• Title/Summary/Keyword: 65-nm CMOS

Search Result 155, Processing Time 0.023 seconds

Design of a V Band Power Amplifier Using 65 nm CMOS Technology (65 nm CMOS 공정을 이용한 V 주파수대 전력증폭기 설계)

  • Lee, Sungah;Cui, Chenglin;Kim, Seong-Kyun;Kim, Byung-Sung
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.24 no.4
    • /
    • pp.403-409
    • /
    • 2013
  • In this work, a CMOS two stage differential power amplifier which includes Marchand balun, transformer and injection-locked buffer is presented. The power amplifier is targeted for 70 GHz frequency band and fabricated using 65 nm technology. The measurement results show 8.5 dB maximum voltage gain at 71.3 GHz and 7.3 GHz 3 dB bandwidth. The measured maximum output power is 8.2 dBm, input $P_{1dB}$ is -2.8 dBm, output $P_{1dB}$ is 4.6 dBm and maximum power added efficiency is 4.9 %. The power amplifier consumes 102 mW DC power from 1.2 V supply voltage.

A 300 GHz Imaging Detector and Image Acquisition Based on 65-nm CMOS Technology (65-nm CMOS 300 GHz 영상 검출기 및 영상 획득)

  • Yoon, Daekeun;Song, Kiryong;Rieh, Jae-Sung
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.25 no.7
    • /
    • pp.791-794
    • /
    • 2014
  • In this work, a 300 GHz imaging detector has been developed and image has been acquired in a 65-nm CMOS technology. The circuit was designed based on the square-law of MOSFET devices. The fabricated detector exhibits a maximum responsivity of 2,270 V/W and minimum NEP of $38pW/Hz^{1/2}$ at 285 GHz, and NEP< ${\sim}200pW/Hz^{1/2}$ for 250~305 GHz range. The chip size is $400{\mu}m{\times}450{\mu}m$ including the probing pads and a balun, while the core of the circuit occupies only $150{\mu}m{\times}100{\mu}m$.

A Design of Voltage Controlled Oscillator and High Speed 1/4 Frequency Divider using 65nm CMOS Process (65nm CMOS 공정을 이용한 전압제어발진기와 고속 4분주기의 설계)

  • Lee, Jongsuk;Moon, Yong
    • Journal of the Institute of Electronics and Information Engineers
    • /
    • v.51 no.11
    • /
    • pp.107-113
    • /
    • 2014
  • A VCO (Voltage Controlled Oscillator) and a divide-by-4 high speed frequency divider are implemented using 65nm CMOS technology for 60GHz wireless communication system. The mm-wave VCO was designed by NMOS cross-coupled LC type using current source. The architecture of the divide-by-4 high speed frequency divider is differential ILFD (Injection Locking Frequency Divider) with varactor to control frequency range. The frequency divider also uses current sources to get good phase noise characteristics. The measured results show that the VCO has 64.36~67.68GHz tuning range and the frequency divider divides the VCO output by 4 exactly. The high output power of 5.47~5.97dBm from the frequency divider is measured. The phase noise of the VCO including the frequency divider are -77.17dBc/Hz at 1MHz and -110.83dBc/Hz at 10MHz offset frequency. The power consumption including VCO is 38.4mW with 1.2V supply voltage.

Design of a 24 GHz Power Amplifier Using 65-nm CMOS Technology (65-nm CMOS 공정을 이용한 24 GHz 전력증폭기 설계)

  • Seo, Dong-In;Kim, Jun-Seong;Cui, Chenglin;Kim, Byung-Sung
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.27 no.10
    • /
    • pp.941-944
    • /
    • 2016
  • This paper proposes 24 GHz power amplifier for automotive collision avoidance and surveillance short range radar using Samsung 65-nm CMOS process. The proposed circuit has a 2-stage differential power amplifier which includes common source structure and transformer for single to differential conversion, impedance matching, and power combining. The measurement results show 15.5 dB maximum voltage gain and 3.6 GHz 3 dB bandwidth. The measured maximum output power is 13.1 dBm, input $P1_{dB}$ is -4.72 dBm, output $P1_{dB}$ is 9.78 dBm, and maximum power efficiency is 17.7 %. The power amplifier consumes 74 mW DC power from 1.2 V supply voltage.

Analysis of Reliability for Different Device Type in 65 nm CMOS Technology (65 nm CMOS 기술에서 소자 종류에 따른 신뢰성 특성 분석)

  • Kim, Chang Su;Kwon, Sung-Kyu;Yu, Jae-Nam;Oh, Sun-Ho;Jang, Seong-Yong;Lee, Hi-Deok
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.27 no.12
    • /
    • pp.792-796
    • /
    • 2014
  • In this paper, we investigated the hot carrier reliability of two kinds of device with low threshold voltage (LVT) and regular threshold voltage (RVT) in 65 nm CMOS technology. Contrary to the previous report that devices beyond $0.18{\mu}m$ CMOS technology is dominated by channel hot carrier(CHC) stress rather than drain avalanche hot carrier(DAHC) stress, both of LVT and RVT devices showed that their degradation is dominated by DAHC stress. It is also shown that in case of LVT devices, contribution of interface trap generation to the device degradation is greater under DAHC stress than CHC stress, while there is little difference for RVT devices.

A Simple Static Noise Margin Model of MOS CML Gate in CMOS Processes

  • Jeong, Hocheol;Kang, Jaehyun;Lee, Kang-Yoon;Lee, Minjae
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.17 no.3
    • /
    • pp.370-377
    • /
    • 2017
  • This paper presents a simple noise margin (NM) model of MOS current mode logic (MCML) gates especially in CMOS processes where a large device mismatch deteriorates logic reliability. Trade-offs between speed and logic reliability are discussed, and a simple yet accurate NM equation to capture process-dependent degradation is proposed. The proposed NM equation is verified for 130-nm, 110-nm, 65-nm, and 40-nm CMOS processes and has errors less than 4% for all cases.

A stable U-band VCO in 65 nm CMOS with -0.11 dBm high output power

  • Lee, Jongsuk;Moon, Yong
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.15 no.4
    • /
    • pp.437-444
    • /
    • 2015
  • A high output power voltage controlled oscillator (VCO) in the U-band was implemented using a 65 nm CMOS process. The proposed VCO used a transmission line to increase output voltage swing and overcome the limitations of CMOS technologies. Two varactor banks were used for fine tuning with a 5% frequency tuning range. The proposed VCO showed small variation in output voltage and operated at 51.55-54.18 GHz. The measured phase noises were -51.53 dBc/Hz, -91.84 dBc/Hz, and -101.07 dBc/Hz at offset frequencies of 10 kHz, 1 MHz, and 10 MHz, respectively, with stable output power. The chip area, including the output buffer, is $0.16{\times}0.16mm^2$ and the maximum output power was -0.11 dBm. The power consumption was 33.4 mW with a supply voltage of 1.2-V. The measured $FOM_P$ was -190.8 dBc/Hz.

30~46 GHz Wideband Amplifier Using 65 nm CMOS (65 nm CMOS 공정을 이용한 저면적 30~46 GHz 광대역 증폭기)

  • Shin, Miae;Seo, Munkyo
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.29 no.5
    • /
    • pp.397-400
    • /
    • 2018
  • This paper presents a miniaturized 65 nm CMOS 30~46 GHz wideband amplifier. To minimize the chip area, coupled inductors are used in the matching networks. The measurement shows that the fabricated amplifier exhibits 9.3 dB of peak gain, 16 GHz of 3 dB bandwidth, and 42 % fractional bandwidth. The measured input and output return losses were more than 10 dB at 35.8~46.0 GHz and 28.6~37.8 GHz, respectively. The chip consumes 42 mW at 1.2 V. The measured group delay variation is 19.1 ps within the 3 dB bandwidth and the chip size excluding the pads is $0.09mm^2$.

A 6b 1.2 GS/s 47.8 mW 0.17 mm2 65 nm CMOS ADC for High-Rate WPAN Systems

  • Park, Hye-Lim;Kwon, Yi-Gi;Choi, Min-Ho;Kim, Young-Lok;Lee, Seung-Hoon;Jeon, Young-Deuk;Kwon, Jong-Kee
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.11 no.2
    • /
    • pp.95-103
    • /
    • 2011
  • This paper proposes a 6b 1.2 GS/s 47.8 mW 0.17 $mm^2$ 65 nm CMOS ADC for high-rate wireless personal area network systems. The proposed ADC employs a source follower-free flash architecture with a wide input range of 1.0 $V_{p-p}$ at a 1.2 V supply voltage to minimize power consumption and high comparator offset effects in a nanometer CMOS technology. The track-and-hold circuits without source followers, the differential difference amplifiers with active loads in pre-amps, and the output averaging layout scheme properly handle a wide-range input signal with low distortion. The interpolation scheme halves the required number of pre-amps while three-stage cascaded latches implement a skew-free GS/s operation. The two-step bubble correction logic removes a maximum of three consecutive bubble code errors. The prototype ADC in a 65 nm CMOS demonstrates a measured DNL and INL within 0.77 LSB and 0.98 LSB, respectively. The ADC shows a maximum SNDR of 33.2 dB and a maximum SFDR of 44.7 dB at 1.2 GS/s. The ADC with an active die area of 0.17 $mm^2$ consumes 47.8 mW at 1.2 V and 1.2 GS/s.

A 32-Gb/s Inductorless Output Buffer Circuit with Adjustable Pre-emphasis in 65-nm CMOS

  • Tanaka, Tomoki;Kishine, Keiji;Tsuchiya, Akira;Inaba, Hiromi;Omoto, Daichi
    • IEIE Transactions on Smart Processing and Computing
    • /
    • v.5 no.3
    • /
    • pp.207-214
    • /
    • 2016
  • Optical communication systems are rapidly spread following increases in data traffic. In this work, a 32-Gb/s inductorless output buffer circuit with adjustable pre-emphasis is proposed. The proposed circuit consists of an output buffer circuit and an emphasis circuit. The emphasis circuit emphasizes the high frequency components and adds the characteristics of the output buffer circuit. We proposed a design method using a small-signal equivalent-circuit model and designed the compensation characteristics with a 65-nm CMOS process in detail using HSPICE simulation. We also realized adjustable emphasis characteristics by controlling the voltage. To confirm the advantages of the proposed circuit and the design method, we fabricated an output buffer IC with adjustable pre-emphasis. We measured the jitter and eye height with a 32-Gb/s input using the IC. Measurement results of double-emphasis showed that the jitter was 14% lower, and the eye height was 59% larger than single-emphasis, indicating that our proposed configuration can be applied to the design of an output buffer circuit for higher operation speed.