• Korean Journal of Optics and Photonics
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• v.20 no.5
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• pp.281-287
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• 2009

The optical anisotropy of rubbed PI(polyimide) film on patterned LCD glass substrate is analyzed using polarimetry. The direction of the optic axis and the magnitude of the very small retardation ($\sim$ 0.4 nm or less) is precisely measured by using a transmission ellipsometer. The variation of the optical anisotropy is presented as the curve of the optic axis versus the magnitude of the phase retardation and it is explained by using a simple optical model.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.83-83
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• 2000

MBE법으로 성장시킨 Cd1-xMgxTe 박막을 조성비 (x=0, 0.23, 0.32, 0.43)에 따라 타원편광 분석기로 측정하여 연구하였다. E0 critical point energy 아래에서 나타나는 간섭무늬를 제거하기 위해 multilayer calculation을 수행했고 ellipsometric data를 2번 미분하여 계산하는 Critical Point Parabolic Band(CPPB) model을 사용하여 E0, E0+Δ0, E1, E1,+Δ1, and E0'critical point energy 들을 구할 수 있었다. 특히 E2 peak region 에서는 종전의 고상시료 (bulk)에서 측정 발표된 값보다도 매우 높고 명확한 <$\varepsilon$2>값이 측정되어, E2와 E、0 peak가 명확하게 분리되는 것을 볼 수 있었다. 또한 Mg의 조성비에 따라 critical point energy 가 linear 하게 변화됨이 관측되었다.

• Journal of the Korean Solar Energy Society
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• v.39 no.1
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• pp.11-19
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• 2019

Spectroscopic ellipsometry is a powerful tool for analyzing optical properties of material. Ellipsometry measurement results is usually given by change of polarization state of probe light, so the measured result should be properly treated and transformed to meaningful parameters by transformation and modeling of the measurement result. In case of hydrogenated amorphous silicon, Tauc-Lorentz dispersion is usually used to model the measured ellipsometry spectrum. In this paper, modeling of spectroscopic ellipsometry result of hydrogenated amorphous silicon using Tauc-Lorentz dispersion is discussed.

• Korean Journal of Optics and Photonics
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• v.20 no.5
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• pp.288-293
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• 2009

Polarization characteristics of a composite film composed of two optically anisotropic films are analyzed. The procedure to determine the effective optics axis and the equivalent retardation of the composite film is suggested in conjuction with the related ellipsometric expressions. The explicit expressions of the effective optic axis and the equivalent retardation of a non-uniform anisotropic film are derived when all optic axes are parallel. Those expressions of the composite film where optic axes of two constituting anisotropic films are not parallel are also derived. Dependence of those expressions on the polarization state of the incident light or the azimuth angle of the linearly polarized light and their limit when applied to practical use are discussed.

• New Physics: Sae Mulli
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• v.68 no.12
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• pp.1281-1287
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• 2018

In this study, $Al_xGa_{1-x}N$ films were grown on (0001) sapphire substrates by using metal-organic chemical vapor deposition (MOCVD). The crystallinity of the grown films was examined with X-ray diffraction (XRD) patterns. The surfaces and the chemical properties of the $Al_xGa_{1-x}N$ films were investigated using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS), respectively. The optical properties of the $Al_xGa_{1-x}N$ film were studied in a wide photon energy range between 2.0 ~ 8.7 eV by using spectroscopic ellipsometry (SE) at room temperature. The data obtained by using SE were analyzed to find the critical points of the pseudodielectric function spectra, $<{\varepsilon}(E)>=<{\varepsilon}_1(E)>+i<{\varepsilon}_2(E)>$. In addition, the second derivative spectra, $d^2<{\varepsilon}(E)>/dE^2$, of the pseudodielectric function for the $Al_xGa_{1-x}N$ films were numerically calculated to determine the critical points (CPs), such as the $E_0$, $E_1$, and $E_2$ structure. For the four samples (x = 0.18, 0.21, 0.25, 0.29) between a composition of x = 0.18 and x = 0.29, changes in the critical points (blue-shifts) with increasing Al composition at 300 K for the $Al_xGa_{1-x}N$ film were observed via ellipsometric measurements for the first time.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.333-333
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• 2012

III-V 족 화합물 반도체 물질인 $InAs_xP_{1-x}$는 다양한 광전자 소자와 빠른 속도의 전자 소자로써의 사용 가능성으로 각광받고 있다. 이러한 $InAs_xP_{1-x}$를 소자 제작에 이용하기 위해서는 임의의 As 함량에 따른 InAsP 물질의 정확한 광학적 특성 분석이 필요하다. 따라서 본 연구에서는 1.5~6.0 eV 에너지 구간에서 $InAs_xP_{1-x}$ ($0{\leq}{\times}{\leq}1$) 화합물의 임의의 As 함량에 따른 유전함수를 보고하고자 한다. MBE (molecular beam epitaxy)를 이용하여 InP 기판 위에 성장시킨 $InAs_xP_{1-x}$ (x = 0.000, 0.13, 0.40, 0.60, 0.80, 1.000) 박막을 타원편광분석법을 이용하여 측정하였고, 이 때 화학적 에칭을 통해 산화막 층을 제거하여 순수한 유전함수 ${\varepsilon}$을 얻을 수 있었다. 측정된 유전함수 분석은 parametric 모델을 이용하였으며, parametric 모델은 Gaussian-broadened polynomial들의 합으로서 반도체 물질의 유전함수를 정확히 기술하는 분석법이다. Parametric 모델을 통해 얻어진 각각의 변수들을 As 조성비 x에 대한 다항식으로 피팅하였고, 그 결과 임의의 조성비에 대한 $InAs_xP_{1-x}$ ($0{\leq}{times}{\leq}1$)의 유전함수를 얻어낼 수 있었다. 본 연구 결과는 물질의 실시간 성장 모니터링이나 다층구조 분석, 광소자의 제작 등에 유용한 정보로 이용될 수 있을 것이다.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.19 no.1
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• pp.34-39
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• 2005

We presented the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism. And, we analyzed the phase error caused by wave plates used in the proposed method by Jones matrix.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.19 no.8
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• pp.1-7
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• 2005

We introduced the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by the polarizing elements, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism and polarizing elements. Ant we analyzed the phase error caused by the azimuth angles of wave plates used in the proposed method by Jones matrix.

• Mineral and Industry
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• v.16 no.1
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• pp.1-16
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• 2003

수천 년 전부터 인간생활에 이용되어온 일라이트-운모는 다른 광물자원에 비하여 사용량은 많지 않지만, 요업, 도료, 종이, 건축용 재료, 화장품 소재 및 전자부품과 전기 재료 등 여러 산업 분야에 널리 사용되고 있다. 일라이트-운모는 광물학적으로 같은 계열의 광물군임에도 불구하고 산출상태, 입도 및 용도의 차이에 따라 다른 광물자원으로 취급되고 있다. 특히 국내에서 일라이트는 용어상의 혼란과 불명확한 법정 등록광종 때문에 효율적인 자원관리와 연구개발이 곤란한 실정이다. 그러므로 일라이트를 비롯한 점토광물 자원에 대한 광업법규상의 개선과 제도적 정비가 시급히 요구된다. 국내에서 개발되고 있는 일라이트-운모의 광석 유형은 그 광물상과 산출상태에 따라 페그마타이트상 백운모, 운모편암상 백운모, 납석상 일라이트 및 점토상 일라이트로 구분된다. 일라이트와 운모는 서로 다른 용도로 사용되고, 그 용도에 따라 그 품위 및 품질 개념이 다르다. 일라이트-운모 광석의 품위 및 품질 면에서 가장 기본적인평가방식은 (1) 육안 및 편광현미경 관찰, (2) X-선회질 분석 및 (3) 화학분석인 것으로 생각된다. 특히 리트벨트법을 응용한 X-선회질 정량분석법은 일라이트의 품위를 산정하는데 유력한 수단이 될 수 있을 것으로 여겨진다. 국내 일라이트-운모 자원의 자원잠재성과 부가가치를 향상시키기 위해서는 광석에 대한 정확한 품위 평가를 바탕으로 가장 적절한 이용 분야를 모색해야 할 것으로 판단된다.

• Journal of Korean Ophthalmic Optics Society
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• v.19 no.3
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• pp.331-337
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• 2014

Purpose: This is a comparative experimental study on the amount of phoria by the removal time of binocular fusion. In this study, three tests were used for phoria test like Howell test, Thorington test and developed 3D polarizing test. Methods: In this study, it was considered the removal time of binocular fusion for measuring phoria. The three methods were used for measuring quantity of phoria: Howell test, Thorington test and developed 3D Polarizing test. The measurements progressed quickly to avoid eye-strain. So we designed the test charts for marking 3D display modules and the apparatus inserted lenses, like Maddox lens and prism, which are compatible with three phoria tests. The phoria at the moment separation was measured when the binocular fusion was broken through the apparatus and the that at the stable separation was measured when activity of the separated two images like indicated box and figure on horizontal axis stopped. Results: There were statistically significant difference between quantity of phoria at moment separation and that at stable separation. Amount of phoria at moment separation was relatively larger than amount of that at stable separation. In result in exophoria, the quantity of phoria at moment separation was higher than that at stable separation, and in phoria measured by developed 3D polarizing test, it shows the similar results at two condition. Conclusions: For exophoria, the amount of phoria at moment separation of binocular fusion was relatively larger than that at stable separation. The amount of difference between phoria values at moment separation and that at stable separation was alike among three phoria tests. Usually in working, there is no distinction between moment separation and stable separation. But there were definitely the difference between two ways to separate binocular fusion. Therefore, it is need for writing on prescription test name for measuring phoria and condition of separation of binocular fusion.