Measurement of the deflection of a nanotube cantilever with nanometer accuracy using epi-fluorescence microscopy (형광을 이용한 나노튜브 캔틸레버의 나노미터 굽힘 변위 측정)
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- Proceedings of the Korean Society of Precision Engineering Conference
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- 2009.06a
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- pp.493-494
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- 2009