• International Journal of Reliability and Applications
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• v.10 no.2
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• pp.101-107
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• 2009

In the accelerated tests, the importance of correct failure analysis must be strongly emphasized. Understanding the failure mechanisms is requisite for designing and conducting successful accelerated life test. Under this presumption, a rational method must be identified to relate the results of accelerated tests quantitatively to the reliability or failure rates in use conditions, using a scientific acceleration transform. Most widely used models for relating the results of accelerated tests quantitatively to the reliability or failure rates in use conditions are an accelerated failure time model and a proportional hazards model. The purpose of this research is to compare the usability of the accelerated failure time model and proportional hazards model in the accelerated life tests.

• Journal of the Korean Data and Information Science Society
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• v.21 no.4
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• pp.813-818
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• 2010

The least squares estimation method for model parameters under failure step-stress accelerated life tests is studied and a numerical example will be given to illustrate the proposed inferential procedures under the compound linear plans proposed as an alternative to the optimal quadratic plan, assuming that the exponential distribution with a quadratic relationship between stress and log-mean lifetime. The proposed compound linear plan for constant stress accelerated life tests and 4:2:1 plan are compared for various situations. Even though the compound linear plan was proposed under constant stress accelerated life tests, we found that this plan did well relatively in failure step-stress accelerated life tests.

• Journal of Applied Reliability
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• v.15 no.2
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• pp.84-89
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• 2015

Accelerated life tests are widely used to evaluate the product reliability within a resonable amount of time and cost. This article provides literature review about accelerated life test plans between 2006~2015. The literature on planning accelerated life tests are reviewed with respect to the test scenario, assumed accelerated model and estimation method and optimization criteria. Finally, recommendations for the future research are presented.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1391-1393
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• 2008

In this paper, the long-term reliability for 1.25G transceiver in use of high speed optical access network is investigated. High temperature storage tests and accelerated life tests are used to long-term reliability. Accelerated aging test have been during 3,000 hour of the three accelerated aging conditions by caused high temperature stress. Mean life is assumed to follow the Arrhenius relationship and analysis from the failure data obtained in the accelerated aging conditions.

• Proceedings of the Korean Statistical Society Conference
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• 2000.11a
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• pp.235-240
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• 2000

In this paper a test of fit for exponentiality and we propose the estimator of Kullback-Leibler Information functions using the data from accelerated life tests. This acceleration model is assumed to be a tampered random variable model. The procedure is applicable when the exponential parameter based on the data from accelerated life tests is or is not specified under null hypothesis. Using Simulations, the power of the proposed test based on use condition of accelerated life test under alternatives is compared with that of other standard tests in the small sample.

• Journal of Applied Reliability
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• v.7 no.3
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• pp.127-136
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• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

• Communications for Statistical Applications and Methods
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• v.26 no.2
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• pp.131-148
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• 2019

Constant stress partially accelerated life tests are studied according to exponentiated Weibull distribution. Grounded on multiple censoring, the maximum likelihood estimators are determined in connection with unknown distribution parameters and accelerated factor. The confidence intervals of the unknown parameters and acceleration factor are constructed for large sample size. However, it is not possible to obtain the Bayes estimates in plain form, so we apply a Markov chain Monte Carlo method to deal with this issue, which permits us to create a credible interval of the associated parameters. Finally, based on constant stress partially accelerated life tests scheme with exponentiated Weibull distribution under multiple censoring, the illustrative example and the simulation results are used to investigate the maximum likelihood, and Bayesian estimates of the unknown parameters.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.281-288
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• 2015

In this paper, the maximum likelihood estimators and confidence intervals for parameters of Weibull distribution are derived under three level constant stress accelerated life tests and the assumption that a log quadratic relationship exits between stress and the scale parameter ${\theta}$. The compound linear plan proposed by Kim (2006) is used to allocate the test units at each stress level, which performed nearly as good as the optimum quadratic plan and had the advantage of simplicity. Some simulation studies are given.

• Journal of the Korean Statistical Society
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• v.35 no.3
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• pp.225-238
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• 2006

This paper considers noninformative priors for the scale parameter of exponential distribution when the data are collected in step stress accelerated life tests. We find the Jeffreys' and reference priors for this model and show that the reference prior satisfies first order matching criterion. Also, we show that there exists no second order matching prior in this problem. Some simulation results are given and we perform Bayesian analysis for proposed priors using some data.

• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.