• Title/Summary/Keyword: Analog CMOS

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A Design of CMOS Signal Processing Adaptive Filter for DSL Modem (DSL 모뎀용 CMOS 신호처리 적응필터 설계)

  • Lee Geun-Ho;Lee Jong-Inn
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.7
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    • pp.1424-1428
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    • 2004
  • In this paper, CMOS analog filters for use in the Analog front End of digital subscriber loop(DSL) chip set are proposed. Designed filters contain receiver continuous-time filters which are composed of lowpass and highpass functions. And their cutoff frequency are 138H1z and 1.1MHz respectively. A low-voltage gm-c integrator is improved and used to design filters. Desisned filters are verified by HSPICE simulation with the 0.25${\mu}m$ CMOS n-well parameter.

The Gain Enhancement of 1.8V CMOS Self-bias High-speed Differential Amplifier by the Parallel Connection Method (병렬연결법에 의한 1.8V CMOS Self-bias 고속 차동증폭기의 이득 개선)

  • Bang, Jun-Ho
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.57 no.10
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    • pp.1888-1892
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    • 2008
  • In this paper, a new parallel CMOS self-bias differential amplifier is designed to use in high-speed analog signal processing circuits. The designed parallel CMOS self-bias differential amplifier is developed by using internal biasing circuits and the complement gain stages which are parallel connected. And also, the parallel architecture of the designed parallel CMOS self-bias differential amplifier can improve the gain and gain-bandwidth product of the typical CMOS self-bias differential amplifier. With 1.8V $0.8{\mu}m$ CMOS process parameter, the results of HSPICE show that the designed parallel CMOS self-bias differential amplifier has a dc gain and a gain-bandwidth product of 64 dB and 49 MHz respectively.

A study on a CMOS analog cell-library design-A CMOS on-chip current reference circuit (CMOS 아날로그 셀 라이브레이 설계에 관한 연구-CMOS 온-칩 전류 레퍼런스 회로)

  • 김민규;이승훈;임신일
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.4
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    • pp.136-141
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    • 1996
  • In this paper, a new CMOS on-chip current reference circit for memory, operational amplifiers, comparators, and data converters is proposed. The reference current is almost independent of temeprature and power-supply variations. In the proposed circuit, the current component with a positive temeprature coefficient cancels that with a negative temperature coefficient each other. While conventional curretn and voltage reference circuits require BiCMOS or bipolar process, the presented circuit can be integrated on a single chip with other digiral and analog circits using a standard CMOS process and an extra mask is not needed. The prototype is fabricated employing th esamsung 1.0um p-well double-poly double-metal CMOS process and the chip area is 300um${\times}$135 um. The proposed reference current circuit shows the temperature coefficient of 380 ppm/.deg. C with the temperature changes form 30$^{\circ}C$ to 80$^{\circ}C$, and the output variation of $\pm$ 1.4% with the supply voltage changes from 4.5 V to 5.5 V.

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A 2.5V 0.25㎛ CMOS Temperature Sensor with 4-bit SA ADC (4-비트 축차근사형 아날로그-디지털 변환기를 내장한 2.5V 0.25㎛ CMOS 온도 센서)

  • Kim, Mungyu;Jang, Young-Chan
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.17 no.2
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    • pp.378-384
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    • 2013
  • In this paper, a CMOS temperature sensor is proposed to measure the internal temperature of a chip. The temperature sensor consists of a proportional-to-absolute-temperature (PTAT) circuit for a temperature sensing part and a 4-bit analog-to-digital converter (ADC) for a digital interface. The PTAT circuit with the compact area is designed by using a vertical PNP architecture in the CMOS process. To reduce sensitivity of temperature variation in the digital interface circuit of the proposed temperature sensor, a 4-bit successive approximation (SA) ADC using the minimum analog circuits is used. It uses a capacitor-based digital-to-analog converter and a time-domain comparator to minimize power consumption. The proposed temperature sensor was fabricated by using a $0.25{\mu}m$ 1-poly 6-metal CMOS process with a 2.5V supply, and its operating temperature range is from 50 to $150^{\circ}C$. The area and power consumption of the fabricated temperature sensor are $130{\times}390{\mu}m^2$ and $868{\mu}W$, respectively.

A Study on Circuit Design Method for Linearity and Range Improvement of CMOS Analog Current-Mode Multiplier (CMOS 아날로그 전류모드 곱셈기의 선형성과 동적범위 향상을 위한 회로설계 기법에 관한 연구)

  • Lee, Daniel Juhun;Kim, Hyung-Min;Park, So-Youn;Nho, Tae-Min;Kim, Seong-Kweon
    • The Journal of the Korea institute of electronic communication sciences
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    • v.15 no.3
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    • pp.479-486
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    • 2020
  • In this paper, we present a design method for improving the linearity and dynamic range of the analog current mode multiplier circuit, which is one of the key devices in an analog current mode AI processor. The proposed circuit consists of 4 quadrant translinear loops made up of NMOS transistors only, which minimizes physical mismatches of the transistors. The proposed circuit can be implemented at 117㎛ × 109㎛ in 0.35㎛ CMOS process and has a total harmonic distortion of 0.3%. The proposed analog current mode multiplier is expected to be useful as the core circuit of a current mode AI processor.

Design of A CMOS Analog Multiplier using Gilbert Cell

  • Lee, Geun-Ho;Park, Hyun-Seung;Yu, Young-Gyu;Kim, Tae-Pyung;Kim, Jae-Young;Kim, Dong-Yong
    • The Journal of the Acoustical Society of Korea
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    • v.18 no.3E
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    • pp.44-48
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    • 1999
  • The CMOS four-quadrant analog multiplier for low-voltage low-power applications are presented in this thesis. The circuit approach is based on the characteristic of the LV (Low-Voltage) composite transistor which is one of the useful analog building block. SPICE simulations are carried out to examine the performances of the designed multiplier. Simulation results are obtained by 0.6㎛ CMOS parameters with 2V power supply. The basic configuration of the multiplier is the CMOS Gilbert cell with two LV composite transistors. The linear input range of the multiplier is over ±0.4V with a linearity error of less than 1.3%. The measured -3dB bandwidth is 288MHz and the power dissipation is 255 ㎼.

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One port resistor cell for CMOS analog integrated circuits (CMOS 아날로그 집적회로를 위한 새로운 구조의 One port 저항 셀)

  • Jo, Young-Chang;Kim, Sung-Hwan;Choi, Pyung
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.3
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    • pp.135-139
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    • 1996
  • It is difficult to fabricate precise resistors for the analog integrated circuits using MOS technology. Until now polysilicon resistors were used at the analog integrated circuits, but some deviations of resistance and sensitive variation processes still cause their misactions. In order to improve these misactions, we suggest a CMOS resistor cell which provides precise resistance and excellant linearity. Also we designed the second order active low pass filter using the CMOS resistor cells and verified their superior performances compared to the actual resistors.

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A Low Power Multi Level Oscillator Fabricated in $0.35{\mu}m$ Standard CMOS Process ($0.35{\mu}m$ 표준 CMOS 공정에서 제작된 저전력 다중 발진기)

  • Chai Yong-Yoong;Yoon Kwang-Yeol
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.55 no.8
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    • pp.399-403
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    • 2006
  • An accurate constant output voltage provided by the analog memory cell may be used by the low power oscillator to generate an accurate low frequency output signal. This accurate low frequency output signal may be used to maintain long-term timing accuracy in host devices during sleep modes of operation when an external crystal is not available to provide a clock signal. Further, incorporation of the analog memory cell in the low power oscillator is fully implementable in a 0.35um Samsung standard CMOS process. Therefore, the analog memory cell incorporated into the low power oscillator avoids the previous problems in a oscillator by providing a temperature-stable, low power consumption, size-efficient method for generating an accurate reference clock signal that can be used to support long sleep mode operation.

The Calculation Method of the Breakdown Voltage for the Drain Region with the Spherical Structure in High Voltage Analog CMOS (Spherical 구조를 갖는 고전압용 Analog CMOS의 Drain 역방향 항복전압의 계산 방법)

  • Lee, Un Gu
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.62 no.9
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    • pp.1255-1259
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    • 2013
  • A calculation method of the breakdown voltage for the Drain region with the spherical structure in high voltage analog CMOS is proposed. The Drain depletion region is divided into many sub-regions and the doping concentration of each sub-region is assumed to be constant. The field in each sub-region is calculated by the integration of the net charge and the breakdown voltage is calculated using the ionization integral method. The breakdown voltage calculated using the proposed method shows the maximum relative error of 3.3% compared with the result of the 2-dimensional device simulation using BANDIS.

Characteristics of Programming on Analog Memory Cell Fabricated in a 0.35$\mu{m}$Single Poly Standard CMOS Process (0.35$\mu{m}$ 싱글폴리 표준 CMOS 공정에서 제작된 아날로그 메모리 셀의 프로그래밍 특성)

  • 채용웅;정동진
    • The Transactions of the Korean Institute of Electrical Engineers D
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    • v.53 no.6
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    • pp.425-432
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    • 2004
  • In this paper, we introduce the analog memory fabricated in a 0.35${\mu}{\textrm}{m}$ single poly standard CMOS process. We measured the programming characteristics of the analog memory cell such as linearity, reliability etc. Finally, we found that the characteristics of the programming of the cell depend on the magnitude and the width of the programming pulse, and that the accuracy of the programming within 10mV is feasible under the optimal condition. In order to standardize the characteristics of the cell, we have investigated numbers of cells. Thus we have used a program named Labview and a data acquisition board to accumulate the data related to the programming characteristics automatically.