and between-sample variances, and evaluate the efficiency of the control chart in terms of the average run length (ARL). Considering the most widely used control chart types such as ${\bar{X}}$, EWMA and CUSUM control charts, we compared the differences between two cases, Case I and Case II, where the between-sample variance is ignored and considered, respectively. We also considered the two cases when the process parameters are given and estimated. The results showed that the false alarm rate of Case I increased sharply as the between-sample variance increases, while that of Case II remains the same regardless of the size of the between-sample variance, as expected.

Design of Robust Expected Loss Control Chart (로버스트 기대손실 관리도의 설계)

  • Lee, Hyeung-Jun;Chung, Young-Bae
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.39 no.3
    • /
    • pp.10-17
    • /
    • 2016
  • Control Chart is a graph which dots the characteristic values of a process. It is the tool of statistical technique to keep a process in controlled condition. It is also used for investigating the state of a process. Therefore many companies have used Control Chart as the tool of statistical process control (SPC). Products from a production process represent accidental dispersion values around a certain reference value. Fluctuations cause of quality dispersion is classified as a chance cause and a assignable cause. Chance cause refers unmanageable practical cause such as operator proficiency differences, differences in work environment, etc. Assignable cause refers manageable cause which is possible to take actions to remove such as operator inattention, error of production equipment, etc. Traditionally ${\bar{x}}-R$ control chart or ${\bar{x}}-s$ control chart is used to find and remove the error cause. Traditional control chart is to determine whether the measured data are in control or not, and lets us to take action. On the other hand, RNELCC (Reflected Normal Expected Loss Control Chart) is a control chart which, even in controlled state, indicates the information of economic loss if a product is in inconsistent state with process target value. However, contaminated process can cause control line sensitive and cause problems with the detection capabilities of chart. Many studies on robust estimation using trimmed parameters have been conducted. We suggest robust RNELCC which used the idea of trimmed parameters with RNEL control chart. And we demonstrate effectiveness of new control chart by comparing with ARL value among traditional control chart, RNELCC and robust RNELCC.

Design of the Robust CV Control Chart using Location Parameter (위치모수를 이용한 로버스트 CV 관리도의 설계)

  • Chun, Dong-Jin;Chung, Young-Bae
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.39 no.1
    • /
    • pp.116-122
    • /
    • 2016
  • Recently, the production cycle in manufacturing process has been getting shorter and different types of product have been produced in the same process line. In this case, the control chart using coefficient of variation would be applicable to the process. The theory that random variables are located in the three times distance of the deviation from mean value is applicable to the control chart that monitor the process in the manufacturing line, when the data of process are changed by the type of normal distribution. It is possible to apply to the control chart of coefficient of variation too. ${\bar{x}}$, s estimates that taken in the coefficient of variation have just used all of the data, but the upper control limit, center line and lower control limit have been settled by the effect of abnormal values, so this control chart could be in trouble of detection ability of the assignable value. The purpose of this study was to present the robust control chart than coefficient of variation control chart in the normal process. To perform this research, the location parameter, ${\bar{x_{\alpha}}}$, $s_{\alpha}$ were used. The robust control chart was named Tim-CV control chart. The result of simulation were summarized as follows; First, P values, the probability to get away from control limit, in Trim-CV control chart were larger than CV control chart in the normal process. Second, ARL values, average run length, in Trim-CV control chart were smaller than CV control chart in the normal process. Particularly, the difference of performance of two control charts was so sure when the change of the process was getting to bigger. Therefore, the Trim-CV control chart proposed in this paper would be more efficient tool than CV control chart in small quantity batch production.