• Title/Summary/Keyword: 전자 장비

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Field Emission source를 이용한 SEMAP(Scanning Electron Microscopy with Polarization Anlysis) 개발

  • Lee, Sang-Seon;Bae, Mun-Seop;Kim, Won-Dong;Hwang, Chan-Yong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.346-346
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    • 2011
  • 최근 들어 나노스케일에서의 자구체(magnetic domain)에 대한 연구가 매우 활발하게 진행되고 있다. 현재 국내에서 자성 나노구조에 대한 연구가 매우 활발하게 진행 되고 있는 반면에 나노자성이미지를 연구 할 수 있는 장비는 매우 미비한 상황이다. 이러한 자성 이미징을 연구하는데 있어 가장 핵심 적인 장비가 SEMPA(Scanning Electron Microscopy with Polarization Analysis)이다. 국내에서 자성나노구조의 자화와 형상을 동시에 측정 할 수 있는 장비는 한국표준과학연구원에서 개발된 W-filament source를 사용한 SEMPA가 유일하다. 일반적으로 SEM의 경우 고에너지 빔의 전자 빔을 주사 시키고 이때 발생되는 이차 전자의 수를 2차원상의 영역에 따라 달라지는 비로 형상을 측정 하게 된다. 이때 전자의 수 뿐만 아니라 이들의 spin polarization을 측정 할 수 있다면 형상뿐 만 아니라 표면에서의 스핀 상태를 동시에 측정할 수 있게 된다. 기개발된 W-filament source를 이용한 SEMPA는 field emission source에 비하여 전자빔의 세기가 약하며 이차 전자의 수도 적어 spin polarization 감도가 현저히 떨어진다. 또한 초고진공(1x10-10torr)에서 사용할 수 없어 측정시료의 contamination을 방지 할 수 없다. 이러한 문제점들을 보안하기 위하여 field emission source를 이용한 FE-SEMPA를 개발 중이다. 본 연구에서는 설계 및 전산시늉등의 연구결과와 진행사항을 발표하고자 한다. 아울러 W-filament를 사용한 SEMPA의 연구결과에 대한 논의를 할 예정이다.

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Development of a Data Bus Analyzer for Avionics Interfaces of Various Types (다종 항공전자 인터페이스를 위한 데이터 버스 분석 장비 개발)

  • Kim, Min-Su
    • Journal of the Korean Society for Aeronautical & Space Sciences
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    • v.44 no.9
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    • pp.825-832
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    • 2016
  • This paper describes the development of a data bus analyzer for use in avionics systems integration test. The data bus analyzer is equipped with MIL-STD-1553B, CAN and Ethernet interface cards which is incorporated in a majority of the avionics systems to accommodate a variety of interfaces. It has an individual hardware for a capture engine and a analyzing engine in order to perform the collection and the analysis of the bus data at the same time efficiently. It provides a data display function of the grid, 2-dimensional and 3-dimensional form to increase the data analysis efficiency. Verification of the data bus analyzer was carried out module unit testing and inter-module integration testing on the basis of the test procedures. Verification of interlocking requirement and usefulness of developed equipment was confirmed through an integration test result performed on a system integration laboratory of aircraft which is an actual testing environment.

Study on the Improvement of Relevant Legislative System for Activating Research Equipment Industry (연구장비산업 활성화를 위한 관련 법제 개선방안에 대한 연구)

  • Baek, Woonil;Han, Gapun
    • The Journal of Society for e-Business Studies
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    • v.25 no.2
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    • pp.127-146
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    • 2020
  • Overseas advanced countries are aware of the importance of research equipment and are providing a lot of policy support to revitalize the research equipment industry. However, Korea does not have any law to support policies or related projects to revitalize the research equipment industry. Therefore, there is an urgent need for legislation to support policies and projects for revitalizing research equipment industry. It is considered necessary to establish a separate special law for revitalizing the research equipment industry so that it can gain competitiveness in the global market of the research equipment industry. As we have seen, the necessary articles in the relevant laws should be specified so that various promotion policies can be developed to foster the research equipment industry. In order to promote the development of research equipment industry, there are three essential items to be specified in the law. First is research and development support, second is infrastructure development, and third is business incubation. The following contents should be included in each contents. First of all, "research and development support" includes research and envelopment project promotion and support policy items, research equipment development trends and investment trends, joint research between industry, academia, And research and development support for fusion, hybrid and commercialization. Next, the items to be included in "infrastructure development" should include the establishment of research equipment clusters, related support items, training of professional manpower, and research equipment development base area and institutions. Finally, the items that should be included in "business incubation." include support matters for the development of excellent companies (priority purchase system, etc.), matters related to technology transfer and marketing, matters concerning the protection of intellectual property, And matters for promoting overseas expansion.

Measurements and Data Interpretation for the Detection of Steel Bars and Delamination inside Concrete (콘크리트내의 철근 및 공동탐사를 위한 측정과 분석)

  • Rhim, Hong-Chul;Park, Ki-Joon;Lee, Soong-Jae
    • Journal of the Korean Society for Nondestructive Testing
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    • v.20 no.4
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    • pp.305-313
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    • 2000
  • To determine detection capabilities of locating steel bars and delamination inside concrete, commercially available nondestructive testing (NDT) equipments have been tested. The equipments include two radar systems and two electromagnetic method systems. The inclusions are a 19 mm diameter steel bar and 50 mm thick delamination embedded at different cover depths from the surface of concrete specimens. For the steel bar, attempts were made to determine the size of the bars by changing the diameter of the bars. A sample result of measuring horizontal spacing between doubly reinforced bars is presented in this paper. Experimental results on various measurement cases are discussed. Application of numerical modeling technique for the simulation of radar measurements and improved output display of radar measurements are also presented.

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Study on Measurement of Wafer Processing Throughput and Sequence Simulation of SWP(Single Wafer Process) Cleaning Equipment (매엽식 세정장비의 동작순서 시뮬레이션 및 웨이퍼 처리량 측정에 관한 연구)

  • Sun, Bok-Keun;Han, Kwang-Rok
    • Journal of the Institute of Electronics Engineers of Korea CI
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    • v.42 no.5
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    • pp.31-40
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    • 2005
  • In this study, we study measurement of wafer processing throughput and sequence simulation of single wafer type for wafer cleaning equipments that were used for etching, cleaning and polishing of wafer. Based on finite state machine, simulation model was built with identification of robot's status according to scheduling algorithm. Moreover, through performance of simulation as above, throughput per hour of cleaning equipment was measured. By the simulation method that are proposed in this paper, we could measure the wafer throughput per hour according to recipe and robot motion speed, and find optimal recipe and moving sequence of robot that maximize the throughput.

Development of Fire Control System with an Analysis of Impact Vibration and Impact Energy (충격체의 진동 및 충격량 분석을 이용한 사격 통제장비 개발)

  • Lee, Dong-Hee;Lee, Jong-Heon;Youn, Ju-Houc;Park, Noh-Sik
    • The Transactions of the Korean Institute of Power Electronics
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    • v.16 no.1
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    • pp.58-63
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    • 2011
  • This paper presents a development of a fire control system with an intelligent judgment algorithm of hit or not. The presented algorithm analyzes an impact energy and impact signals according to impact materials. And the detected signals are used to judge the correct hit or not. Furthermore, Zigbee wireless communication technology is applied in the developed fire control system. The wireless communication technology can supply a simple installation of the practical system and free from ageing of communication wire. The presented system is verified in the practical fire test, and the results show the effectiveness of the development system.

Comparison of Data Measured by Doppler Instruments at 1,550 nm and 23.2 cm Wavelengths (1,550 nm와 23.2 cm 파장의 도플러 측기 관측자료 비교)

  • Geon-Myeong Lee;Byung-Hyuk Kwon;Kyung-Hun Lee;Zi-Woo Seo
    • The Journal of the Korea institute of electronic communication sciences
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    • v.18 no.6
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    • pp.1041-1048
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    • 2023
  • Wind LiDAR and Wind Profiler are devices that produce continuous vertical distribution of wind vector in high-resolution data, and their use has recently been increasing. Although the observation and data processing methods of the two devices are similar, differences in wind detection accuracy may occur depending on weather and operation settings. introduce the characteristics of the two instruments and wind calculation methods, and apply the latest instrument verification standards to evaluate their accuracy by comparing them with the wind observed with a radiosonde. Accordingly, a new direction for performance verification following the introduction of equipment and additional necessary complements are presented.

A Study on the Development of Qualification for Semiconductor Machine Maintenance (반도체장비유지보수 자격개발에 관한 연구)

  • Kang, Seok-Ju
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.13 no.6
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    • pp.2472-2478
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    • 2012
  • This research is aiming to develop Semiconductor equipment maintenance certification course to train qualified maintenance experts more effectively requested in related semiconductor industry. In the course of research, we adopted diverse research technique such as interview, on-spot investigation, documentary references to analyze current status of related training facilities, and forecast the population of test applicants. We analyzed similar certification course(Craftsman SMT, Industrial Engineer SMT, Craftsman Mechatronics, Industrial Enginee Mechatronics, et) as reference to set up job objectives and curriculum of semiconductor equipment maintenance certification. We conducted survey on expectations on newly created certificate, presented evaluation standard and objective of test, and preliminary writing test and demonstration test. Based on the result of various research, we were able to present training program for semiconductor equipment maintenance certification and set the assessment standard of qualification exam.

Comparison of PCB Surface Treatment Effect Using UV Equipment and Atmospheric Pressure Plasma Equipment (UV 장비 및 대기압 플라즈마 장비를 이용한 PCB 표면 처리 효과 비교)

  • Ryu, Sun-Joong
    • Journal of the Microelectronics and Packaging Society
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    • v.16 no.3
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    • pp.53-59
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    • 2009
  • Low pressure mercury lamp type UV equipments have been widely used for cleaning and modification of PCB surfaces. To enhance the productivity of the process, we newly developed remote DBD type atmospheric pressure plasma equipment. The productivity of both equipments could be compared by measuring surface contact angle for various transferring speed. By the result of the measurement, we could verify that the productivity of the atmospheric pressure plasma be superior to the productivity of the UV equipment. XPS experiments confirmed that the surface effect of the UV and atmospheric pressure plasma processing are similar for each other. Organic contamination level was reduced after the processing and some surface elements were oxidized for both cases. Finally, the atmospheric pressure plasma equipment was adapted to flip chip BGA's flux printing process and it was concluded that the printing uniformity be enhanced by the atmospheric pressure plasma surface treatment.

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