• Journal of the Korean Magnetics Society
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• v.14 no.5
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• pp.163-168
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• 2004

We prepared ultra thin film structure of Si(100)/ $SiO_2$(200 nm)/Ta(5 nm)/Ni$_{80}$Fe$_{20/(l～15 nm)}$Ta(5 nm) using an inductively coupled plasma(ICP) helicon sputter. Magnetic properties and cross-sectional microstructures were investigated with a superconduction quantum interference device(SQUID) and a transmission electron microscope(TEM), respectively. We report that NiFe films of sub-3 nm thickness show the B$_{bulk}$ = 0 and B$_{surf}$=-3 ${\times}$ 10$^{-7}$(J/$m^2$). Moreover, Curie temperature may be lowered by decreasing thickness. Coercivity become larger as temperature decreased with 0.5 nm - thick Ta/NiFe interface intermixing. Our result implies that effective magnetic properties of magnetoelastic anisotropy, saturation magnetization, and coercivity may change abruptly in nano-thick films. Thus we should consider those abrupt changes in designing nano-devices such as MRAM applications.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.133.1-133.1
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• 2014

이 발표에서 우리는 수백 나노미터 크기인 두 개의 나노 금속 원반 또는 나노 블록이 백 나노미터 이하의 간격으로 결합된 초미세 이중 금속 플라즈몬 광공진기를 제안하고 그 응용을 살펴본다. 원반구조 경우, 반지름이 476 nm인 나노원반 두 개가 100 nm 두께의 유전체 원반의 양쪽에 위치하여 1550 nm 공진파장을 가진 표면 플라즈몬 whispering-gallery-mode (WGM)을 유전체 내에 형성한다. 유전체의 두께를 일정하게 유지할 경우, WGM의 공진파장은 원반의 반지름에 따라 줄어든다. 반면, 반지름이 일정할 때에는 두 금속 원반 사이의 유전체 두께가 줄어듦에 따라 두 금속 원반 사이에 작용하는 표면 플라즈몬의 결합이 강해져서 공진파장이 길어진다. 따라서, 일반적으로 공진기의 크기가 줄어듦에 따라 공진파장이 짧아지는 것과 달리, 제안된 원반구조에서 발생하는 WGM는 원반의 반지름과 유전체의 두께를 함께 줄여도 공진파장이 동일하게 유지되는 차별화된 특성을 가지고 있다. 최종적으로 같은 공진파장을 가지는 WGM를 반지름 88 m, 유전체 두께 10 nm의 공진기에서도 여기시킬 수 있음으로, 모드부피(V)를 1/160으로 줄일 수 있다. 이에 비해, 공진모드의 품위값(Q)은 증가된 금속의 흡수손실에 의해 1/3정도 줄어듦으로써, 공진기와 물질의 상호작용 정도를 보여주는 Q/V값은 크기가 줄어든 공진기에서 오히려 50배 가량 증가함을 확인할 수 있다. 이 같은 초미세 플라즈몬 공진기는 매우 작은 굴절율 센서로서 응용을 가지고 있으며, 1160 nm/(단위 굴절율 변화)의 높은 민감도를 보인다. 한편, $200{\times}150{\times}100nm3$의 크기를 가진 두 개의 금속 나노블록이 10 nm의 공기 간격을 가지고 결합된 나노 공진기는, 공기 간격 내에 강하게 집적된 838 nm의 공진파장을 가진 플라즈몬 공진기 모드를 여기시킨다. 제안된 공진모드는 공기간격이 줄어듦에 따라 공진파장이 급격하게 증가하는 특성을 가지므로 옹스토롬 정도의 분해능을 가진 두께 변화 센서로 응용할 수 있다. 예를 들어, 공기간격 2 nm에서는 1A 두께 변화에 대해 공진파장 변화는 약 40 nm로 매우 민감하게 변화한다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.26 no.7
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• pp.539-544
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• 2013

To study the encapsulation method for heat dissipation of high brightness organic light emitting diode (OLED), red emitting OLED of ITO (150 nm) / 2-TNATA (50 nm) / NPB (30 nm) / $Alq_3$ : 1 vol.% Rubrene (30 nm) / $Alq_3$ (30 nm) / LiF (0.7 nm) / Al (200 nm) structure was fabricated, which on $Alq_3$ (150 nm) / LiF (150 nm) as buffer layer and Al as protective layer was deposited to protect the damage of OLED, and subsequently it was encapsulated using attaching film and metal sheet. The current density, luminance and power efficiency was improved according to thickness of Al protective layer. The emission spectrum and the Commission International de L'Eclairage (CIE) coordinate did not have any effects on encapsulation process using attaching film and metal sheet The lifetime of encapsulated OLED using attaching film and metal sheet was 307 hours in 1,200 nm Al thickness, which was increased according to thickness of Al protective layer, and was improved 7% compared with 287 hours, lifetime of encapsulated OLED using attaching film and flat glass. As a result, it showed the improved current density, luminance, power efficiency and the long lifetime, because the encapsulation method using attaching film and metal sheet could radiate the heat on OLED effectively.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.4 no.5
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• pp.1127-1134
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• 2000

$RuO_2$ thin films are prepared by RP magnetron reactive sputtering and their characteristics of crystalliBation,microstructure, surface roughness and resistivity are studied with various O2/(Ar+O2)ratios and substrate temperatures. As O2/(Ar+O2) ratio decreases and substrate temperature increases, the preferred growing plane of$RuO_2$ thin films are changed from (110) to (101) plane. With increase of the 021(Ar+O2) ratio from 2075 to 50%, the surface roughness and the resistivity of $RuO_2$ thin films increase from 2.38nm to 7.81nm, and from $103.6 \mu\Omega-cm\; to \; 227 \mu\Omega-cm$, respectively, but the deposition rate decreases from 47nm/min to 17nm/min. On the other hand, as the substrate temperature increases from room temperature to$500^{\circ}C$, resistivity decreases from $210.5 \mu\Omega-cm\; to \; 93.7\mu\Omega-cm$. $RuO_2$ thin film deposited at $300^{\circ}C$ shows a excellent surface roughness of 2.38 m. As the annealing temperature increases in the range between $400^{\circ}C$ and $650^{\circ}C$, the resistivity decreases because of the improvement of crystallinity. We find that RuO$_2$ thin film deposited at 20% of 02/(Ar+O2) ratio and $300^{\circ}C$ of substrate temperature shows excellent combination of surface smoothness and low resistivity so that it is well qualified for bottom electrode for ferroelectric thin films.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.12 no.4
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• pp.178-183
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• 2002

The PLZT (x/50/50, x = 1, 2, 5, 7) thin films have been prepared by a sol-gel method using polypropanediol as a solvent, and their dielectric properties have been investigated. The prepared sol was coated 10 times on $Pt/Ti/SiO2_2$/Si wafer. After post-annealing at 560~$600^{\circ}C$ for 10 min, the 600 nm-thick PLZT (x/50/50) thin films were formed with pure perovskite phase. Grain size of the PLZT (x/50/50) thin films was increased with increasing the amount of La. For all the compositions, dielectric properties such as dielectric constant and remnant polarization were enhanced with increasing annealing temperatures. As the amount of La was increased, the remnant polarization, coercive field and dielectric constant of the PLZT (x/50/50) thin films fired at $600^{\circ}C$ were decreased.

• Korean Chemical Engineering Research
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• v.47 no.5
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• pp.608-614
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• 2009

In this work, ruthenium substituted SBA-15's(Ru-SBA15's) of various Si/Ru ratios were prepared using a non-ionic triblock copolymer surfactant, $EO_{20}PO_{70}EO_{20}$, as template. We investigated the nitrogen or oxygen adsorption/desorption behaviors of the Ru-SBA-15's for their future applications as catalysts or selective adsorbents, etc. The pore size of the Ru-SBA-15's was determined by both the Barrett-Joyner-Halenda(BJH)($D_{BJH}$) and the Broekhoff-de Boer analysis with a Frenkel-Halsey-Hill isotherm(BdB-FFF) method($D_{BdB-FHH}$). The $D_{BJH}$ and $D_{BdB-FHH}$ of the Ru-SBA-15 having 50/1 ratio of Si/Ru were 3.9 nm and 4.7 nm, respectively. The transmission electron microscope(TEM) image of the Ru-SBA 15 of the Si/Ru mole ratio of 50 showed that the pore size is 4.7 nm, which is consistent with the $N_2$ adsorption results with the BdB-FHH method. The surface area of pores form oxygen adsorption/desorption isotherm was higher than that from the nitrogen adsorption/desorption isotherm by the Brunauer-Emmett-Teller(BET) method, which were respectively $612.7m^2/g$, and $573.3m^2/g$. X-ray diffraction(XRD) patterns and TEM analyses showed that the mesoporous materials possess well-ordered hexagonal arrays.

• Journal of Bio-Environment Control
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• v.23 no.1
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• pp.50-55
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• 2014

This study was conducted to investigate the responses of red pepper (Hongjinju) leaves under water stress. Hyperspectral short wave infrared (SWIR, 1000~1800 nm) reflectance imaging techniques were used to acquire the spectral images for the red pepper leaves with and without water stress. The acquired spectral data were analyzed with a multivariate analysis method of ANOVA (analysis of variance). The ANOVA model suggested that 1449 nm wavebands was the most effective to determine the stress responses of the red pepper leaves exposed to the water deficiency. The waveband of 1449 nm was closely related to the water absorption band. The processed spectral image of 1449 nm could separate the non-stress, moderate stress (-20 kPa), and severe stress (-50 kPa) groups of red pepper leaves distinctively. Results demonstrated that hyperspectral imaging technique can be applied to monitoring the stress responses of red pepper leaves which are an indicator of physiological and biochemical changes under water deficiency.

• Journal of the Korean Ceramic Society
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• v.50 no.1
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• pp.50-56
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• 2013

Phosphorescent materials coated with titanium dioxide were fabricated and photocatalytic reactions between these materials and VOCs gases were examined. A thin film (approx. 100 nm) of nanosized $TiO_2$ was deposited on the $Sr_4Al_{14}O_{25}$ : $Eu^{2+}$, $Dy^{3+}$, $Ag^+$ phosphor using low-pressure chemical vapor deposition (LPCVD). The characteristics of the photocatalytic reaction were examined in terms of the decomposition of benzene gas using a gas chromatography (GC) system under ultraviolet (${\lambda}$ = 365 nm) and visible light (${\lambda}$ > 420 nm) irradiation. $TiO_2$-coated $Sr_4Al_{14}O_{25}$ : $Eu^{2+}$, $Dy^{3+}$, $Ag^+$ phosphor showed different photocatalytic behavior compared with pure $TiO_2$. $TiO_2$-coated phosphorescent materials showed a much faster photocatalytic decomposition of benzene gas under visible irradiation compared to the pure $TiO_2$ for which the result was practically negligible. This suggests that the extension of the absorption wavelength to visible light occurred through energy band bending by a heterojunction at the interface of the $Sr_4Al_{14}O_{25}-TiO_2$ composite. Also, the $Sr_4Al_{14}O_{25}-TiO_2$ composite showed the photocatalytic decomposition of benzene in darkness due to the photon light emitted from the $Sr_4Al_{14}O_{25}$ phosphors.

• Transactions on Electrical and Electronic Materials
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• v.12 no.2
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• pp.60-63
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• 2011

We investigated the etching characteristics of zinc oxide (ZnO) and the effect of additive gases in a $Cl_2$-based inductively coupled plasma. The inert gases were argon, nitrogen, and helium. The maximum etch rates were 44.3, 39.9, and 37.9 nm/min for $Cl_2$(75%)/Ar(25%), $Cl_2$(50%)/$N_2$(50%), and $Cl_2$(75%)/He(25%) gas mixtures, 600 W radiofrequency power, 150 W bias power, and 2 Pa process pressure. We obtained the maximum etch rate by a combination of chemical reaction and physical bombardment. A volatile compound of Zn-Cl. achieved the chemical reaction on the surface of the ZnO thin films. The physical etching was performed by inert gas ion bombardment that broke the Zn-O bonds. The highly oriented (002) peak was determined on samples, and the (013) peak of $Zn_2SiO_4$ was observed in the ZnO thin film sample based on x-ray diffraction spectroscopy patterns. In addition, the sample of $Cl_2$/He chemistry showed a high full-width at half-maximum value. The root-mean-square roughness of ZnO thin films decreased to 1.33 nm from 5.88 nm at $Cl_2$(50%)/$N_2$(50%) plasma chemistry.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.23 no.10
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• pp.7-13
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• 2009

By incorporating a polarization beam splitter and fiber coupler, we propose a fiber-optic multiwavelength-switchable interleaving filter that can function as a polarizaiton-independent transmission or reflection-type one. The proposed filter consists of a polarizaiton beam splitter and a Sagnac birefringence loop that is composed of a 50:50 coupler, polarizaiton-maintaining fibers, and two quarter-wave plates. In the proposed filter, a transmission-type filter with a channel isolation > 18[dB] or a reflection-type one with a channel isolation ~3[dB], whose channel spacing and switching displacement were 0.8 and 0.4[nm] in common, respectively, could be obtained. Channel interleaving operation could be performed by the proper control of waveplates within the Sagnac birefringence loop.