• 한국표면공학회지
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• 제29권5호
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• pp.570-576
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• 1996

Cu films for future ULSI metallization were prepared by partially ionized beam (PIB) deposition and characterized in terms of preferred orientation, grain size, roughness and resistivity. PIB-Cu films were prepared on Si (100) at pressure of $8 \times 10^{-7}$~$1 \times 10^{-6}$ Torr. Effects of acceleration voltage and ionization potential on the properties of PIB-Cu films have been investigated. As the acceleration voltage increased at constant ionization potential of 400 V, the degree of preferred orientation and surface smoothness of the Cu film increased. At the ionization potential of 450 V, the degree of preferred orientation at the acceleration voltage higher than 2 kV decreased and surface roughness increased with acceleration voltage. Grain size of Cu films increased to 1100 $\AA$ initially up to applied acceleration voltage of 1 kV, above which a little increase occurred with the acceleration voltage. There was no indication of impurities such as C, O in all sample. Resistivity of Cu film had the same trends as the surface roughness with acceleration voltage and ionization potential. The increase of electrical resistivity of PIB-Cu films was explained in terms of grain size and surface roughness

• 한국생산제조학회지
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• 제24권6호
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• pp.653-659
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• 2015

The aim of this study is to develop a technique for the accelerated life test of the capacitor in a propulsion control device of a traction inverter used for a high-speed train. Using this technique, the accelerated life test can possibly estimate the life cycle of a capacitor under various temperature conditions and irregularly applied voltage. The accelerated life test is conducted for the capacitor of the traction inverter. The common proceedings of this test are selection of failure mechanism, determination of accelerated stress, range determination of the accelerated stress, determination of the test condition, and distribution and determination of the sample. From this result, the continuous applied voltage was not considered for the acceleration factors anymore. Therefore, the final result having an acceleration factor of 9.4 (= 13,626/1,445) was observed. Furthermore, the life-shortening acceleration effect for the irregular applied voltage condition can be applied to various situations.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제48권5호
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• pp.354-360
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• 1999

PCN-PZT piezoelectric acceleration sensors of annular shear mode voltage type were fabricated and their characteristics have been investigated. Field tests are also carried out. To avoid noise problems from the environmental conditions, acceleration sensors employed solid state micro-electronics for pre-amplifier. The calibration procedures based on the principle of the comparison method were adopted for investigating the characteristics of fabricated acceleration sensors. The voltage sensitivity and resonant frequency of fabricated acceleration sensors were 83mv/g, 23kHz, respectively. The lower and upper frequency limit were 4Hz and 9kHz, respectively. The variation of the voltage sensitivity showed 10% at $-406{\circ}C\; and\; 9%\; at\; 121^{\circ}C$ compared to that of reference temperature at $40^{\circ}C$.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2008년도 추계학술대회 논문집
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• pp.603-604
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• 2008

• 대한전기학회논문지
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• 제36권6호
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• pp.390-395
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• 1987

There is a variety not only of research topics but also of research techniques in electric power problems. It is well known that a significant increase in the rate of convergence can be obtained for the Gauss-Seidel method using the bus admittance matrix by applying acceleration factors determined empirically. The acceleration factor is calculated theoretically by using the bus voltage sensitivity (buses voltage interact each other) in this paper. It is observed that the proposed method using calculated acceleration factor gives better results than those of the method using calculated acceleration factor gives better results than those of the method using empirical one.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2009년도 추계학술대회 논문집
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• pp.587-588
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• 2009

• 융합신호처리학회 학술대회논문집
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• 한국신호처리시스템학회 2006년도 하계 학술대회 논문집
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• pp.77-80
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• 2006

This paper based on spiral vector, three phase induction motor is described a detailed modeling by a phase segment methode. Based on this model, A torque control and the equation of regenerative power for the induction motor drive, based on the field acceleration method(FAM), is presented. The speed control system is designed to be applied voltage source inverters that is easy the current type feedback of power regeneration for motor drive. The ability of shaving power to be measured power regeneration has been investigated in speed acceleration and reduction. And it is change of stator resistance that the voltage commands include error, the ripple of exited voltage and torque occur from the results. The experimental tests verify the performance of the proposed regenerative drive for FAM, proving that good behavior of the drive is achieved in the transient and steady-state operating conditions.

• Transactions on Electrical and Electronic Materials
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• 제10권1호
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• pp.5-8
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• 2009

The reliability of multilayer ceramic capacitor with active thin dielectric layer was investigated by highly accelerated life test at various stress condition. The distribution of multilayer ceramic capacitor failure times is plotted as a function of time from Weibull distribution function. According to the test result, voltage acceleration factor is obtained from 2.24 to 2.96. The acceleration by temperature is much higher than other values of active thick dielectric layer. It is clear that median time to failure is affected by the stress voltage for high volumetric efficiency ceramic capacitors with active thin dielectric layer. The degradation under stress of voltage involves electromigration and accumulation of oxygen vacancy at Ni electrode interface of cathode.

• 한국신뢰성학회지:신뢰성응용연구
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• 제12권3호
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• pp.153-163
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• 2012

Recently, as a electronic components are becoming more high-density, so that electronic circuits have smaller pitches between the leads and are more vulnerable to insulation failure. And the reliability of electric insulation has become an ever important issue as device contact pitches and print patterns shrink. Ion migration occurs in highly humid environment as voltage is applied to an installed print circuit. Under highly humid and voltage applied circumstances, electronic components respond to applied voltages by electrochemical ionization of metals, and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. In thesis, we study acceleration test of ion migration in FR-4 PCB plated with Sn. Voltage applied test of FR-4 PCB circuits plated with Sn was tested in the temperature and humidity environments. As a result of this test, equation of acceleration model was derived.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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• pp.149-150
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• 2005

Thyristor breakdown voltage variation acceleration aging test was investigated. The breakdown voltage was deceased after 1000 hours acceleration aging test. It temperature rising caused by electric field concentration at the edge beveling region of the thyristor was confirmed using Silvaco device simulation. The local temperature rising is driving force for the defect propagation. Consequently, propagated defects of the beveling region seems to decrease thyristor's breakdown voltage.